Definition of the fiducial phase space.

The seven input variables to the NN ordered by their discriminating power. The jet that is not $b$-tagged is referred to as $\textit{untagged}~$jet.

The seven input variables to the NN ordered by their discriminating power. The jet that is not $b$-tagged is referred to as $\textit{untagged}~$jet.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events(at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-quark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-antiquark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the absolute differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$.

Uncertainties for the normalised differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

The measured fiducial cross section vs $E_{\mathrm{T}}^\gamma$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The absolute differential cross-section measured in the fiducial phase-space as a function of the minimum $\Delta R$ between the photon and the leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The absolute differential cross-section measured in the fiducial phase-space as a function of the $\Delta\phi$ between the two leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The absolute differential cross-section measured in the fiducial phase-space as a function of the $|\Delta\eta|$ between the two leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the photon pT in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the photon $|\eta|$ in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the minimum $\Delta R$ between the photon and the leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the $\Delta\phi$ between the two leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The normalised differential cross-section measured in the fiducial phase-space as a function of the $|\Delta\eta|$ between the two leptons in the electron-muon channel. The uncertainty is decomposed into four components which are the signal modelling uncertainty, the background modelling uncertainty, the experimental uncertainty, and the data statistical uncertainty.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the photon pT in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the photon $|\eta|$ in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the minimum $\Delta R$ between the photon and the leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the $\Delta\phi$ between the two leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the absolute differential cross-section measured in the fiducial phase-space as a function of the $|\Delta\eta|$ between the two leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the photon pT in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the photon $|\eta|$ in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the minimum $\Delta R$ between the photon and the leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the $\Delta\phi$ between the two leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the normalised differential cross-section measured in the fiducial phase-space as a function of the $|\Delta\eta|$ between the two leptons in the electron-muon channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The statistical correlation matrix of all the absolute differential cross-sections measured in the fiducial phase-space in the electron-muon channel.

The statistical correlation matrix of all the normalised differential cross-sections measured in the fiducial phase-space in the electron-muon channel.

Fiducial region definition.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

The differential cross section of $Z$ boson production scaled by 1/$p_\mathrm{T}^{Z}$, (1/$p_\mathrm{T}^{Z}$) $d\sigma /dp_\mathrm{T}^{Z}$, for $-3<y^\mathrm{*}_{Z}<2$.

The differential cross section of $Z$ boson production scaled by 1/$p_\mathrm{T}^{Z}$, (1/$p_\mathrm{T}^{Z}$) $d\sigma /dp_\mathrm{T}^{Z}$, for $-2<y^\mathrm{*}_{Z}<0$ and $0<y^\mathrm{*}_{Z}<2.

Centrality bias corrected $Z$ boson yields per event for $-3<y^\mathrm{*}_{Z}<2$ scaled by by $\langle N_{coll}\rangle$. (To remove the centrality bias correction each value may be multiplied by the approriate correction value found in arXiv:1412.0976.).

The rapidity differential Z boson yields per event scaled by $\langle N_{coll}\rangle$ for three centrality ranges.