Correlation matrix for the differential branching fraction extraction between different $q^2$ bins in the simultaneous fit.

The product of acceptance and efficiency ($A\epsilon$) of the $\mathcal{B}(\mathrm{B}^+\to\mathrm{K}^+\mu^+\mu^-)$ channel, as a function of the muon pair $q^2$, as measured in simulated signal events, after all the corrections applied. In the figure, regions corresponding to resonances are displayed with red markers.

Same as Table 5, but for the bins containing the J$\psi$ and $\psi$(2S) resonances.

Integrated branching fraction $\mathcal{B}(\mathrm{B}^\pm \to \mathrm{K}^\pm\mu^+\mu^-)$ in the low-$q^2$ region.

Ratio of branching fractions $\mathcal{B}(\text{B}^\pm \to \text{K}^\pm\mu^+\mu^-)$ to $\mathcal{B}(\text{B}^\pm \to \text{K}^\pm\text{e}^+\text{e}^-)$, determined from the measured double ratio $R$(K) of these decays to the respective branching fractions of the decay chains $\text{B}^\pm\to\text{J/}\psi\text{K}^\pm$ with $\text{J/}\psi\to\mu^+\mu^-$ and $\text{e}^+\text{e}^-$.

Negative log likelihood function from the fit profiled as a function of the inverse ratio $R(\mathrm{K})^{-1}$.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

The number of background events obtained from the 1- and 2-leg predictions derived from data, together with the direct observation in data, in bins in ChF, where either the leading or subleading jet has a ChF within the bin edges, and both have a ChF below the upper bin threshold. The bottom panel shows the ratios of the observation in data to the 1-leg and the 2-leg background predictions.

The expected and observed 95% CL upper limits on the production cross section for SIMPs with masses between 1 and 1000 GeV, with the assumption that the SIMP interaction in the detector can be approximated as neutron-like. The theoretical prediction of a simplified model incorporating this approximation and including a scalar mediator with couplings g_chi = -1 and g_q = 1 is also shown (red line). For masses above 100 GeV, where the modelling of the SIMP-nucleon interaction becomes more speculative, the obtained cross section upper limits are increasingly uncertain (shaded area).

Experimental uncertainties affecting transfer factors in the analysis that is used to estimate the W background in the signal region (SR). The number of W boson events are denoted as $W_{SR}$ for the SR and in analogy as $W_{\mu\nu}$ ($W_{e\nu}$) for the single-muon (single-electron) control region (CR).

Uncertainties assigned to the simulation based processes in SR and CRs.

Uncertainties assigned to the simulation based processes in SR and CRs.

Cross sections (fb) at large Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and their combination. The theoretical predictions from Madgraph at NLO in QCD and corrected to NLO in electroweak using the NNPDF 3.0 are also reported. With the exception of the largest Z $p_{T}$ bin, the statistical uncertainties in the measurements are much smaller than the systematic uncertainties. Both measurements and predictions correspond to $\sigma \mathcal{B}(Z -> \ell\ell)$, where $\sigma$ is the total fiducial cross section, $\mathcal{B}$ is the branching fraction, and $\ell$ is a charged lepton. The $Z -> \nu\nu$ measurement corresponds to $\sigma \mathcal{B}(Z -> \ell\ell)/\mathcal{B}(Z -> \nu\nu)$.

Cross sections (fb) at large Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and their combination. The theoretical predictions from Madgraph at NLO in QCD and corrected to NLO in electroweak using the NNPDF 3.0 are also reported. With the exception of the largest Z $p_{T}$ bin, the statistical uncertainties in the measurements are much smaller than the systematic uncertainties. Both measurements and predictions correspond to $\sigma \mathcal{B}(Z -> \ell\ell)$, where $\sigma$ is the total fiducial cross section, $\mathcal{B}$ is the branching fraction, and $\ell$ is a charged lepton. The $Z -> \nu\nu$ measurement corresponds to $\sigma \mathcal{B}(Z -> \ell\ell)/\mathcal{B}(Z -> \nu\nu)$.

Cross sections normalized to the total cross section measurements at high Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and in their combination. The uncertainty includes both statistical and systematic uncertainties.

Cross sections normalized to the total cross section measurements at high Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and in their combination. The uncertainty includes both statistical and systematic uncertainties.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Measured min-$d_{xy}$ distribution in the 2-match category, after requiring the $d_{xy}$ muon to pass the isolation requirement $I_{\mathrm{rel}}^{\mathrm{PF}} <0.25$ (i. e., the B and D bins of the ABCD plane). Overlaid with a red histogram is the background predicted from the region of the ABCD plane failing the same requirement (the A and C bins), as well as three signal benchmark hypotheses (as defined in the legends), assuming $\alpha_D = \alpha_{\mathrm{EM}}$ (the fine-structure constant). The red hatched bands correspond to the background prediction uncertainty. The last bin includes the overflow.

