Observed and predicted dimuon invariant mass (m_mumu) distribution in the search region. The bin width is constant in log(m_mumu).

Expected and observed 95% CL limits on the cross-section times branching ratio (sigma*B) for Zprime_SSM production and the two E6-motivated Zprime models with lowest and highest sigma*B for the combination of the dielectron and dimuon channels.

Expected sigma*B for Zprime_SSM production and the two E6-motivated Zprime models with lowest and highest sigma*B.

Expected and observed 95% CL limits on sigma*B for Z* boson production for the combination of the dielectron and dimuon channels.

Expected sigma*B for Z* boson production.

Expected and observed 95% CL limits on M_{G*} versus k/Mbar_{Pl} for the combination of dielectron and dimuon channels.

Expected and observed 95% CL limits on M_{TS} versus eta_{TS} for the combination of dielectron and dimuon channels.

Expected and observed 95% CL limits on M_{pi_T} versus M_{rho_T,omega_T} for the combination of dielectron and dimuon channels.

Expected and observed 95% CL limits on M_A versus the coupling strength g-tilde for the combination of dielectron and dimuon channels.

Expected and observed 95% CL limits on g as a function of M_KK, for the combination of dielectron and dimuon channels.

Expected and observed upper limits on gammaprime within the Minimal Zprime Models parameterization, for the combination of dielectron and dimuon channels. The lower boundary corresponds to tan(theta) = 1.43 and the upper boundary to tan(theta) = -1.19. Two representative values of theta are tan(theta) = 0 and tan(theta) = -2 which correspond to the Z_{B-L} and Z_{3R} model at specific values of gammaprime respectively.

The best-fit predicted and observed distributions of the combined NN output in the high-$p_\text{T}$-SR for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the collinear mass $m_\text{coll}$ in the high-$p_\text{T}$-SR for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the collinear mass $m_\text{coll}$ in the high-$p_\text{T}$-SR for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

Observed and expected upper limits on $\mathcal{B}(Z\rightarrow\ell\tau)$ with leptonically decaying $\tau$ at 95% confidence level.

Observed and expected upper limits on $\mathcal{B}(Z\rightarrow\ell\tau)$ at 95% confidence level, combination of hadronically and leptonically decaying $\tau$ channels.

The best-fit predicted and observed distributions of the collinear mass $m_\text{coll}$ in the CRZ$\tau\tau$ for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the collinear mass $m_\text{coll}$ in the CRZ$\tau\tau$ for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the combined NN output in the CRZ$\tau\tau$ for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the combined NN output in the CRZ$\tau\tau$ for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the leading lepton transverse momentum $p_\text{T}(e)$ in the high-$p_\text{T}$-SR for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the leading lepton transverse momentum $p_\text{T}(\mu)$ in the high-$p_\text{T}$-SR for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the missing transverse momentum $E^\text{miss}_\text{T}$ in the low-$p_\text{T}$-SR for the $e\tau_\mu$ channel. The first and last bin include underflow and overflow events, respectively.

The best-fit predicted and observed distributions of the missing transverse momentum $E^\text{miss}_\text{T}$ in the low-$p_\text{T}$-SR for the $\mu\tau_e$ channel. The first and last bin include underflow and overflow events, respectively.

Normalisation factors for the major background processes and ttW ($\Delta \eta < 0$) from the fit using only statistical uncertainties (fixing Nuisance Parameters (NP) to their fitted values) to data in all analysis regions.

Normalisation factors for the major background processes and ttW ($\Delta \eta < 0$) from the fit using using both statistical and systematic uncertainties to data in all analysis regions.

Correlation matrix between the Normalisation Factors in the fit using only statistical uncertainties (fixing Nuisance Parameters (NP) to their fitted values) to data in all analysis regions.

The most relevant systematic uncertainties ranked by their impact on the leptonic charge asymmetry ($A_c^{\ell}$) parameter at reconstructed level. The impact of the uncertainties is shown before and after the combined profile-likelihood fit to data in the signal and control regions. Pulls introduced by the fitting procedure are also shown. The entries shown in bold are the uncertainties of the freely floating background normalisations. ME stands for "matrix element", PS for "parton shower" and JER for "jet energy resolution". The gamma-uncertainties refer to the MC statistical uncertainties in a specific region and bin.

The most relevant systematic uncertainties ranked by their impact on the ttW Normalisation Factor ($\Delta \eta < 0$) parameter at reconstructed level. The impact of the uncertainties is shown before and after the combined profile-likelihood fit to data in the signal and control regions. Pulls introduced by the fitting procedure are also shown. ME stands for "matrix element", PS for "parton shower" and JER for "jet energy resolution". The gamma-uncertainties refer to the MC statistical uncertainties in a specific region and bin.

The predicted and observed numbers of events in the control and signal regions. The predictions are shown before the fit to data. The indicated uncertainties consider statistical as well as all experimental and theoretical systematic uncertainties. Background categories with event yields with a value of 1.0e-6 have a negligible contribution to the region and are manually set to that value.

The predicted and observed numbers of events in the control and signal regions. The predictions are shown after the fit to data. The indicated uncertainties consider statistical as well as all experimental and theoretical systematic uncertainties. Background categories with event yields with a value of 1.0e-6 have a negligible contribution to the region and are manually set to that value.

Summary of the observed and expected 95% CL upper limits on the cross section for $\mathrm{LQ}_{\mathrm{mix}}^{\mathrm{d}}$ pair production as a function of $m_{\mathrm{LQ}_{\mathrm{mix}}^{\mathrm{d}}}$ under the assumptions of B(LQ$\rightarrow t\mu$)=1.

Summary of observed and predicted yields in the four signal region categories. The background prediction is shown after the combined likelihood fit to data under the background-only hypothesis across all control region and signal region categories. The expected signal yields that are obtained by using their theoretical cross sections are also shown with their pre-fit uncertainties, assuming B=1 and $\mu$=1. The "Other" contribution is dominated by $t\bar{t}t\bar{t}$ and $t\bar{t}WW$ in the $3\ell$ SRs, whereas it is dominated by $tWZ$ and $t\bar{t}WW$ in the $4\ell$ SRs. Dashes refer to components that are negligible or not applicable.

Summary of the data, background and signal yields in the four signal region categories. The background prediction is shown before the combined likelihood fit to data. Dashes (--) refer to components that are negligible or not applicable.

Summary of the data and background yields in the seven control region categories. The background prediction is shown before the combined likelihood fit to data. Dashes (--) refer to components that are negligible or not applicable.

Summary of the data and background yields in the seven control region categories. The background prediction is shown after the combined likelihood fit to data under the background-only hypothesis across all control region categories. Dashes (--) refer to components that are negligible or not applicable.

