Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $E_{\mathrm{T}}^{\gamma}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $p_{\mathrm{T}}^{\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $|y^{\textrm{jet}}|$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $E_{\mathrm{T}}^{\gamma}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $p_{\mathrm{T}}^{\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $|y^{\textrm{jet}}|$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

The measured $p_{\mathrm{T}}^{\mathrm{recoil}}$ distributions in the top control region, compared with the background predictions as estimated after the simultaneous, binned background-only fit to the data in the control regions. The last bin of the distribution contains overflows.

The measured $p_{\mathrm{T}}^{\mathrm{recoil}}$ distributions in the $Z\rightarrow\mu\mu$ control region, compared with the background predictions as estimated after the simultaneous, binned background-only fit to the data in the control regions. The last bin of the distribution contains overflows.

The measured $p_{\mathrm{T}}^{\mathrm{recoil}}$ distributions in the $Z\rightarrow ee$ control region, compared with the background predictions as estimated after the simultaneous, binned background-only fit to the data in the control regions. The last bin of the distribution contains overflows.

The measured $p_{\mathrm{T}}^{\mathrm{recoil}}$ distributions in the signal region, compared with the background predictions as estimated after the simultaneous, binned background-only fit to the data in the control regions. The last bin of the distribution contains overflows.

Observed exclusion contour at 95% CL in the $m_{Z_{A}}-m_\chi$ parameter plane for the axial-vector mediator model.

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ up observed exclusion contour at 95% CL in the $m_{Z_{A}}-m_\chi$ parameter plane for the axial-vector mediator model.

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ down observed exclusion contour at 95% CL in the $m_{Z_{A}}-m_\chi$ parameter plane for the axial-vector mediator model.

Expected exclusion contour at 95% CL in the $m_{Z_{A}}-m_\chi$ parameter plane for the axial-vector mediator model.

1 $\sigma$ up expected exclusion contour at 95% CL in the $m_{Z_{A}}-m_\chi$ parameter plane for the axial-vector mediator model.

1 $\sigma$ down expected exclusion contour at 95% CL in the $m_{Z_{A}}-m_\chi$ parameter plane for the axial-vector mediator model.

2 $\sigma$ up expected exclusion contour at 95% CL in the $m_{Z_{A}}-m_\chi$ parameter plane for the axial-vector mediator model.

2 $\sigma$ down expected exclusion contour at 95% CL in the $m_{Z_{A}}-m_\chi$ parameter plane for the axial-vector mediator model.

Observed exclusion contour at 95% CL in the $m_{Z_{P}}-m_\chi$ parameter plane for the pseudo-scalar mediator model.

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ up observed exclusion contour at 95% CL in the $m_{Z_{P}}-m_\chi$ parameter plane for the pseudo-scalar mediator model.

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ down observed exclusion contour at 95% CL in the $m_{Z_{P}}-m_\chi$ parameter plane for the pseudo-scalar mediator model.

Expected exclusion contour at 95% CL in the $m_{Z_{P}}-m_\chi$ parameter plane for the pseudo-scalar mediator model.

1 $\sigma$ up expected exclusion contour at 95% CL in the $m_{Z_{P}}-m_\chi$ parameter plane for the pseudo-scalar mediator model.

1 $\sigma$ down expected exclusion contour at 95% CL in the $m_{Z_{P}}-m_\chi$ parameter plane for the pseudo-scalar mediator model.

2 $\sigma$ up expected exclusion contour at 95% CL in the $m_{Z_{P}}-m_\chi$ parameter plane for the pseudo-scalar mediator model.

2 $\sigma$ down expected exclusion contour at 95% CL in the $m_{Z_{P}}-m_\chi$ parameter plane for the pseudo-scalar mediator model.

A comparison of the inferred limits with the constraints from direct-detection experiments on the spin-dependent WIMP-neutron and WIMP-proton scattering cross section as a function of the WIMP mass, in the context of the simplified model with axial-vector couplings. Limits are shown at 90% CL.

