Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Comparisons of the data and the expected background distributions of the WZ invariant mass in the ANN-based VBF signal region. The background predictions are obtained through a background-only simultaneous fit to the VBF signal region and the WZ-QCD and ZZ VBF control regions. The yields are normalized to the bin width

Comparisons of the observed data and the expected background distributions of the WZ invariant mass using the cut-based VBF selection. The background predictions are obtained through a background-only simultaneous fit to the VBF cut-based signal region and the WZ-QCD and ZZ VBF control regions. The yields are normalized to the bin width.

Comparisons of the observed data and the expected background distributions of the WZ invariant mass using the cut-based VBF selection. The background predictions are obtained through a background-only simultaneous fit to the VBF cut-based signal region and the WZ-QCD and ZZ VBF control regions. The yields are normalized to the bin width.

Drell-Yan signal region selection cutflow for a simulated W' in the HVT model A with m_W' = 1 TeV. The unweighted number of events is shown.

Drell-Yan signal region selection cutflow for a simulated W' in the HVT model A with m_W' = 1 TeV. The unweighted number of events is shown.

VBF signal region selection cutflow for a simulated W' in the HVT model C with m_W' = 500 GeV. The unweighted number of events is shown.

VBF signal region selection cutflow for a simulated W' in the HVT model C with m_W' = 500 GeV. The unweighted number of events is shown.

VBF signal region selection cutflow for a simulated H5+ in the GM model with m_H5+ = 450 GeV. The unweighted number of events is shown.

VBF signal region selection cutflow for a simulated H5+ in the GM model with m_H5+ = 450 GeV. The unweighted number of events is shown.

The acceptancetimes efficiencyof the HVT W' in the Drell-Yan signal region for different mass points and for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof the HVT W' in the Drell-Yan signal region for different mass points and for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF H5+ selection after the ANN-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF H5+ selection after the ANN-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF HVT W' selection after the ANN-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF HVT W' selection after the ANN-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF H5+ selection after the cut-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF H5+ selection after the cut-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF HVT W' selection after the cut-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF HVT W' selection after the cut-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

Observed and expected 95% CL exclusion upper limits on sigma * B(W' -> WZ) for the Drell-Yan production of a W' boson in the HVT model as a function of its mass. The LO theory predictions for HVT Model A with g_V=1 and Model B with g_V=$ are also shown.

Observed and expected 95% CL exclusion upper limits on sigma * B(W' -> WZ) for the Drell-Yan production of a W' boson in the HVT model as a function of its mass. The LO theory predictions for HVT Model A with g_V=1 and Model B with g_V=3 are also shown.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) for the VBF production of a W' boson in the HVT with parameter c_F=0, as a function of its mass. The LO theory predictions for HVT VBF model with different values of the coupling parameters g_V and c_H are also shown.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) for the VBF production of a W' boson in the HVT with parameter c_F=0, as a function of its mass. The LO theory predictions for HVT VBF model with different values of the coupling parameters g_V and c_H are also shown.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) of the GM model as a function of m_H_5.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) of the GM model as a function of m_H_5.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sin(thetaH) of the GM model as a function of m_H_5.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sin(thetaH) of the GM model as a function of m_H_5.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) for the VBF production of a W' boson in the HVT with parameter c_F=0, as a function of its mass. The LO theory predictions for HVT VBF model with different values of the coupling parameters g_V and c_H are also shown.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) for the VBF production of a W' boson in the HVT with parameter c_F=0, as a function of its mass. The LO theory predictions for HVT VBF model with different values of the coupling parameters g_V and c_H are also shown.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) of the GM model as a function of m_H_5.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) of the GM model as a function of m_H_5.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sin(thetaH) of the GM model as a function of m_H_5.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sin(thetaH) of the GM model as a function of m_H_5.

Event yields of the signal and SM background processes in the six analysis regions after the fit to the data under the $t \rightarrow uX$ hypothesis assuming $m_X = 30$ GeV. Total includes signal and background.The quoted uncertainties take into account correlations and constraints of the nuisance parameters and include both the statistical and systematic uncertainties. Negative correlations between the $t\bar{t} +$ light, $t\bar{t} + \geq1b$ and $t\bar{t} + \geq1c$ modelling uncertainties can make the uncertainty in the total yields smaller than in the individual components.

