Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Measured $p_{\mathrm{T}}(D^{-})$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{+}+D^{-}$ channel. The last $p_{\mathrm{T}}$ bin has no upper bound. The displayed cross sections are integrated over each differential bin.

Measured $|\eta(\ell)|$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{-}+D^{+}$ channel. The displayed cross sections are integrated over each differential bin.

Measured $|\eta(\ell)|$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{+}+D^{-}$ channel. The displayed cross sections are integrated over each differential bin.

Measured $p_{\mathrm{T}}(D^{*+})$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{-}+D^{*+}$ channel. The last $p_{\mathrm{T}}$ bin has no upper bound. The displayed cross sections are integrated over each differential bin.

Measured $p_{\mathrm{T}}(D^{*-})$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{+}+D^{*-}$ channel. The last $p_{\mathrm{T}}$ bin has no upper bound. The displayed cross sections are integrated over each differential bin.

Measured $|\eta(\ell)|$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{-}+D^{*+}$ channel. The displayed cross sections are integrated over each differential bin.

Measured $|\eta(\ell)|$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{+}+D^{*-}$ channel. The displayed cross sections are integrated over each differential bin.

The data statistical uncertainty covariance matrix for the differential $p_{\mathrm{T}}(D^{\pm})$ fit in the $D^{\pm}$ channel (Tables 3 and 4).

The data statistical uncertainty covariance matrix for the differential $|\eta(\ell)|$ fit in the $D^{\pm}$ channel (Tables 5 and 6).

The data statistical uncertainty covariance matrix for the differential $p_{\mathrm{T}}(D^{*\pm})$ fit in the $D^{*\pm}$ channel (Tables 7 and 8).

The data statistical uncertainty covariance matrix for the differential $|\eta(\ell)|$ fit in the $D^{*\pm}$ channel (Tables 9 and 10).

The combined statistical and systematic uncertainty covariance matrix for the differential $p_{\mathrm{T}}(D^{\pm})$ fit in the $D^{\pm}$ channel (Tables 3 and 4).

The combined statistical and systematic uncertainty covariance matrix for the differential $|\eta(\ell)|$ fit in the $D^{\pm}$ channel (Tables 5 and 6).

The combined statistical and systematic uncertainty covariance matrix for the differential $p_{\mathrm{T}}(D^{*\pm})$ fit in the $D^{*\pm}$ channel (Tables 7 and 8).

The combined statistical and systematic uncertainty covariance matrix for the differential $|\eta(\ell)|$ fit in the $D^{*\pm}$ channel (Tables 9 and 10).

Measured $|\eta(\ell)|$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{-}+D^{+}$ channel with the full breakdown of uncertainties.

Measured $|\eta(\ell)|$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{+}+D^{-}$ channel with the full breakdown of uncertainties.

Measured $|\eta(\ell)|$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{-}+D^{*+}$ channel with the full breakdown of uncertainties.

Measured $|\eta(\ell)|$ differential fiducial cross-section times the single-lepton-flavor W boson branching ratio in the $W^{+}+D^{*-}$ channel with the full breakdown of uncertainties.

Descriptions of nuisance parameters.

Distribution of $m^{vis}_{HH}$ after applying all the event selection that define the $HH$ SR, except the requirement on $m^{vis}_{HH}$. The background labelled as "Others" contains $W$+jets, diboson, $t\bar{t}$ and single-top-quark processes. The $X\rightarrow HH \rightarrow b\bar{b}\tau^{+}\tau^{-}$ signal is overlaid for two resonance mass hypotheses with a cross-section set to the expected limit, while all backgrounds are pre-fit. The first and the last bins contains the under-flow and over-flow bin entries, respectively. The hatched bands represent combined statistical and systematic uncertainties.

Event yields of the various estimated backgrounds and data, computed in the signal region of the search for $X\rightarrow HH \rightarrow b\bar{b}\tau^{+}\tau^{-}$. The background labelled as "Others" contains $W$+jets, diboson, $t\bar{t}$ and single-top-quark processes. Statistical and systematic uncertainties are quoted. The background yields and uncertainties are pre-fit and are found to be similar to those post-fit.

Event yields of the various estimated backgrounds and data, computed in the signal region of the search for $X\rightarrow HH \rightarrow b\bar{b}\tau^{+}\tau^{-}$. The background labelled as "Others" contains $W$+jets, diboson, $t\bar{t}$ and single-top-quark processes. Statistical and systematic uncertainties are quoted. The background yields and uncertainties are pre-fit and are found to be similar to those post-fit.

