Probability of finding at least one TAR jet, where the p_T-leading TAR jet passes the m_Wcand and D₂^β=1 requirements, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=500 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1000 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1700 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied that do not pass the requirements of the merged category.

Observed exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected+1σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected-1σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected+2σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected-2σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=0.5 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=0.5 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=1 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=1.7 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=1.7 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=2.1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=2.1 TeV, shown in dashed blue.

Data overlaid on SM background yields stacked in each SR and CR category after the fit to data ('Post-fit'). The yields in the SR are broken down into their contributions to the individual bins. The maximum-likelihood estimators are set to the conditional values of the CR-only fit, and propagated to SR and CRs.

Dominant sources of uncertainty for three dark Higgs scenarios after the fit to data. The uncertainties are quantified in terms of their contribution to the fitted signal uncertainty that is expressed relative to the theory prediction. Three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01 and m_χ=200 GeV are considered, which are indicated using the (m_Z', m_s) format in units of GeV in the table columns.

Cumulative efficiencies in the merged category for three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01, m_Z' = 1 TeV, and m_χ=200 GeV considering s→W(ℓν)W(qq) decays only.

Cumulative efficiencies in the resolved category for three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01, m_Z' = 1 TeV, and m_χ=200 GeV considering s→W(ℓν)W(qq) decays only.

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={300, 350, 400, 500, 750} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={1000, 1700} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={2100, 2500, 2900, 3300} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Transverse mass distribution for events satisfying all selection criteria in the muon channel.

Upper limits at the 95% CL on the cross section for SSM W' production and decay to the electron+neutrino channel as a function of the W' pole mass.

Upper limits at the 95% CL on the cross section for SSM W' production and decay to the electron+neutrino channel as a function of the W' pole mass.

Upper limits at the 95% CL on the cross section for SSM W' production and decay to the muon+neutrino channel as a function of the W' pole mass.

Upper limits at the 95% CL on the cross section for SSM W' production and decay to the muon+neutrino channel as a function of the W' pole mass.

Combined (electron and muon channels) upper limits at the 95% CL on the cross section for SSM W' production and decay to a single lepton generation as a function of the W' pole mass.

Combined (electron and muon channels) upper limits at the 95% CL on the cross section for SSM W' production and decay to a single lepton generation as a function of the W' pole mass.

Product of acceptance and efficiency for the electron and muon selections as a function of the W' pole mass.

Product of acceptance and efficiency for the electron and muon selections as a function of the W' pole mass.

Observed and predicted mTtot distribution in the b-tag category of the 2tau_h channel. Despite listing this as an exclusive final state (as there must be at least one b-jets), there is no explicit selection on the presence of additional light-flavour jets. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. The last bin includes overflows. The combined prediction for A and H bosons with masses of 300, 500 and 800 GeV and $\tan\beta$ = 10 in the hMSSM scenario are also provided.

Observed and predicted mTtot distribution for the b-inclusive selection in the 1l1tau_h channel. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. In the paper, the first bin is cut off at 60 GeV for aesthetics but contains underflows down to 50 GeV as in the HepData table. The last bin includes overflows. The prediction for a SSM Zprime with masses of 1500, 2000 and 2500 GeV are also provided.

Observed and predicted mTtot distribution for the b-inclusive selection in the 2tau_h channel. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. The last bin includes overflows. The prediction for a SSM Zprime with masses of 1500, 2000 and 2500 GeV are also provided.

Observed and expected 95% CL upper limits on the b-associated Higgs boson production cross section times ditau branching fraction as a function of the boson mass.

Observed and expected 95% CL upper limits on the Drell Yan production cross section times ditau branching fraction as a function of the Zprime boson mass.

Observed and expected 95% CL upper limits on the Higgs boson production cross section times ditau branching fraction as a function of the boson mass and the relative strength of the b-associated production.

Ratio of the 95% CL upper limits on the production cross section times branching fraction for alternate Zprime models with respect to the SSM, both observed and expected are shown.

Acceptance, acceptance times efficiency and b-tag category fraction for a scalar boson produced by gluon-gluon fusion as a function of the scalar boson mass.

Acceptance, acceptance times efficiency and b-tag category fraction for a scalar boson produced by b-associated production as a function of the scalar boson mass.