Event yields of the signal and SM background processes in the six analysis regions after the fit to the data under the $t \rightarrow cX$ hypothesis assuming $m_X = 30$ GeV. Total includes signal and background.The quoted uncertainties take into account correlations and constraints of the nuisance parameters and include both the statistical and systematic uncertainties. Negative correlations between the $t\bar{t} +$ light, $t\bar{t} + \geq1b$ and $t\bar{t} + \geq1c$ modelling uncertainties can make the uncertainty in the total yields smaller than in the individual components.

Event acceptance times efficiency in percent for every $t\rightarrow uX$ and $t\rightarrow cX$ mass signal sample.

Cut flow for the scalar signal in the $t\rightarrow uX$ decay combining both quark and anti-quark samples. Shown for each signal are the corresponding mass, the number of generated events, the number of reconstructed ("Reco") events, the events that pass the lepton triggers, the events that have only one electron ("el") or only one muon ("mu") with p$_{\text{T}}$ larger than 27 GeV, the number of events with at least four jets with p$_{\text{T}}$ larger than 25 GeV, the number of events with at least three $b$-tagged jets at the 70% efficiency working point, and the number of events with at least two $b$-tagged jets at the 60% efficiency working point and at least another one at the 70%. The quoted yields do not include reweighting.

Cut flow for the scalar signal in the $t\rightarrow cX$ decay combining both quark and anti-quark samples. Shown for each signal are the corresponding mass, the number of generated events, the number of reconstructed ("Reco") events, the events that pass the lepton triggers, the events that have only one electron ("el") or only one muon ("mu") with p$_{\text{T}}$ larger than 27 GeV, the number of events with at least four jets with p$_{\text{T}}$ larger than 25 GeV, the number of events with at least three $b$-tagged jets at the 70% efficiency working point, and the number of events with at least two $b$-tagged jets at the 60% efficiency working point and at least another one at the 70%. The quoted yields do not include reweighting.

Distribution of $m(e^{\pm},\mu^{\pm})_{\mathrm{lead}}$ in the electron-muon signal region after the background-only fit.

Distribution of $m(\mu^{\pm},\mu^{\pm})_{\mathrm{lead}}$ in the muon-muon signal region after the background-only fit.

Distribution of $m(\ell^{\pm},\ell^{\prime \pm})_{\mathrm{lead}}$ in the three-lepton signal region after the background-only fit.

Event yield in the four-lepton signal region after the background-only fit.

Two-lepton signal region weighted cutflows for electron-electron channel. Data and a few representative signal samples are presented alongside the main background contributions. Yield stands for the observed yield in data and the expected yields based on $\sigma \cdot \mathcal{L}$ for the signal and background samples. Top quark and multiboson process backgrounds are merged under the 'other' category.

Two-lepton signal region weighted cutflows for electron-muon channel. Data and a few representative signal samples are presented alongside the main background contributions. Yield stands for the observed yield in data and the expected yields based on $\sigma \cdot \mathcal{L}$ for the signal and background samples. Top quark and multiboson process backgrounds are merged under the 'other' category.

Two-lepton signal region weighted cutflows for muon-muon channel. Data and a few representative signal samples are presented alongside the main background contributions. Yield stands for the observed yield in data and the expected yields based on $\sigma \cdot \mathcal{L}$ for the signal and background samples. Top quark and multiboson process backgrounds are merged under the 'other' category.

Three-lepton signal region weighted cutflow for $\ell \ell \ell$ channel. Data and a few representative signal samples are presented alongside the main background contributions. Yield stands for the observed yield in data and the expected yields based on $\sigma \cdot \mathcal{L}$ for the signal and background samples. Top quark and multiboson process backgrounds are merged under the 'other' category.

Four-lepton signal region weighted cutflow for $\ell \ell \ell \ell$ channel. Data and a few representative signal samples are presented alongside the main background contributions. Yield stands for the observed yield in data and the expected yields based on $\sigma \cdot \mathcal{L}$ for the signal and background samples. Top quark, Drell-Yan, and multiboson process backgrounds are merged under the 'other' category.

