SIMILARLY AS WELL IN PREVIOUS TABLE FOR EACH AN EVENT THE SECOND MOMENT OF PSEUDORAPIDITY WAS OBTAINED. TABLE PRESENTS DISTRIBUTIONS OF TOPOLOGY CROSS SECTIONS UPON THE DISPERSION.

DISTRIBUTION OF AVERAGED WITHIN EACH A TOPOLOGY MEAN PSEUDORAPIDITIES , DEFINED IN TABLE 3 , UPON DIFFERENT TOPOLOGIES.

DISTRIBUTION OF AVERAGED WITHIN EACH A TOPOLOGY DISPERSION (SEE TABLE 4) UPON DIFFERENT TOPOLOGIES.

IN THIS TABLE 'DETARAP' MEANS THE SMALLEST STEP IN PSEUDORAPIDITY DISTRIBUTION BETWEEN NEIGHBOUR PARTICLES.

IN THIS TABLE 'DYRAP' MEANS THE LARGEST STEP IN RAPIDITY DISTRIBUTION BETWEEN NEIGHBOUR PARTICLES.

IN THIS TABLE 'DYRAP' MEANS THE LARGEST STEP IN RAPIDITY DISTRIBUTION BETWEEN NEIGHBOUR PARTICLES.

Expected CLs contour in the GMSB (LAMBDA, TAU(NEUTRALINO) ) signal space.

Expected CLs contour with minus 1-sigma in the GMSB (LAMBDA, TAU(NEUTRALINO) ) signal space.

Expected CLs contour with plus 1-sigma in the GMSB (LAMBDA, TAU(NEUTRALINO) ) signal space.

The total expected and observed limits on SPS8 cross-section [fb] for each signal point.

The total expected and observed limits on number of accepted signal events for each signal point.

The total normalization systematic for each signal point.

Cutflow showing the number of events passing various cuts for the $\Lambda =$ 300 TeV, $\tau =$ 2 ns GMSB SPS8 signal point.

The number of events in the signal region sub-divided into the different bins used in the limit setting procedure for the $\Lambda =$ 300 TeV, $\tau =$ 2 ns GMSB SPS8 signal point. Maximum values of $|t_\gamma| <$ 4 ns and $\Delta z_\gamma<$ 2000 mm have been applied to both photons in the event.

Distribution of ETmiss in the signal region for data and for the background predicted from the fit in the CRs. Overflows are included in the final bin.

Limits at 90% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the vector operator D5. Results where EFT truncation is applied are also shown, assuming coupling values sqrt(g_f g_chi)= 1, 4pi.

Limits at 90% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the axial-vector operator D8. Results where EFT truncation is applied are also shown, assuming coupling values sqrt(g_f g_chi)= 1, 4pi.

Limits at 90% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the tensor operator D9. Results where EFT truncation is applied are also shown, assuming coupling values sqrt(g_f g_chi)= 1, 4pi.

Upper limits at 90% C.L. on the WIMP-nucleon scattering cross section as a function of m_chi for spin-independent and spin-dependent interactions, for a coupling strength g = sqrt(g_f g_chi) of unity or the maximum value (4 pi) that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

Upper limits at 95% C.L. on the WIMP simplified model coupling parameter, sqrt(g_f g_chi), with vector coupling and mediator width Gamma=m_V/3, as a function of WIMP (m_chi) and the mediator particle (m_V) masses.

Observed lower limits at 95% C.L. on the EFT suppression scale M* as a function of the mediator mass mV, for a Z'-like mediator with vector interactions. For a dark-matter mass m_chi of 50 or 400 GeV, results are shown for different values of the mediator total decay width Gamma.

Observed lower limits at 95% C.L. on the EFT suppression scale M* as a function of the mediator mass mV, for a Z'-like mediator with axial-vector interactions. For a dark-matter mass m_chi of 50 or 400 GeV, results are shown for different values of the mediator total decay width Gamma.

Limits at 95% C.L. on the effective mass scale M* in the (k2, k1) parameter plane for the s-channel EFT model inspired by Fermi-LAT gamma-ray line, for m_chi = 130 GeV. The upper part of the plane is excluded.

Lower limits at 95% C.L. on the mass scale M_D in the ADD models of large extra dimensions, for several values of the number of extra dimensions.

Upper limits at 95% C.L. on the cross section for the compressed squark model, as a function of the squark mass, m_squark, and of the difference between the squark mass and the mass of the neutralino, m_squark-m_neutralino, in the compressed region of m_squark-m_neutralino < 50 GeV.

Number of data events (20.3 fb$^{-1}$), number of predicted events from the fit, statistical uncertainty on the fit, systematic uncertainty on the choice of control region, and on the choice of fit function versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ lower bin edge for inclusive jet multiplicity $N_{\textrm{Jet}} \geq 6$. The total uncertainty is obtained by adding the three uncertainties linearly.

Number of data events (20.3 fb$^{-1}$), number of predicted events from the fit, statistical uncertainty on the fit, systematic uncertainty on the choice of control region, and on the choice of fit function versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ lower bin edge for inclusive jet multiplicity $N_{\textrm{Jet}} \geq 7$. The total uncertainty is obtained by adding the three uncertainties linearly.