Acceptance and acceptance times efficiency for a heavy gauge boson produced by Drell Yan as a function of the gauge boson mass.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Observed and expected 95% CL upper limits on the gluon-gluon fusion Higgs boson production cross section times ditau branching fraction as a function of the boson mass.

Fractions of selected events for several signal MC samples with a mass difference $\Delta m = 100$ GeV, illustrating how $\mathcal{A}\times\varepsilon$ varies with the model parameters.

Two-dimensional distribution of $m_{\mathrm{DV}}$ and track multiplicity for DVs in data events and events of a $R$-hadron signal sample with $m_{\tilde{g}} = 1.4$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and $\tau_{\tilde{g}} = 1$ ns that satisfy all signal region event selection criteria.

Two-dimensional distribution of $m_{\mathrm{DV}}$ and track multiplicity for DVs in data events and events of a $R$-hadron signal sample with $m_{\tilde{g}} = 1.4$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 1.32$ TeV and $\tau_{\tilde{g}} = 1$ ns that satisfy all signal region event selection criteria.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{g}}$ and $\tau$ for $m_{\tilde{\chi}_{1}^{0}}=100$ GeV. For the mass limits see the entry of Figure 8b.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Vertex reconstruction efficiency as a function of radial position $R$ with and without the special LRT processing for one $R$-hadron signal sample with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and $\tau_{\tilde{g}} = 1$ ns. The efficiency is defined as the probability for a true LLP decay to be matched with a reconstructed DV fulfilling the vertex preselection criteria in events with a reconstructed primary vertex.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Vertex reconstruction efficiency as a function of radial position $R$ for two $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $\tau_{\tilde{g}} = 1$ ns and different neutralino masses. The efficiency is defined as the probability for a true LLP decay to be matched with a reconstructed DV fulfilling the vertex preselection criteria in events with a reconstructed primary vertex.

Lower 95% CL limits on $m_{\tilde{g}}$ for fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Fractions of selected events for several signal MC samples with a gluino lifetime $\tau = 1$ ns, illustrating how $\mathcal{A}\times\varepsilon$ varies with the model parameters.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Fractions of selected events for several signal MC samples with a mass difference $\Delta m = 100$ GeV, illustrating how $\mathcal{A}\times\varepsilon$ varies with the model parameters.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Two-dimensional distribution of $m_{\mathrm{DV}}$ and track multiplicity for DVs in data events and events of a $R$-hadron signal sample with $m_{\tilde{g}} = 1.4$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and $\tau_{\tilde{g}} = 1$ ns that satisfy all signal region event selection criteria.

Lower 95% CL limit on $m_{\tilde{g}}$ for fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Two-dimensional distribution of $m_{\mathrm{DV}}$ and track multiplicity for DVs in data events and events of a $R$-hadron signal sample with $m_{\tilde{g}} = 1.4$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 1.32$ TeV and $\tau_{\tilde{g}} = 1$ ns that satisfy all signal region event selection criteria.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $\tau=1$ ns as a function of $m_{\tilde{\chi}_{1}^{0}}$.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $\tau=1$ ns as a function of $m_{\tilde{\chi}_{1}^{0}}$.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Observed 95% CL limit as a function of $m_{\tilde{g}}$ and $m_{\tilde{\chi}_{1}^{0}}$ for fixed $\tau=1$ ns.

Lower 95% CL limit on $m_{\tilde{g}}$ for fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Two-dimensional distributions of $x$-$y$ positions of vertices observed in the data passing the vertex pre-selection and satisfying all signal region event-level requirements.

Two-dimensional distributions of $x$-$y$ positions of vertices observed in the data passing the vertex pre-selection and satisfying all signal region event-level requirements.

Distribution of the mass $m_{\mathrm{DV}}$ for vertices in data events and in events of five $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and different $\tau_{\tilde{g}}$ that satisfy the signal region event requirements. All DV selections are applied except for the $m_{\mathrm{DV}}$ and track multiplicity requirements.

Distribution of the mass $m_{\mathrm{DV}}$ for vertices in data events and in events of five $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and different $\tau_{\tilde{g}}$ that satisfy the signal region event requirements. All DV selections are applied except for the $m_{\mathrm{DV}}$ and track multiplicity requirements.

