Impact of different components of systematic uncertainty on the measured fiducial cross section, without taking into account correlations. The impact of one source of systematic uncertainty is computed by first performing the fit with the corresponding nuisance parameter fixed to one standard deviation up or down from the value obtained in the nominal fit, then these up and down variations are symmetrized. The impacts of several sources of systematic uncertainty are added in quadrature for each component. The categorization of sources of systematic uncertainties into experimental and theory modeling correspond to those used for the measured fiducial cross section.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dijet invariant mass, $m_{jj}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dilepton invariant mass, $m_{ll}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Statistical correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Total correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

List of experimentally considered systematic uncertainties for the WW cross section measurement.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $p_\text{T}^{\text{lead }\ell}$.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $m_{e\mu}$.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $p_{T}^{e\mu}$.

Observed top-quark mass distribution and expected background in Region A after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region B after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region C after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region D after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region SR1 Medium 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Medium 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Tight 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Tight 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Medium 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Medium 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Tight 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Tight 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Expected and observed upper limits on the cross-section times branching fraction of topcolor-assisted-technicolor Z$^{\prime}_{TC2}$ decaying into top-quark pair as a function of the Z$^{\prime}_{TC2}$ mass.

Expected and observed upper limits on the cross-section times branching fraction of A1 axial-vector mediator decaying into top-quark pair as a function of the mediator mass.

Expected and observed upper limits on the cross-section times branching fraction of V1 vector mediator decaying into top-quark pair as a function of the mediator mass.

Expected and observed upper limits on the cross-section times branching fraction of Kaluza-Klein graviton decaying into top-quark pair as a function of the graviton mass.

Expected and observed upper limits on the cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the gluon mass.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 0.5 TeV.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 1 TeV.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 1.5 TeV.

Expected upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 2 TeV.

Expected upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 5 TeV.

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 50$< p_{T}^{4l} <$100 GeV

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 100$< p_{T}^{4l} <$600 GeV

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.0$< y_{4l} <$0.4

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.4$< y_{4l} <$0.8

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.8$< y_{4l} <$1.2

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 1.2$< y_{4l} <$2.5

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$<$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$>$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $\mu\mu\mu\mu$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $eeee$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $ee\mu\mu$ events

Systematic covariance matrix for the differential $m_{4l}$ distribution.

Statistical covariance matrix for the differential $m_{4l}$ distribution.

Background covariance matrix for the differential $m_{4l}$ distribution.

Systematic covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution.<br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Statistical covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Background covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Systematic covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Statistical covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Background covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Systematic covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Statistical covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Background covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Systematic covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Statistical covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Background covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Lower mass requirement for signal regions.

Lower mass requirement for signal regions.

Lower mass requirement for signal regions.

Expected and observed events in the 16 discovery regions along with the according control regions.

Expected and observed events in the 16 discovery regions along with the according control regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector R-hadron search.

p0-values and model-independent upper limits on cross-section x acceptance x efficiency for the 16 discovery regions.

p0-values and model-independent upper limits on cross-section x acceptance x efficiency for the 16 discovery regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic search for metastable gluino R-hadrons.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic search for metastable gluino R-hadrons.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector direct-stau search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector direct-stau search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector chargino search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector chargino search.

Upper cross-section limit in gluino R-hadron search.

Upper cross-section limit in gluino R-hadron search.

Upper cross-section limit in sbottom R-hadron search.

Upper cross-section limit in sbottom R-hadron search.

Upper cross-section limit in stop R-hadron search.

Upper cross-section limit in stop R-hadron search.

Upper cross-section limit in stau search.

Upper cross-section limit in stau search.

Upper cross-section limit in chargino search.

Upper cross-section limit in chargino search.

Lower mass limit as function of gluino lifetime.

Lower mass limit as function of gluino lifetime.

Acceptance x efficiency, acceptance and efficiency for the full range of simulated masses in the MS-agnostic R-hadron search.

Acceptance x efficiency, acceptance and efficiency for the full range of simulated masses in the MS-agnostic R-hadron search.

Upper cross-section limit in meta-stable gluino R-hadron search.

Upper cross-section limit in meta-stable gluino R-hadron search.

Flavor composition of 800 GeV stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

ETmiss trigger efficiency as function of true ETmiss (EtmissTurnOn).