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of single plus non-resonant plus pair vector LQ production from the combination of the high b-jet $p_{T}$ signal region for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 1.0]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of single plus non-resonant plus pair vector LQ production from the combination of the high b-jet $p_{T}$ signal region for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 1.7]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of single plus non-resonant plus pair vector LQ production from the combination of the high b-jet $p_{T}$ signal region for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 2.5]

The two-dimensional 95% CL exclusion limits in the $\lambda$-$m_{LQ}$ plane for singly plus non-resonant produced vector LQ (green lines) and for the sum, referred as Total, of single plus non-resonant plus pair vector LQ production (blue lines). Regions to the left of the lines are excluded. The dotted area shows the preferred region where the chosen LQ model can explain observed B anomalies. [$\kappa$ = 0]

The two-dimensional 95% CL exclusion limits in the $\lambda$-$m_{LQ}$ plane for singly plus non-resonant produced vector LQ (green lines) and for the sum, referred as Total, of single plus non-resonant plus pair vector LQ production (blue lines). Regions to the left of the lines are excluded. The dotted area shows the preferred region where the chosen LQ model can explain observed B anomalies. [$\kappa$ = 1]

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 1.0 on the cross-section of single plus non-resonant plus pair $\widetilde{S_{1}}$ production hypotheses from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 1.7 on the cross-section of single plus non-resonant plus pair $\widetilde{S_{1}}$ production hypotheses from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 2.5 on the cross-section of single plus non-resonant plus pair $\widetilde{S_{1}}$ production hypotheses from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels.

The two-dimensional 95% CL exclusion limits in the $\lambda$-$m_{LQ}$ plane for singly plus non-resonant produced $\widetilde{S_{1}}$ (green lines) and for the sum, referred as Total, of single plus non-resonant plus pair vector LQ production (blue lines). Regions to the left of the lines are excluded.

Observed (solid line) and expected (dashed line) 95% upper limits on the visible cross-section, $\sigma_{\mathrm{vis}}$, obtained from model-independent search by a signal-plus-background fit in the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels.

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly plus non-resonant produced vector LQ signals from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 1.0]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly plus non-resonant produced vector LQ signals from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 1.7]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly plus non-resonant produced vector LQ signals from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 2.5]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly plus non-resonant produced vector LQ signals from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 1.0]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly plus non-resonant produced vector LQ signals from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 1.7]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly plus non-resonant produced vector LQ signals from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 2.5]

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 1.0 on the cross-section of singly produced $\widetilde{S_{1}}$ signal hypotheses from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 1.7 on the cross-section of singly produced $\widetilde{S_{1}}$ signal hypotheses from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 2.5 on the cross-section of singly produced $\widetilde{S_{1}}$ signal hypotheses from the combination of the high b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels.

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $\widetilde{S_{1}}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 1.0]

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $\widetilde{S_{1}}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 1.7]

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $\widetilde{S_{1}}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 2.5]

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $U_1^{MIN}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 1.0]

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $U_1^{MIN}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 1.7]

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $U_1^{MIN}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 2.5]

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $U_1^{YM}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 1.0]

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $U_1^{YM}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 1.7]

The signal acceptance times efficiency for single plus non-resonant produced LQ in the $U_1^{YM}$ model from the combination of the high and low b-jet $p_{T}$ signal regions for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels. [$\lambda$ = 2.5]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly produced vector LQ signals from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 1.0]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly produced vector LQ signals from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 1.7]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly produced vector LQ signals from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 2.5]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly produced vector LQ signals from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 1.0]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly produced vector LQ signals from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 1.7]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of singly produced vector LQ signals from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 2.5]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of the single plus non-resonant plus pair production of vector LQ from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 1.0]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of the single plus non-resonant plus pair production of vector LQ from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 1.7]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of the single plus non-resonant plus pair production of vector LQ from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{YM}$ model ($\kappa$ = 0) with $\lambda$ = 2.5]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of the single plus non-resonant plus pair production of vector LQ from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 1.0]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of the single plus non-resonant plus pair production of vector LQ from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 1.7]

Observed (solid line) and expected (dashed line) 95% CL upper limits on the cross-section of the single plus non-resonant plus pair production of vector LQ from the combination of the high and low b-jet $p_{T}$ category for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$U_1^{MIN}$ model ($\kappa$ = 1) with $\lambda$ = 2.5]

The two-dimensional 95% CL exclusion limits in the $\lambda$-$m_{LQ}$ plane for singly plus non-resonant produced vector LQ (green lines) and for the sum, referred as Total, of single plus non-resonant plus pair vector LQ production (blue lines).Regions to the left of the lines are excluded. The dotted area shows the preferred region where the chosen LQ model can explain observed B anomalies. Results are extracted from the combination of the high and low b-jet $p_{T}$ signal region for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$\kappa$ = 0]

The two-dimensional 95% CL exclusion limits in the $\lambda$-$m_{LQ}$ plane for singly plus non-resonant produced vector LQ (green lines) and for the sum, referred as Total, of single plus non-resonant plus pair vector LQ production (blue lines).Regions to the left of the lines are excluded. The dotted area shows the preferred region where the chosen LQ model can explain observed B anomalies. Results are extracted from the combination of the high and low b-jet $p_{T}$ signal region for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region. [$\kappa$ = 1]

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 1.0 on the cross-section of singly-produced $\widetilde{S_{1}}$ signals from the combination of the high and low b-jet $p_{T}$ categories for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 1.7 on the cross-section of singly-produced $\widetilde{S_{1}}$ signals from the combination of the high and low b-jet $p_{T}$ categories for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 2.5 on the cross-section of singly-produced $\widetilde{S_{1}}$ signals from the combination of the high and low b-jet $p_{T}$ categories for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 1.0 on the cross-section of single plus non-resonant plus pair $\widetilde{S_{1}}$ production signal from the combination of the high and low b-jet $p_{T}$ categories for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 1.7 on the cross-section of single plus non-resonant plus pair $\widetilde{S_{1}}$ production signal from the combination of the high and low b-jet $p_{T}$ categories for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region.

Observed (solid line) and expected (dashed line) 95% CL upper limits for $\lambda$ = 2.5 on the cross-section of single plus non-resonant plus pair $\widetilde{S_{1}}$ production signal from the combination of the high and low b-jet $p_{T}$ categories for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region.

The two-dimensional 95% CL exclusion limits in the $\lambda$-$m_{LQ}$ plane for singly plus non-resonant produced $\widetilde{S_{1}}$ (green lines) and for the sum, referred as Total, of single plus non-resonant plus pair $\widetilde{S_{1}}$ production (blue lines). Regions to the left of the lines are excluded. Results are extracted from the combination of the high and low b-jet $p_{T}$ signal region for the $\tau_\text{lep}\tau_\text{had}$ and $\tau_\text{had}\tau_\text{had}$ channels, neglecting the interference between the LQ non-resonant production processes and the SM processes. However, the interference between the non-resonant LQ production and SM diagrams, such as those from Z+jets, could be non-negligible for events in the low b-jet $p_{T}$ signal region.