Distribution of the track multiplicity $n_{\mathrm{Tracks}}$ for vertices in data events and events of five $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and and different $\tau_{\tilde{g}}$ that satisfy the signal region event requirements. All DV selections are applied except for the $m_{\mathrm{DV}}$ and track multiplicity requirements. The track multiplicity distribution requires vertices to have $m_{\mathrm{DV}}>3$ GeV.

Distribution of the track multiplicity $n_{\mathrm{Tracks}}$ for vertices in data events and events of five $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and and different $\tau_{\tilde{g}}$ that satisfy the signal region event requirements. All DV selections are applied except for the $m_{\mathrm{DV}}$ and track multiplicity requirements. The track multiplicity distribution requires vertices to have $m_{\mathrm{DV}}>3$ GeV.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{g}}$ and $\tau$ for $m_{\tilde{\chi}_{1}^{0}}=100$ GeV. For the mass limits see the entry of Figure 8b.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{g}}$ and $\tau$ for $\Delta m=100$ GeV. For the mass limits see the entry of Figure 9b.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{g}}$ and $\tau$ for $\Delta m=100$ GeV. For the mass limits see the entry of Figure 9b.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{\chi}_{1}^{0}}$ and $m_{\tilde{g}}$ for $\tau = 1$ ns. For the mass limits see the entry of Figure 10b.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{\chi}_{1}^{0}}$ and $m_{\tilde{g}}$ for $\tau = 1$ ns. For the mass limits see the entry of Figure 10b.

Parameterized event selection efficiencies as a function of truth MET for events which have all truth decay vertices occurring before the start of the ATLAS calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have all truth decay vertices occurring before the start of the ATLAS calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have the furthest truth decay occurring inside the calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have the furthest truth decay occurring inside the calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have the furthest truth decay occurring after the end of the ATLAS calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have the furthest truth decay occurring after the end of the ATLAS calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $4$ mm $< R_{\mathrm{decay}} < 22$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $4$ mm $< R_{\mathrm{decay}} < 22$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $22$ mm $< R_{\mathrm{decay}} < 25$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $22$ mm $< R_{\mathrm{decay}} < 25$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $25$ mm $< R_{\mathrm{decay}} < 29$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $25$ mm $< R_{\mathrm{decay}} < 29$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $29$ mm $< R_{\mathrm{decay}} < 38$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $29$ mm $< R_{\mathrm{decay}} < 38$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $38$ mm $< R_{\mathrm{decay}} < 46$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $38$ mm $< R_{\mathrm{decay}} < 46$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Lower 95% CL limits on $m_{\tilde{g}}$ for fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $46$ mm $< R_{\mathrm{decay}} < 73$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $46$ mm $< R_{\mathrm{decay}} < 73$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $73$ mm $< R_{\mathrm{decay}} < 84$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $73$ mm $< R_{\mathrm{decay}} < 84$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $84$ mm $< R_{\mathrm{decay}} < 111$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $84$ mm $< R_{\mathrm{decay}} < 111$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $111$ mm $< R_{\mathrm{decay}} < 120$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $111$ mm $< R_{\mathrm{decay}} < 120$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $\tau=1$ ns as a function of $m_{\tilde{\chi}_{1}^{0}}$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $120$ mm $< R_{\mathrm{decay}} < 145$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $120$ mm $< R_{\mathrm{decay}} < 145$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $\tau=1$ ns as a function of $m_{\tilde{\chi}_{1}^{0}}$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $145$ mm $< R_{\mathrm{decay}} < 180$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $145$ mm $< R_{\mathrm{decay}} < 180$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Observed 95% CL limit as a function of $m_{\tilde{g}}$ and $m_{\tilde{\chi}_{1}^{0}}$ for fixed $\tau=1$ ns.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $180$ mm $< R_{\mathrm{decay}} < 300$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $180$ mm $< R_{\mathrm{decay}} < 300$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Measured differential cross section with associated uncertainties as a function of COS(THETA*). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2GAMMA). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>30 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>50 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of HT. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of M(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of ABSDPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2GAMMA,2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of TAUJET. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of SUM(TAUJET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=0,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=1,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=2,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET>=3,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

The measured cross sections or cross section limits of the diphoton, VBF-enhanced, Nlepton $\geq$ 1, high $E_{T}^{miss}$, and ttH-enhanced fiducial regions are shown.

