Number of tracks in vertex vs invariant mass of vertex (DATA) The number of tracks in the vertex vs the invariant mass of the vertex, for the data, and for the MH signal sample respectively. All selection cuts are applied, with the exceptions of those on the variables in the plot (Ntrk and mass), and the offline muon requirements.

Number of tracks in vertex vs invariant mass of vertex (SIGNAL) The number of tracks in the vertex vs the invariant mass of the vertex, for the data, and for the MH signal sample respectively. All selection cuts are applied, with the exceptions of those on the variables in the plot (Ntrk and mass), and the offline muon requirements.

95% CL upper limit on sigma.BR^2 vs c*tau The observed 95% CL upper limits on the cross-section for squark production, multiplied by the branching fraction for both squarks to decay to long-lived neutralinos, which in turn decay to mu+jets, given that we observed zero events in the signal region.

Expected upper limit on sigma.BR^2 vs c*tau The expected 95% CL upper limits on the cross-section for squark production, multiplied by the branching fraction for both squarks to decay to long-lived neutralinos, which in turn decay to mu+jets.

Fiducial Upsilon(3S) production cross-section, where pT>4 GeV and |eta|<2.3 for both muons, as a function of Upsilon(3S) pT in the Upsilon(3S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Fiducial Upsilon(nS) production cross-section, where pT>4 GeV and |eta|<2.3 for both muons, as a function of Upsilon(nS) rapidity (|y|) in Upsilon(nS) PT ranging from 0 - 70 GeV. The first uncertainty is statistical, the second is systematic.

Inclusive Upsilon(1S) production cross-section as a function of Upsilon(1S) pT in the Upsilon(1S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(2S) production cross-section as a function of Upsilon(2S) pT in the Upsilon(2S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(3S) production cross-section as a function of Upsilon(3S) pT in the Upsilon(3S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(nS) production cross-section as a function of Upsilon(nS) rapidity (|y|) in Upsilon(nS) PT ranging from 0 - 70 GeV. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Ratio of Upsilon(2S) to Upsilon(1S) inclusive cross-section as a function of Upsilon pT in the Upsilon rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Ratio of Upsilon(3S) to Upsilon(1S) inclusive cross-section as a function of Upsilon pT in the Upsilon rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Ratio of Upsilon(2S) and Upsilon(3S) to Upsilon(1S) inclusive cross-section as a function of Upsilon rapidity (|y|) in Upsilon pT 0 - 70 GeV. The first uncertainty is statistical, the second is systematic.

The measured individual cross sections in the fiducial region and the combined cross sections for 4-muon and 4-electron final states at a centre-of-collision energy of 8 TeV.

The measured individual cross sections in the fiducial region and the combined cross sections for for 2-muon-2-electron final states at a centre-of-collision energy of 8 TeV.

The measured cross section for four-lepton final states at a centre-of-collision energy of 8 TeV.

The branching fraction for Z0 --> 4 LEPTON, summed over all final states, measured using both the 7 and 8 TeV datasets.

Measured differential cross sections as function of the lepton pseudo-rapidity of the production of a W boson with a D meson or a D* meson times the branching ratio W -> l nu in the fiducial regions together with the statistical and systematic uncertainties. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events.

Measured cross section ratios of the production of a W boson with a D meson or a D* meson and the inclusive production of a W boson in the fiducial regions together with the statistical and systematic uncertainties. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events.

Measured differential cross section ratios of the production of a W boson with a D meson or a D* meson and the inclusive production of a W boson in the fiducial regions as function of the D/D* meson pT together with the statistical and systematic uncertainties. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events.

Measured integrated cross sections of the production of a W boson in association with a single c-jet and exactly zero or one additional non-c-jets times the branching ratio W -> l nu in the fiducial regions together with the statistical and systematic uncertainties. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. The cross sections are defined for OS-SS events.