Observed 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson, as a function of the dark-photon mean proper decay length c&tau;. The limits are shown for all search channels combined, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio is larger than unity.

Observed 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for a &gamma;_d mass of 100&nbsp;MeV, as a function of the dark-photon mean proper decay length c&tau;. The solid black curve shows the observed exclusion limit from their statistical combination. The hatched band denotes the region in which the branching ratio is larger than unity.

Observed 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for a &gamma;_d mass of 10&nbsp;GeV, as a function of the dark-photon mean proper decay length c&tau;. The solid black curve shows the observed exclusion limit from their statistical combination. The hatched band denotes the region in which the branching ratio is larger than unity.

Acceptance times efficiency extrapolated as a function of c&tau;_&gamma;d for the &mu;DPJ channel (SR_&mu;), obtained for the different FRVZ MC signal mass points.

Acceptance times efficiency extrapolated as a function of c&tau;_&gamma;d for the low E_T^miss caloDPJ channel (SR_c^L), obtained for the different FRVZ MC signal mass points.

Acceptance times efficiency extrapolated as a function of c&tau;_&gamma;d for the high E_T^miss caloDPJ channel (SR_c^H), obtained for the different FRVZ MC signal mass points.

Observed (solid line) and expected (dashed line) 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for FRVZ processes with a 125&nbsp;GeV Higgs boson as a function of dark photon mean proper decay length for the ggF, WH and VBF analyses. The full combination is shown as solid or dashed black lines for a dark photon mass of 17&nbsp;MeV.

Observed (solid line) and expected (dashed line) 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for FRVZ processes with a 125&nbsp;GeV Higgs boson as a function of dark photon mean proper decay length for the ggF, WH and VBF analyses. The full combination is shown as solid or dashed black lines for a dark photon mass of 50&nbsp;MeV.

Observed (solid line) and expected (dashed line) 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for FRVZ processes with a 125&nbsp;GeV Higgs boson as a function of dark photon mean proper decay length for the ggF, WH and VBF analyses. The full combination is shown as solid or dashed black lines for a dark photon mass of 400&nbsp;MeV.

Observed (solid line) and expected (dashed line) 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for FRVZ processes with a 125&nbsp;GeV Higgs boson as a function of dark photon mean proper decay length for the ggF, WH and VBF analyses. The full combination is shown as solid or dashed black lines for a dark photon mass of 900&nbsp;MeV.

Observed (solid line) and expected (dashed line) 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for FRVZ processes with a 125&nbsp;GeV Higgs boson as a function of dark photon mean proper decay length for the ggF, WH and VBF analyses. The full combination is shown as solid or dashed black lines for a dark photon mass of 2&nbsp;GeV.

Observed (solid line) and expected (dashed line) 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for FRVZ processes with a 125&nbsp;GeV Higgs boson as a function of dark photon mean proper decay length for the ggF, WH and VBF analyses. The full combination is shown as solid or dashed black lines for a dark photon mass of 6&nbsp;GeV.

Observed (solid line) and expected (dashed line) 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for FRVZ processes with a 125&nbsp;GeV Higgs boson as a function of dark photon mean proper decay length for the ggF, WH and VBF analyses. The full combination is shown as solid or dashed black lines for a dark photon mass of 15&nbsp;GeV.

Observed 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson, as a function of the dark-photon mean proper decay length c&tau;. The limits are shown for the SR_&mu; search channel, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio is larger than unity.

Observed 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson, as a function of the dark-photon mean proper decay length c&tau;. The limits are shown for the SR_c^L search channel, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio is larger than unity.

Observed 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson, as a function of the dark-photon mean proper decay length c&tau;. The limits are shown for the SR_c^H search channel, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio is larger than unity.

Observed 95% CL upper limits on B(H&rarr;&nbsp;2&gamma;_d+X) for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson, as a function of the dark-photon mean proper decay length c&tau;. The limits are shown for all search channels combined, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio is larger than unity.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 2\gamma_d + X$ with $m_H$ = 800 GeV in the hadron-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 2\gamma_d + X$ with $m_H$ = 800 GeV in the muon-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the muon-muon final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the muon-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the hadron-hadron final state.

The reconstruction efficiency for caloDPJs produced by the decay of &gamma;_d into e⁺e^- or qq&#772;. The reconstruction efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as a function of their transverse momentum in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2&mu;^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2&mu;^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

The CalRatio 2015--2016 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The CalRatio 2015--2016 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

The CalRatio 2017--2018 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The CalRatio 2017--2018 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

The narrow-scan 2015--2016 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The narrow-scan 2015--2016 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is below 6&nbsp;m.

The narrow-scan 2017--2018 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The narrow-scan 2017--2018 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is below 6&nbsp;m.

Efficiency of the cosmic-ray tagger as function of the &gamma;_d transverse decay length. The efficiency is calculated accepting the &mu;DPJs for which the cosmic-ray tagger score is &gt; 0.2 for each associated MS-only track.

Efficiency of the cosmic-ray tagger as function of the &gamma;_d transverse momentum. The efficiency is calculated accepting the &mu;DPJs for which the cosmic-ray tagger score is &gt; 0.2 for each associated MS-only track.

Efficiency of the QCD tagger as function of the &gamma;_d transverse decay length. The efficiency is calculated accepting the caloDPJs for which the QCD tagger score is &gt; 0.5.

Efficiency of the QCD tagger as function of the &gamma;_d transverse momentum. The efficiency is calculated accepting the caloDPJs for which the QCD tagger score is &gt; 0.5.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2&mu;^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c+&mu;^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2c^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c^WH.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2c^WH.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c+&mu;^WH.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_2&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_c+&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_2c^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_2&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_c+&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_2c^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the 2&mu; search channel, assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the c+&mu; search channel, assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the 2c search channel, assuming an FRVZ signal model.

Distribution of the PT of the leading muon for E-MU events in the Signal Region, before the application of the leading lepton PT cut.

Distribution of the missing ET for all events in the Signal Region.

Distribution of MET-significnce, ie the missing ET/sqrt(scalar sum of PT of all leptons and jets), for all events in the Signal Region.

Distribution of the missing ET for E-E events in the Z Control Region.

Distribution of the missing ET for MU-MU events in the Z Control Region.

Distribution of the missing ET for E-E events in the Top Control Region.

Distribution of the missing ET for E-MU events in the Top Control Region.

Distribution of the missing ET for MU-MU events in the Top Control Region.

Distribution of the Jet Multiplicity for all events in the Top Control Region.

Distribution of the B-Jet Multiplicity for all events in the Top Control Region.