Observed excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to c + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ up observed excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to c + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ down observed excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to c + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

Expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to c + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma$ up expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to c + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma$ down expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to c + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

2 $\sigma$ up expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to c + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

2 $\sigma$ down expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to c + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

Observed excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to b + ff^{'} + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ up observed excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to b + ff^{'} + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ down observed excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to b + ff^{'} + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

Expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to b + ff^{'} + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma$ up expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to b + ff^{'} + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma$ down expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to b + ff^{'} + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

2 $\sigma$ up expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to b + ff^{'} + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

2 $\sigma$ down expected excluded regions at the 95% CL in the ($\tilde{t}_1,\tilde{\chi}^{0}_{1}$)mass plane for the decay channel $\tilde{t}_1 \to b + ff^{'} + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

Observed exclusion plane at 95% CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_1 \to b + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ up observed exclusion plane at 95% CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_1 \to b + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ down observed exclusion plane at 95% CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_1 \to b + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

Expected exclusion plane at 95% CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_1 \to b + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma$ up expected exclusion plane at 95% CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_1 \to b + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

1 $\sigma$ down expected exclusion plane at 95% CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_1 \to b + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

2 $\sigma$ up expected exclusion plane at 95% CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_1 \to b + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

2 $\sigma$ down expected exclusion plane at 95% CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_1 \to b + \tilde{\chi}^{0}_{1}$ ($\mathcal{B}=100\%$)

Observed exclusion region at 95$\%$ CL as a function of squark mass and the squark--neutralino massdifference for $\tilde{q} \to q + \tilde{\chi}^{0}_{1}$ and $\tilde{q}_\mathrm{L} + \tilde{q}_\mathrm{R}$with ($\tilde{u},\tilde{d},\tilde{c},\tilde{s}$).

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ up observed exclusion region at 95$\%$ CL as a function of squark mass and the squark--neutralino massdifference for $\tilde{q} \to q + \tilde{\chi}^{0}_{1}$ and $\tilde{q}_\mathrm{L} + \tilde{q}_\mathrm{R}$with ($\tilde{u},\tilde{d},\tilde{c},\tilde{s}$).

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ down observed exclusion region at 95$\%$ CL as a function of squark mass and the squark--neutralino massdifference for $\tilde{q} \to q + \tilde{\chi}^{0}_{1}$ and $\tilde{q}_\mathrm{L} + \tilde{q}_\mathrm{R}$with ($\tilde{u},\tilde{d},\tilde{c},\tilde{s}$).

Expected exclusion region at 95$\%$ CL as a function of squark mass and the squark--neutralino massdifference for $\tilde{q} \to q + \tilde{\chi}^{0}_{1}$ and $\tilde{q}_\mathrm{L} + \tilde{q}_\mathrm{R}$with ($\tilde{u},\tilde{d},\tilde{c},\tilde{s}$).

1 $\sigma$ up expected exclusion region at 95$\%$ CL as a function of squark mass and the squark--neutralino massdifference for $\tilde{q} \to q + \tilde{\chi}^{0}_{1}$ and $\tilde{q}_\mathrm{L} + \tilde{q}_\mathrm{R}$with ($\tilde{u},\tilde{d},\tilde{c},\tilde{s}$).

1 $\sigma$ down expected exclusion region at 95$\%$ CL as a function of squark mass and the squark--neutralino massdifference for $\tilde{q} \to q + \tilde{\chi}^{0}_{1}$ and $\tilde{q}_\mathrm{L} + \tilde{q}_\mathrm{R}$with ($\tilde{u},\tilde{d},\tilde{c},\tilde{s}$).

2 $\sigma$ up expected exclusion region at 95$\%$ CL as a function of squark mass and the squark--neutralino massdifference for $\tilde{q} \to q + \tilde{\chi}^{0}_{1}$ and $\tilde{q}_\mathrm{L} + \tilde{q}_\mathrm{R}$with ($\tilde{u},\tilde{d},\tilde{c},\tilde{s}$).

2 $\sigma$ down expected exclusion region at 95$\%$ CL as a function of squark mass and the squark--neutralino massdifference for $\tilde{q} \to q + \tilde{\chi}^{0}_{1}$ and $\tilde{q}_\mathrm{L} + \tilde{q}_\mathrm{R}$with ($\tilde{u},\tilde{d},\tilde{c},\tilde{s}$).

Observed and expected exclusions at $95\%$ CL on the Horndeski dark-energy model for $m_{\phi}=0.1$ GeV and $c_{i\neq 2}=0$, $c_{2}=1$, expressed in terms of the visible cross section as a function of the suppression scale $M_{2}$.

$95\%$ CL observed and expected lower limits on the fundamental Planck scale in $4+n$ dimensions, $M_D$, as a function of the number of extra dimensions $n$, considering nominal LO signal cross sections.

Observed and expected 95$\%$ CL upper limits on the coupling $c_{\stackrel{\sim}{\smash{G}}}$ as a function of the effective scale $f_a$ for ALP mass of 1 MeV. The bands indicate the $\pm 1\sigma$ theory uncertainties in the observed limit and the $\pm 1\sigma$and $\pm 2\sigma$ ranges of the expected limit in the absence of a signal. The 95$\%$ CL limits are computed with no suppression of the events with $\hat{s} > f_a^2$.

