Measured differential cross section with associated uncertainties as a function of COS(THETA*). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2GAMMA). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>30 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>50 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of HT. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of M(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of ABSDPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2GAMMA,2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of TAUJET. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of SUM(TAUJET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=0,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=1,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=2,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET>=3,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

The measured cross sections or cross section limits of the diphoton, VBF-enhanced, Nlepton $\geq$ 1, high $E_{T}^{miss}$, and ttH-enhanced fiducial regions are shown.

Measured differential cross section with associated uncertainties as a function of diphoton transverse momentum in bins of ABS(COS(THETA*)). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.Each systematic uncertainty sources is fully uncorrelated with the other sources.

Non-perturbative correction factors in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are evaluated by deriving these factors using different generators and tunes as described in the text. No factor are given for the Nlepton $\geq$ 1 and High-$E_{T}^{miss}$ fiducial regions as the gluon fusion contamination in both is negligible.

Isolation efficiencies in percent for gluon fusion $H\rightarrow\gamma\gamma$ for each fiducial region/variable bin measured in this analysis. The isolation efficiency is defined as the probability for both photons to fulfil the isolation criteria (as described in Section 9.1) for events that pass the diphoton kinematic criteria. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are assigned in the same way as for the non-perturbative correction factors: by varying the fragmentation and underlying event modelling. These factors can be multiplied by the kinematic acceptance factors (see Table 29) to extrapolate an inclusive gluon fusion Higgs prediction to the fiducial volume used in this analysis. No factors for the Nlepton $\geq$ 1 and High $E_{T}^{miss}$ fiducial regions are provided as the gluon fusion contamination is negligible.

Combined non-perturbative (Table 27) and particle-level isolation correction factors (Table 28) in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. The uncertainties on the combined values properly take into account the correlations between both multiplicative factors.

Diphoton kinematic acceptances in percent for gluon-gluon fusion for the diphoton fiducial region and all differential variable bins studied in this paper, defined as the probability to fulfill the diphoton kinematic criteria: $p_{T}$/$m_{\gamma\gamma}$ < 0.35 (0.25) for the leading (subleading) photon and $|\eta_{\gamma\gamma}|$ < 2.37. The factors are evaluated using the Powheg NNLOPSevent generator. Uncertainties are taken from PDF variations. QCD scale variations have a negligible impact on these factors. The range of each bin is given in Table 26.

observed statistical correlations between pTyy, Njets, mjj, |DeltaPhijj| and pTj1

ggH default MC + XH predictions

XH ( = VBF + VH + ttH + bbH ) MC predictions

Best-fit values and uncertainties of the production-mode cross sections times branching ratio.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Measured cross sections for isolated-photon plus jet production as a function of $m^{\gamma-\rm jet}$.

Measured cross sections for isolated-photon plus jet production as a function of $|\cos\theta^{\star}|$.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $467 < m^{\gamma-\rm jet1} < 510$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $510 < m^{\gamma-\rm jet1} < 590$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $590 < m^{\gamma-\rm jet1} < 670$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $670 < m^{\gamma-\rm jet1} < 760$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $760 < m^{\gamma-\rm jet1} < 850$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $850 < m^{\gamma-\rm jet1} < 950$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $0.95 < m^{\gamma-\rm jet1} < 1.05$ TeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $1.05 < m^{\gamma-\rm jet1} < 1.25$ TeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $1.25 < m^{\gamma-\rm jet1} < 2.45$ TeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $E_{\rm T}^{\gamma}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $p_{\rm T}^{\rm jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\beta^{\rm jet1}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\beta^{\gamma}$.

Ratio of measured cross sections for isolated-photon plus 2jet production as a function of $\beta$.

Measured cross sections for isolated-photon plus 3jet production as a function of $E_{\rm T}^{\gamma}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $p_{\rm T}^{\rm jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Parton-level normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are pb$^2$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are pb$^2$.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Differential cross sections normalized to the fiducial cross section for the combined 4e, 4mu and 2e2mu decay channels as a function of pT for the ZZ system.

Differential cross sections normalized to the fiducial cross section for the combined 4e, 4mu and 2e2mu decay channels as a function of mass of the ZZ system.

Differential cross sections normalized to the fiducial cross section for the combined 4e, 4mu and 2e2mu decay channels as a function of azimuthal separation of the two Z bosons.

Differential cross sections normalized to the fiducial cross section for the combined 4e, 4mu and 2e2mu decay channels as a function of delta R of the two Z bosons.

Transverse thrust for $320 < p_{T,1} < 390$ GeV.

Transverse thrust for $p_{T,1} > 390$ GeV.

Jet broadening for $110 < p_{T,1} < 170$ GeV.

Jet broadening for $170 < p_{T,1} < 250$ GeV.

Jet broadening for $250 < p_{T,1} < 320$ GeV.

Jet broadening for $320 < p_{T,1} < 390$ GeV.

Jet broadening for $p_{T,1} > 390$ GeV.

Total jet mass for $110 < p_{T,1} < 170$ GeV.

Total jet mass for $170 < p_{T,1} < 250$ GeV.

Total jet mass for $250 < p_{T,1} < 320$ GeV.

Total jet mass for $320 < p_{T,1} < 390$ GeV.

Total jet mass for $p_{T,1} > 390$ GeV.

Total transverse jet mass for $110 < p_{T,1} < 170$ GeV.

Total transverse jet mass for $170 < p_{T,1} < 250$ GeV.

Total transverse jet mass for $250 < p_{T,1} < 320$ GeV.

Total transverse jet mass for $320 < p_{T,1} < 390$ GeV.

Total transverse jet mass for $p_{T,1} > 390$ GeV.

Third-jet resolution parameter for $110 < p_{T,1} < 170$ GeV.

Third-jet resolution parameter for $170 < p_{T,1} < 250$ GeV.

Third-jet resolution parameter for $250 < p_{T,1} < 320$ GeV.

Third-jet resolution parameter for $320 < p_{T,1} < 390$ GeV.

Third-jet resolution parameter for $p_{T,1} > 390$ GeV.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 30-45 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 45-60 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 60-120 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 120-200 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 200-1500 GeV, as measured in the combined dilepton channel.

Measured ratio of the Drell-Yan normalized differential cross sections at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel for the full phase space.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 20-30 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 30-45 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 45-60 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 60-120 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 120-200 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 200-1500 GeV.