Distribution of the PT of the leading Jet for all events in the Top Control Region.

Distribution of the PT of the leading B-Jet for all events in the Top Control Region.

Observed 95 PCT exclusion limit in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Expected 95 PCT exclusion limit in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Observed 95 PCT exclusion limit in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Number of MC signal events in the M(stop), M(neutralino) plane in gaugino universality scenario.

Number of MC signal events in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Number of MC signal events in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Cross section in the M(stop), M(neutralino) plane in gaugino universality scenario.

Cross section in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Cross section in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Acceptance in the 1LSR signal region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Acceptance in the 1LSR signal region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Efficiency in the 1LSR signal region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Efficiency in the 1LSR signal region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Total PCT systematic uncertainty in the 1LSR region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Total PCT systematic uncertainty in the 1LSR region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Acceptance in the 2LSR1 signal region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Acceptance in the 2LSR2 signal region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Efficiency in the 2LSR1 signal region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Efficiency in the 2LSR2 signal region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Total PCT systematic uncertainty in the 2LSR1 region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Total PCT systematic uncertainty in the 2LSR2 region in the M(stop), M(neutralino) plane in gaugino universality scenario.

Acceptance in the 2LSR1 signal region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Acceptance in the 2LSR2 signal region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Efficiency in the 2LSR1 signal region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Efficiency in the 2LSR2 signal region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Total PCT systematic uncertainty in the 2LSR1 region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Total PCT systematic uncertainty in the 2LSR2 region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

Acceptance in the 2LSR1 signal region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Acceptance in the 2LSR2 signal region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Efficiency in the 2LSR1 signal region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Efficiency in the 2LSR2 signal region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Total PCT systematic uncertainty in the 2LSR1 region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Total PCT systematic uncertainty in the 2LSR2 region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

expected CLs values for the 1LSR region in the M(stop), M(neutralino) plane in gaugino universality scenario.

observed CLs values for the 1LSR region in the M(stop), M(neutralino) plane in gaugino universality scenario.

expected CLs values for the 2LSR1 region in the M(stop), M(neutralino) plane in gaugino universality scenario.

observed CLs values for the 2LSR1 region in the M(stop), M(neutralino) plane in gaugino universality scenario.

expected CLs values for the 2LSR2 region in the M(stop), M(neutralino) plane in gaugino universality scenario.

observed CLs values for the 2LSR2 region in the M(stop), M(neutralino) plane in gaugino universality scenario.

expected CLs values combining the 1LSR and 2LSR1 regions in the M(stop), M(neutralino) plane in gaugino universality scenario.

observed CLs values combining the 1LSR and 2LSR1 regions in the M(stop), M(neutralino) plane in gaugino universality scenario.

expected CLs values combining the 1LSR and 2LSR2 regions in the M(stop), M(neutralino) plane in gaugino universality scenario.

observed CLs values combining the 1LSR and 2LSR2 regions in the M(stop), M(neutralino) plane in gaugino universality scenario.

expected CLs values for the best expected combination in the M(stop), M(neutralino) plane in gaugino universality scenario.

observed CLs values for the best expected combination in the M(stop), M(neutralino) plane in gaugino universality scenario.

expected CLs values for the 1LSR region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

observed CLs values for the 1LSR region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

expected CLs values for the 2LSR1 region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

observed CLs values for the 2LSR1 region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

expected CLs values for the 2LSR2 region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

observed CLs values for the 2LSR2 region in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

expected CLs values combining the 1LSR and 2LSR1 regions in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

observed CLs values combining the 1LSR and 2LSR1 regions in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

expected CLs values combining the 1LSR and 2LSR2 regions in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

observed CLs values combining the 1LSR and 2LSR2 regions in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

expected CLs values for the best expected combination in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

observed CLs values for the best expected combination in the M(chargino), M(neutralino) plane in the scenario where M(stop) = 180 GEV.

expected CLs values for the 2LSR1 region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

observed CLs values for the 2LSR1 region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

expected CLs values for the 2LSR2 region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

observed CLs values for the 2LSR2 region in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

expected CLs values for the best expected combination in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

observed CLs values for the best expected combination in the M(stop), M(neutralino) plane in the scenario where M(chargino) = 106 GEV.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Reconstruction efficiency of TYPE0 LJs as a function of $L_{\mathrm{xy}}$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.4 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE0 LJs as a function of $L_{\mathrm{xy}}$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.9 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE0 LJs as a function of $L_{\mathrm{xy}}$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 1.5 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $p_{\mathrm{T}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.05 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $p_{\mathrm{T}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.15 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $p_{\mathrm{T}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.4 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $p_{\mathrm{T}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.9 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $p_{\mathrm{T}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 1.5 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $L_{\mathrm{xy}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.05 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $L_{\mathrm{xy}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.15 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $L_{\mathrm{xy}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.4 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $L_{\mathrm{xy}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.9 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of $L_{\mathrm{xy}}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 1.5 GeV. The uncertainties are statistical only.

Reconstruction efficiency of TYPE0 LJs as a function of the $p_{\mathrm{T}}$ of the $s_{d_{1}}$ for LJs with two $\gamma_{d}$'s for an \scalar mass of 2 GeV. For the $\gamma_{d}$, the kinematically allowed mass of 0.4 GeV is considered. The distributions for the other $s_{d_{1}}$ masses are very similar. The uncertainties are statistical only.

Reconstruction efficiency of TYPE0 LJs as a function of the $p_{\mathrm{T}}$ of the $s_{d_{1}}$ for LJs with two $\gamma_{d}$'s for an \scalar mass of 2 GeV. For the $\gamma_{d}$, the kinematically allowed mass of 0.9 GeV is considered. The distributions for the other $s_{d_{1}}$ masses are very similar. The uncertainties are statistical only.

Reconstruction efficiency of TYPE1 LJs as a function of the $p_{\mathrm{T}}$ of the $s_{d_{1}}$ for LJs with two $\gamma_{d}$'s for an \scalar mass of 2 GeV. For the $\gamma_{d}$, the kinematically allowed mass of 0.4 GeV is considered. The distributions for the other $s_{d_{1}}$ masses are very similar. The uncertainties are statistical only.