Number of data events (20.3 fb$^{-1}$), number of predicted events from the fit, statistical uncertainty on the fit, systematic uncertainty on the choice of control region, and on the choice of fit function versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ lower bin edge for inclusive jet multiplicity $N_{\textrm{Jet}} \geq 8$. The total uncertainty is obtained by adding the three uncertainties linearly.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 3$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 4$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 5$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 6$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 7$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 8$.

Mean reconstruction efficiencies $(\epsilon)$ and RMS of the reconstruction efficiencies for various black hole and string ball models.

mjj region 1600 - 2000 GeV. The observed systematic is the experimental uncertainty, while the SM prediction systematic is the theoretical uncertainty.

mjj region 2000 - 2600 GeV. The observed systematic is the experimental uncertainty, while the SM prediction systematic is the theoretical uncertainty.

mjj region 2600 - 3200 GeV. The observed systematic is the experimental uncertainty, while the SM prediction systematic is the theoretical uncertainty.

mjj region 3200 - 8000 GeV. The observed systematic is the experimental uncertainty, while the SM prediction systematic is the theoretical uncertainty.

The fiducial efficiency for electrons and taus in different $\eta$ ranges ($\epsilon_{\mathrm{fid}}(\eta)$). For electrons from tau decays, the $\eta$ is that of the electron, not the tau. The uncertainties shown reflect the statistical uncertainties of the simulated samples only. UPDATE (18 MAY 2015): Updated fiducial lepton efficiencies.

Expected and observed event yields for the $H_{\mathrm{T}}^{\mathrm{leptons}}$ signal regions.

Expected and observed event yields for the minimum $p_{\mathrm{T}}^{\ell}$ signal regions.

Expected and observed event yields for the $b$-tag signal regions.

Expected and observed event yields for the inclusive $m_{\mathrm{eff}}$ signal regions.

Expected and observed event yields for the high-$E_{\mathrm{T}}^{\mathrm{miss}}$, $m_{\mathrm{eff}}$ signal regions.

Expected and observed event yields for the high-$m_{\mathrm{T}}^{W}$, $m_{\mathrm{eff}}$ signal regions.

Expected and observed event yields for the high-$H_{\mathrm{T}}^{\mathrm{jets}}$, $E_{\mathrm{T}}^{\mathrm{miss}}$ signal regions.

Expected and observed event yields for the low-$H_{\mathrm{T}}^{\mathrm{jets}}$, $E_{\mathrm{T}}^{\mathrm{miss}}$ signal regions.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $H_{\mathrm{T}}^{\mathrm{leptons}}$.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $p_{\mathrm{T}}^{\ell\mathrm{,min}}$.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on the number of $b$-tagged jets.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $m_{\mathrm{eff}}$.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $m_{\mathrm{eff}}$ [GeV]. All these signal regions have an additional requirement of $E_{\mathrm{T}}^{\mathrm{miss}}\geq 100$ GeV.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $m_{\mathrm{eff}}$ [GeV]. All these signal regions have an additional requirement of $m_{\mathrm{T}}^{W}\geq 100$ GeV.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $E_{\mathrm{T}}^{\mathrm{miss}}$. All these signal regions have an additional requirement of $H_{\mathrm{T}}^{\mathrm{jets}}\geq 150$ GeV.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $E_{\mathrm{T}}^{\mathrm{miss}}$. All these signal regions have an additional requirement of $H_{\mathrm{T}}^{\mathrm{jets}} < 150$ GeV.

Observed limits on the pair production cross section as a function of mass for vector-like B quarks. These limits assume branching ratios given by the model where the B quark exists as a singlet.

Observed limits on the pair production cross section as a function of mass for vector-like T quarks. These limits assume branching ratios given by the model where the T quark exists as a singlet.

Expected and observed cross section limits as a function of mass on T_5/3 pair production.

Expected and observed cross section limits as a function of mass on T_5/3 pair production plus single production for $\lambda = 0.5$.

Expected and observed cross section limits as a function of mass on T_5/3 pair production plus single production for $\lambda = 1.0$.

Expected and observed limits for the sgluon pair-production cross section times branching ratio to four top quarks as a function of the sgluon mass.

Expected and observed limits on the four- top-quark production rate for the 2UED/RPP model in the symmetric case. The theory line corresponds to the production of four-top-quark events by tier (1, 1) with a branching ratio of A^(1,1) to tttt of 100%.

Distribution of the transverse mass of the $W$-candidate $m_{\rm T}^{W}$ for the one lepton and two $b$-jets channel in SRlbb-1 and SRlbb-2, $m_{bb}$ sidebands. The background histograms are obtained from the background-only fit, and their uncertainty represents the total background uncertainty after the fit. The last bin includes overflow.

Distribution of the number of $b$-jets for the one lepton and two $b$-jets channel in SRlbb-1 and SRlbb-2 without the b-jet multiplicity requirement, central $m_{bb}$ bin. The background histograms are obtained from the background-only fit, and their uncertainty represents the total background uncertainty after the fit.

Distribution of the invariant mass of the $b$-jets $m_{bb}$ for the one lepton and two $b$-jets channel in the SRlbb-1 and SRlbb-2. The background histograms are obtained from the background-only fit, and their uncertainty represents the total background uncertainty after the fit.

