The expected and observed 95% confidence intervals for the anomalous coupling parameters defined in the EFT frame work. WV->lvJ channel.

The expected number of events passing the final event selection in the WW/WZ->lvjj channel, in each pT(jj) bin of the signal region (SR). The expected number of background and signal events are given, together with the number of events observed in data. The numbers correspond to Figures 7(a). The BSM numbers do not include the SM WV contribution, so the SM and BSM WV numbers should be added together. The numbers correspond to the raw event yields, not divided by the bin widths. The six bins in the SR have the following bin boundaries: (100, 200, 300, 400, 600, 800, +inf) GeV.

The expected number of events passing the final event selection in the WW/WZ->lvjj channel, in each pT(jj) bin of the sideband control region (CR). The expected number of background and signal events are given, together with the number of events observed in data. The numbers correspond to Figures 6 of auxiliary material. The BSM numbers do not include the SM WV contribution, so the SM and BSM WV numbers should be added together. The numbers correspond to the raw event yields, not divided by the bin widths. The four bins in the CR have the following bin boundaries: (100, 200, 300, 700, +inf) GeV.

The expected number of events passing the final event selection in the WW/WZ->lvJ channel, in each pT(J) bin of the signal region (SR). The expected number of background and signal events are given, together with the number of events observed in data. The numbers correspond to Figures 7(b). The BSM numbers do not include the SM WV contribution, so the SM and BSM WV numbers should be added together. The numbers correspond to the raw event yields, not divided by the bin widths. The six bins in the SR have the following bin boundaries: (100, 200, 300, 400, 500, 600, 700, +inf) GeV. No control region is used for the WW/WZ->lvJ channel.

Observed and expected upper limit on the cross-section for $pp \to H^{++}H^{--}$ for a combination of partial branching ratios of $B(ee) = 30\%$, $B(e \mu ) = 40\%$, and $B( \mu \mu ) = 30\%$.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to e^{\pm}e^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to e^{\pm}e^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to e^{\pm}\mu^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to e^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Minimum observed and expected lower limit (among all partial branching ratio combinations) on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to e^{\pm}e^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to e^{\pm}e^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to e^{\pm}\mu^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to e^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Minimum observed and expected lower limit (among all partial branching ratio combinations) on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 100%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 100%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 90%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 90%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 80%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 80%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 70%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 70%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 60%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 60%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 50%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 50%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 40%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 40%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 30%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 30%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 20%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 20%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 10%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 10%.

Reconstructed mtb distribution in data and for the background after the fit to the data in the signal region SR2. The statistical uncertainty on data points is calculated using assymetric Poisson confidence intervals.

Reconstructed mtb distribution in data and for the background after the fit to the data in the signal region SR3. The statistical uncertainty on data points is calculated using assymetric Poisson confidence intervals.

Reconstructed mtb distribution in data and for the background after the fit to the data in the validation region VR. The statistical uncertainty on data points is calculated using assymetric Poisson confidence intervals.

Upper 95% CL limits on the Z' production cross-section times branching ratio to two electrons as a function of Z' pole mass.

Upper 95% CL limits on the Z' production cross-section times branching ratio to two muons as a function of Z' pole mass.

Upper 95% CL limits on the Z' production cross-section times branching ratio to two leptons as a function of Z' pole mass.

Upper 95% CL limits on the acceptance times Z' production cross-section times branching ratio to two leptons in the dielectron channel as a function of Z' pole mass. Expected limits in the dielectron channel for different widths with an applied mass window of two times the true width of the signal around the pole mass.

Upper 95% CL limits on the acceptance times Z' production cross-section times branching ratio to two leptons in the dielectron channel as a function of Z' pole mass. Observed limits in the dielectron channel for different widths with an applied mass window of two times the true width of the signal around the pole mass.

Upper 95% CL limits on the acceptance times Z' production cross-section times branching ratio to two leptons in the dimuon channel as a function of Z' pole mass. Expected limits in the dimuon channel for different widths with an applied mass window of two times the true width of the signal around the pole mass.