Expected and observed 95% CL upper limits on the production of a heavy, narrow-width, scalar resonance decaying to a pair of Higgs bosons ($X\rightarrow HH$). The final state used in the search consists of a boosted $b\bar{b}$ pair and a boosted hadronically decaying $\tau^{+}\tau^{-}$ pair, and the SM braching ratio of the Higgs boson are assumed. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit are indicated by the error bands. Two different requirements are applied on the visible mass of the two boosted Higgs boson candidates for the resonance mass hypotheses of 1.6 TeV and 2.5 TeV, leading to discontinuities in the limits (at 1.6 TeV, the difference between imposing no requirement and $m^{vis}_{HH}>900$ GeV is less than 1% though).

Expected and observed 95% CL upper limits on the production of a heavy, narrow-width, scalar resonance decaying to a pair of Higgs bosons ($X\rightarrow HH$). The final state used in the search consists of a boosted $b\bar{b}$ pair and a boosted hadronically decaying $\tau^{+}\tau^{-}$ pair, and the SM braching ratio of the Higgs boson are assumed. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit are indicated by the error bands. Two different requirements are applied on the visible mass of the two boosted Higgs boson candidates for the resonance mass hypotheses of 1.6 TeV and 2.5 TeV, leading to discontinuities in the limits (at 1.6 TeV, the difference between imposing no requirement and $m^{vis}_{HH}>900$ GeV is less than 1% though).

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the inclusive fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{inc}}/\sigma^{\text{pred.}}_{\text{inc}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{inc}}/\sigma^{\text{pred}}_{\text{inc}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.

Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the fiducial fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{fid}}/\sigma^{\text{pred.}}_{\text{fid}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{fid}}/\sigma^{\text{pred}}_{\text{fid}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.

Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the fiducial fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{fid}}/\sigma^{\text{pred.}}_{\text{fid}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{fid}}/\sigma^{\text{pred}}_{\text{fid}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.

Impact of different categories of systematic uncertainties on the fiducial and inclusive measurements. The quoted values are obtained by repeating the fit, fixing a set of nuisance parameters of the sources corresponding to the considered category, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters built by the fit.

Impact of different categories of systematic uncertainties on the fiducial and inclusive measurements. The quoted values are obtained by repeating the fit, fixing a set of nuisance parameters of the sources corresponding to the considered category, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters built by the fit.

Fiducial region definition

Fiducial region definition

The absolute differential cross-section measured in the fiducial phase-space as a function of the minimum $\Delta R$ between the photon and the leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The absolute differential cross-section measured in the fiducial phase-space as a function of the $\Delta\phi$ between the two leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The absolute differential cross-section measured in the fiducial phase-space as a function of the $|\Delta\eta|$ between the two leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the photon pT in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the photon $|\eta|$ in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the minimum $\Delta R$ between the photon and the leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the $\Delta\phi$ between the two leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the $|\Delta\eta|$ between the two leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the photon pT in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the photon $|\eta|$ in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the minimum $\Delta R$ between the photon and the leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the $\Delta\phi$ between the two leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the $|\Delta\eta|$ between the two leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the photon pT in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the photon $|\eta|$ in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the minimum $\Delta R$ between the photon and the leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the $\Delta\phi$ between the two leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the $|\Delta\eta|$ between the two leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The statistical correlation matrix of all the absolute differential cross-sections measured in the fiducial phase-space in the electron-muon channel.

The statistical correlation matrix of all the normalised differential cross-sections measured in the fiducial phase-space in the electron-muon channel.

Fiducial region definition.

Distribution of the diphoton invariant mass in validation region VR2. The solid histograms are stacked to show the SM expectations after the 2&times;2D background estimation technique is applied. Background and signal predictions are normalised to the luminosity. The background category "h (other)" includes events originating from VBF, Vh, ggF, thq, thW and bb&#772;h, all subdominant in this signature. Statistical and systematic uncertainties are indicated by the shaded area. The lower panel of each plot shows the ratio of the data to the SM prediction for the respective bin. The first and last bins include the underflows and overflows respectively.

Distribution of the missing transverse momentum in validation region VR2. The solid histograms are stacked to show the SM expectations after the 2&times;2D background estimation technique is applied. Background and signal predictions are normalised to the luminosity. The background category "h (other)" includes events originating from VBF, Vh, ggF, thq, thW and bb&#772;h, all subdominant in this signature. Statistical and systematic uncertainties are indicated by the shaded area. The lower panel of each plot shows the ratio of the data to the SM prediction for the respective bin. The first and last bins include the underflows and overflows respectively.