Distribution of missing transverse momentum $E_{\rm T}^{\rm miss}$ in the one lepton and two photons signal regions SR$\ell\gamma\gamma$-1 and SR$\ell\gamma\gamma$-2 for the Higgs-mass window ($120\lt m_{\gamma\gamma} \lt 130$ GeV). The final column (background) is a simulation-based cross check. The contributions from non-Higgs backgrounds are scaled by 10 GeV / 50 GeV = 0.2 from the $m_{\gamma\gamma}$ sideband ($100 \lt m_{\gamma\gamma} \lt 120$ GeV and $130 \lt m_{\gamma\gamma} \lt 160$ GeV) into the Higgs-mass window. The last bin includes overflow. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(165,35)$ GeV.

Distribution of the azimuth difference between the $W$ and Higgs boson candidates $\Delta\phi(W,h)$ in the one lepton and two photons signal regions SR$\ell\gamma\gamma$-1 and SR$\ell\gamma\gamma$-2 for the Higgs-mass window ($120\lt m_{\gamma\gamma} \lt 130$ GeV). The final column (background) is a simulation-based cross check. The contributions from non-Higgs backgrounds are scaled by 10 GeV / 50 GeV = 0.2 from the $m_{\gamma\gamma}$ sideband ($100 \lt m_{\gamma\gamma} \lt 120$ GeV and $130 \lt m_{\gamma\gamma} \lt 160$ GeV) into the Higgs-mass window. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(165,35)$ GeV.

Distribution of the transverse mass of the $W$ and photon system $m_{\rm{T}}^{W\gamma_1}$ in the one lepton and two photons signal regions SR$\ell\gamma\gamma$-1 and SR$\ell\gamma\gamma$-2 for the Higgs-mass window ($120\lt m_{\gamma\gamma} \lt 130$ GeV). The final column (background) is a simulation-based cross check. The contributions from non-Higgs backgrounds are scaled by 10 GeV / 50 GeV = 0.2 from the $m_{\gamma\gamma}$ sideband ($100 \lt m_{\gamma\gamma} \lt 120$ GeV and $130 \lt m_{\gamma\gamma} \lt 160$ GeV) into the Higgs-mass window. The last bin includes overflow. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(165,35)$ GeV.

Distribution of the transverse mass of the $W$ and photon system $m_{\rm{T}}^{W\gamma_2}$ in the one lepton and two photons signal regions SR$\ell\gamma\gamma$-1 and SR$\ell\gamma\gamma$-2 for the Higgs-mass window ($120\lt m_{\gamma\gamma} \lt 130$ GeV). The final column (background) is a simulation-based cross check. The contributions from non-Higgs backgrounds are scaled by 10 GeV / 50 GeV = 0.2 from the $m_{\gamma\gamma}$ sideband ($100 \lt m_{\gamma\gamma} \lt 120$ GeV and $130 \lt m_{\gamma\gamma} \lt 160$ GeV) into the Higgs-mass window. The last bin includes overflow. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(165,35)$ GeV.

Results of the background-only fit to the diphoton invariant mass, $m_{\gamma\gamma}$, distribution in the one lepton and two photons signal region SR$l\gamma\gamma$-1. The contributions from SM Higgs boson production are constrained to the MC prediction and associated systematic uncertainties. The fit is performed on events with 100 GeV $ \lt m_{\gamma\gamma} \lt $ 160 GeV, with events in SR$l\gamma\gamma$-1 or SR$l\gamma\gamma$-2 in the Higgs-mass window (120 GeV $\le m_{\gamma\gamma} \le$ 130 GeV) excluded from the fit.

Results of the background-only fit to the diphoton invariant mass, $m_{\gamma\gamma}$, distribution in the one lepton and two photons signal region SR$l\gamma\gamma$-2. The contributions from SM Higgs boson production are constrained to the MC prediction and associated systematic uncertainties. The fit is performed on events with 100 GeV $ \lt m_{\gamma\gamma} \lt $ 160 GeV, with events in SR$l\gamma\gamma$-1 or SR$l\gamma\gamma$-2 in the Higgs-mass window (120 GeV $\le m_{\gamma\gamma} \le$ 130 GeV) excluded from the fit.

Results of the background-only fit to the diphoton invariant mass, $m_{\gamma\gamma}$, distribution in the one lepton and two photons validation region VR$l\gamma\gamma$-1. The contributions from SM Higgs boson production are constrained to the MC prediction and associated systematic uncertainties. The fit is performed on events with 100 GeV $ \lt m_{\gamma\gamma} \lt $ 160 GeV, with events in SR$l\gamma\gamma$-1 or SR$l\gamma\gamma$-2 in the Higgs-mass window (120 GeV $\le m_{\gamma\gamma} \le$ 130 GeV) excluded from the fit.

Results of the background-only fit to the diphoton invariant mass, $m_{\gamma\gamma}$, distribution in the one lepton and two photons validation region VR$l\gamma\gamma$-2. The contributions from SM Higgs boson production are constrained to the MC prediction and associated systematic uncertainties. The fit is performed on events with 100 GeV $ \lt m_{\gamma\gamma} \lt $ 160 GeV, with events in SR$l\gamma\gamma$-1 or SR$l\gamma\gamma$-2 in the Higgs-mass window (120 GeV $\le m_{\gamma\gamma} \le$ 130 GeV) excluded from the fit.