Reconstruction efficiency of TYPE1 LJs as a function of the $p_{\mathrm{T}}$ of the $s_{d_{1}}$ for LJs with two $\gamma_{d}$'s for an \scalar mass of 2 GeV. For the $\gamma_{d}$, the kinematically allowed mass of 0.9 GeV is considered. The distributions for the other $s_{d_{1}}$ masses are very similar. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of the $p_{\mathrm{T}}$ of the $s_{d_{1}}$ for LJs with two $\gamma_{d}$'s for an \scalar mass of 2 GeV. For the $\gamma_{d}$, the kinematically allowed mass of 0.05 GeV is considered. The distributions for the other $s_{d_{1}}$ masses are very similar. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of the $p_{\mathrm{T}}$ of the $s_{d_{1}}$ for LJs with two $\gamma_{d}$'s for an \scalar mass of 2 GeV. For the $\gamma_{d}$, the kinematically allowed mass of 0.15 GeV is considered. The distributions for the other $s_{d_{1}}$ masses are very similar. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of the $p_{\mathrm{T}}$ of the $s_{d_{1}}$ for LJs with two $\gamma_{d}$'s for an \scalar mass of 2 GeV. For the $\gamma_{d}$, the kinematically allowed mass of 0.4 GeV is considered. The distributions for the other $s_{d_{1}}$ masses are very similar. The uncertainties are statistical only.

Reconstruction efficiency of TYPE2 LJs as a function of the $p_{\mathrm{T}}$ of the $s_{d_{1}}$ for LJs with two $\gamma_{d}$'s for an \scalar mass of 2 GeV. For the $\gamma_{d}$, the kinematically allowed mass of 0.9 GeV is considered. The distributions for the other $s_{d_{1}}$ masses are very similar. The uncertainties are statistical only.

Muon trigger efficiency, $\rm \varepsilon$(2mu6), as a function of $p_{T}$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.4 GeV. The uncertainties are statistical only.

Muon trigger efficiency, $\rm \varepsilon$(2mu6), as a function of $p_{T}$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.9 GeV. The uncertainties are statistical only.

Muon trigger efficiency, $\rm \varepsilon$(2mu6), as a function of $p_{T}$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 1.5 GeV. The uncertainties are statistical only.

Muon trigger efficiency, $\rm \varepsilon$(2mu6), as a function of $\eta$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.4 GeV. The uncertainties are statistical only.

Muon trigger efficiency, $\rm \varepsilon$(2mu6), as a function of $\eta$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.9 GeV. The uncertainties are statistical only.

Muon trigger efficiency, $\rm \varepsilon$(2mu6), as a function of $\eta$ of the $\gamma_{d}$ for $\gamma_{d} \to \mu\mu$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 1.5 GeV. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $p_{T}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.05 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $p_{T}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.15 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $p_{T}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.4 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $p_{T}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.9 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $p_{T}$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 1.5 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $\eta$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.05 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $\eta$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.15 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $\eta$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.4 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $\eta$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 0.9 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Calorimetric trigger efficiency as a function of $\eta$ of the $\gamma_{d}$ for $\gamma_{d} \to ee,\pi\pi$ obtained from the LJ gun MC samples with $\gamma_{d}$ masses 1.5 GeV. Similar distributions are obtained for LJs containing two dark photons. The uncertainties are statistical only.

Sequential impact of each requirement on the number of events passing the selection for the high-$E_T$ analysis.

Sequential impact of each requirement on the number of events passing the selection for the low-$E_T$ analysis.

Application of the modified ABCD method to the final high-$E_T$ and low-$E_T$ selections.

The extrapolated signal efficiencies as a function of proper decay length of the $s$ for several simulated samples in the low-$E_T$ selections.

The extrapolated signal efficiencies as a function of proper decay length of the $s$ for several simulated samples in the high-$E_T$ selections.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 25 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 600 ~\mathrm{GeV}$ and $m_{s} = 150 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 25 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 600 ~\mathrm{GeV}$ and $m_{s} = 150 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 5 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 8 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 15 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 40 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 55 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 8 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 25 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 400 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 400 ~\mathrm{GeV}$ and $m_{s} = 100 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 600 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 150 ~\mathrm{GeV}$.

The observed limits, expected limits and $\pm 1 \sigma$ and $\pm 2 \sigma$ bands for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 400 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 5 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 8 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 15 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 125 ~\mathrm{GeV}$ and $m_{s} = 40 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 8 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 25 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 200 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 400 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 400 ~\mathrm{GeV}$ and $m_{s} = 100 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 600 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 50 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 150 ~\mathrm{GeV}$.

Combined limits for the CalRatio and MS analyses, for a model with $m_{\phi} = 1000 ~\mathrm{GeV}$ and $m_{s} = 400 ~\mathrm{GeV}$.

Observed $CL_S$ limits on $\sigma \times BR$ for $m_{\Phi} = 200-400$ GeV.

Observed $CL_S$ limits on $\sigma \times BR$ for $m_{\Phi} = 600-1000$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 15$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 40$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

Comparison of the IDVx reconstruction and selection efficiency for a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV, using only standard tracking versus using standard and large radius tracking for all ID vertices in the signal MC sample.

Comparison of the IDVx reconstruction and selection efficiency for a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV, using only standard tracking versus using standard and large radius tracking for ID vertices passing the full IDVx selection criteria.

Comparison of the IDVx reconstruction and selection efficiency for a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV, using only standard tracking versus using standard and large radius tracking for all ID vertices in the signal MC sample.

Comparison of the IDVx reconstruction and selection efficiency for a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV, using only standard tracking versus using standard and large radius tracking for ID vertices passing the full IDVx selection criteria.

The IDVx selection efficiency as a function of long-lived particle decay $z$ position for MC signal samples with a 125 GeV Higgs boson decaying to LLPs with masses of 8, 25, and 55 GeV. The efficiency for the 55 GeV LLP sample is shown both with and without the material veto applied.

The IDVx selection efficiency as a function of long-lived particle decay $z$ position for MC signal samples with mediators of masses 200, 400, and 600 GeV decaying to LLPs with a mass of 50 GeV. The efficiency for the 200 GeV mediator sample is shown both with and without the material veto applied.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 8$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 15$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 25$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 40$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 8$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 400$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 400$ GeV, $m_s = 100$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 600$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 600$ GeV, $m_s = 150$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 150$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 400$ GeV.

