Expected and observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ with $\Gamma_X$=10 GeV in VBF production mode.

Expected and observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ with $\Gamma_X$=100 GeV with VBF fraction profiled.

Expected and observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ with $\Gamma_X$=100 GeV in VBF production mode.

Observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ and $\Gamma_X$ values when VBF fraction is profiled.

Observed upper limits at the 95% CL on the pp --> X --> ZZ cross section as a function of $m_X$ and $\Gamma_X$ values in VBF production mode.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 0 W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{j})]$ in the W+jets control region, for 1 or more W-tagged jet category. Example signal distributions are also shown. The background distributions correspond to background-only fit to data while signal distributions are before the fit to data. Electron and muon event samples are combined. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 0 t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 0 W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 1 b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Distributions of $\min[M(\ell,\mathrm{b})]$ in events with 1 or more t-tagged jets, 1 or more W-tagged jets, and 2 or more b-tagged jets for the combined electron and muon samples in the signal region. Example signal distributions are also shown. The background distributions correspond to the background-only fit to data, while signal distributions are before the fit to data. The last bin includes overflow events and its content is divided by the bin width. The distributions in each category have variable-size bins, chosen so that the statistical uncertainty in the total background in each bin is less than 30%. The lower panel in each plot shows the difference between the observed and the predicted numbers of events in that bin divided by the total uncertainty. The total uncertainty is calculated as the sum in quadrature of the statistical uncertainty in the observed measurement and the statistical and systematic uncertainties in the background-only fit to data.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the same-sign dilepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining all categories for the single-lepton final state. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an LH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Expected and observed limits at 95% CL for an RH $X_{5/3}$ after combining the same-sign dilepton and single-lepton final states. The theoretical uncertainty in the signal cross section is shown as a narrow band around the theoretical prediction.

Ratios of B+ differential production cross sections at 13 TeV and at 7 TeV as a function of |yB| for 10 < ptB < 100 GeV or 17 < ptB < 100 GeV. The calculations from FONLL and PYTHIA are provided as well.

B+ differential production cross sections DSIG/DPT for |yB|< 1.45 or |yB|< 2.1, at 13 TeV. The calculations from FONLL and PYTHIA are provided.

B+ differential production cross sections DSIG/DETARAP for 10 < ptB < 100 GeV or 17 < ptB < 100 GeV, at 13 TeV. The calculations from FONLL and PYTHIA are provided.

B+ production cross section for the phase-space region of 10 <= pTB < 17 GeV and |yB| < 1.45, and 17 <= pTB < 100 GeV and |yB| < 2.1. The calculations from FONLL and PYTHIA are provided.

Expected and observed exclusion limits (95% CL, in the asymptotic approximation) on the product of the production cross section and branching fraction into two photons for an additional SM-like Higgs boson, for the VBF plus VH processes, from the analysis of the 8 TeV data. The inner and outer bands indicate the regions containing the distribution of limits located within $pm 1 and 2 $sigma, respectively, of the expectation under the background-only hypothesis.

Expected and observed exclusion limits (95% CL, in the asymptotic approximation) on the product of the production cross section and branching fraction into two photons for an additional SM-like Higgs boson, for the ggH plus ttH processes, from the analysis of the 13 TeV data. The inner and outer bands indicate the regions containing the distribution of limits located within $pm 1 and 2 $sigma, respectively, of the expectation under the background-only hypothesis.

Expected and observed exclusion limits (95% CL, in the asymptotic approximation) on the product of the production cross section and branching fraction into two photons for an additional SM-like Higgs boson, for the VBF plus VH processes, from the analysis of the 13 (bottom) TeV data. The inner and outer bands indicate the regions containing the distribution of limits located within $pm 1 and 2 $sigma, respectively, of the expectation under the background-only hypothesis.

Expected and observed exclusion limits (95% CL, in the asymptotic approximation) on the product of the production cross section and branching fraction into two photons for an additional Higgs boson, relative to the expected SM-like value, from the analysis of the 8 and 13 TeV data. The inner and outer bands indicate the regions containing the distribution of limits located within $pm 1 and 2 $sigma , respectively, of the expectation under the background-only hypothesis.

Observed 95% CL upper limits on the product of the production cross section and the branching fraction for a new spin-1 Z prime resonance decaying to ZH, as a function of the resonance mass hypothesis.

Observed 95% CL upper limits on the product of the production cross section and the branching fraction for a new spin-1 V prime (Wprime/Zprime) resonance decaying to VH, as a function of the resonance mass hypothesis.

The timing distribution of the background sources predicted to contribute to the signal region, compared to those for a representative signal model. The time is defined by the jet in the event with the largest $t_{\mathrm{jet}}$ passing the relevant selection. The distributions for the major backgrounds are taken from control regions and normalized to the predictions. The observed data is shown by the black points. No events are observed in data for $t_{\mathrm{jet}} > 3\,$ns (indicated with a vertical black line).

The product of the acceptance and efficiency in the $c\tau_{0}$ vs. $m_{\tilde{g}}$ plane for the GMSB model, after all requirements.

The product of the acceptance and efficiency in the $c\tau_{0}$ vs. $m_{\tilde{g}}$ plane for the GMSB model, after all requirements.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed and expected upper limits at $95\%$ CL on the gluino pair production cross section for a gluino GMSB model with $m_{\tilde{g}}=2400$ GeV. The one (two) standard deviation variation in the expected limit is shown in the inner green (outer yellow) band. The blue solid line shows the observed limit obtained by the CMS displaced jet search

The observed and expected upper limits at $95\%$ CL on the gluino pair production cross section for a gluino GMSB model with $m_{\tilde{g}}=2400$ GeV. The one (two) standard deviation variation in the expected limit is shown in the inner green (outer yellow) band. The blue solid line shows the observed limit obtained by the CMS displaced jet search

The distribution (normalized to unity) of number of ECAL cells hit in the jet for jets in a background enriched data sample (satisfying $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets satisfying signal region requirements (except those on $E_{\mathrm{ECAL}}$ and $N^{\mathrm{cell}}_{\mathrm{ECAL}}$).