Distribution of the diphoton invariant mass with all selections of the signal regions applied, except on m_{&gamma;&gamma;} itself, for signal region SR1h. The background estimation techniques described in the text are applied. The different backgrounds are stacked to add up to the total SM prediction in each bin. The predicted yields for signal benchmark models of varying &chi;&#771;⁰₁ mass are also overlaid (not stacked) assuming B(&chi;&#771;⁰₁ &rarr; hG&#771; ) to equal 100%. Background and signal predictions are normalised to the luminosity. The background category "h (other)" includes events originating from VBF, Vh, ggF, thq, thW and bb&#772;h, all subdominant in this signature. The sizes of the statistical and systematic uncertainties are indicated by the shaded areas. The lower panels show the ratio of the data to the SM prediction. Arrows indicate the borders of the signal region (|m_{&gamma;&gamma;}-125 GeV|&lt;5 GeV). The first and last bins include the underflows and overflows respectively.

Distribution of the diphoton invariant mass with all selections of the signal regions applied, except on m_{&gamma;&gamma;} itself, for signal region SR1Z. The background estimation techniques described in the text are applied. The different backgrounds are stacked to add up to the total SM prediction in each bin. The predicted yields for signal benchmark models of varying &chi;&#771;⁰₁ mass are also overlaid (not stacked) assuming B(&chi;&#771;⁰₁ &rarr; hG&#771; ) to equal 50%. Background and signal predictions are normalised to the luminosity. The background category "h (other)" includes events originating from VBF, Vh, ggF, thq, thW and bb&#772;h, all subdominant in this signature. The sizes of the statistical and systematic uncertainties are indicated by the shaded areas. The lower panels show the ratio of the data to the SM prediction. Arrows indicate the borders of the signal region (|m_{&gamma;&gamma;}-125 GeV|&lt;5 GeV). The first and last bins include the underflows and overflows respectively.

Distribution of the diphoton invariant mass with all selections of the signal regions applied, except on m_{&gamma;&gamma;} itself, for signal region SR2. The background estimation techniques described in the text are applied. The different backgrounds are stacked to add up to the total SM prediction in each bin. The predicted yields for signal benchmark models of varying &chi;&#771;⁰₁ mass are also overlaid (not stacked) assuming B(&chi;&#771;⁰₁ &rarr; hG&#771; ) to equal 100%. Background and signal predictions are normalised to the luminosity. The background category "h (other)" includes events originating from VBF, Vh, ggF, thq, thW and bb&#772;h, all subdominant in this signature. The sizes of the statistical and systematic uncertainties are indicated by the shaded areas. The lower panels show the ratio of the data to the SM prediction. Arrows indicate the borders of the signal region (|m_{&gamma;&gamma;}-125 GeV|&lt;5 GeV). The first and last bins include the underflows and overflows respectively.

Observed and expected limits on the pure higgsino cross-section at 95% CL assuming B(&chi;&#771;⁰₁ &rarr; hG&#771; )=100% for different &chi;&#771;⁰₁ masses, obtained by a statistical combination of the three signal regions SR1h, SR1Z and SR2. The inner and outer bands indicate the 1&sigma; and 2&sigma; variation on the expected limit respectively.

Observed and expected 95% CL limits on the pure-higgsino branching fraction to B(&chi;&#771;⁰₁ &rarr; hG&#771; ) as a function of the higgsino mass m(&chi;&#771;⁰₁) assuming it decays via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;. Limits are obtained by performing a statistical combination of the three signal regions SR1h, SR1Z and SR2. The &plusmn; 1&sigma; variation on the expected limit is shown. The dotted lines indicate the observed limit obtained by a variation of theoretical prediction for the neutralino production cross-section by &plusmn;1 &sigma;. Values of B(&chi;&#771;⁰₁ &rarr; hG&#771; ) larger than the observed 95% CL limit are excluded, as indicated by the hatched area.

Observed and expected 95% CL limits on the pure-higgsino branching fraction to B(&chi;&#771;⁰₁ &rarr; hG&#771; ) as a function of the higgsino mass m(&chi;&#771;⁰₁) assuming it decays via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;. Limits are obtained by performing a statistical combination of the three signal regions SR1h, SR1Z and SR2. The &plusmn; 1&sigma; variation on the expected limit is shown. The dotted lines indicate the observed limit obtained by a variation of theoretical prediction for the neutralino production cross-section by &plusmn;1 &sigma;. Values of B(&chi;&#771;⁰₁ &rarr; hG&#771; ) larger than the observed 95% CL limit are excluded, as indicated by the hatched area.