Barrel Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=200$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=400$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=600$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=1000$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel Muon RoI Cluster trigger efficiencies (in %) for all Stealth SUSY benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel Muon RoI Cluster trigger efficiencies (in %) for baryogenesis $\chi \rightarrow \nu b \bar{b}$ benchmark samples ($m_{h}=125$ GeV). The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel Muon RoI Cluster trigger efficiencies (in %) for baryogenesis $\chi \rightarrow cbs$ benchmark samples ($m_{h}=125$ GeV). The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel Muon RoI Cluster trigger efficiencies (in %) for baryogenesis $\chi \rightarrow lcb$ benchmark samples ($m_{h}=125$ GeV). The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel Muon RoI Cluster trigger efficiencies (in %) for baryogenesis $\chi \rightarrow \tau\tau\nu$ benchmark samples ($m_{h}=125$ GeV). The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=100$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=125$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=200$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=400$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=600$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for $m_{\Phi}=1000$ GeV scalar benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for all Stealth SUSY benchmark samples. The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for baryogenesis $\chi \rightarrow \nu b \bar{b}$ benchmark samples ($m_{h}=125$ GeV). The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for baryogenesis $\chi \rightarrow cbs$ benchmark samples ($m_{h}=125$ GeV). The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for baryogenesis $\chi \rightarrow lcb$ benchmark samples ($m_{h}=125$ GeV). The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Endcap Muon RoI Cluster trigger efficiencies (in %) for baryogenesis $\chi \rightarrow \tau\tau\nu$ benchmark samples ($m_{h}=125$ GeV). The trigger efficiency is defined as the fraction of LLPs selected by the Muon RoI Cluster trigger as a function of the LLP decay position. The trigger is efficient for hadronic decays of LLPs that occur anywhere from the outer regions of the HCal to the middle station of the MS. These efficiencies are obtained from the subset of events with only a single LLP decay in the muon spectrometer in order to ensure that the result of the trigger is due to a single burst of MS activity. The uncertainties shown are statistical only. The relative differences in efficiencies of the benchmark samples are a result of the different kinematics.

Barrel MS vertex efficiencies (in %) for $m_{\Phi}=100$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for $m_{\Phi}=125$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for $m_{\Phi}=200$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for $m_{\Phi}=400$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for $m_{\Phi}=600$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for $m_{\Phi}=1000$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for all Stealth SUSY benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for baryogenesis $\chi \rightarrow \nu b \bar{b}$ benchmark samples ($m_{h}=125$ GeV). The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for baryogenesis $\chi \rightarrow cbs$ benchmark samples ($m_{h}=125$ GeV). The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for baryogenesis $\chi \rightarrow lcb$ benchmark samples ($m_{h}=125$ GeV). The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Barrel MS vertex efficiencies (in %) for baryogenesis $\chi \rightarrow \tau\tau\nu$ benchmark samples ($m_{h}=125$ GeV). The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for $m_{\Phi}=100$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for $m_{\Phi}=125$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for $m_{\Phi}=200$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for $m_{\Phi}=400$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for $m_{\Phi}=600$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for $m_{\Phi}=1000$ GeV scalar benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for all Stealth SUSY benchmark samples. The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for baryogenesis $\chi \rightarrow \nu b \bar{b}$ benchmark samples ($m_{h}=125$ GeV). The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for baryogenesis $\chi \rightarrow cbs$ benchmark samples ($m_{h}=125$ GeV). The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for baryogenesis $\chi \rightarrow lcb$ benchmark samples ($m_{h}=125$ GeV). The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Endcap MS vertex efficiencies (in %) for baryogenesis $\chi \rightarrow \tau\tau\nu$ benchmark samples ($m_{h}=125$ GeV). The vertex reconstruction efficiency is defined as the fraction of simulated LLP decays in the MS fiducial volume that match a reconstructed vertex ($\Delta R(\textrm{LLP,vertex}) = 0.4$) passing the baseline event selection and satisfying the vertex isolation criteria. A vertex is considered matched to a displaced decay if the vertex is within $\Delta R = 0.4$ of the simulated decay position. The MS vertex efficiency is parameterized as a function of the LLP decay position.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=5$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=5$ GeV scalar benchmark sample for 1MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=5$ GeV scalar benchmark sample for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=8$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=8$ GeV scalar benchmark sample for 1MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=8$ GeV scalar benchmark sample for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=15$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=15$ GeV scalar benchmark sample for 1MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=15$ GeV scalar benchmark sample for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=25$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=25$ GeV scalar benchmark sample for 1MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=25$ GeV scalar benchmark sample for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=40$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=40$ GeV scalar benchmark sample for 1MSVx strategy.

Upper 95% CL limits on $\sigma/\sigma_{\textrm{SM}}\times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=125$ GeV and $m_{s}=40$ GeV scalar benchmark sample for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=250$ GeV for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=500$ GeV for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=500$ GeV for 1MSVx strategy.

Upper 95% CL limits on $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=500$ GeV for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=800$ GeV for 2MSVx strategy.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=800$ GeV for 1MSVx strategy.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=800$ GeV for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=1200$ GeV for 2MSVx strategy.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=1200$ GeV for 1MSVx strategy.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=1200$ GeV for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=1500$ GeV for 2MSVx strategy.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=1500$ GeV for 1MSVx strategy.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=1500$ GeV for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=2000$ GeV for 2MSVx strategy.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=2000$ GeV for 1MSVx strategy.

Upper 95% CL limits $\sigma \times B_{\tilde{g} \rightarrow \tilde{S} g}$ as a function of the proper lifetime $c\tau$ for $m_{\tilde{g}}=2000$ GeV for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=100$ GeV and $m_{s}=8$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=100$ GeV and $m_{s}=25$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=200$ GeV and $m_{s}=8$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=200$ GeV and $m_{s}=25$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=200$ GeV and $m_{s}=50$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=400$ GeV and $m_{s}=50$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=400$ GeV and $m_{s}=100$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=600$ GeV and $m_{s}=50$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=600$ GeV and $m_{s}=150$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=1000$ GeV and $m_{s}=50$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=1000$ GeV and $m_{s}=150$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma \times B$ as a function of the proper lifetime $c\tau$ for $m_{\Phi}=1000$ GeV and $m_{s}=400$ GeV scalar benchmark sample for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \nu b \bar{b}$ channel with $m_{\chi}=100$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow c b s$ channel with $m_{\chi}=100$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for 1MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for the combination of 1MSVx and 2MSVx strategies.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow l c b$ channel with $m_{\chi}=100$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \tau \tau \nu$ channel with $m_{\chi}=10$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \tau \tau \nu$ channel with $m_{\chi}=30$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \tau \tau \nu$ channel with $m_{\chi}=50$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Upper 95% CL limits on $\sigma\times B$ as a function of the proper lifetime $c\tau$ for $\chi \rightarrow \tau \tau \nu$ channel with $m_{\chi}=100$ GeV ($m_{h}=125$ GeV) for 2MSVx strategy.

Number of tracks in vertex vs invariant mass of vertex (DATA) The number of tracks in the vertex vs the invariant mass of the vertex, for the data, and for the MH signal sample respectively. All selection cuts are applied, with the exceptions of those on the variables in the plot (Ntrk and mass), and the offline muon requirements.

Number of tracks in vertex vs invariant mass of vertex (SIGNAL) The number of tracks in the vertex vs the invariant mass of the vertex, for the data, and for the MH signal sample respectively. All selection cuts are applied, with the exceptions of those on the variables in the plot (Ntrk and mass), and the offline muon requirements.

95% CL upper limit on sigma.BR^2 vs c*tau The observed 95% CL upper limits on the cross-section for squark production, multiplied by the branching fraction for both squarks to decay to long-lived neutralinos, which in turn decay to mu+jets, given that we observed zero events in the signal region.