Two-dimensional exclusion surfaces for $\Delta = 0.1 \, m_1$ as a function of the DM mass $m_1$ and the signal strength $y$, with $m_{A'} = 3 \, m_1$. Filled histograms denote observed limits on $\sigma(\mathrm{pp} \to A' \to \chi_2 \chi_1) \, \mathcal{B}(\chi_2 \to \chi_1 \mu^+ \mu^-)$. Solid (dashed) curves denote the observed (expected) exclusion limits at 95% CL, with 68% CL uncertainty bands around the expectation. Regions above the curves are excluded, depending on the $\alpha_D$ hypothesis: $\alpha_{\mathrm{D}} = \alpha_{\mathrm{EM}}$ (dark blue) or 0.1 (light magenta).

Two-dimensional exclusion surfaces for $\Delta = 0.4 \, m_1$ as a function of the DM mass $m_1$ and the signal strength $y$, with $m_{A'} = 3 \, m_1$. Filled histograms denote observed limits on $\sigma(\mathrm{pp} \to A' \to \chi_2 \chi_1) \, \mathcal{B}(\chi_2 \to \chi_1 \mu^+ \mu^-)$. Solid (dashed) curves denote the observed (expected) exclusion limits at 95% CL, with 68% CL uncertainty bands around the expectation. Regions above the curves are excluded, depending on the $\alpha_D$ hypothesis: $\alpha_{\mathrm{D}} = \alpha_{\mathrm{EM}}$ (dark blue) or 0.1 (light magenta).

Measured misidentification probability distribution as a function of track multiplicity for the EMJ-1 criteria group defined in Table 2. The red up-pointing triangles are for b jets while the blue down-pointing triangles are for light-flavor jets. The horizontal lines on the data points indicate the variable bin width.

The $H_\mathrm{T}$ distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 8 (SM QCD-enhanced), requiring at least two jets tagged by loose emerging jet criteria.

The number of associated tracks distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 8 (SM QCD-enhanced), requiring at least two jets tagged by loose emerging jet criteria.

The $H_\mathrm{T}$ distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 9 (SM QCD-enhanced), requiring at least one jet tagged by loose emerging jet criteria and large $p_\mathrm{T}^\mathrm{miss}$.

The number of associated tracks distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 9 (SM QCD-enhanced), requiring at least one jet tagged by loose emerging jet criteria and large $p_\mathrm{T}^\mathrm{miss}$.

Upper limits at 95% CL on the signal cross section for models with dark pion mass $(m_{\pi_\mathrm{DK}})$ of 5 GeV in the proper decay length $(c\tau_{\pi_\mathrm{DK}})$ versus dark mediator mass $(m_{\mathrm{X_{DK}}})$ plane.

Dark mediator mass exclusion limits at 95% CL derived from theoretical cross sections for models with dark pion mass $(m_{\pi_\mathrm{DK}})$ of 5 GeV in the proper decay length $(c\tau_{\pi_\mathrm{DK}})$ versus dark mediator mass $(m_{\mathrm{X_{DK}}})$ plane.

The background estimate and the observed data in the number of tagged jets >= 2 bin, for each of the seven validation samples (VS$_{1}$ through VS$_{7}$), along with the signal sample (Sig S). Signal model distributions for scalar masses of 15 and 55 GeV with a proper mean decay length of 20 mm are also shown. The Higgs boson branching fraction to long-lived scalars (B(H$\rightarrow $ SS)) is set to 20%.

Exclusion limits at 95% CL on the Higgs boson branching fraction to long-lived scalars B(H$\rightarrow$ SS) as a function of the mean proper decay length of the scalar for scalar mass 15 GeV and the S$\rightarrow d\bar{d}$ decay mode.

Exclusion limits at 95% CL on the Higgs boson branching fraction to long-lived scalars B(H$\rightarrow$ SS) as a function of the mean proper decay length of the scalar for scalar mass 40 GeV and the S$\rightarrow d\bar{d}$ decay mode.

Exclusion limits at 95% CL on the Higgs boson branching fraction to long-lived scalars B(H$\rightarrow$ SS) as a function of the mean proper decay length of the scalar for scalar mass 55 GeV and the S$\rightarrow d\bar{d}$ decay mode.