Observed exclusion contour at 95% CL in the $m_{Z_{V}}-m_\chi$ parameter plane for the vector mediator model.

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ up observed exclusion contour at 95% CL in the $m_{Z_{V}}-m_\chi$ parameter plane for the vector mediator model.

1 $\sigma_{\mathrm{theory}}^{\mathrm{PDF+scale}}$ down observed exclusion contour at 95% CL in the $m_{Z_{V}}-m_\chi$ parameter plane for the vector mediator model.

Expected exclusion contour at 95% CL in the $m_{Z_{V}}-m_\chi$ parameter plane for the vector mediator model.

1 $\sigma$ up expected exclusion contour at 95% CL in the $m_{Z_{V}}-m_\chi$ parameter plane for the vector mediator model.

1 $\sigma$ down expected exclusion contour at 95% CL in the $m_{Z_{V}}-m_\chi$ parameter plane for the vector mediator model.

2 $\sigma$ up expected exclusion contour at 95% CL in the $m_{Z_{V}}-m_\chi$ parameter plane for the vector mediator model.

2 $\sigma$ down expected exclusion contour at 95% CL in the $m_{Z_{V}}-m_\chi$ parameter plane for the vector mediator model.

A comparison of the inferred limits with the constraints from direct-detection experiments on the spin-independent WIMP-nucleon scattering cross section as a function of the WIMP mass, in the context of the simplified model with vector couplings. Limits are shown at 90% CL.

Inferred 95% CL limits on the WIMP annihilation rate as a function of WIMP mass, for the pseudoscalar mediator model. The annihilation rate is defined as the product of cross section $\sigma$ and relative velocity $v_{rel}$, averaged over the DM velocity distribution ($\langle\sigma v_{rel}\rangle$). Both the $qq$ and $gg$ annihilation channels are considered in the calculation of the annihilation rate

Contribution to the total SR background uncertainty in exclusive bins of the SR, as obtained from the CR-only fit. In the table, the contribution of each source of systematic is shown as the sum in quadrature of the individual contributions represented by the corresponding nuisance parameters.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM0.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM1.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM2.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM3.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM4.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM5.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM6.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM7.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM8.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM9.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM10.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM11.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the exclusive SR bin EM12.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM0.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM1.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM2.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM3.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM4.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM5.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM6.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM7.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM8.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM9.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM10.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM11.

Expected and observed backgrounds, before and after a binned likelihood fit in the control regions, in the inclusive SR IM12.

Cutflow of several signal benchmarks. A cut on the truth $E_\mathrm{T}^\mathrm{miss}$ at 150 GeV is applied.

Cutflow of several signal benchmarks. A cut on the truth $E_\mathrm{T}^\mathrm{miss}$ at 350 GeV is applied.

Fiducial $W+b$-jets cross-section correlations of statistical errors in the 1-jet region in bins of $p_T^{b-jet}$.

Fiducial $W+b$-jets cross-section correlations of systematic errors in the 1-jet region in bins of $p_T^{b-jet}$.

Fiducial $W+b$-jets cross-section correlations of statistical errors in the 1-jet region in bins of $p_T^{b-jet}$ without single-top subtraction.

Fiducial $W+b$-jets cross-section correlations of systematic errors in the 1-jet region in bins of $p_T^{b-jet}$ without single-top subtraction.

Measured fiducial $W+b$-jets cross-section in the 2-jet region with statistical and systematic uncertainties in bins of $p_T^{b-jet}$. Also shown are the cross sections obtained without single-top subtraction. UPDATE (04 MAY 2019): units corrected from nb/GeV to fb/GeV.

Fiducial $W+b$-jets cross-section correlations of statistical errors in the 2-jet region in bins of $p_T^{b-jet}$.

Fiducial $W+b$-jets cross-section correlations of systematic errors in the 2-jet region in bins of $p_T^{b-jet}$.

Fiducial $W+b$-jets cross-section correlations of statistical errors in the 2-jet region in bins of $p_T^{b-jet}$ without single-top subtraction.

Fiducial $W+b$-jets cross-section correlations of systematic errors in the 2-jet region in bins of $p_T^{b-jet}$ without single-top subtraction.

Multiplicative correction factors for non-perturbative effects and additive corrections for double-parton interactions, derived from the ALPGEN simulation, applied to the MCFM and POWHEG predictions for the comparisons with unfolded results. The non-perturbative uncertainties include the hadronization and underlying event modelling, while the DPI uncertainties are based on the ATLAS measurement of $\sigma_{\rm eff}$.