Expected upper limit on sigma.BR^2 vs c*tau The expected 95% CL upper limits on the cross-section for squark production, multiplied by the branching fraction for both squarks to decay to long-lived neutralinos, which in turn decay to mu+jets.

Vertex selection efficiency for the $\tilde{t}$ $R$-hadron benchmark model as a function of the transverse decay distance $r_{DV}$.

Track multiplicity $n_{Tracks}$ for preselected DVs in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

The observed event yields in the control, validation and signal regions are shown for the MET Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the MET Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the Muon Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the Muon Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

Expected exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (1 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (1 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (2 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (2 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (+1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (+1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (-1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (-1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Exclusion limits on the production cross section as a function of m($\tilde{t}$) are shown for several values of $\tau(\tilde{t})$ along with the nominal signal production cross section and its theoretical uncertainty.

Exclusion limits on the production cross section as a function of m($\tilde{t}$) are shown for several values of $\tau(\tilde{t})$ along with the nominal signal production cross section and its theoretical uncertainty.

Parameterized event selection efficiencies for the $E_{T}^{miss}$ Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the $E_{T}^{miss}$ Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the Muon Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the Muon Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized muon-level reconstruction efficiencies as a function of the muon $p_{T}$ and $d_{0}$. The muon-level efficiencies are extracted using muons passing the muon acceptance criteria.

Parameterized muon-level reconstruction efficiencies as a function of the muon $p_{T}$ and $d_{0}$. The muon-level efficiencies are extracted using muons passing the muon acceptance criteria.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated independent of the muons originating from this truth vertex.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated independent of the muons originating from this truth vertex.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated only for truth vertices which have a muon originating from them which is matched to a reconstructed muon.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated only for truth vertices which have a muon originating from them which is matched to a reconstructed muon.

The $p_{T}$ distribution of all muons originating from LLP decays in the samples used to calculate and validate the efficiencies.

The $p_{T}$ distribution of all muons originating from LLP decays in the samples used to calculate and validate the efficiencies.

The invariant mass and multiplicity of selected decay products of all truth vertices used in the calculation and validation of the reconstructed efficiencies.

The invariant mass and multiplicity of selected decay products of all truth vertices used in the calculation and validation of the reconstructed efficiencies.

Fractions of selected events for several signal MC samples with a mass difference $\Delta m = 100$ GeV, illustrating how $\mathcal{A}\times\varepsilon$ varies with the model parameters.

Two-dimensional distribution of $m_{\mathrm{DV}}$ and track multiplicity for DVs in data events and events of a $R$-hadron signal sample with $m_{\tilde{g}} = 1.4$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and $\tau_{\tilde{g}} = 1$ ns that satisfy all signal region event selection criteria.

Two-dimensional distribution of $m_{\mathrm{DV}}$ and track multiplicity for DVs in data events and events of a $R$-hadron signal sample with $m_{\tilde{g}} = 1.4$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 1.32$ TeV and $\tau_{\tilde{g}} = 1$ ns that satisfy all signal region event selection criteria.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{g}}$ and $\tau$ for $m_{\tilde{\chi}_{1}^{0}}=100$ GeV. For the mass limits see the entry of Figure 8b.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Vertex reconstruction efficiency as a function of radial position $R$ with and without the special LRT processing for one $R$-hadron signal sample with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and $\tau_{\tilde{g}} = 1$ ns. The efficiency is defined as the probability for a true LLP decay to be matched with a reconstructed DV fulfilling the vertex preselection criteria in events with a reconstructed primary vertex.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Vertex reconstruction efficiency as a function of radial position $R$ for two $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $\tau_{\tilde{g}} = 1$ ns and different neutralino masses. The efficiency is defined as the probability for a true LLP decay to be matched with a reconstructed DV fulfilling the vertex preselection criteria in events with a reconstructed primary vertex.

Lower 95% CL limits on $m_{\tilde{g}}$ for fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Fractions of selected events for several signal MC samples with a gluino lifetime $\tau = 1$ ns, illustrating how $\mathcal{A}\times\varepsilon$ varies with the model parameters.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Fractions of selected events for several signal MC samples with a mass difference $\Delta m = 100$ GeV, illustrating how $\mathcal{A}\times\varepsilon$ varies with the model parameters.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Two-dimensional distribution of $m_{\mathrm{DV}}$ and track multiplicity for DVs in data events and events of a $R$-hadron signal sample with $m_{\tilde{g}} = 1.4$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and $\tau_{\tilde{g}} = 1$ ns that satisfy all signal region event selection criteria.

Lower 95% CL limit on $m_{\tilde{g}}$ for fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Two-dimensional distribution of $m_{\mathrm{DV}}$ and track multiplicity for DVs in data events and events of a $R$-hadron signal sample with $m_{\tilde{g}} = 1.4$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 1.32$ TeV and $\tau_{\tilde{g}} = 1$ ns that satisfy all signal region event selection criteria.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $\tau=1$ ns as a function of $m_{\tilde{\chi}_{1}^{0}}$.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $\tau=1$ ns as a function of $m_{\tilde{\chi}_{1}^{0}}$.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Observed 95% CL limit as a function of $m_{\tilde{g}}$ and $m_{\tilde{\chi}_{1}^{0}}$ for fixed $\tau=1$ ns.

Lower 95% CL limit on $m_{\tilde{g}}$ for fixed $\Delta m=100$ GeV as a function of lifetime $\tau$.

Two-dimensional distributions of $x$-$y$ positions of vertices observed in the data passing the vertex pre-selection and satisfying all signal region event-level requirements.

Two-dimensional distributions of $x$-$y$ positions of vertices observed in the data passing the vertex pre-selection and satisfying all signal region event-level requirements.

Distribution of the mass $m_{\mathrm{DV}}$ for vertices in data events and in events of five $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and different $\tau_{\tilde{g}}$ that satisfy the signal region event requirements. All DV selections are applied except for the $m_{\mathrm{DV}}$ and track multiplicity requirements.

Distribution of the mass $m_{\mathrm{DV}}$ for vertices in data events and in events of five $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and different $\tau_{\tilde{g}}$ that satisfy the signal region event requirements. All DV selections are applied except for the $m_{\mathrm{DV}}$ and track multiplicity requirements.

Distribution of the track multiplicity $n_{\mathrm{Tracks}}$ for vertices in data events and events of five $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and and different $\tau_{\tilde{g}}$ that satisfy the signal region event requirements. All DV selections are applied except for the $m_{\mathrm{DV}}$ and track multiplicity requirements. The track multiplicity distribution requires vertices to have $m_{\mathrm{DV}}>3$ GeV.