Measured integrated cross sections ratio of the production of a W+ and W- bosons in association with a single c-jet and exactly zero or one additional non-c-jets in the fiducial regions together with the statistical and systematic uncertainties. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. The cross sections are defined for OS-SS events.

Measured integrated cross sections of the production of a W boson in association with a single c-jet decaying into a soft muon in the fiducial regions together with the statistical and systematic uncertainties. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. Soft muons are associated to c-jets within a cone of DeltaR<0.5. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events.

Correlation matrix corresponding to the total uncertainties of measured integrated cross sections of the production of a W boson with a single c-jet, a D meson or a D* meson times the branching ratio W -> l nu in the fiducial regions.

Systematic uncertainties after the averaging procedure of the inclusive cross sections in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels. The luminosity is included in these correlated systematic uncertainties.

Systematic uncertainties after the averaging procedure of the differential cross sections as function of the lepton pseudo-rapidity in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels and bins. The luminosity is included in these correlated systematic uncertainties. The systematic uncertainties for the W+ + cbar-jet channel are shown in this table.

Systematic uncertainties after the averaging procedure of the differential cross sections as function of the lepton pseudo-rapidity in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels and bins. The luminosity is included in these correlated systematic uncertainties. The systematic uncertainties for the W- + c-jet channel are shown in this table.

Systematic uncertainties after the averaging procedure of the differential cross sections as function of the lepton pseudo-rapidity in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels and bins. The luminosity is included in these correlated systematic uncertainties. The systematic uncertainties for the W+ D- and W- D+ channels are shown in this table.

Systematic uncertainties after the averaging procedure of the differential cross sections as function of the lepton pseudo-rapidity in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels and bins. The luminosity is included in these correlated systematic uncertainties. The systematic uncertainties for the W+ D*- and W- D*+ channels are shown in this table.

Theoretical Predictions for the integrated cross section of the production of W+ and W- bosons associated with a single c-jet, a D meson or a D* meson in the fiducial regions together with the statistical and systematic uncertainties. For the W+c-jet cross sections events with more than one c-jet are discarded. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events. The predictions have been obtained the aMC@NLO MC simulation interfaced to the Herwig++ parton shower programme. The uncertainties on the predictions entail PDF uncertainties, parton shower, fragmentation and scale uncertainties. The predictions are reweighted using LHAPDF from the CT10nlo PDF set to the following PDF sets with the LHAPDF IDs given in brackets: CT10nlo (11000), MSTW2008nlo68cl (21100), NNPDF23_nlo_as_0119 (230000), NNPDF23_nlo_collider_as_0119 (236000), HERAPDF15NLO (EIG+VAR, 60700+60730), ATLAS-epWZ12 (EIG+VAR, 65000+65040).

PDF uncertainty for each of the used PDF sets as well as the combined parton shower, fragmentation and scale uncertainties (given in percent) for the theoretical Predictions for the integrated cross section of the production of W+ and W- bosons associated with a single c-jet, a D meson or a D* meson in the fiducial regions together with the statistical and systematic uncertainties. If added quadratically, these uncertainties represent the total uncertainty on the quoted theory prediction. For the W+c-jet cross sections events with more than one c-jet are discarded. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events. The predictions have been obtained the aMC@NLO MC simulation interfaced to the Herwig++ parton shower programme. The uncertainties on the predictions entail PDF uncertainties, FSR uncertainties and scale uncertainties. The predictions are reweighted using LHAPDF from the CT10nlo PDF set to the following PDF sets with the LHAPDF IDs given in brackets: CT10nlo (11000), MSTW2008nlo68cl (21100), NNPDF23_nlo_as_0119 (230000), NNPDF23_nlo_collider_as_0119 (236000), HERAPDF15NLO (EIG+VAR, 60700+60730), ATLAS-epWZ12 (EIG+VAR, 65000+65040). The determination of the parton shower, fragmentation and scale uncertainties is detailed in the paper.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Measured fiducial cross section in all $\ell^+\ell^-\ell'^+\ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Cross section extrapolated to total phase space and all Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.