ETmiss trigger efficiency as function of true ETmiss (EtmissTurnOn).

Single-muon trigger efficiency as function of $|\eta|$ and $\beta$ (SingleMuTurnOn).

Single-muon trigger efficiency as function of $|\eta|$ and $\beta$ (SingleMuTurnOn).

Candidate reconstruction efficiency for ID+Calo selection (IDCaloEff).

Candidate reconstruction efficiency for ID+Calo selection (IDCaloEff).

Candidate reconstruction efficiency for loose selection (LooseEff).

Candidate reconstruction efficiency for loose selection (LooseEff).

Efficiency for a loose candidate to be promoted to a tight candidate (TightPromotionEff).

Efficiency for a loose candidate to be promoted to a tight candidate (TightPromotionEff).

Resolution and average of reconstructed dE/dx mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed dE/dx mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for FullDet candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for FullDet candidates.

Ratio of unfolded width of azimuthal angular correlation distributions (P PB/ P P). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Ratio of unfolded Dijet conditional yields (P PB/ P P). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Unfolded width of azimuthal angular correlation distributions (Delta p_{T} > 3). Full markers represent p+Pb, open markers p+p

Unfolded Dijet conditional yields (Delta p_{T} > 3). Full markers represent p+Pb, open markers p+p

Ratio of unfolded width of azimuthal angular correlation distributions (P PB/ P P) (Delta p_{T} > 3). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Ratio of unfolded Dijet conditional yields (P PB/ P P) (Delta p_{T} > 3). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Unfolded azimuthal angular correlation distributions. Black markers represent p+Pb, red markers p+p

Unfolded azimuthal angular correlation distributions (Delta p_{T} > 3). Black markers represent p+Pb, red markers p+p

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Measured ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

List of relative uncertainties in the measured cross sections of the $t\bar{t}Z$ and $t\bar{t}W$ processes from the fit, grouped in categories. All uncertainties are symmetrized. The sum in quadrature may not be equal to the total due to correlations between uncertainties introduced by the fit.

The expected and observed 68% and 95% confidence intervals, which include the value 0, for $\mathcal{C}_{i}/\Lambda^{2}$ for the EFT coefficients $\mathcal{C}_{\phi Q}^{(3)}$, $\mathcal{C}_{\phi t}$, $\mathcal{C}_{tB}$ and $\mathcal{C}_{tW}$. The intervals for $\mathcal{C}_{\phi Q}^{(3)}$ are derived setting $\mathcal{C}_{\phi Q}^{(1)}$ to zero; the measurement is sensitive to the difference $\mathcal{C}_{\phi Q}^{(3)}-\mathcal{C}_{\phi Q}^{(1)}$. All results are given in units of 1/TeV$^{2}$. Limits from fits for the EFT coefficients with only the linear term are also shown.

Data and SM predictions in SRs for the $1lb\bar{b}$ analysis for $E_{\mathrm{T}}^{\mathrm{miss}}$ in SR1Lbb-Medium. All SRs selections but the one on the quantity shown are applied. All uncertainties are included in the uncertainty band. Example SUSY models are superimposed for illustrative purposes.

Distributions of $m_{\gamma\gamma}$ before the final requirement on $m_{\gamma\gamma}$ in SR1Lyy-a. The expected contributions from both the peaking and non-peaking backgrounds are shown as stacked colored histograms. Two example SUSY models are superimposed for illustrative purposes.

Distributions of $m_{\gamma\gamma}$ before the final requirement on $m_{\gamma\gamma}$ in SR1Lyy-b. The expected contributions from both the peaking and non-peaking backgrounds are shown as stacked colored histograms. Two example SUSY models are superimposed for illustrative purposes.

Observed and predicted distributions for $m_{jj}$ in SRSS-j1. All SRs selections but the one on the quantity shown are applied. All uncertainties are included in the uncertainty band. An example SUSY model is superimposed for illustrative purposes.

Observed and predicted distributions for $m_{T2}$ in SRSS-j23. All SRs selections but the one on the quantity shown are applied. All uncertainties are included in the uncertainty band. An example SUSY model is superimposed for illustrative purposes.