Distribution of the track multiplicity $n_{\mathrm{Tracks}}$ for vertices in data events and events of five $R$-hadron signal samples with $m_{\tilde{g}} = 1.2$ TeV, $m_{\tilde{\chi}_{1}^{0}} = 100$ GeV and and different $\tau_{\tilde{g}}$ that satisfy the signal region event requirements. All DV selections are applied except for the $m_{\mathrm{DV}}$ and track multiplicity requirements. The track multiplicity distribution requires vertices to have $m_{\mathrm{DV}}>3$ GeV.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{g}}$ and $\tau$ for $m_{\tilde{\chi}_{1}^{0}}=100$ GeV. For the mass limits see the entry of Figure 8b.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{g}}$ and $\tau$ for $\Delta m=100$ GeV. For the mass limits see the entry of Figure 9b.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{g}}$ and $\tau$ for $\Delta m=100$ GeV. For the mass limits see the entry of Figure 9b.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{\chi}_{1}^{0}}$ and $m_{\tilde{g}}$ for $\tau = 1$ ns. For the mass limits see the entry of Figure 10b.

Observed cross section upper 95% CL limits as a function of $m_{\tilde{\chi}_{1}^{0}}$ and $m_{\tilde{g}}$ for $\tau = 1$ ns. For the mass limits see the entry of Figure 10b.

Parameterized event selection efficiencies as a function of truth MET for events which have all truth decay vertices occurring before the start of the ATLAS calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have all truth decay vertices occurring before the start of the ATLAS calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have the furthest truth decay occurring inside the calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have the furthest truth decay occurring inside the calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have the furthest truth decay occurring after the end of the ATLAS calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized event selection efficiencies as a function of truth MET for events which have the furthest truth decay occurring after the end of the ATLAS calorimeter. Event-level efficiencies are evaluated for events that have truth MET $> 200$ GeV, pass the trackless jet requirement, and have at least one displaced truth decay within the fiducial volume. To satisfy the event-level efficiency, events must then pass the full event selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $4$ mm $< R_{\mathrm{decay}} < 22$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $4$ mm $< R_{\mathrm{decay}} < 22$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $22$ mm $< R_{\mathrm{decay}} < 25$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $22$ mm $< R_{\mathrm{decay}} < 25$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $25$ mm $< R_{\mathrm{decay}} < 29$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $25$ mm $< R_{\mathrm{decay}} < 29$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $29$ mm $< R_{\mathrm{decay}} < 38$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $29$ mm $< R_{\mathrm{decay}} < 38$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $38$ mm $< R_{\mathrm{decay}} < 46$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $38$ mm $< R_{\mathrm{decay}} < 46$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Lower 95% CL limits on $m_{\tilde{g}}$ for fixed $m_{\tilde{\chi}_{1}^{0}}=100$ GeV as a function of lifetime $\tau$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $46$ mm $< R_{\mathrm{decay}} < 73$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $46$ mm $< R_{\mathrm{decay}} < 73$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $73$ mm $< R_{\mathrm{decay}} < 84$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $73$ mm $< R_{\mathrm{decay}} < 84$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $84$ mm $< R_{\mathrm{decay}} < 111$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $84$ mm $< R_{\mathrm{decay}} < 111$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $111$ mm $< R_{\mathrm{decay}} < 120$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $111$ mm $< R_{\mathrm{decay}} < 120$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=1.4$ TeV and fixed $\tau=1$ ns as a function of $m_{\tilde{\chi}_{1}^{0}}$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $120$ mm $< R_{\mathrm{decay}} < 145$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $120$ mm $< R_{\mathrm{decay}} < 145$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Upper 95% CL limits on the signal cross section for $m_{\tilde{g}}=2.0$ TeV and fixed $\tau=1$ ns as a function of $m_{\tilde{\chi}_{1}^{0}}$.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $145$ mm $< R_{\mathrm{decay}} < 180$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $145$ mm $< R_{\mathrm{decay}} < 180$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Observed 95% CL limit as a function of $m_{\tilde{g}}$ and $m_{\tilde{\chi}_{1}^{0}}$ for fixed $\tau=1$ ns.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $180$ mm $< R_{\mathrm{decay}} < 300$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Parameterized vertex level efficiencies as a function of number of particles associated to a truth decay vertex, and the vertex invariant mass for truth decays with $180$ mm $< R_{\mathrm{decay}} < 300$ mm. Selected particles are required to have nonzero electric charge, $p_{T}(|Q|=1) > 1$ GeV, and $d_0 > 2$ mm. The per-vertex efficiency is evaluated only for truth vertices that have at least 5 associated tracks, an invariant mass $> 10$ GeV, and are in the region $4$ mm $< R_{\mathrm{decay}} < 300$ mm, and $|Z_{\mathrm{decay}}| < 300$ mm. A truth vertex satisfies the vertex level efficiency if it can be matched to a reconstructed DV which passes the final vertex selection.

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

The 95% CL upper limit on the production cross section for charge 5 particles.

The 95% CL upper limit on the production cross section for charge 6 particles.

Expected 95% CL limit on cross section times acceptance times branching ratio for each width and mass of Gaussian signal shape tested, in the region defined by |y*|<0.3.

Observed 95% CL limit on cross section times acceptance times branching ratio for each width and mass of Gaussian signal shape tested, in the region defined by |y*|<0.6.

Expected 95% CL limit on cross section times acceptance times branching ratio for each width and mass of Gaussian signal shape tested, in the region defined by |y*|<0.6.

Dijet mass distribution for the b-tagged category. Data, estimated background and uncertainties are shown. Events are collected using the combined trigger and contain a $E_T^{\gamma} > 95$ GeV photon and two $p_T^{jet} > 65$ GeV jets.

Upper limits on Gaussian-shape contributions to the dijet mass distributions from the flavour-inclusive category and masses below 450 GeV, for which the single-photon trigger was used.

Upper limits on Gaussian-shape contributions to the dijet mass distributions from the flavour-inclusive category and masses above 450 GeV, for which the combined trigger was used.

Upper limits on Gaussian-shape contributions to the dijet mass distributions from the b-tagged category and masses below 450 GeV, for which the single-photon trigger was used.

Upper limits on Gaussian-shape contributions to the dijet mass distributions from the b-tagged category and masses above 450 GeV, for which the combined trigger was used.

Kinematic acceptance values predicted for the $Z'$ model as a function of mass $m_{Z'}$ for the flavour-inclusive category using the single-photon trigger.

Kinematic acceptance values predicted for the $Z'$ model as a function of mass $m_{Z'}$ for the flavour-inclusive category using the combined trigger.

Kinematic acceptance values predicted for the $Z'$ model as a function of mass $m_{Z'}$ for the b-tagged category using the single-photon trigger.

Kinematic acceptance values predicted for the $Z'$ model as a function of mass $m_{Z'}$ for the b-tagged category using the combined trigger.