Observed and expected 95% CL limits on the pure-higgsino branching fraction to B(&chi;&#771;⁰₁ &rarr; hG&#771; ) as a function of the higgsino mass m(&chi;&#771;⁰₁) assuming it decays via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;. Limits are obtained by performing a statistical combination of the three signal regions SR1h, SR1Z and SR2. The &plusmn; 1&sigma; variation on the expected limit is shown. The dotted lines indicate the observed limit obtained by a variation of theoretical prediction for the neutralino production cross-section by &plusmn;1 &sigma;. Values of B(&chi;&#771;⁰₁ &rarr; hG&#771; ) larger than the observed 95% CL limit are excluded, as indicated by the hatched area.

Observed and expected 95% CL limits on the pure-higgsino branching fraction to B(&chi;&#771;⁰₁ &rarr; hG&#771; ) as a function of the higgsino mass m(&chi;&#771;⁰₁) assuming it decays via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;. Limits are obtained by performing a statistical combination of the three signal regions SR1h, SR1Z and SR2. The &plusmn; 1&sigma; variation on the expected limit is shown. The dotted lines indicate the observed limit obtained by a variation of theoretical prediction for the neutralino production cross-section by &plusmn;1 &sigma;. Values of B(&chi;&#771;⁰₁ &rarr; hG&#771; ) larger than the observed 95% CL limit are excluded, as indicated by the hatched area.

Observed and expected 95% CL limits on the pure-higgsino branching fraction to B(&chi;&#771;⁰₁ &rarr; hG&#771; ) as a function of the higgsino mass m(&chi;&#771;⁰₁) assuming it decays via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;. Limits are obtained by performing a statistical combination of the three signal regions SR1h, SR1Z and SR2. The &plusmn; 1&sigma; variation on the expected limit is shown. The dotted lines indicate the observed limit obtained by a variation of theoretical prediction for the neutralino production cross-section by &plusmn;1 &sigma;. Values of B(&chi;&#771;⁰₁ &rarr; hG&#771; ) larger than the observed 95% CL limit are excluded, as indicated by the hatched area.

Observed and expected 95% CL limits on the pure-higgsino branching fraction to B(&chi;&#771;⁰₁ &rarr; hG&#771; ) as a function of the higgsino mass m(&chi;&#771;⁰₁) assuming it decays via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;. Limits are obtained by performing a statistical combination of the three signal regions SR1h, SR1Z and SR2. The &plusmn; 1&sigma; variation on the expected limit is shown. The dotted lines indicate the observed limit obtained by a variation of theoretical prediction for the neutralino production cross-section by &plusmn;1 &sigma;. Values of B(&chi;&#771;⁰₁ &rarr; hG&#771; ) larger than the observed 95% CL limit are excluded, as indicated by the hatched area.

Numbers of signal and background events in the signal regions. The respective background estimation techniques are applied. The background category "h (other)" includes events originating from VBF, Vh, ggF, thq, thW and bb&#772;h, all subdominant in this signature. The different backgrounds are stacked to add up to the total Standard Model prediction in each bin. The predicted yields for signal benchmark models of varying &chi;&#771;⁰₁ mass are also plotted (not stacked), assuming B(&chi;&#771;⁰₁ &rarr; hG&#771; )=100% and a &chi;&#771;⁰₁ mass of 130 or 200 GeV. The statistical and systematic uncertainties are indicated by the shaded areas in the top plot. The bottom panel shows the statistical significance&nbsp;<a href="https://atlas.web.cern.ch/Atlas/GROUPS/PHYSICS/PUBNOTES/ATL-PHYS-PUB-2020-025/">[Ref]</a> of the difference between the SM prediction and the observed data in each region.

Observed 95% CL limits in pb on the pure higgsino cross-section, shown in the m(&chi;&#771;⁰₁)-B(&chi;&#771;⁰₁ &rarr; hG&#771; ) plane. Limits are obtained by a statistical combination of the three signal regions SR1h, SR1Z and SR2, assuming the neutralino to decay via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;.

Acceptances for all signal model points considered in the analysis, shown in the m(&chi;&#771;⁰₁)-B(&chi;&#771;⁰₁ &rarr; hG&#771; ) plane. Acceptances are provided separately for signal region SR1h, assuming the neutralino to decay via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;.

Acceptances for all signal model points considered in the analysis, shown in the m(&chi;&#771;⁰₁)-B(&chi;&#771;⁰₁ &rarr; hG&#771; ) plane. Acceptances are provided separately for signal region SR1Z, assuming the neutralino to decay via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;.