Distribution of effective mass $m_{\rm eff}$ in the validation region of the same-sign $e\mu$ channel. This validation region is defined by requiring one, two, or three jets, and reversing the $m_{lj}$, $m_{ljj}$ criteria. The distribution of a signal hypothesis is also shown.

Distribution of effective mass $m_{\rm eff}$ for the same-sign dilepton channel in the signal regions with one jet SR$ll$-1. SR$ll$-1 is the sum of SR$ee$-1, SR$e\mu$-1, and SR$\mu\mu$-1. All selection criteria are applied, except for the one on $m_{\rm eff}$. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(130,0)$ GeV. The last bin includes overflow.

Distribution of effective mass $m_{\rm eff}$ for the same-sign dilepton channel in the signal regions with two or three jets SR$ll$-2. SR$ll$-2 is the sum of SR$ee$-2, SR$e\mu$-2, and SR$\mu\mu$-2. All selection criteria are applied, except for the one on $m_{\rm eff}$. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(130,0)$ GeV. The last bin includes overflow.

Distribution of largest transverse mass $m_{\rm T}^{\rm max}$ for the same-sign dilepton channel in the signal regions with one jet SR$ll$-1. SR$ll$-1 is the sum of SR$ee$-1, SR$e\mu$-1, and SR$\mu\mu$-1. All selection criteria are applied, except for the one on $m_{\rm T}^{\rm max}$. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(130,0)$ GeV. The last bin includes overflow.

Distribution of largest transverse mass $m_{\rm T}^{\rm max}$ for the same-sign dilepton channel in the signal regions with two or three jets SR$ll$-2. SR$ll$-2 is the sum of SR$ee$-2, SR$e\mu$-2, and SR$\mu\mu$-2. All selection criteria are applied, except for the one on $m_{\rm T}^{\rm max}$. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(130,0)$ GeV. The last bin includes overflow.

Distribution of invariant mass of lepton and jet $m_{lj}$ for the same-sign dilepton channel in the signal regions with one jet SR$ll$-1. SR$ll$-1 is the sum of SR$ee$-1, SR$e\mu$-1, and SR$\mu\mu$-1. All selection criteria are applied, except for the one on $m_{lj}$. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(130,0)$ GeV. The last bin includes overflow.

Distribution of invariant mass of lepton and di-jet $m_{ljj}$ for the same-sign dilepton channel in the signal regions with two or three jets SR$ll$-2. SR$ll$-2 is the sum of SR$ee$-2, SR$e\mu$-2, and SR$\mu\mu$-2. All selection criteria are applied, except for the one on $m_{ljj}$. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(130,0)$ GeV. The last bin includes overflow.

One lepton and two $b$-jets channel: observed and expected 95% CL upper limits on the cross section normalised by the simplified model prediction as a function of the common mass $m_{\tilde{\chi}_1^\pm \tilde{\chi}^0_2}$ for $m_{\tilde{\chi}^0_1}=0$.

One lepton and two photons channel: observed and expected 95% CL upper limits on the cross section normalised by the simplified model prediction as a function of the common mass $m_{\tilde{\chi}_1^\pm \tilde{\chi}^0_2}$ for $m_{\tilde{\chi}^0_1}=0$.

Same-sign dilepton channel: observed and expected 95% CL upper limits on the cross section normalised by the simplified model prediction as a function of the common mass $m_{\tilde{\chi}_1^\pm \tilde{\chi}^0_2}$ for $m_{\tilde{\chi}^0_1}=0$.

Combination: observed and expected 95% CL upper limits on the cross section normalised by the simplified model prediction as a function of the common mass $m_{\tilde{\chi}_1^\pm \tilde{\chi}^0_2}$ for $m_{\tilde{\chi}^0_1}=0$. This combination is obtained using the result from the ATLAS three-lepton search, J. High Energy Phys. 04 (2014) 169, in addition to the three channels reported in this paper.

One lepton and two b-jets channel: Expected 95% CL exclusion contour for chargino neutralino production via Wh.

One lepton and two b-jets channel: Observed 95% CL exclusion contour for chargino neutralino production via Wh.

One lepton and two photons channel: Expected 95% CL exclusion contour for chargino neutralino production via Wh.

One lepton and two photons channel: Observed 95% CL exclusion contour for chargino neutralino production via Wh.

Same-sign dilepton channel: Expected 95% CL exclusion contour for chargino neutralino production via Wh.

Same-sign dilepton channel: Observed 95% CL exclusion contour for chargino neutralino production via Wh.

Combination: Expected 95% CL exclusion contour for chargino neutralino production via Wh.

Combination: Observed 95% CL exclusion contour for chargino neutralino production via Wh.

Combination: excluded model cross-section at 95% CL IN PB.

Acceptance SR$\ell\gamma\gamma$-1.

Acceptance SR$\ell\gamma\gamma$-2.

Efficiency SR$\ell\gamma\gamma$-1.

Efficiency SR$\ell\gamma\gamma$-2.

$m_{\gamma\gamma}$ distribution in the SR$l\gamma\gamma$-1 region for the full $m_{\gamma\gamma}$ window. The last column (background) is from a simulation-based cross check. $Z\gamma$ events, with $Z\rightarrow{ee}$ and one electron mis-identified as a photon, are included in the $Z\gamma(\gamma)$ background. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(165,35)$ GeV.