Measured differential cross section with associated uncertainties as a function of diphoton transverse momentum in bins of ABS(COS(THETA*)). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.Each systematic uncertainty sources is fully uncorrelated with the other sources.

Non-perturbative correction factors in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are evaluated by deriving these factors using different generators and tunes as described in the text. No factor are given for the Nlepton $\geq$ 1 and High-$E_{T}^{miss}$ fiducial regions as the gluon fusion contamination in both is negligible.

Isolation efficiencies in percent for gluon fusion $H\rightarrow\gamma\gamma$ for each fiducial region/variable bin measured in this analysis. The isolation efficiency is defined as the probability for both photons to fulfil the isolation criteria (as described in Section 9.1) for events that pass the diphoton kinematic criteria. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are assigned in the same way as for the non-perturbative correction factors: by varying the fragmentation and underlying event modelling. These factors can be multiplied by the kinematic acceptance factors (see Table 29) to extrapolate an inclusive gluon fusion Higgs prediction to the fiducial volume used in this analysis. No factors for the Nlepton $\geq$ 1 and High $E_{T}^{miss}$ fiducial regions are provided as the gluon fusion contamination is negligible.

Combined non-perturbative (Table 27) and particle-level isolation correction factors (Table 28) in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. The uncertainties on the combined values properly take into account the correlations between both multiplicative factors.

Diphoton kinematic acceptances in percent for gluon-gluon fusion for the diphoton fiducial region and all differential variable bins studied in this paper, defined as the probability to fulfill the diphoton kinematic criteria: $p_{T}$/$m_{\gamma\gamma}$ < 0.35 (0.25) for the leading (subleading) photon and $|\eta_{\gamma\gamma}|$ < 2.37. The factors are evaluated using the Powheg NNLOPSevent generator. Uncertainties are taken from PDF variations. QCD scale variations have a negligible impact on these factors. The range of each bin is given in Table 26.

observed statistical correlations between pTyy, Njets, mjj, |DeltaPhijj| and pTj1

ggH default MC + XH predictions

XH ( = VBF + VH + ttH + bbH ) MC predictions

Best-fit values and uncertainties of the production-mode cross sections times branching ratio.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Observed 95% confidence-level upper limits on the cross section for Drell-Yan spin-1/2 HECO production as a function of mass for various values of electric charge in the range $20\le|z|\le100$.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 200 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 1000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 1500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 2000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 2500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 3000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 4000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 200 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 1000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 1500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 2000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 2500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 3000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 4000 GeV.

Displaced HNL search observed 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNV case).

Prompt HNL search observed and expected 95% confidence level exclusion upper limits in $|U_{e}|^2$ as a function of HNL mass.

Prompt HNL search observed and expected 95% confidence level exclusion upper limits in $|U_{\mu}|^2$ as a function of HNL mass.

Displaced HNL search expected 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNC case).

Displaced HNL search expected 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNV case).