Upper 95% CL limits on the acceptance times Z' production cross-section times branching ratio to two leptons in the dimuon channel as a function of Z' pole mass. Observed limits in the dimuon channel for different widths with an applied mass window of two times the true width of the signal around the pole mass.

Upper 95% CL limits on the acceptance times Z' production cross-section times branching ratio to two leptons in the combined dilepton channel as a function of Z' pole mass. Expected limits in the dilepton channel for different widths with an applied mass window of two times the true width of the signal around the pole mass.

Upper 95% CL limits on the acceptance times Z' production cross-section times branching ratio to two leptons in the dilepton channel as a function of Z' pole mass. Observed limits in the dilepton channel for different widths with an applied mass window of two times the true width of the signal around the pole mass.

Observed 95% CL upper limits on the production cross section times branching ratio to a photon and a quark or gluon for the ADD model. The limits are placed as a function of M_th. The calculation is performed using ensemble tests for masses in the search range every 500 GeV.

Fiducial acceptance and selection efficiency for the ADD model as a function of M_th.

Fiducial acceptance and selection efficiency for the RS1 model as a function of M_th.

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon1,Photon2).

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon1,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon2,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon1,Photon2)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon1,Photon3)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon2,Photon3)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon2).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon2,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon2,Photon3).

Measured differential cross section with associated uncertainties as a function of COS(THETA*). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2GAMMA). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>30 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>50 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of HT. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of M(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of ABSDPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2GAMMA,2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of TAUJET. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of SUM(TAUJET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=0,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=1,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=2,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET>=3,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

The measured cross sections or cross section limits of the diphoton, VBF-enhanced, Nlepton $\geq$ 1, high $E_{T}^{miss}$, and ttH-enhanced fiducial regions are shown.

Measured differential cross section with associated uncertainties as a function of diphoton transverse momentum in bins of ABS(COS(THETA*)). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.Each systematic uncertainty sources is fully uncorrelated with the other sources.

Non-perturbative correction factors in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are evaluated by deriving these factors using different generators and tunes as described in the text. No factor are given for the Nlepton $\geq$ 1 and High-$E_{T}^{miss}$ fiducial regions as the gluon fusion contamination in both is negligible.

Isolation efficiencies in percent for gluon fusion $H\rightarrow\gamma\gamma$ for each fiducial region/variable bin measured in this analysis. The isolation efficiency is defined as the probability for both photons to fulfil the isolation criteria (as described in Section 9.1) for events that pass the diphoton kinematic criteria. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are assigned in the same way as for the non-perturbative correction factors: by varying the fragmentation and underlying event modelling. These factors can be multiplied by the kinematic acceptance factors (see Table 29) to extrapolate an inclusive gluon fusion Higgs prediction to the fiducial volume used in this analysis. No factors for the Nlepton $\geq$ 1 and High $E_{T}^{miss}$ fiducial regions are provided as the gluon fusion contamination is negligible.

Combined non-perturbative (Table 27) and particle-level isolation correction factors (Table 28) in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. The uncertainties on the combined values properly take into account the correlations between both multiplicative factors.

Diphoton kinematic acceptances in percent for gluon-gluon fusion for the diphoton fiducial region and all differential variable bins studied in this paper, defined as the probability to fulfill the diphoton kinematic criteria: $p_{T}$/$m_{\gamma\gamma}$ < 0.35 (0.25) for the leading (subleading) photon and $|\eta_{\gamma\gamma}|$ < 2.37. The factors are evaluated using the Powheg NNLOPSevent generator. Uncertainties are taken from PDF variations. QCD scale variations have a negligible impact on these factors. The range of each bin is given in Table 26.

observed statistical correlations between pTyy, Njets, mjj, |DeltaPhijj| and pTj1

ggH default MC + XH predictions

XH ( = VBF + VH + ttH + bbH ) MC predictions

Best-fit values and uncertainties of the production-mode cross sections times branching ratio.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.