$m_{\gamma\gamma}$ distribution in the SR$l\gamma\gamma$-2 region for the full $m_{\gamma\gamma}$ window. The last column (background) is from a simulation-based cross check. $Z\gamma$ events, with $Z\rightarrow{ee}$ and one electron mis-identified as a photon, are included in the $Z\gamma(\gamma)$ background. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(165,35)$ GeV.

$m_{\gamma\gamma}$ distribution in the VR$l\gamma\gamma$-1 region for the full $m_{\gamma\gamma}$ window. The last column (background) is from a simulation-based cross check. $Z\gamma$ events, with $Z\rightarrow{ee}$ and one electron mis-identified as a photon, are included in the $Z\gamma(\gamma)$ background. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(165,35)$ GeV.

$m_{\gamma\gamma}$ distribution in the VR$l\gamma\gamma$-2 region for the full $m_{\gamma\gamma}$ window. The last column (background) is from a simulation-based cross check. $Z\gamma$ events, with $Z\rightarrow{ee}$ and one electron mis-identified as a photon, are included in the $Z\gamma(\gamma)$ background. The distributions of a signal hypothesis are also shown for $m(\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2},\tilde{\chi}^{0}_{1})=(165,35)$ GeV.

Acceptance for SRlbb-1, central $m_{bb}$ bin.

Acceptance for SRlbb-1, $m_{bb}$ sideband.

Acceptance for SRlbb-2, central $m_{bb}$ bin.

Acceptance for SRlbb-2, $m_{bb}$ sideband.

Efficiency for SRlbb-1, central $m_{bb}$ bin.

Efficiency for SRlbb-1, $m_{bb}$ sideband.

Efficiency for SRlbb-2, central $m_{bb}$ bin.

Efficiency for SRlbb-2, $m_{bb}$ sideband.

Acceptance for the same-sign $ee$ channel with one jet.

Acceptance for the same-sign $ee$ channel with two or three jets.

Acceptance for the same-sign $e\mu$ channel with one jet.

Acceptance for the same-sign $e\mu$ channel with two or three jets.

Acceptance for the same-sign $\mu\mu$ channel with one jet.

Acceptance for the same-sign $\mu\mu$ channel with two or three jets.

Efficiency for the same-sign $ee$ channel with one jet.

Efficiency for the same-sign $ee$ channel with two or three jets.

Efficiency for the same-sign $e\mu$ channel with one jet.

Efficiency for the same-sign $e\mu$ channel with two or three jets.

Efficiency for the same-sign $\mu\mu$ channel with one jet.

Efficiency for the same-sign $\mu\mu$ channel with two or three jets.

The observed and expected $E_T^{miss}$ distribution in the dimuon SR-Z. The negigible estimated contribution from Z+jets is omitted in these distributions. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in SR-loose. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in SR-loose. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the two-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the two-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the four jet b-veto SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the four-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the two-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in two-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the four-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the four-jet $b$-tag SR. The last bin contains the overflow.

Expected 95% exclusion contour for the GGM model with $\tan(\beta)=1.5$ in SR-Z.

Observed 95% exclusion contour for the GGM model with $\tan(\beta)=1.5$ in SR-Z.

Expected 95% exclusion contour for the GGM model with $\tan(\beta)=30$ in SR-Z.

Observed 95% exclusion contour for the GGM model with $\tan(\beta)=30$ in SR-Z.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons in the two-jet $b$-veto SR.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons in the two-jet $b$-veto SR.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Number of generated events in the two-step gluino simplified model with sleptons.

Production cross-section in the two-step gluino simplified model with sleptons.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Number of generated events in the GGM model with $\tan(\beta)=1.5$.

Production cross-section in the GGM model with $\tan(\beta)=1.5$.

Number of generated events in the GGM model with $\tan(\beta)=30$.

Production cross-section in the GGM model with $\tan(\beta)=30$.

Total experimental uncertainty [%] for the two-step gluino simplified model with sleptons.

Total experimental uncertainty [%] for the GGM model with $\tan(\beta)=1.5$.

Total experimental uncertainty for the GGM model with $\tan(\beta)=30$.

Signal acceptance for the GGM model with $\tan(\beta)=1.5$ in the combined electron and muon SR-Z.

Signal acceptance for the GGM model with $\tan(\beta)=30$ in the combined electron and muon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the dielectron SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the dielectron SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the dimuon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the dimuon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the electron and muon combined SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the the electron and muon combined SR-Z.

Signal acceptance for the two-step first- and second-generation squarks simplified model with sleptons in the two-jet $b$-veto SR.

Signal acceptance for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Signal efficiency for the two-step first- and second-generation squarks simplified model with sleptons in the two-jet $b$-veto SR.

Signal efficiency for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Upper limits on the signal cross-section at 95% CL for the GGM model with $\tan(\beta)=1.5$.

Observed CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=1.5$.

Expected CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=1.5$.

Upper limits on the signal cross-section at 95% CL for the GGM model with $\tan(\beta)=30$.

Observed CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=30$.

Expected CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=30$.

Upper limits on the signal stength at 95% CL for the two-step first- and second-generation squark simplified model with sleptons. The excluded signal strength is defined as the ratio of the observed excluded production cross section to the expected production cross section calculated at NLO+NLL.

Upper limits on the signal stength at 95% CL for the two-step gluino simplified model with sleptons. The excluded signal strength is defined as the ratio of the observed excluded production cross section to the expected production cross section calculated at NLO+NLL.

Observed CL$_{\text{S}}$ for the two-step first- and second-generation squark simplified model with sleptons.

Expected CL$_{\text{S}}$ for the two-step first- and second-generation squark simplified model with sleptons.

Observed CL$_{\text{S}}$ for the two-step gluino simplified model with sleptons.

Expected CL$_{\text{S}}$ for the two-step gluino simplified model with sleptons.

Cutflow table for three benchmark signal points in SR-Z for the $ee$ and $\mu\mu$ channels separately. The three signal points are taken from the $\tan\beta = 1.5$ grid. 100000 events were generated for each of these points. Shown here are both the unweighted number of events and the number of events normalised to 20.3 fb$^{-1}$. The total experimental systematic uncertainty on the signal yields is indicated at the last cut, along with the corresponding observed and expected $CL_S$ values.

Cutflow table for three benchmark signal points in the two jet b-veto SR of the off-$Z$ search for the $ee$ and $\mu\mu$ channels separately. Shown here are both the unweighted number of events and the number of events normalised to 20.3$^{-1}$. Except for the last two rows indicating the dilepton mass requirements, quoted event yields include all requirements from the top of the table down to the given row.

Cutflow table for three benchmark signal points in the four jet b-veto SR of the off-$Z$ search for the $ee$ and $\mu\mu$ channels separately. Shown here are both the unweighted number of events and the number of events normalised to 20.3 fb$^{-1}$. Except for the last two rows indicating the dilepton mass requirements, quoted event yields include all requirements from the top of the table down to the given row.

Ratio of the Z'NU to Z'SSM acceptance times efficiency (ACC*EFF) in the lep-had channel as a function of sin^2phi and the Z' mass.

Z' SSM acceptance (ACC) and product of acceptance and efficiency (ACC*EFF) for the had-had and lep-had selections as a function of the Z' mass.

Number of expected Z'SSM signal (NS), background (NB) and observed (N) events passing the total transverse mass ($m_{\rm T}^{\rm tot}$) threshold in the had-had and lep-had channels.

Median expected and observed 95% CL upper limits on the cross-section times branching fraction to tau+tau- for Z'SSM production for the exclusive had-had and lep-had channels, and for both channels combined.

Observed 95% CL upper limits on the cross-section times branching fraction to tau+tau- for Z'L and Z'R production for the combination of the had-had and lep-had channels.

Observed 95% CL lower limit on the Z'NU mass as a function of sin^2(phi).

Observed and expected $E_T^{miss}$ distribution in soft dimuon signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution in hard single-lepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution for hard single-lepton 5-jet signal region. The last bin includes the overflow.

Observed and expected $E_{T}^{miss}$ distribution for hard single-lepton 6-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton 3-jet opposite-flavour signal region. The last bin includes the overflow.

Observed 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Expected 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Observed 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Expected 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Observed 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Expected 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Observed 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Expected 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Observed 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Expected 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Observed 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Observed 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production, where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the combination of soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Number of generated events in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Production cross-section in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Number of generated events in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV. squark decaying to quark neutralino1 with varying x.

Production cross-section in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Number of generated evens in the minimal UED model.

Production cross-section in the minimal UED model in pb.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for the soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Acceptance for soft dimuon signal region in the minimal UED model (mUED).

Efficiency for soft dimuon signal region in minimal UED model (mUED).

Acceptance for hard dilepton 3-jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Best expected signal region in the minimal UED model (mUED).

Expected CLs from hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Observed CLs from the hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Expected CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Observed CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Acceptance for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% upper limit on the visible cross-section in the minimal UED model (mUED) from the combination of the soft dimuon and hard dilepton analyses.

95% C.L. observed exclusion contour for all regions combined.

Best expected signal region for signal points.

95% CLs observed upper limit on model cross-section for signal points in the signal region with $m_{CT}>150$ GeV.

95% C.L. expected exclusion contour for the $m_{CT}>150 $ GeV region.

95% C.L. observed exclusion contour for the $m_{CT}>150 $ GeV region.

95% CLs observed upper limit on model cross-section for signal points in the signal region with $m_{CT}>200$ GeV.

95% C.L. expected exclusion contour for the $m_{CT}>200 $ GeV region.

95% C.L. observed exclusion contour for the $m_{CT}>200 $ GeV region.

95% CLs observed upper limit on model cross-section for signal points in the signal region with $m_{CT}>250$ GeV.

95% C.L. expected exclusion contour for the $m_{CT}>250 $ GeV region.

95% C.L. observed exclusion contour for the $m_{CT}>250 $ GeV region.

95% CLs upper limit on model cross-section for signal points in C1.

95% CLs upper limit on model cross-section for signal points in C2.

Acceptance times Efficiency for signal points in the signal region with $m_{CT}>150$ GeV.

Acceptance times Efficiency for signal points in the signal region with $m_{CT}>200$ GeV.

Acceptance times Efficiency for signal points in the signal region with $m_{CT}>250$ GeV.

Acceptance (flavour-blind) for signal points in the signal region with $m_{CT}>150$ GeV.

Acceptance (flavour-blind) for signal points in the signal region with $m_{CT}>200$ GeV.