Exclusion limits at 95% CL on the Higgs boson branching fraction to long-lived scalars B(H$\rightarrow$ SS) as a function of the mean proper decay length of the scalar for scalar mass 15 GeV and the S$\rightarrow b\bar{b}$ decay mode.

Exclusion limits at 95% CL on the Higgs boson branching fraction to long-lived scalars B(H$\rightarrow$ SS) as a function of the mean proper decay length of the scalar for scalar mass 40 GeV and the S$\rightarrow b\bar{b}$ decay mode.

Exclusion limits at 95% CL on the Higgs boson branching fraction to long-lived scalars B(H$\rightarrow$ SS) as a function of the mean proper decay length of the scalar for scalar mass 55 GeV and the S$\rightarrow b\bar{b}$ decay mode.

The post-fit distribution of the $M(\ell\ell)$ variable is shown for the high-MET bin for the $\text{t}\bar{\text{t}}$ CR. Uncertainties include both the statistical and systematic components.

The post-fit distribution of the $M(\ell\ell)$ variable is shown for the low-MET bin for the WZ-enriched region. Uncertainties include both the statistical and systematic components.

The post-fit distribution of the $M(\ell\ell)$ variable is shown for the high-MET bin for the WZ-enriched region. Uncertainties include both the statistical and systematic components.

The post-fit distribution of the $M(\ell\ell)$ variable is shown for the high-MET bin for the SS CR. Uncertainties include both the statistical and systematic components.

The 2$\ell$-Ewk SR: the post-fit distribution of the $M(\ell\ell)$ variable is shown for the low-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 2$\ell$-Ewk SR: the post-fit distribution of the $M(\ell\ell)$ variable is shown for the med-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 2$\ell$-Ewk SR: the post-fit distribution of the $M(\ell\ell)$ variable is shown for the high-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 2$\ell$-Ewk SR: the post-fit distribution of the $M(\ell\ell)$ variable is shown for the ultra-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 3$\ell$-Ewk search regions: the post-fit distribution of the $M^{\text{min}}_{\text{SFOS}}(\ell\ell)$ variable is shown for the low-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 3$\ell$-Ewk search regions: the post-fit distribution of the $M^{\text{min}}_{\text{SFOS}}(\ell\ell)$ variable is shown for the high-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 2$\ell$-Stop SR: the post-fit distribution of the leading lepton $p_{T}$ variable is shown for the low-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the T2bff$\tilde{\chi}^0_1$ and the T2bW models. The numbers after the model name in the legend indicate the mass of the top squark and the mass splitting between the top squark and LSP, in GeV.

The 2$\ell$-Stop SR: the post-fit distribution of the leading lepton $p_{T}$ variable is shown for the med-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the T2bff$\tilde{\chi}^0_1$ and the T2bW models. The numbers after the model name in the legend indicate the mass of the top squark and the mass splitting between the top squark and LSP, in GeV.

The 2$\ell$-Stop SR: the post-fit distribution of the leading lepton $p_{T}$ variable is shown for the high-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the T2bff$\tilde{\chi}^0_1$ and the T2bW models. The numbers after the model name in the legend indicate the mass of the top squark and the mass splitting between the top squark and LSP, in GeV.

The 2$\ell$-Stop SR: the post-fit distribution of the leading lepton $p_{T}$ variable is shown for the ultra-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the T2bff$\tilde{\chi}^0_1$ and the T2bW models. The numbers after the model name in the legend indicate the mass of the top squark and the mass splitting between the top squark and LSP, in GeV.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the TChiWZ model. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. Results are reported for the $\widetilde{m}_{\tilde{\chi}^0_2} \widetilde{m}_{\tilde{\chi}^0_1} > 0$ $M(\ell\ell)$ spectrum reweighting scenario. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the TChiWZ model. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. Results are reported for the $\widetilde{m}_{\tilde{\chi}^0_2} \widetilde{m}_{\tilde{\chi}^0_1} < 0$ $M(\ell\ell)$ spectrum reweighting scenario. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the simplified higgsino model. The simplified model includes both neutralino pair and neutralino-chargino production modes. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. The results are reported for the $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ $M(\ell\ell)$ spectrum reweighting scenario. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the pMSSM higgsino model. The pMSSM one includes all possible production modes. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. The results are reported for the $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ $M(\ell\ell)$ spectrum reweighting scenario. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the T2bff$\tilde{\chi}^0_1$ simplified model. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the T2bW simplified model. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. The range of luminosities of the analysis regions included in the fit is indicated on the plot.