Multiplicative correction factors for non-perturbative effects and additive corrections for double-parton interactions, derived from the ALPGEN simulation, applied to the MCFM and POWHEG predictions for the comparisons with unfolded results. The non-perturbative uncertainties include the hadronization and underlying event modelling, while the DPI uncertainties are based on the ATLAS measurement of $\sigma_{\rm eff}$.

Theoretical NLO predictions for the $W+b$-jet fiducial cross-section for one lepton flavour calculated with the MCFM program, corrected for non-perturbative effects and DPI contributions.

Post-fit background and signal yields in the full signal region. The total systematic uncertainty differs from the sum in quadrature of the different uncertainties due to correlations. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair. HF $e$ (HF $\mu$) refers to events with one non-prompt electron (muon) from heavy-flavour hadron decay, LF refers to events with a lepton originating from light-meson decay, and 'Other $t\bar{t}X$' includes events coming from $t\bar{t}WZ$, $t\bar{t}Z$+jets, $t\bar{t}WH$, $t\bar{t}HH$.

Ranking of the nuisance parameters included in the fit according to their impact on the signal strength $\mu$. Only the 20 most highly ranked nuisance parameters are shown in the thumbnail figure. The empty blue rectangles correspond to the pre-fit impact on $\mu$ and the filled blue ones to the post-fit impact on $\mu$, both referring to the upper $x$-axis scale. The impact of each nuisance parameter, $\Delta\mu$, is computed by comparing the nominal best-fit value of $\mu$ with the result of the fit when fixing the nuisance parameter to its best-fit value, $\hat{\theta}$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta\theta$ ($\pm \Delta\hat{\theta}$). The black points show the pulls of the parameter relative to their nominal values, $\theta_0$. The nominal value for all parameters is $\theta_0 = 0$. The pulls of the most impactful parameters and their relative post-fit errors, $\Delta\hat{\theta}/\Delta\theta$, are referenced to the lower $x$-axis scale. In the table, POI means Parameter of Interest.

Comparison between data and prediction before the fit ('Pre-Fit') for the 'HF e' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the 'HF mu' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the $m_{ee}^{PV}$ variable in the 'Conv.' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the $\Sigma p_{T}^{l}$ variable in the 'ttW' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the 'HF e' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the 'HF mu' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the $m_{ee}^{PV}$ variable in the 'Conv.' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the $\Sigma p_{T}^{l}$ variable in the in 'ttW' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the BDT score in the signal region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the BDT score in the signal region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $10<p_{\textrm{T}}^{\mu}<20$ GeV selection in the $\mu-\mu$ channel.

The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $20<p_{\textrm{T}}^{\mu}<250$ GeV selection in the $e-\mu$ channel.

The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $20<p_{\textrm{T}}^{\mu}<250$ GeV selection in the $\mu-\mu$ channel.

The measurement of the ratio of the rate of decay of W bosons to τ-leptons and muons, $R(\tau/\mu)=B(W\rightarrow\tau\nu_\tau)/B(W\rightarrow \mu\nu_\mu)$.

Acceptance x efficiency versus $\kappa_{2V}$ for non-resonant signal of $HH$.

Acceptance x efficiency versus resonance mass for both narrow and broad resonance $X$ to $HH$.

Acceptance x efficiency versus resonance mass for both narrow and broad resonance $X$ to $HH$.

Acceptance x efficiency versus resonance mass for both narrow and broad resonance $X$ to $HH$.

Acceptance x efficiency versus resonance mass for both narrow and broad resonance $X$ to $HH$.

Post-fit mass distribution of the $HH$ candidates in the signal region. The expected background is shown after the profile-likelihood fit to data with the background-only hypothesis; the narrow-width resonant signal at 800 GeV and the non-resonant signal at $\kappa_{2V}$ = 3 are overlaid, both normalised to the corresponding observed upper limits on the cross-section.

Post-fit mass distribution of the $HH$ candidates in the signal region. The expected background is shown after the profile-likelihood fit to data with the background-only hypothesis; the narrow-width resonant signal at 800 GeV and the non-resonant signal at $\kappa_{2V}$ = 3 are overlaid, both normalised to the corresponding observed upper limits on the cross-section.

Post-fit mass distribution of the $HH$ candidates in the signal region. The expected background is shown after the profile-likelihood fit to data with the background-only hypothesis; the narrow-width resonant signal at 800 GeV and the non-resonant signal at $\kappa_{2V}$ = 3 are overlaid, both normalised to the corresponding observed upper limits on the cross-section.