Acceptance (flavour-blind) for signal points in the signal region with $m_{CT}>250$ GeV.

Signal cross-sections and uncertainties.

Observed and expected 95% CL upper limits on the cross section times branching fraction as a function of the resonance pole mass for the G$^*$. The LO theoretical cross section for the G$^*$ production is also shown.

Observed and expected 95% CL upper limits on the cross section times branching fraction as a function of the resonance pole mass for the EGM W'. The NNLO theoretical cross section for the EGM W' production is also shown.

Reconstructed mass $m_\beta$ in observed data, background estimate and expected signal ($\tilde{\chi}^{\pm}_1$ masses of 400 and 600 GeV) in the chargino search for the lower of the two masses ($m$) in the two-candidate signal region.

Reconstructed mass $m_\beta$ in observed data, background estimate and expected signal ($\tilde{\chi}^{\pm}_1$ masses of 400 and 600 GeV) in the chargino search for the one-loose-candidate signal region.

Reconstructed mass $m_\beta$ in observed data, background estimate and expected signal ($\tilde{\chi}^{\pm}_1$ masses of 400 and 600 GeV) in the chargino search for the one-candidate signal region.

Data and background estimates for the reconstructed mass based on time-of-flight, $m_{\beta}$, for combined candidates in the full-detector 500 GeV gluino R-Hadron search (SR-RH-FD).

Data and background estimates for the reconstructed mass based on specific energy loss, $m_{\beta\gamma}$, for combined candidates in the full-detector 500 GeV gluino R-Hadron search (SR-RH-FD).

Data and background estimates for the reconstructed mass based on time-of-flight, $m_{\beta}$, for the MS-agnostic 500 GeV sbottom and $m_{\beta\gamma}$ R-Hadron search (SR-RH-MA).

Data and background estimates for the reconstructed mass based on specific energy loss, $m_{\beta\gamma}$, for the MS-agnostic 500 GeV stop R-Hadron search (SR-RH-MA).

Cross-section upper limits as a function of the mass of the lightest stau for the GMSB models with $\tan\beta = 10$. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the mass of the lightest stau for the GMSB models with $\tan\beta = 20$. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the mass of the lightest stau for the GMSB models with $\tan\beta = 30$. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the mass of the lightest stau for the GMSB models with $\tan\beta = 40$. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the mass of the lightest stau for the GMSB models with $\tan\beta = 50$. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Observed 95% CL exclusion contour for directly produced sleptons in the plane $\Delta=m(\tilde{\ell})-m(\tilde{\tau}_1)$ vs. $m(\tilde{\tau}_1)$.

Expected 95% CL exclusion contour for directly produced sleptons in the plane $\Delta=m(\tilde{\ell})-m(\tilde{\tau}_1)$ vs. $m(\tilde{\tau}_1)$.

Cross-section upper limits as a function of the $\tilde{\tau}_1$ mass for direct $\tilde{\tau}_1$ production and three values of $\tan\beta$. Expected limits for $\tan\beta=10$ with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties observed limits for three values of $\tan\beta$ and theoretical cross-section prediction for $\tan\beta=10$ with $\pm 1\sigma$ band.

Cross-section upper limits as a function of the $\tilde{\chi}_1$ mass for $\tilde{\tau}_1$ sleptons resulting from the decay of directly produced charginos and neutralinos in GMSB. Observed limits, expected limits for $\tan\beta=10$ with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties and theoretical cross-section prediction (dominated by $\tilde{\chi}^0_1 \tilde{\chi}^+_1$ production) with $\pm 1\sigma$ uncertainty. Depending on the hypothesis and to a small extent on $\tan\beta$, in these models, the chargino mass is 210 to 260 GeV higher than the neutralino mass.

Observed 95% CL exclusion contour for the LeptoSUSY model.

Expected 95% CL exclusion contour for the LeptoSUSY model.

Cross-section upper limits for various chargino masses in stable-chargino models. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the LLP mass for the gluino R-Hadron models for the MS-agnostic search. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the LLP mass for the gluino R-Hadron models for the full-detector search. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the LLP mass for the sbottom R-Hadron models for the MS-agnostic search. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the LLP mass for the sbottom R-Hadron models for the full-detector search. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the LLP mass for the stop R-Hadron models for the MS-agnostic search. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Cross-section upper limits as a function of the LLP mass for the stop R-Hadron models for the full-detector search. Expected limit with $\pm 1\sigma$ and $\pm 2\sigma$ uncertainties, observed limit and theoretical cross-section prediction with $\pm 1\sigma$ uncertainties.

Summary of systematic uncertainties for the slepton searches (given in percent). Ranges indicate a mass dependence for the given uncertainty (low mass to high mass).

Summary of systematic uncertainties for the chargino and R-Hadron searches (given in percent). Ranges indicate a mass dependence for the given uncertainty (low mass to high mass).

Observed and expected event yields, as well as efficiencies and uncertainties for three MC simulation signal samples, in the two signal regions used in the GMSB slepton search. Cross-section upper limits are stated at 95% CL.

Observed and expected event yields, as well as efficiencies and uncertainties for three MC simulation signal samples, in the three signal regions used in the LeptoSUSY slepton search. Cross-section upper limits are stated at 95% CL.