- - - - - - - - Overview of HEPData Record - - - - - - - - <br/><br/> <b>Background Fit results:</b> <ul> <li><a href="89413?version=4&table=Background fit 1">CRs</a> <li><a href="89413?version=4&table=Background fit 2">VRs</a> <li><a href="89413?version=4&table=Background fit 5">inclusive DF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 6">inclusive DF-1J SRs</a> <li><a href="89413?version=4&table=Background fit 3">inclusive SF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 4">inclusive SF-1J SRs</a> </ul> <b>Kinematic distributions in VRs:</b> <ul> <li><a href="89413?version=4&table=VR kinematics 1">$m_{T2}$ in VR-top-low</a> <li><a href="89413?version=4&table=VR kinematics 2">$m_{T2}$ in VR-top-high</a> <li><a href="89413?version=4&table=VR kinematics 3">$E_T^{miss}$ in VR-WW-0J</a> <li><a href="89413?version=4&table=VR kinematics 4">$E_T^{miss}$ in VR-WW-1J</a> <li><a href="89413?version=4&table=VR kinematics 5">$E_T^{miss}$ sig in VR-VZ</a> <li><a href="89413?version=4&table=VR kinematics 6">$E_T^{miss}$ sig in VR-top-WW</a> </ul> <b>Kinematic distributions in SRs:</b> <ul> <li><a href="89413?version=4&table=SR kinematics 1">$m_{T2}$ in SR-SF-0J</a> <li><a href="89413?version=4&table=SR kinematics 2">$m_{T2}$ in SR-SF-1J</a> <li><a href="89413?version=4&table=SR kinematics 3">$m_{T2}$ in SR-DF-0J</a> <li><a href="89413?version=4&table=SR kinematics 4">$m_{T2}$ in SR-DF-1J</a> </ul> <b>Systematic uncertaities:</b> <ul> <li><a href="89413?version=4&table=Systematic uncertainties">dominant systematic uncertainties in the inclusive SRs</a> </ul> <b>Exclusion contours:</b> <ul> <li><a href="89413?version=4&table=Exclusion contour (exp) 1">expected exclusion contour direct chargino-pair production via W decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 1">observed exclusion contour direct chargino-pair production via W decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 2">expected exclusion contour direct chargino-pair production via slepton decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 2">observed exclusion contour direct chargino-pair production via slepton decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 3">expected exclusion contour direct slepton-pair production grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 3">observed exclusion contour direct slepton-pair production grid</a> </ul> <br/><br/><b>AUXILIARY MATERIAL</b><br/> <b>Background Fit in binned SRs:</b> <ul> <li><a href="89413?version=4&table=Background fit 7">binned DF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 8">binned DF-1J SRs</a> <li><a href="89413?version=4&table=Background fit 9">binned SF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 10">binned SF-1J SRs</a> </ul> <b>Exclusion contours:</b> <ul> <li><a href="89413?version=4&table=Exclusion contour (exp) 4">expected exclusion contour left-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 4">observed exclusion contour left-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 5">expected exclusion contour right-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 5">observed exclusion contour right-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 6">expected exclusion contour selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 6">observed exclusion contour selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 7">expected exclusion contour left-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 7">observed exclusion contour left-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 8">expected exclusion contour right-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 8">observed exclusion contour right-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 9">expected exclusion contour smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 9">observed exclusion contour smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 10">expected exclusion contour left-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 10">observed exclusion contour left-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 11">expected exclusion contour right-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 11">observed exclusion contour right-handed smuon-pair production</a> </ul> <b>Cross section upper limits:</b> <ul> <li><a href="89413?version=4&table=xsec upper limits 1">upper limits on signal cross section for direct chargino-pair production via W decay</a> <li><a href="89413?version=4&table=xsec upper limits 2">upper limits on signal cross section for direct chargino-pair production via slepton decay</a> <li><a href="89413?version=4&table=xsec upper limits 3">upper limits on signal cross section for direct slepton-pair production</a> </ul> <b>Acceptances and Efficiencies for direct chargino-pair production via W decay grid </b> <ul> <li> <b>Acceptance</b> <br/> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,inf) for C1C1WW grid">SR-DF-0J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[160,inf) for C1C1WW grid">SR-DF-0J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,120) for C1C1WW grid">SR-DF-0J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[120,160) for C1C1WW grid">SR-DF-0J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,105) for C1C1WW grid">SR-DF-0J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[105,110) for C1C1WW grid">SR-DF-0J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[110,120) for C1C1WW grid">SR-DF-0J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[120,140) for C1C1WW grid">SR-DF-0J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[140,160) for C1C1WW grid">SR-DF-0J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[160,180) for C1C1WW grid">SR-DF-0J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[180,220) for C1C1WW grid">SR-DF-0J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[220,260) for C1C1WW grid">SR-DF-0J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[260,inf) for C1C1WW grid">SR-DF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,inf) for C1C1WW grid">SR-DF-1J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[160,inf) for C1C1WW grid">SR-DF-1J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,120) for C1C1WW grid">SR-DF-1J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[120,160) for C1C1WW grid">SR-DF-1J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,105) for C1C1WW grid">SR-DF-1J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[105,110) for C1C1WW grid">SR-DF-1J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[110,120) for C1C1WW grid">SR-DF-1J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[120,140) for C1C1WW grid">SR-DF-1J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[140,160) for C1C1WW grid">SR-DF-1J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[160,180) for C1C1WW grid">SR-DF-1J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[180,220) for C1C1WW grid">SR-DF-1J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[220,260) for C1C1WW grid">SR-DF-1J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[260,inf) for C1C1WW grid">SR-DF-1J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,inf) for C1C1WW grid">SR-SF-0J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[160,inf) for C1C1WW