The observed exclusion for the $0lb\bar{b}$ channel. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The expected exclusion for the $0lb\bar{b}$ channel. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The observed exclusion for the $1lb\bar{b}$ channel. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The expected exclusion for the $1lb\bar{b}$ channel. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The expected exclusion for the $1l\gamma\gamma$ channel. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The observed exclusion for the $l^{\pm}l^{\pm}$ channel. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The expected exclusion for the $l^{\pm}l^{\pm}$ channel. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $3l$ analysis for signal models with $m(\tilde{\chi}_{2}^{0}) - m(\tilde{\chi}_{1}^{0}) = 130$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $3l$ analysis for signal models with $m(\tilde{\chi}_{2}^{0}) - m(\tilde{\chi}_{1}^{0}) = 130$ GeV.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $1lb\bar{b}$ analysis for signal models with $m(\tilde{\chi}_{2}^{0}) - m(\tilde{\chi}_{1}^{0}) = 130$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $1lb\bar{b}$ analysis for signal models with $m(\tilde{\chi}_{2}^{0}) - m(\tilde{\chi}_{1}^{0}) = 130$ GeV.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $1l\gamma\gamma$ analysis for signal models with $m(\tilde{\chi}_{2}^{0}) - m(\tilde{\chi}_{1}^{0}) = 130$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $1l\gamma\gamma$ analysis for signal models with $m(\tilde{\chi}_{2}^{0}) - m(\tilde{\chi}_{1}^{0}) = 130$ GeV.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $l^{\pm}l^{\pm}$ analysis for signal models with $m(\tilde{\chi}_{2}^{0}) - m(\tilde{\chi}_{1}^{0}) = 130$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $l^{\pm}l^{\pm}$ analysis for signal models with $m(\tilde{\chi}_{2}^{0}) - m(\tilde{\chi}_{1}^{0}) = 130$ GeV.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $0lb\bar{b}$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $0lb\bar{b}$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $1lb\bar{b}$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $1lb\bar{b}$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $1l\gamma\gamma$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $1l\gamma\gamma$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $l^{\pm}l^{\pm}$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $l^{\pm}l^{\pm}$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The observed cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $3l$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

The expected cross-section exclusion as a function of the $\tilde{\chi}_{1}^{\pm}$/$\tilde{\chi}_{2}^{0}$ masses for the $3l$ analysis for signal models assuming $m(\tilde{\chi}_{1}^{0}) = 0$ GeV.

Acceptance for $0lb\bar{b}$ SRHad-Low signal region. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $0lb\bar{b}$ SRHad-Low signal region.

Acceptance for $0lb\bar{b}$ SRHad-High signal region. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $0lb\bar{b}$ SRHad-High signal region.

Upper cross section limits for the $0lb\bar{b}$ analysis.

Acceptance for $1lb\bar{b}$ SR1Lbb-Low signal region. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiency for $1lb\bar{b}$ SR1Lbb-Low signal region. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $1lb\bar{b}$ SR1Lbb-Medium signal region. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiency for $1lb\bar{b}$ SR1Lbb-Medium signal region. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $1lb\bar{b}$ SR1Lbb-High signal region. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiency for $1lb\bar{b}$ SR1Lbb-High signal region. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Upper cross section limits for the $1lb\bar{b}$ analysis.

Acceptance for $1l\gamma\gamma$ signal region SR1Lyy-a. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $1l\gamma\gamma$ signal region SR1Lyy-a.

Acceptance for $1l\gamma\gamma$ signal region SR1Lyy-b. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $1l\gamma\gamma$ signal region SR1Lyy-b.

Upper cross section limits for the $1l\gamma\gamma$ analysis.

Acceptance for $l^{\pm}l^{\pm}$ signal region SRSS-j1. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $l^{\pm}l^{\pm}$ signal region SRSS-j1. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $l^{\pm}l^{\pm}$ signal region SRSS-j23. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $l^{\pm}l^{\pm}$ signal region SRSS-j23. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $3L$ SFOS signal region SR3L-SFOS-1J. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $3L$ SFOS signal region SR3L-SFOS-1J. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $3L$ SFOS signal region SR3L-SFOS-0Ja. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $3L$ SFOS signal region SR3L-SFOS-0Ja. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $3L$ SFOS signal region SR3L-SFOS-0Jb. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $3L$ SFOS signal region SR3L-SFOS-0Jb. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $3L$ DFOS signal region SR3L-DFOS-0J. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $3L$ DFOS signal region SR3L-DFOS-0J. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $3L$ DFOS signal region SR3L-DFOS-1Ja. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $3L$ DFOS signal region SR3L-DFOS-1Ja. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Acceptance for $3L$ DFOS signal region SR3L-DFOS-1Jb. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Efficiencies for $3L$ DFOS signal region SR3L-DFOS-1Jb. Note that the acceptance is relative to the total chargino-neutralino production cross section.