The distribution (normalized to unity) of number of ECAL cells hit in the jet for jets in a background enriched data sample (satisfying $|\eta| < 1.48$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets satisfying signal region requirements (except those on $E_{\mathrm{ECAL}}$ and $N^{\mathrm{cell}}_{\mathrm{ECAL}}$).

The distribution (normalized to unity) of $\mathrm{HEF}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} < 1/12$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $\mathrm{HEF}$).

The distribution (normalized to unity) of $\mathrm{HEF}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $p_\mathrm{T}tf < 0.08$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $\mathrm{HEF}$).

The distribution (normalized to unity) of $E_{\mathrm{HCAL}}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} < 1/12$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $E_{\mathrm{HCAL}}$).

The distribution (normalized to unity) of $E_{\mathrm{HCAL}}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $p_\mathrm{T}tf < 0.08$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $E_{\mathrm{HCAL}}$).

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $PV_{\rm track}^{\rm fraction}$ for a data sample enriched in main bunch backgrounds (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $|t_{\mathrm{jet}}| < 3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} >20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $PV_{\rm track}^{\rm fraction}$).

The distribution (normalized to unity) of $p_\mathrm{T}tf$ for a data sample enriched in main bunch backgrounds (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $|t_{\mathrm{jet}}| < 3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} >20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $p_\mathrm{T}tf$).

The distribution (normalized to unity) of $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$ for a data sample enriched in beam halo (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} < 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$)

The distribution (normalized to unity) of $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$ for a data sample enriched in beam halo (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} < 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$)

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$).

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset with no cleaning selection applied (a) and after all jet cleaning selections are applied (b) in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} > 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 1/12$ to enrich the sample in those originating from main and satellite bunch backgrounds. The cleaning selections are shown to reduce the backgrounds by many orders of magnitude.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset with no cleaning selection applied (a) and after all jet cleaning selections are applied (b) in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} > 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 0.08$ to enrich the sample in those originating from main and satellite bunch backgrounds. The cleaning selections are shown to reduce the backgrounds by many orders of magnitude.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} < 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 1/12$ to enrich the sample in those originating from main and satellite bunch backgrounds (all other jet cleaning selections are applied). Clear contributions from jets from satellite bunch collisions can be seen peaked around -5, 5 and 10 ns.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} < 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 0.08$ to enrich the sample in those originating from main and satellite bunch backgrounds (all other jet cleaning selections are applied). Clear contributions from jets from satellite bunch collisions can be seen peaked around -5, 5 and 10 ns.

Contribution to the delayed time of jets from the $\beta$ of the gluino is plotted against the delay contribution from the difference (assuming straight line paths) between the path taken by the gluino and the particle forming the jet from the path length for a particle travelling directly to the same position on the ECAL barrel for gluino $c\tau_{0} = 10$ m and mass of 1000 Gev (top) and 3000 GeV (bottom). The dominant contribution is shown to be the gluino $\beta$.

Contribution to the delayed time of jets from the $\beta$ of the gluino is plotted against the delay contribution from the difference (assuming straight line paths) between the path taken by the gluino and the particle forming the jet from the path length for a particle travelling directly to the same position on the ECAL barrel for gluino $c\tau_{0} = 10$ m and mass of 1000 Gev (top) and 3000 GeV (bottom). The dominant contribution is shown to be the gluino $\beta$.

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=1000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=1000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=2400$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=2400$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=3000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=3000$ and various proper decay lengths

The observed upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{-}_{L}$

Impact of groups of uncertainties on charge asymmetry versus $|y_{W}|$ for $W_{L}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}_{L}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{-}_{R}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}_{L}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{-}_{L}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{-}_{R}$

Impact of groups of uncertainties on charge asymmetry versus $|y_{W}|$ for $W_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on unpolarized charge asymmetry versus $|y_{W}|$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on $A_{4}$ coefficient versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on $A_{4}$ coefficient versus $|y_{W}|$ for $W^{+}$

Correlation matrix among normalized signal cross sections in the helicity fit, for combination of muon and electron channel. The cross sections are shown in Fig. 9 in paper

Correlation matrix among normalized signal cross sections in the helicity fit, for combination of muon and electron channel. The cross sections are shown in Fig. 9 in paper

Correlation matrix among PDF nuisances parameters in the helicity fit with fixed signal cross sections, for combination of muon and electron channel. The postfit values for these nuisance parameters are shown in Fig. 20 in paper

Postfit pulls and constraints for some nuisance parameters: $p_T^{W}$ binned $\mu_R$, $\mu_F$, $\mu_R\mu_F$ for $W_R$

Postfit pulls and constraints for some nuisance parameters: $p_T^{W}$ binned $\mu_R$, $\mu_F$, $\mu_R\mu_F$ for $W_L$

Postfit pulls and constraints for some nuisance parameters: PDFs and $\alpha_S$

Postfit pulls and constraints for all nuisance parameters in the W boson helicity fit with fixed signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Postfit pulls and constraints for all nuisance parameters in the W boson helicity fit with floating signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured fiducial cross sections and ratio from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Impact of groups of uncertainties on charge asymmetry versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on charge asymmetry versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Postfit pulls and constraints for all nuisance parameters in the W boson double-differential cross section fit with floating signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt