Fiducial Upsilon(3S) production cross-section, where pT>4 GeV and |eta|<2.3 for both muons, as a function of Upsilon(3S) pT in the Upsilon(3S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Fiducial Upsilon(nS) production cross-section, where pT>4 GeV and |eta|<2.3 for both muons, as a function of Upsilon(nS) rapidity (|y|) in Upsilon(nS) PT ranging from 0 - 70 GeV. The first uncertainty is statistical, the second is systematic.

Inclusive Upsilon(1S) production cross-section as a function of Upsilon(1S) pT in the Upsilon(1S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(2S) production cross-section as a function of Upsilon(2S) pT in the Upsilon(2S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(3S) production cross-section as a function of Upsilon(3S) pT in the Upsilon(3S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(nS) production cross-section as a function of Upsilon(nS) rapidity (|y|) in Upsilon(nS) PT ranging from 0 - 70 GeV. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Ratio of Upsilon(2S) to Upsilon(1S) inclusive cross-section as a function of Upsilon pT in the Upsilon rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Ratio of Upsilon(3S) to Upsilon(1S) inclusive cross-section as a function of Upsilon pT in the Upsilon rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Ratio of Upsilon(2S) and Upsilon(3S) to Upsilon(1S) inclusive cross-section as a function of Upsilon rapidity (|y|) in Upsilon pT 0 - 70 GeV. The first uncertainty is statistical, the second is systematic.

Inclusive muon cross section from W+->mu+nu simulated with MC with CTEQ6.6 pdf set for |eta| < 2.5 and pT > 4 GeV: the error shown is due to the MC statistics.

Inclusive muon cross section from W-->mu-nu simulated with MC with CTEQ6.6 pdf set for |eta| < 2.5 and pT > 4 GeV: the error shown is due to the MC statistics.

Inclusive muon cross section from Z->mu+mu- simulated with MC with CTEQ6.6 pdf set for |eta| < 2.5 and pT > 4 GeV (the Z is defined as Z/gamma* with m_ll > 60 GeV): the error shown is due to the MC statistics.

Inclusive muon cross section from backgrounds: Z->tau tau, ttbar, Drell-Yan->mu+mu- (Drell-Yan is defined as Z/gamma* with m_ll < 60 GeV) simulated with Pythia with MRSTLO* pdf set for |eta| < 2.5 and pT > 4 GeV: the error shown is due to the MC statistics.

Inclusive muon cross section from bbar+ccbar production and decays simulated with FONLL with CTEQ6.6 pdf set for |eta| < 2.5 and pT > 4 GeV: the error shown is the uncertainty due to scale variation, alpha_s+pdf using CTEQ6.6 error set and the heavy quark masses.

Inclusive muon cross section from bbar+ccbar simulated with FONLL removing the resummation term with CTEQ6.6 pdf set for |eta| < 2.5 and pT > 4 GeV?.

Inclusive muon cross section for |eta| < 2.0 excluding 1.37 < |eta| < 1.52 and pT > 4 GeV: (stat) statistical error, (sys) systematic error. The first systematic error is the intrinsic error of the measurement, the second is the error due to the luminosity.

Inclusive muon cross section after subtraction of W,Z, Drell-Yan and top background for |eta| < 2.0 excluding 1.37 < |eta| < 1.52 and pT > 4 GeV: (stat): statistical error, (sys): systematic error. The first systematic error is the intrinsic error of the measurement, the second the error due to the luminosity, the third is due to the subtraction of the background and is dominated by the error on the W, Z inclusive cross sections.

Inclusive muon cross section from W+->mu+nu simulated with MC with CTEQ6.6 pdf set for |eta| < 2.0 excluding 1.37 < |eta| < 1.52 and pT > 4 GeV: the error shown is due to the MC statistics.

Inclusive muon cross section from W-->mu-nu simulated with MC with CTEQ6.6 pdf set for |eta| < 2.0 excluding 1.37 < |eta| < 1.52 and pT > 4 GeV: the error shown is due to the MC statistics.

Inclusive muon cross section from Z->mu+mu- simulated with MC with CTEQ6.6 pdf set for |eta| < 2.0 excluding 1.37 < |eta| < 1.52 and pT > 4 GeV (the Z is defined as Z/gamma* with m_ll > 60 GeV): the error shown is due to the MC statistics.