Upper cross section limits for the $l^{\pm}l^{\pm}$ analysis.

Upper cross section limits for the $3l$ analysis.

Event selection cutflow for SM background (pre-fit) and representative signal samples for the $0lb\bar{b}$ SR. The masses of next-lightest-neutralinos and LSPs are reported. Only statistical uncertainties are shown. The MC statistics for the signal samples is 50K and 44K events, respectively. Samples are produced with generator filters which selects $h \rightarrow b\bar{b}$ and $W \rightarrow qq'$ decays. ``All events" for SUSY scenarios represent the total number of signal events for the models considered taking into account the BR of $W \rightarrow qq'$ (0.674) and $h \rightarrow b\bar{b}$ (0.582).

Event selection cutflow for SM background (pre-fit) and representative signal samples for the $1lb\bar{b}$ channel. The masses of next-lightest-neutralinos and LSPs are reported. Only statistical uncertainties are shown. The MC statistics for the signal samples is 28K, 29K and 29K events, respectively. Samples are produced with generator filters which selects $h \rightarrow b\bar{b}$ and $W \rightarrow l \nu$ decays. ``All events" for SUSY scenarios represent the total number of signal events for the models considered taking into account the BR of $W \rightarrow l \nu$ (0.324) and $h \rightarrow b\bar{b}$ (0.582).

Event selection cutflow is presented for SM background (pre-fit) and three signal scenarios for the $1l\gamma\gamma$ channel SRs. The masses of next-lightest-neutralinos and LSPs are reported. The uncertainties only include statistical uncertainties. The MC statistics for the signal samples is 10K events in all cases. Samples are produced with generator filters which selects $h \rightarrow \gamma\gamma$ and $W \rightarrow l \nu$ decays. The data-driven-estimated non-peaking background is not evaluated at each stage of the selection, hence only the peaking background cutflow is presented.

Event selection cutflow is presented for one signal scenario for SRSS-j23. The model with next-to-lightest neutralino mass of 175 GeV and massless $\tilde{\chi}^{0}_{1})$ with 100% BR is considered. The MC statistics for the signal samples is 75K events. Samples are produced with a generator filter which selects events with at least two leptons with $p_{\mathrm{T}} > 7$ GeV. ``2SS leptons" indicates the selection of two same-sign electrons or muons as described in the text (Section 6.4).

Event selection cutflow is presented for one signal scenario for SRSS-j1. The model with next-to-lightest neutralino mass of 175 GeV and massless $\tilde{\chi}^{0}_{1})$ with 100% BR is considered. The MC statistics for the signal samples is 75K events. Samples are produced with a generator filter which selects events with at least two leptons with $p_{\mathrm{T}} > 7$ GeV. ``2SS leptons" indicates the selection of two same-sign electrons or muons as described in the text (Section 6.4).

Event selection cut-flow is presented for one signal scenario for each signal regions. The model with next-to-lightest neutralino mass of 150 GeV and massless LSP with 100 \% BR is considered. The MC statistics for the signal samples is 123K events. Samples are produced with a generator filter which selects events with at least two leptons with pT $>$ 7 GeV. ``3L+Trigger" indicates three-lepton and trigger requirements. ``Preselection" includes the veto on bjets, ETmiss above 20 GeV and invariant mass of the three leptons above 20 GeV.

The measured normalized differential cross section as a function of the photon $|\eta|$ in the single lepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the $\Delta R$ between the photon and the lepton in the single lepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the photon pT in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the photon $|\eta|$ in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of minimum $\Delta R) between the photon and the leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of $|\Delta\eta|$ between the two leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of $\Delta\phi$ between the two leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The total correlation matrix of the measured normalized differential cross section as a function of the photon pT in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon $|\eta|$ in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $\Delta R$ between the photon and the lepton in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon pT in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon $|\eta|$ in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the minimum $\Delta R$ between the photon and the leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $|\Delta\eta|$ between the two leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $\Delta\phi$ between the two leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The statistical correlation matrix of all the measured normalized differential cross sections in the single lepton channel.