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-3j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$SS region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-2j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3jSS region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$ region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}$-1j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-3j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$SS region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-2j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3jSS region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}\tau_{had}$ region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}$-1j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{lep}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{lep}\tau_{had}$-3j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}\tau_{had}$SS region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-2j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-3j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-3jSS region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}\tau_{had}$ region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}$-1j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{lep}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{lep}\tau_{had}$-3j region,Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}\tau_{had}$SS region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-2j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-3j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-3jSS region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ for the individual searches as well as their combination, assuming $\mathcal{B}(\mathrm{t}\to\mathrm{uH}) = 0$. The observed limits are compared with the expected (median) limits under the background-only hypothesis. The surrounding shaded bands correspond to the 68% and 95% CL intervals around the expected limits, denoted by $\pm 1\sigma$ and $\pm 2\sigma$, respectively.

95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ for the individual searches as well as their combination, assuming $\mathcal{B}(\mathrm{t}\to\mathrm{cH}) = 0$. The observed limits are compared with the expected (median) limits under the background-only hypothesis. The surrounding shaded bands correspond to the 68% and 95% CL intervals around the expected limits, denoted by $\pm 1\sigma$ and $\pm 2\sigma$, respectively.

Observed upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $+2\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $+1\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $-1\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $-2\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Observed upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $+2\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $+1\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $-1\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $-2\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Predicted and observed yields in each of the analysis regions considered in leptonic channel.

Predicted and observed yields in each of the analysis regions considered in hadronic channel.

Absolute uncertainties on $\mathcal{B}(\mathrm{t}\to\mathrm{qH})$ obtained from the combined fit to the data.

Summary of 95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{qH})$, significance and best-fit branching ratio in the signal regions. The values in the tables are in the form of observed(expected).

Breakdown of expected and observed yields in the electroweak search Int, Low, and OffShell signal regions after a simultaneous fit to the signal regions and control regions. All statistical and systematic uncertainties are included.

Breakdown of expected and observed yields in the four edge signal regions, integrated over the $m_{\ell\ell}$ distribution after a separate simultaneous fit to each signal region and control region pair. The uncertainties include both the statistical and systematic sources.

Breakdown of expected and observed yields in the three on-$Z$ signal regions after a separate simultaneous fit to each signal region and control region pair. The uncertainties include both the statistical and systematic sources.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-High-Sideband-EWK (top-left), VR-High-R-EWK (top-right), VR-1J-High-EWK (bottom-left), and VR-$\ell\ell bb$-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-High-Sideband-EWK (top-left), VR-High-R-EWK (top-right), VR-1J-High-EWK (bottom-left), and VR-$\ell\ell bb$-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-High-Sideband-EWK (top-left), VR-High-R-EWK (top-right), VR-1J-High-EWK (bottom-left), and VR-$\ell\ell bb$-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-High-Sideband-EWK (top-left), VR-High-R-EWK (top-right), VR-1J-High-EWK (bottom-left), and VR-$\ell\ell bb$-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-Int-EWK (top-left), VR-Low-EWK (top-right), VR-Low-2-EWK (bottom-left), and VR-OffShell-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-Int-EWK (top-left), VR-Low-EWK (top-right), VR-Low-2-EWK (bottom-left), and VR-OffShell-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-Int-EWK (top-left), VR-Low-EWK (top-right), VR-Low-2-EWK (bottom-left), and VR-OffShell-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-Int-EWK (top-left), VR-Low-EWK (top-right), VR-Low-2-EWK (bottom-left), and VR-OffShell-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Observed and expected dilepton mass distributions in VRC-STR (top-left), VRLow-STR (top-right), VRMed-STR (bottom-left), and VRHigh-STR (bottom-right). Each validation region is fit separately with the corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The entries are normalized to the bin width, and the last bin is the overflow.

Observed and expected dilepton mass distributions in VRC-STR (top-left), VRLow-STR (top-right), VRMed-STR (bottom-left), and VRHigh-STR (bottom-right). Each validation region is fit separately with the corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The entries are normalized to the bin width, and the last bin is the overflow.

Observed and expected dilepton mass distributions in VRC-STR (top-left), VRLow-STR (top-right), VRMed-STR (bottom-left), and VRHigh-STR (bottom-right). Each validation region is fit separately with the corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The entries are normalized to the bin width, and the last bin is the overflow.