Acceptances for all signal model points considered in the analysis, shown in the m(&chi;&#771;⁰₁)-B(&chi;&#771;⁰₁ &rarr; hG&#771; ) plane. Acceptances are provided separately for signal region SR2, assuming the neutralino to decay via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;.

Efficiencies for all signal model points considered in the analysis, shown in the m(&chi;&#771;⁰₁)-B(&chi;&#771;⁰₁ &rarr; hG&#771; ) plane. Efficiencies are provided separately for signal region SR1h, assuming the neutralino to decay via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;.

Efficiencies for all signal model points considered in the analysis, shown in the m(&chi;&#771;⁰₁)-B(&chi;&#771;⁰₁ &rarr; hG&#771; ) plane. Efficiencies are provided separately for signal region SR1Z, assuming the neutralino to decay via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;.

Efficiencies for all signal model points considered in the analysis, shown in the m(&chi;&#771;⁰₁)-B(&chi;&#771;⁰₁ &rarr; hG&#771; ) plane. Efficiencies are provided separately for signal region SR2, assuming the neutralino to decay via either &chi;&#771;⁰₁&rarr; hG&#771; or &chi;&#771;⁰₁&rarr; ZG&#771;.

Observed and expected numbers of events in the three signal regions. The background category "h (other)" includes events originating from VBF, Vh, ggF, thq, thW and bb&#772;h, all subdominant in this signature. The table also includes model-independent 95% CL upper limits on the visible number of BSM events (S⁹⁵_obs), the number of BSM events given the expected number of background events (S⁹⁵_exp) and the visible BSM cross-section (&lang;&epsilon; &sigma;&rang;_obs⁹⁵), all calculated from pseudo-experiments. The discovery p-value (p₀) is also shown and its value is capped at 0.5 if the observed number of events is below the expected number of events.

Cutflows of two benchmark signal points assuming B(&chi;&#771;⁰₁ &rarr; hG&#771; )=100% for all three discovery signal regions. The initial selection includes the leptons veto. Only statistical uncertainties are included. Expected yields are normalised to a luminosity of 139 fb^-1.

Best fit values of $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The values involving cross sections are given for $\sqrt{s}$=8 TeV, assuming the SM values for $\sigma_i(7 \mathrm{TeV})/\sigma_i(8 \mathrm{TeV})$. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\kappa_{gZ}= \kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and of the ratios of coupling modifiers, as defined in the most generic parameterisation described in the context of the $\kappa$ framework, from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The uncertainties in $\lambda_{tg}$ and $\lambda_{WZ}$, for which a negative solution is allowed, are calculated around the overall best fit value. The expected total uncertainties in the measurements are also shown. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Measured global signal strength $\mu$ and its total uncertainty, together with the breakdown of the uncertainty into its four components as defined in the text. The results are shown for the combination of ATLAS and CMS, and separately for each experiment. The expected uncertainty, with its breakdown, is also shown.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson production processes. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson branching fractions are the same as in the SM.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson decay channels. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson production process cross sections at $\sqrt{s}$ = 7 and 8 TeV are the same as in the SM.

Results of the ten-parameter fit of $\mu_F^f = \mu_{gg\mathrm{F}+ttH}^f$ and $\mu_V^f = \mu_{\mathrm{VBF}+VH}^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Results of the six-parameter fit of the global ratio $\mu_V/\mu_F = \mu_{\mathrm{VBF}+VH}/\mu_{gg\mathrm{F}+ttH}$ together with $\mu_F^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Fit results allowing BSM loop couplings, assuming that $|\kappa_{V}| \le$ 1, where $\kappa_{V}$ denotes $\kappa_{Z}$ or $\kappa_{W}$, and that $\mathrm{B_{BSM}} \ge$ 0. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results allowing BSM loop couplings, assuming that there are no additional BSM contributions to the Higgs boson width, i.e. $\mathrm{B_{BSM}}=0$. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $\mathrm{B_{BSM}}$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results for the parameterisation assuming the absence of BSM particles in the loops ($\mathrm{B_{BSM}}$=0). The results with their measured and expected uncertainties are reported for the combination of ATLAS and CMS, together with the individual results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ CL interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $|\kappa_\mu|$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for up-type versus down-type fermions. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{uu}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{du}$, for which both signs are allowed, the other 1$\sigma$ CL interval is shown on a second line. Negative values for the parameter $\lambda_{Vu}$ are excluded by more than 4$\sigma$.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for leptons versus quarks. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{qq}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{lq}$, for which there is no sensitivity to the sign, only the absolute values are shown. Negative values for the parameter $\lambda_{Vq}$ are excluded by more than 4$\sigma$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

ATLAS+CMS combined best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow bb$ channel.