The statistical correlation matrix of all the measured normalized differential cross sections in the dilepton channel.

Expected 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Majorana $N_R$ neutrino $\mu\mu$ channel.

Observed 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Majorana $N_R$ neutrino $\mu\mu$ channel.

Observed and expected 95% CL exclusion, for the tested signal mass hypotheses in the $m_{W_R}–m_{N_R}$ plane, for the Majorana $N_R$ neutrino $\mu\mu$ channel.

Expected 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $ee$ channel.

Observed 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $ee$ channel.

Observed and expected 95% CL exclusion, for the tested signal mass hypotheses in the $m_{W_R}–m_{N_R}$ plane, for the Dirac $N_R$ neutrino $ee$ channel.

Expected 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $\mu\mu$ channel.

Observed 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $\mu\mu$ channel.

Observed and expected 95% CL exclusion, for the tested signal mass hypotheses in the $m_{W_R}–m_{N_R}$ plane, for the Dirac $N_R$ neutrino $\mu\mu$ channel.

Observed 95% CL upper limit on cross-section times branching ratio to the $ee$ final state for the Keung-Senjanovic process in the $m_{W_R}–m_{N_R}$ plane for the Majorana $N_R$ neutrino $ee$ channel.

Observed 95% CL upper limit on cross-section times branching ratio to the $\mu\mu$ final state for the Keung-Senjanovic process in the $m_{W_R}–m_{N_R}$ plane for the Majorana $N_R$ neutrino $\mu\mu$ channel.

Observed 95% CL upper limit on cross-section times branching ratio to the $\mu\mu$ final state for the Keung-Senjanovic process in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $ee$ channel.

Observed 95% CL upper limit on cross-section times branching ratio to the $\mu\mu$ final state for the Keung-Senjanovic process in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $\mu\mu$ channel.

Efficiencies times acceptance for signal region selection as a function of the signal $W_R$ and $N_R$ masses for the SS $e^{\pm}e^{\pm}$ channel.

Efficiencies times acceptance for signal region selection as a function of the signal $W_R$ and $N_R$ masses for the SS $\mu^{\pm}\mu^{\pm}$ channel.

Efficiencies times acceptance for signal region selection as a function of the signal $W_R$ and $N_R$ masses for the OS $e^{\pm}e^{\mp}$ channel.

Efficiencies times acceptance for signal region selection as a function of the signal $W_R$ and $N_R$ masses for the OS $\mu^{\pm}\mu^{\mp}$ channel.

The observed and expected 95% CL upper limits on model-independent visible cross-sections, along with the observed $p0$ values, for the stable signal region, as a function of different mass windows, for which the lower bound is shown. The upper boundary on the mass window is 5 TeV for all windows.

The observed and expected 95% CL upper limits on model-independent visible cross-sections, along with the observed $p0$ values, for the metastable signal region, as a function of different mass windows, for which the lower bound is shown. The upper boundary on the mass window is 5 TeV for all windows.

For each gluino lifetime and mass in the signal samples, the lower boundary of the mass window in which at least $70\%$ of the reconstructed signal appears. The upper boundary for all mass windows is 5 TeV.

Acceptance and efficiency for a representative set of pair-produced gluino signal samples. The mass of the gluino ($m(\tilde{g})$), its lifetime ($\tau(\tilde{g})$) and the mass of the neutralino ($m(\tilde{\chi}^{0})$) are given in the first three columns. The Pythia 6.4.27 signal samples shown in this table are not reweighted to match the transverse momentum of the gluino-gluino system as simulated by MadGraph5_aMC@NLO. The acceptance is defined as the fraction of events passing a loose set of fiducial requirements. The full simulation efficiency (Full sim. $\epsilon$) is defined as the ratio of the number of reconstructed events, as expected by the full ATLAS simulation, and the number of events passing the fiducial requirements. The parameterised simulation efficiency (Param. sim. $\epsilon$) is defined as the ratio of the number of events estimated using a set of parametrised efficiencies (see auxiliary Figures 9,10,11,12) and the number of events passing the fiducial requirements alone.

The reconstructed candidate track mass distributions for observed data, predicted background, and the expected contribution from two signal models in the metastable R-hadron signal region. The yellow band around the background estimation includes both the statistical and systematic uncertainties.