Observed and expected dilepton mass distributions in VRC-STR (top-left), VRLow-STR (top-right), VRMed-STR (bottom-left), and VRHigh-STR (bottom-right). Each validation region is fit separately with the corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The entries are normalized to the bin width, and the last bin is the overflow.

Observed and expected jet multiplicity in VRLow-STR (top-left), VRMed-STR (top-right), and VRHigh-STR (bottom) after a fit performed on the $m_{\ell\ell}$ distribution and corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The last bin contains the overflow.

Observed and expected jet multiplicity in VRLow-STR (top-left), VRMed-STR (top-right), and VRHigh-STR (bottom) after a fit performed on the $m_{\ell\ell}$ distribution and corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The last bin contains the overflow.

Observed and expected jet multiplicity in VRLow-STR (top-left), VRMed-STR (top-right), and VRHigh-STR (bottom) after a fit performed on the $m_{\ell\ell}$ distribution and corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The last bin contains the overflow.

Observed and expected dilepton mass distributions in VR3L-STR without a fit to the data. The 'Other' category includes the negligible contributions from $t\bar{t}$ and $Z/\gamma^*$+jets processes. The hatched band contains the statistical uncertainty and the theoretical systematic uncertainties of the $WZ$/$ZZ$ prediction, which are the dominant sources of uncertainty. No fit is performed. The last bin contains the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected dilepton mass distributions in SRC-STR (top-left), SRLow-STR (top-right), SRMed-STR (bottom-left), and SRHigh-STR (bottom-right), with the binning used for interpretations after a separate simultaneous fit to each signal region and control region pair. The red dashed lines are example signal models overlaid on the figure. All statistical and systematic uncertainties are included in the hatched bands. The last bins are the overflow.

Observed and expected dilepton mass distributions in SRC-STR (top-left), SRLow-STR (top-right), SRMed-STR (bottom-left), and SRHigh-STR (bottom-right), with the binning used for interpretations after a separate simultaneous fit to each signal region and control region pair. The red dashed lines are example signal models overlaid on the figure. All statistical and systematic uncertainties are included in the hatched bands. The last bins are the overflow.

Observed and expected dilepton mass distributions in SRC-STR (top-left), SRLow-STR (top-right), SRMed-STR (bottom-left), and SRHigh-STR (bottom-right), with the binning used for interpretations after a separate simultaneous fit to each signal region and control region pair. The red dashed lines are example signal models overlaid on the figure. All statistical and systematic uncertainties are included in the hatched bands. The last bins are the overflow.

Observed and expected dilepton mass distributions in SRC-STR (top-left), SRLow-STR (top-right), SRMed-STR (bottom-left), and SRHigh-STR (bottom-right), with the binning used for interpretations after a separate simultaneous fit to each signal region and control region pair. The red dashed lines are example signal models overlaid on the figure. All statistical and systematic uncertainties are included in the hatched bands. The last bins are the overflow.

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294]. The grey numbers indicate the observed 95\% CLs upper limit on the cross section.

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294]. The grey numbers indicate the observed 95$\%$ CLs upper limit on the cross section.

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$ ilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$ ilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$ ilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$ ilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].The grey numbers indicated the observed 95\% CL upper limit on the cross section.

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].The grey numbers indicated the observed 95\% CL upper limit on the cross section.

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].The grey numbers indicated the observed 95\% CL upper limit on the cross section.

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

The combined $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution of VRLow-STR and SRLow-STR (left), and the same region with the $\Delta\phi(\boldsymbol{j}_{1,2},\boldsymbol{\mathit{p}}_{ ext{T}}^{ ext{miss}})<0.4$ requirement, used as a control region to normalize the $Z/\gamma^*+\mathrm{jets}$ process (right). Separate fits for the SR and VR are performed, as for the results in the paper, and the resulting distributions are merged. All statistical and systematic uncertainties are included in the hatched bands. The last bins contain the overflow.