Post-fit mass distribution of the $HH$ candidates in the signal region. The expected background is shown after the profile-likelihood fit to data with the background-only hypothesis; the narrow-width resonant signal at 800 GeV and the non-resonant signal at $\kappa_{2V}$ = 3 are overlaid, both normalised to the corresponding observed upper limits on the cross-section.

Observed and expected limits at 95% CL on the cross-sections of narrow resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of narrow resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of narrow resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-section of narrow resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of broad resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of broad resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of broad resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-section of broad resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of non-resonant $HH$ production via VBF as a function of the di-vector-boson-di-Higgs-boson coupling modifier $\kappa_{2V}$. The theory prediction of the cross-section as a function of $\kappa_{2V}$ is also shown. The minimum theory cross-section is 1.37 fb at $\kappa_{2V}=1.17$.

Observed and expected limits at 95% CL on the cross-sections of non-resonant $HH$ production via VBF as a function of the di-vector-boson-di-Higgs-boson coupling modifier $\kappa_{2V}$. The theory prediction of the cross-section as a function of $\kappa_{2V}$ is also shown. The minimum theory cross-section is 1.37 fb at $\kappa_{2V}=1.17$.

Observed and expected limits at 95% CL on the cross-sections of non-resonant $HH$ production via VBF as a function of the di-vector-boson-di-Higgs-boson coupling modifier $\kappa_{2V}$. The theory prediction of the cross-section as a function of $\kappa_{2V}$ is also shown. The minimum theory cross-section is 1.37 fb at $\kappa_{2V}=1.17$.

Observed and expected limits at 95% CL on the cross-sections of non-resonant $HH$ production via VBF as a function of the di-vector-boson-di-Higgs-boson coupling modifier $\kappa_{2V}$. The theory prediction of the cross-section as a function of $\kappa_{2V}$ is also shown. The minimum theory cross-section is 1.37 fb at $\kappa_{2V}=1.17$.

Distribution of $S$, which is one of the discriminating variables used to define the $2\ell^{sc}$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $E_{T}^{miss}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $\Delta R_{\ell^{\pm}\ell^{\pm}}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $m_{x\ell}$ ($x$=3), which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $p_{T}^{leading jet}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $E_{T}^{miss}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $\Delta R_{\ell^{\pm}\ell^{\pm}}^{min}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $m_{x\ell}$ ($x$=4), which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $p_{T}^{\ell_{1}}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Contributions from different categories of uncertainties relative to the expected background yields in the defined SRs, as obtained after performing the likelihood ratio test discussed in Section 9 in the paper. The uncertainties are shown for the combination of the individual channels of the $2\ell^{sc}$, $3\ell$ and $4\ell$ SRs. The SRs are indicated along the horizontal axis. In the HEPData entry, the x-axis is simplified for easier visualisation. The first number indicates the sub channel (2:$2\ell^{sc}$, 3:$3\ell$, 4:$4\ell$), while the second number indicates the mass point (2:200, 3:300, 4:400, 5:500).

Data event yields compared with the expected contributions from relevant background sources, for the combination of the individual channels of the $2\ell^{sc}$, $3\ell$ and $4\ell$ SRs. The total uncertainties in the expected event yields are shown as the hatched bands. The SRs are indicated along the horizontal axis. In the HEPData entry, the x-axis is simplified for easier visualisation. The first number indicates the sub channel (2:$2\ell^{sc}$, 3:$3\ell$, 4:$4\ell$), while the second number indicates the mass point (2:200, 3:300, 4:400, 5:500).

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $2\ell^{sc}$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $3\ell$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $4\ell$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

Observed and expected upper limits of the $H^{\pm\pm}$ pair production cross section times branching fraction at 95% CL obtained from the combination of 2$\ell^{sc}$, 3$\ell$ and 4$\ell$ channels. The region above the observed limit is excluded by the measurement. The bands represent the expected exclusion curves within one and two standard deviations.

The theoretical prediction of Figure 9(a) in the paper.

Observed and expected upper limits of the $H^{\pm\pm}$ and $H^{\pm}$ production cross section times branching fraction at 95% CL obtained from the combination of 2$\ell^{sc}$, 3$\ell$ and 4$\ell$ channels. The region above the observed limit is excluded by the measurement. The bands represent the expected exclusion curves within one and two standard deviations.

The theoretical prediction of Figure 9(b) in the paper.

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 200~GeV$ or $m_{H^{\pm\pm}} = 220~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 300~GeV$ or $m_{H^{\pm\pm}} = 350~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 400~GeV$ or $m_{H^{\pm\pm}} = 450~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 500~GeV$ or $m_{H^{\pm\pm}} = 550~GeV$ or $m_{H^{\pm\pm}} = 600~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).