The reconstructed candidate track mass distributions for observed data, predicted background, and the expected contribution from two signal models in the stable R-hadron signal region. The yellow band around the background estimation includes both the statistical and systematic uncertainties.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 10$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for stable gluino $R$-hadrons, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

Observed 95% lower limits on the gluino mass in the gluino lifetime--mass plane. The excluded area is to the left of the curves.

Expected 95% lower limits on the gluino mass in the gluino lifetime--mass plane. The excluded area is to the left of the curves.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 1$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 3$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 30$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 50$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The relationship between generated and reconstructed mass for gluino $R$-hadrons. Above 1500 GeV, the reconstructed mass falls below the generated mass due to bias in the reconstructed momentum. The uncertainty on the reconstructed mass is dominated by momentum uncertainty. The black dots represent the reconstructed mass computed as the most probable value of a Gaussian fit function, with the error bars showing its statistical uncertainty, while the orange band is the full-width at half maximum of the reconstructed mass distribution.

The parameterised efficiency for events to pass metastable event selections (including trigger, E$_{T}^{miss}$, and event cleaning requirements) as a function of the true E$_{T}^{miss}$ in the system, which is calculated at generator level. Event-level efficiencies are evaluated for events which have at least true E$_{T}^{miss} > 50$ GeV. The metastable event efficiencies are evaluated for different radial regions depending on the smallest radial distance, R, at which an R-hadron decays in the detector.

The parameterised efficiency for events to pass metastable event selections (including trigger, E$_{T}^{miss}$, and event cleaning requirements) as a function of the true E$_{T}^{miss}$ in the system, which is calculated at generator level. Event-level efficiencies are evaluated for events which have at least true E$_{T}^{miss} > 50$ GeV. The stable event efficiencies are evaluated for samples in which no R-hadron decays within the detector.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$. The stable efficiency is evaluated for samples which do not decay within the detector. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

Expected and observed upper limits on $\tan\beta$ as a function of $m_{H^{+}}$ in the hMSSM scenario of the MSSM. Limits are shown for $\tan\beta$ values in the range of 0.5-60, where predictions are available from both scenarios. The bands surrounding the expected limits show the 68% and 95% confidence intervals. The limits are based on the combination of the $\ell+$jets and $\ell\ell$ final states. The production cross-section of $t\bar{t}H$ and $tH$, as well as the branching ratios of the $H$, are fixed to their SM values at each point in the plane. Uncertainties on the predicted $H^{+}$ cross-sections or branching ratios are not considered.

Expected and observed lower limits on $\tan\beta$ as a function of $m_{H^{+}}$ in the hMSSM scenario of the MSSM. Limits are shown for $\tan\beta$ values in the range of 0.5-60, where predictions are available from both scenarios. The bands surrounding the expected limits show the 68% and 95% confidence intervals. The limits are based on the combination of the $\ell+$jets and $\ell\ell$ final states. The production cross-section of $t\bar{t}H$ and $tH$, as well as the branching ratios of the $H$, are fixed to their SM values at each point in the plane. Uncertainties on the predicted $H^{+}$ cross-sections or branching ratios are not considered.

Expected 95% CL exclusion contour in the tan$\beta$ - $m_H$ plane shown in the context of the hMSSM, for the regions in which theoretical predictions are available (0.5$\leq\text{tan}\beta\leq60$).

Observed a95% CL exclusion contour in the tan$\beta$ - $m_H$ plane shown in the context of the $m_{H}^{mod-}$ scenario, for the regions in which theoretical predictions are available (0.5$\leq\text{tan}\beta\leq60$).

Expected 95% CL exclusion contour in the tan$\beta$ - $m_H$ plane shown in the context of the $m_{H}^{mod-}$ scenario, for the regions in which theoretical predictions are available (0.5$\leq\text{tan}\beta\leq60$).

The systematic uncertainty on the unfolded distribution as a function of minimax-mbl, broken down by components.

The covariance matrix for the unfolded, normalized data in bins of minimax-mbl shown in Figure 2. Redundant entries are suppressed.

Leading lepton transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading lepton transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading lepton pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading lepton pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading b-jet transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading b-jet transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading b-jet pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading b-jet pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

The detector-level minimax-m(bl) distribution for events entering the Z+jets control region.