Cutflow of expected events in the four Strong search edge signal regions. `Leptons' refers to electrons and muons only. The gluino-$Z^{(*)}$ model with $m_{ ilde{g}}=800~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRC-STR with 60000 Monte Carlo (MC) events generated. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRMed-STR with 30000 (MC) events generated. The gluino-slepton model with $m_{ ilde{g}}=2~TeV$ and $m_{ ilde{\ell}}=1.3~TeV$ is used for SRLow-STR and SRHigh-STR with 30000 MC events generated. The Generator Filter requires two 5~GeV leptons and 100~GeV of \met. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~GeV$ or at least one lepton with $p_{\mathrm{T}}>25~GeV$ and a photon with $p_{\mathrm{T}}>40~GeV$, with all objects within $|\eta|=2.6$.

Cutflow of expected events in the four Strong search edge signal regions. `Leptons' refers to electrons and muons only. The gluino-$Z^{(*)}$ model with $m_{ ilde{g}}=800~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRC-STR with 60000 Monte Carlo (MC) events generated. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRMed-STR with 30000 (MC) events generated. The gluino-slepton model with $m_{ ilde{g}}=2~TeV$ and $m_{ ilde{\ell}}=1.3~TeV$ is used for SRLow-STR and SRHigh-STR with 30000 MC events generated. The Generator Filter requires two 5~GeV leptons and 100~GeV of \met. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~GeV$ or at least one lepton with $p_{\mathrm{T}}>25~GeV$ and a photon with $p_{\mathrm{T}}>40~GeV$, with all objects within $|\eta|=2.6$.

Cutflow of expected events in the four Strong search edge signal regions. `Leptons' refers to electrons and muons only. The gluino-$Z^{(*)}$ model with $m_{ ilde{g}}=800~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRC-STR with 60000 Monte Carlo (MC) events generated. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRMed-STR with 30000 (MC) events generated. The gluino-slepton model with $m_{ ilde{g}}=2~TeV$ and $m_{ ilde{\ell}}=1.3~TeV$ is used for SRLow-STR and SRHigh-STR with 30000 MC events generated. The Generator Filter requires two 5~GeV leptons and 100~GeV of \met. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~GeV$ or at least one lepton with $p_{\mathrm{T}}>25~GeV$ and a photon with $p_{\mathrm{T}}>40~GeV$, with all objects within $|\eta|=2.6$.

Cutflow of expected events in the four Strong search edge signal regions. `Leptons' refers to electrons and muons only. The gluino-$Z^{(*)}$ model with $m_{ ilde{g}}=800~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRC-STR with 60000 Monte Carlo (MC) events generated. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRMed-STR with 30000 (MC) events generated. The gluino-slepton model with $m_{ ilde{g}}=2~TeV$ and $m_{ ilde{\ell}}=1.3~TeV$ is used for SRLow-STR and SRHigh-STR with 30000 MC events generated. The Generator Filter requires two 5~GeV leptons and 100~GeV of \met. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~GeV$ or at least one lepton with $p_{\mathrm{T}}>25~GeV$ and a photon with $p_{\mathrm{T}}>40~GeV$, with all objects within $|\eta|=2.6$.

Cutflow of expected events in the three Strong search on-$Z$ signal regions. The cutflow up to the signal region specific requirements is the same as in the Strong search edge cutflow. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for all of the on-$Z$ signal regions with 30000 (MC) events generated.

Cutflow of expected events in the three Strong search on-$Z$ signal regions. The cutflow up to the signal region specific requirements is the same as in the Strong search edge cutflow. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for all of the on-$Z$ signal regions with 30000 (MC) events generated.

Cutflow of expected events in the three Strong search on-$Z$ signal regions. The cutflow up to the signal region specific requirements is the same as in the Strong search edge cutflow. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for all of the on-$Z$ signal regions with 30000 (MC) events generated.

Table 36: Cutflow of expected events in the region SR-OffShell_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 36: Cutflow of expected events in the region SR-OffShell_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 37: Cutflow of expected events in the region SR-OffShell_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 37: Cutflow of expected events in the region SR-OffShell_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 38: Cutflow of expected events in the region SR-Low_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 38: Cutflow of expected events in the region SR-Low_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 39: Cutflow of expected events in the region SR-Low_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 39: Cutflow of expected events in the region SR-Low_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 40: Cutflow of expected events in the region SR-Low-2-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 40: Cutflow of expected events in the region SR-Low-2-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 41: Cutflow of expected events in the region SR-Int_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 41: Cutflow of expected events in the region SR-Int_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 42: Cutflow of expected events in the region SR-Int_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 42: Cutflow of expected events in the region SR-Int_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 43: Cutflow of expected events in the region SR-High_16a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 43: Cutflow of expected events in the region SR-High_16a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 44: Cutflow of expected events in the region SR-High_16b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 44: Cutflow of expected events in the region SR-High_16b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 45: Cutflow of expected events in the region SR-High_8a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 45: Cutflow of expected events in the region SR-High_8a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 46: Cutflow of expected events in the region SR-High_8b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 46: Cutflow of expected events in the region SR-High_8b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 47: Cutflow of expected events in the region SR-1J-High-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 47: Cutflow of expected events in the region SR-1J-High-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 48: Cutflow of expected events in the region SR-llbb-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 48: Cutflow of expected events in the region SR-llbb-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