Inclusive muon cross section from backgrounds: Z->tau tau, ttbar, Drell-Yan->mu+mu- (Drell-Yan is defined as Z/gamma* with m_ll < 60 GeV) simulated with Pythia with MRSTLO* pdf set for |eta| < 2.0 excluding 1.37 < |eta| < 1.52 and pT > 4 GeV: the error shown is due to the MC statistics.

Inclusive muon cross section from bbar+ccbar production and decays simulated with FONLL with CTEQ6.6 pdf set for |eta| < 2.0 excluding 1.37 < |eta| < 1.52 and pT > 4 GeV: the error shown is the uncertainty due to scale variation, alpha_s+pdf using CTEQ6.6 error set and the heavy quark masses.

Inclusive muon cross section from bbar+ccbar simulated with FONLL removing the resummation term with CTEQ6.6 pdf set for |eta| < 2.0 excluding 1.37 < |eta| < 1.52 and pT > 4 GeV.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $N_\mathrm{jets}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $N_\mathrm{jets}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $N$($b$-jets). Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate. For the meaning of the bins please refer to the figure.

Measured differential cross section with associated uncertainties as a function of $N$($b$-jets). Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate. For the meaning of the bins please refer to the figure.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $m_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $m_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Observed statistical correlations, evaluated with a bootstrapping technique, between $p_\mathrm{T}^{\gamma\gamma}$, $N_\mathrm{jets}$, $m_{jj}$, $\Delta\phi_{jj}$, and $p_\mathrm{T}^{j1}$

Observed statistical correlations, evaluated with a bootstrapping technique, between $p_\mathrm{T}^{\gamma\gamma}$, $N_\mathrm{jets}$, $m_{jj}$, $\Delta\phi_{jj}$, and $p_\mathrm{T}^{j1}$

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N_\mathrm{jets}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N_\mathrm{jets}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N$($b$-jets).

Post-fit correlation matrix for the differential cross section measured as a function of $N$($b$-jets).

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$ in the VBF fiducial region.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$ in the VBF fiducial region.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. The bins are the same as in the corresponding plot of the differential cross section.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$.

Measured differential cross section with associated uncertainties as a function of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $|y_{\gamma\gamma}|$.

Post-fit correlation matrix for the differential cross section measured as a function of $|y_{\gamma\gamma}|$.

Measured differential cross section with associated uncertainties as a function of $m_{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $m_{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{\gamma\gamma j}$.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{\gamma\gamma j}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma j}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma j}$.

Measured differential cross section with associated uncertainties as a function of $H_{T}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $H_{T}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $H_{T}$.

Post-fit correlation matrix for the differential cross section measured as a function of $H_{T}$.

Measured differential cross section with associated uncertainties as a function of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\tau_{C,j1}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\tau_{C,j1}$.

Measured differential cross section with associated uncertainties as a function of $\sum\tau_{C,j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\sum\tau_{C,j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\sum\tau_{C,j}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\sum\tau_{C,j}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$.

Post-fit correlation matrix for the differential cross section measured as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. The bins are the same as in the corresponding plot of the differential cross section.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. The bins are the same as in the corresponding plot of the differential cross section.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. The bins are the same as in the corresponding plot of the differential cross section.

Post-fit correlation matrix for the differential cross section measured as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $|\eta^*|$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $|\eta^*|$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $|\eta^*|$ in the VBF fiducial region.

Post-fit correlation matrix for the differential cross section measured as a function of $|\eta^*|$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in the VBF fiducial region.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. The bins are the same as in the corresponding plot of the differential cross section.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. The bins are the same as in the corresponding plot of the differential cross section.

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SHAPE COEFFICIENTS.

SHAPE COEFFICIENTS FOR POLARIZATION.

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Measured value of TT and LT polarized cross sections extracted from the data.

Values of r_04_00 and r_1_1-1 extracted from the angular distributions.

The measured fiducial cross section vs $E_{\mathrm{T}}^\gamma$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate prior to any fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of all Higgs boson candidates with reconstructed $p_T^H$ in the various bins of the dilepton (left), single-lepton resolved (middle) and boosted (right) channels.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of all Higgs boson candidates with reconstructed $p_T^H$ in the various bins of the dilepton (left), single-lepton resolved (middle) and boosted (right) channels.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.