The detector-level minimax-m(bl) distribution for events entering the same-sign lepton control region.

Exclusion limits on higgsino pair production divided by the theory cross-section.The results of the low-mass analysis are used below m(higgsino) = 300 GeV, while those of the high-mass analysis are used above. The figure shows the observed and expected 95% upper limits on the higgsino pair production cross-section as a function of m(higgsino).

Observed and expected 95% limits in the m(higgsino) vs BR(higgsino to higgs+gravitino) plane. The regions above the lines are excluded by the analyses.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the high-mass search. Only the high-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the high-mass search, divided by the theory cross section. Only the high-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the low-mass search. Only the low-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the low-mass search, divided by the theory cross section. Only the low-mass analysis results are used in this figure.

Particle-level acceptance for the low-mass discovery signal regions low-SR-MET0-meff440 and low-SR-MET150-meff440, shown as a function of higgsino mass. The acceptance is defined as the fraction of signal events passing the particle-level event selection that emulates the detector-level selection. The acceptance calculation considers only those signal events where both higgsinos decay to Higgs bosons that subsequently both decay to b-quarks.

The experimental efficiency of the low-mass analysis, for the two discovery signal regions low-SR-MET0-meff440 and low-SR-MET150-meff440, as a function of higgsino mass. The experimental efficiency is defined as the number of events passing the detector-level event selection divided by the number of events passing the event selection for a perfect detector. The denominator is obtained by implementing particle-level event selection that emulate the detector-level selection. Such particle-level selection is not applied on the numerator.

Particle-level acceptance for the high-mass discovery signal regions SR-4b-meff1-A-disc and SR-3b-meff3-A, shown as a function of higgsino mass. The acceptance is defined as the fraction of signal events passing the particle-level event selection that emulates the detector-level selection. The acceptance calculation considers only those signal events where both higgsinos decay to Higgs bosons that subsequently both decay to b-quarks.

The experimental efficiency of the high-mass analysis, for the two discovery signal regions SR-4b-meff1-A-disc and SR-3b-meff3-A, as a function of higgsino mass. The experimental efficiency is defined as the number of events passing the detector-level event selection divided by the number of events passing the event selection for a perfect detector. The denominator is obtained by implementing particle-level event selection that emulate the detector-level selection. Such particle-level selection is not applied on the numerator.

Example cutflow for SR-3b-meff3-A.

Example cutflow for SR-4b-meff1-A-disc.

Cutflow for low-mass analysis for each signal mass point.

Observed and expected dilepton mass distributions, with the bin boundaries considered for the interpretation, in SRC of the low-pT edge search. All statistical and systematic uncertainties of the expected background are included in the hatched band. An example signal from the $Z^{*}$ model with m(gluino) = 1000 GeV and m(neutralino1) = 900 GeV is overlaid.

Observed and expected dilepton mass distributions, with the bin boundaries considered for the interpretation, in SRC-MET of the low-pT edge search. All statistical and systematic uncertainties of the expected background are included in the hatched band. An example signal from the $Z^{*}$ model with m(gluino) = 1000 GeV and m(neutralino1) = 900 GeV is overlaid.

Observed 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Expected 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Observed 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Expected 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Observed 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Expected 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Observed 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Expected 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the gluino and next-to-lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the gluino and next-to-lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the squark and next-to-lightest neutralino masses in a SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the squark and next-to-lightest neutralino masses in a SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and the lightest neutralino.

Acceptance and efficiency in the on-Z bin for SR-medium for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Acceptance and efficiency in the on-Z bin for SR-high for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-low for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-medium for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-high for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SRC for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SRC-MET for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the signal regions, in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the low-p$_{T}$ signal regions, in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the signal regions, in a SUSYscenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the low-p$_{T}$ signal regions, in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson.

Cutflow table for three benchmark signal points from the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, with m(gluino) = 1395 GeV and m(neutralino2) = 505 GeV, m(gluino) = 920 GeV and m(neutralino2) = 230 GeV and m(gluino) = 940 GeV and m(neutralino2) = 660 GeV, in the on-$Z$ $m_{ll}$ bins of SR-medium and SR-high for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow table for a signal point from the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, with m(gluino) = 1000 GeV and m(neutralino1) = 800 GeV, m(gluino) = 1200 GeV and m(neutralino1) = 500 GeV and m(gluino) = 1400 GeV and m(neutralino1) = 100 GeV, in all m_{ll}$ bins of SR-low, SR-medium and SR-high for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow table for a signal point from the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, with m(gluino) = 600 GeV and m(neutralino1) = 560 GeV and m(gluino) = 1000 GeV and m(neutralino1) = 960 GeV, in all $m_{ll}$ bins of SRC and SRC-MET for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, corresponding to the SR determined to give the best expected limit for a given signal point.