The combined $m_{jj}$ distribution of CR-Z-EWK and SR-Low-EWK (left), and the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in CR-Z-met-EWK (right), which removes the upper limit of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}}) < 9$ from the definition of CR-Z-EWK. This $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ tail overlaps other control and validation regions, but not signal regions. The arrows indicate the signal region SR-Low-EWK (left), and the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ phase space which is not included in CR-Z-EWK (right). All EWK search control and signal regions are included in the fit. All statistical and systematic uncertainties are included in the hatched bands. The theoretical uncertainties from CR-Z-EWK are applied to CR-Z-met-EWK. The last bins contain the overflow.

The combined $m_{jj}$ distribution of CR-Z-EWK and SR-Low-EWK (left), and the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in CR-Z-met-EWK (right), which removes the upper limit of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}}) < 9$ from the definition of CR-Z-EWK. This $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ tail overlaps other control and validation regions, but not signal regions. The arrows indicate the signal region SR-Low-EWK (left), and the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ phase space which is not included in CR-Z-EWK (right). All EWK search control and signal regions are included in the fit. All statistical and systematic uncertainties are included in the hatched bands. The theoretical uncertainties from CR-Z-EWK are applied to CR-Z-met-EWK. The last bins contain the overflow.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Observed and expected event yields for the signal and all of the background processes considered in this analysis after the fit to the data in all of the regions. The uncertainty on the expected yield is the combination of statistical and systematic uncertainties obtained in the fit. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the event yield for processes in all regions, after the fit over all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Impact of different components of systematic uncertainty on the measured cross section, without taking into account the correlations. The impact is calculated by fixing the value of the corresponding nuisance parameters to the values obtained in the fit used to measure the cross section, performing the fit, estimating the signal strength uncertainty and subtracting it from the nominal uncertainty in quadrature.

Fitted POI values for this analysis, the previous ATLAS analysis, and their combination. The first and second columns present the values obtained in the individual analyses. The third column presents the values obtained in the combination.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters. Limits are obtained by setting all aQGCs parameters except one to zero. Unitarity is not preserved.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters in the region, where unitarity is preserved. Cutoff scales in MC, $E_{c}$, are given for each parameter. Limits are obtained by setting all aQGCs parameters except one to zero.

The $E_{T}^{\gamma}$ distribution in the SR after the fit in the control regions. The red (green) line shows the expected number of events in the case of non-zero EFT coefficient $f_{T0}/\Lambda^4$ ($f_{M0}/\Lambda^4$) with the value shown in the legend. The vertical error bars on the data points correspond to the data statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T5}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T8}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T9}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M1}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M2}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Correlation matrix of the parameters for the fit in all regions. Only parameters with absolute value of the correlation coefficient larger than 10 are shown.

The observed mass distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the short lifetime regime.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the long lifetime regime.

The observed $p_{\rm T$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Expected and observed distributions in SR-Inclusive_Low of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal track selection efficiency as a function of CLLP $\beta\gamma$ for SR-Inclusive_Low and SR-Inclusive_High bins. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal selection efficiency by the mass window for SR-Inclusive_Low and SR-Inclusive_High bins.

Acceptance for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |eta| < 1.8 and r_decay > 500 mm.

Acceptance for the chargino pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the stau pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Event-level efficiency for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Passing events in event selection steps for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes.

Passing events in event selection steps for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes.

Passing events in event selection steps for the chargino pair-production model for various masses and lifetimes.

Passing events in event selection steps for the stau pair-production model for various masses and lifetimes.