grid">SR-SF-0J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,120) for C1C1WW grid">SR-SF-0J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[120,160) for C1C1WW grid">SR-SF-0J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,105) for C1C1WW grid">SR-SF-0J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[105,110) for C1C1WW grid">SR-SF-0J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[110,120) for C1C1WW grid">SR-SF-0J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[120,140) for C1C1WW grid">SR-SF-0J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[140,160) for C1C1WW grid">SR-SF-0J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[160,180) for C1C1WW grid">SR-SF-0J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[180,220) for C1C1WW grid">SR-SF-0J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[220,260) for C1C1WW grid">SR-SF-0J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[260,inf) for C1C1WW grid">SR-SF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,inf) for C1C1WW grid">SR-SF-1J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[160,inf) for C1C1WW grid">SR-SF-1J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,120) for C1C1WW grid">SR-SF-1J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[120,160) for C1C1WW grid">SR-SF-1J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,105) for C1C1WW grid">SR-SF-1J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[105,110) for C1C1WW grid">SR-SF-1J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[110,120) for C1C1WW grid">SR-SF-1J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[120,140) for C1C1WW grid">SR-SF-1J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[140,160) for C1C1WW grid">SR-SF-1J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[160,180) for C1C1WW grid">SR-SF-1J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[180,220) for C1C1WW grid">SR-SF-1J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[220,260) for C1C1WW grid">SR-SF-1J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[260,inf) for C1C1WW grid">SR-SF-1J-[260,inf) </a><br/> <li> <b>Efficiency</b> <br/> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,inf) for C1C1WW grid">SR-DF-0J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[160,inf) for C1C1WW grid">SR-DF-0J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,120) for C1C1WW grid">SR-DF-0J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[120,160) for C1C1WW grid">SR-DF-0J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,105) for C1C1WW grid">SR-DF-0J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[105,110) for C1C1WW grid">SR-DF-0J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[110,120) for C1C1WW grid">SR-DF-0J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[120,140) for C1C1WW grid">SR-DF-0J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[140,160) for C1C1WW grid">SR-DF-0J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[160,180) for C1C1WW grid">SR-DF-0J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[180,220) for C1C1WW grid">SR-DF-0J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[220,260) for C1C1WW grid">SR-DF-0J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[260,inf) for C1C1WW grid">SR-DF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,inf) for C1C1WW grid">SR-DF-1J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[160,inf) for C1C1WW grid">SR-DF-1J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,120) for C1C1WW grid">SR-DF-1J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[120,160) for C1C1WW grid">SR-DF-1J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,105) for C1C1WW grid">SR-DF-1J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[105,110) for C1C1WW grid">SR-DF-1J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[110,120) for C1C1WW grid">SR-DF-1J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[120,140) for C1C1WW grid">SR-DF-1J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[140,160) for C1C1WW grid">SR-DF-1J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[160,180) for C1C1WW grid">SR-DF-1J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[180,220) for C1C1WW grid">SR-DF-1J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[220,260) for C1C1WW grid">SR-DF-1J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[260,inf) for C1C1WW grid">SR-DF-1J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,inf) for C1C1WW grid">SR-SF-0J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[160,inf) for C1C1WW grid">SR-SF-0J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,120) for C1C1WW grid">SR-SF-0J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[120,160) for C1C1WW grid">SR-SF-0J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,105) for C1C1WW grid">SR-SF-0J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[105,110) for C1C1WW grid">SR-SF-0J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[110,120) for C1C1WW grid">SR-SF-0J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[120,140) for C1C1WW grid">SR-SF-0J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[140,160) for C1C1WW grid">SR-SF-0J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[160,180) for C1C1WW grid">SR-SF-0J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[180,220) for C1C1WW grid">SR-SF-0J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[220,260) for C1C1WW grid">SR-SF-0J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[260,inf) for C1C1WW grid">SR-SF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,inf) for C1C1WW grid">SR-SF-1J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[160,inf) for C1C1WW grid">SR-SF-1J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,120) for C1C1WW grid">SR-SF-1J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[120,160) for C1C1WW grid">SR-SF-1J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,105) for C1C1WW grid">SR-SF-1J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[105,110) for C1C1WW grid">SR-SF-1J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[110,120) for C1C1WW grid">SR-SF-1J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[120,140) for C1C1WW grid">SR-SF-1J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[140,160) for C1C1WW grid">SR-SF-1J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[160,180) for C1C1WW grid">SR-SF-1J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[180,220) for C1C1WW grid">SR-SF-1J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[220,260) for C1C1WW grid">SR-SF-1J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[260,inf) for C1C1WW grid">SR-SF-1J-[260,inf) </a><br/> </ul> <b>Cutflow:</b> <ul> <li><a href="89413?version=4&table=Cutflow 1">Cutflow for direct chargino-pair production via W decay $m(\tilde{\chi}^{\pm}_1,\tilde{\chi}^{0}_1)=(300,50) GeV$</a> <li><a href="89413?version=4&table=Cutflow 2">Cutflow for direct chargino-pair production via slepton decay $m(\tilde{\chi}^{\pm}_1,\tilde{l},\tilde{\chi}^{0}_1)=(600,300,1) GeV$</a> <li><a href="89413?version=4&table=Cutflow 3">Cutflow for direct slepton-pair production $m(\tilde{l},\tilde{\chi}^{0}_1)=(400,200) GeV$</a> </ul> <b>SimpleAnalysis framework implementation</b> of the search SRs is available under "Resources" (purple button on the left)