Low-$p_{T}$ signal region used to derive the exclusion limit in the compressed region for the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Low-$p_{T}$ signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Dijet mass spectra after the background only fit with the background prediction in the high-mass region with two b-tags.

Dijet mass spectra after the background only fit with the background prediction in the low-mass region with two b-tags.

The online b-tagging efficiency with respect to the offline b-tagging efficiency as a function of pT. The b-tagging online and offline working points correspond to an efficiency of 60% and 70%, respectively.

Observed and expected 95% credibility-level upper limits on the cross-section for the b* model in the high-mass region with inclusive b-jet selection.

Observed and expected 95% credibility-level upper limits on the cross-section times branching ratio for the SSM and leptophobic Z' models in the low- and high-mass region with two b-tags selection.

Observed and expected 95% credibility-level upper limits on the cross-section for DM Z' models in the low-mass region with two b-tags selection. The Z' is expected to decay to all five quark flavors other than the top quark and the mediator to SM quark coupling (gSM) equal to 0.1 is assumed.

Observed and expected 95% credibility-level upper limits on the cross-section times branching ratio for DM Z'->bb models in the high-mass region with two b-tags selection. The Z' is expected to decay to bb only and the mediator to SM quark coupling (gSM) equal to 0.25 is assumed.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances with intrinsic width smaller than the detector resolution. The width of the Gaussian reconstructed shape is dominated by the dijet mass resolution. The table shows the limits obtained from the high-mass inclusive one b-tag selection.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances with intrinsic width smaller than the detector resolution. The width of the Gaussian reconstructed shape is dominated by the dijet mass resolution. The table shows the limits obtained from the combined low- and high-mass two b-tags selection.

The mass distributions for the inclusive one b-tagged selection and two b-tagged selection using an integrated luminosity of 36.1 $fb^{-1}$. The inclusive one b-tagged Pythia8 MC distribution is normalized to the inclusive one b-tagged data. The two b-tagged Pythia8 MC distribution is normalized to the two b-tagged data. The systematic uncertainty band is dominated by the b-tagging scale factor and the b-jet energy scale.

Signal acceptance times efficiency for inclusive 1 b-tag and 2 b-tag categories as a function of the simulated b* and the Z' masses.

Signal acceptance times efficiency for 2 b-tag categories as a function of the simulated Z' masses.

The flavor composition of the simulated dijet background as a function of dijet mass before tagging. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

The flavor composition of the simulated dijet background as a function of dijet mass with inclusive one b-tag. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

The flavor composition of the simulated dijet background as a function of dijet mass with two b-tags. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 3%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 7%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 10%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 15%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 3%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 7%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 10%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 15%.

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Acceptance for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

The observed and expected 95% CL upper limits on the production cross section times branching ratio for SM non-resonant Higgs pair production.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 4-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 5-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 5-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 5-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Covariance matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Systematic uncertanties for the absolute differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t,had}$ in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t,had}$ in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t,had}$ in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t,had}$ in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t,had}$ in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t,had}$ in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Reconstructed mtb distribution in data and for the background after the fit to the data in the signal region SR2. The statistical uncertainty on data points is calculated using assymetric Poisson confidence intervals.

Reconstructed mtb distribution in data and for the background after the fit to the data in the signal region SR3. The statistical uncertainty on data points is calculated using assymetric Poisson confidence intervals.

Reconstructed mtb distribution in data and for the background after the fit to the data in the validation region VR. The statistical uncertainty on data points is calculated using assymetric Poisson confidence intervals.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.

Measured cross sections for isolated-photon plus jet production as a function of $m^{\gamma-\rm jet}$.

Measured cross sections for isolated-photon plus jet production as a function of $|\cos\theta^{\star}|$.

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon1,Photon2).

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon1,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon2,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon1,Photon2)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon1,Photon3)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon2,Photon3)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon2).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon2,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon2,Photon3).

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.