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Efficiency in the Single-bin SR as a function of the M(Sbottom) vs. M(N2) with the $\Delta$ M(N2,N1) $= 130$ GeV. Keep in mind that the efficiency is given in units of $10^{-2}$.

Acceptance in the Multi-bin SR, $\min_{\Theta} < 0.5$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the acceptance is given in units of $10^{-4}$.

Efficiency in the Multi-bin SR, $\min_{\Theta} < 0.5$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the efficiency is given in units of $10^{-2}$.

Acceptance in the Multi-bin SR, $0.5 < \min_{\Theta} < 1.0$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the acceptance is given in units of $10^{-4}$.

Efficiency in the Multi-bin SR, $0.5 < \min_{\Theta} < 1.0$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the efficiency is given in units of $10^{-2}$.

Acceptance in the Multi-bin SR, $\min_{\Theta} > 1.0$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the acceptance is given in units of $10^{-4}$.

Efficiency in the Multi-bin SR, $\min_{\Theta} > 1.0$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the efficiency is given in units of $10^{-2}$.

Observed upper limits on the signal cross section as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV.

Expected upper limits on the signal cross section as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV.

Cutflows for the bechmarl signal point M(Sbottom) = 800 GeV, M(N2) = 180 GeV. Weighted event yields are reported starting with the "Preselection" line, normalized to an integrated luminosity of $139$ fb$^{−1}$.

Comparison of the expected and observed event yields in the signal regions. The top-quark and Z(mumu) background contributions are scaled with the normalization factors obtained from the background-only fit. The other contribution includes all the backgrounds not explicitly listed in the legend (V+jets except Z(mumu)+jets, di-/triboson, multijet). The hatched band indicates the total statistical and systematic uncertainties in the SM background. The contributions from three signal models to the signal regions are also displayed, where the masses M(Sbottom) and M(N2) are given in GeV in the legend. The lower panel shows the significance of the deviation of the observed yield from the expected background yield.

Dominant systematic uncertainties in the background prediction for the signal regions after the fit to the control regions. “Other” includes the uncertainties arising from muons, jet-vertex tagging, modeling of pile-up, the $E_{T}^{miss}$ computation, multijet background, and luminosity. The individual uncertainties can be correlated and do not necessarily add up quadratically to the total uncertainty.

Fitted event-level b-tagging selection efficiency as a function of the dijet invariant mass. The uncertainties are evaluated by propagating the uncertainties on the fit parameters to the fitted efficiency.