Observed and expected event yields, as well as efficiencies and uncertainties for three MC simulation signal samples, in the three signal regions used in the chargino search. Cross-section upper limits are stated at 95% CL.

Observed and expected event yields, as well as efficiencies and uncertainties for three MC simulation signal samples, in the R-Hadron searches. Cross-section upper limits are stated at 95% CL.

Mass of the $\tilde{\tau}_1$; cross-section; minimum $p_T$, maximum $\beta$ and minimum $m_{\beta}$ requirements; expected number of signal events (exp.); signal selection efficiency (eff.); background estimate (est.); observed number of events (obs.); expected upper cross-section limit ($\sigma^\mathrm{exp}$); and observed upper cross-section limit ($\sigma^\mathrm{obs}$) for the two signal regions used in the GMSB slepton search.

Mass of the $\tilde{\tau}_1$; cross-section; minimum \pt, maximum $\beta$ and minimum $m_{\beta}$ requirements; expected number of signal events (exp.); signal selection efficiency (eff.); background estimate (est.); observed number of events (obs.); expected upper cross-section limit ($\sigma^\mathrm{exp}$); and observed upper cross-section limit ($\sigma^\mathrm{obs}$) for the two signal regions used in the directly produced $\tilde{\tau}_1$ search.

Masses of the $\tilde{g}$ and $\tilde{q}$; cross-section; minimum \pt, maximum $\beta$ and minimum $m_{\beta}$ requirements; expected number of signal events (exp.); signal selection efficiency (eff.); background estimate (est.); observed number of events (obs.); expected upper cross-section limit ($\sigma^\mathrm{exp}$); and observed upper cross-section limit ($\sigma^\mathrm{obs}$) for the two signal regions used in the LeptoSUSY search.

Slepton search candidate requirements and example candidate selection flow for loose and tight selections.

Mass of the $\tilde{\chi}^{\pm}_{1}$; cross-section; minimum $p_T$, maximum $\beta$ and minimum $m_{\beta}$ requirements; expected number of signal events (exp.); signal selection efficiency (eff.); background estimate (est.); observed number of events (obs.); expected upper cross-section limit ($\sigma^\mathrm{exp}$); and observed upper cross-section limit ($\sigma^\mathrm{obs}$) for the three signal regions used in the chargino search.

Chargino search candidate requirements and example candidate selection flow for the total production as well as chargino-neutralino (CN) and chargino-pair (CC) production separately.

Mass of the LLP; cross-section; minimum $p$, maximum $\beta\gamma$, maximum $\beta$, minimum $m_{\beta\gamma}$ and minimum $m_{\beta}$ requirements; expected signal (exp.); signal efficiency (eff.); background estimate (est.); observed number of events (obs.); expected upper cross-section limit ($\sigma^\mathrm{exp}$); and observed upper cross-section limit ($\sigma^\mathrm{obs}$) for all R-Hadron models considered in the R-Hadron MS-agnostic (SR-RH-MA) search.

Mass of the LLP; cross-section; minimum $p$, maximum $\beta\gamma$, maximum $\beta$, minimum $m_{\beta\gamma}$ and minimum $m_{\beta}$ requirements; expected signal (exp.); signal efficiency (eff.); background estimate (est.); observed number of events (obs.); expected upper cross-section limit ($\sigma^\mathrm{exp}$); and observed upper cross-section limit ($\sigma^\mathrm{obs}$) for all R-Hadron models considered in the R-Hadron full-detector (SR-RH-FD) search. In cases where two numbers are stated, these reflect the values in the ID+calorimeter and combined selection, respectively, used in this search.

Muon-agnostic search R-Hadron candidate requirements and example candidate selection flow for ID+calorimeter selection.

Full-detector search R-Hadron candidate requirements and example candidate selection flow for combined selection.

The LAMBDA reconstruction and selection efficiency EFF as a function of PT and XF.

The LAMBDABAR reconstruction and selection efficiency EFF as a function of PT and XF.

Distribution of $m_{{\rm T}2}(\ell, \tau_{\mathrm{had}})$ for events passing all the lepton-hadron HM signal region requirements, except that on the variable itself. The SM background process have been normalised using a fit to the data observed in CRs.

Expected exclusion contour at 95% CL in the (scalar top, scalar tau) mass plane from the combination of all selections.

Observed exclusion contour at 95% CL in the (scalar top, scalar tau) mass plane from the combination of all selections.

The region / analysis with the best expected upper limit on the signal cross-section (95% CL) as a function of the stop and stau masses. 1: SRLM, 2: SRHH, 3: two-lepton channel analysis, 5: SRHM.

The 95% CL excluded cross section times branching ratio, using the best expected SR / analysis for each mass point.

The cut flow on the raw generated events for the signal point (scalar top mass, scalar tau mass) = (337,148) GeV for the hadron-hadron SR. The production cross section for this signal point is $1.00 \pm 0.14$ pb. Quality Cuts indicate a set of cuts applied to ensure good quality events in data. A full description of the cuts used is given in the text. The original input file has a filter applied to it that ensures that all the events have $E_T^{miss}>60$ GeV or one electron or muon with $p_\mathrm{T} > 20$ GeV at truth level. After the filter is applied (efficiency = 0.883) there are 100000 events remaining.

The cut flow on the raw generated events for the signal point (scalar top mass, scalar tau mass) = (195,87) GeV for the lepton-hadron LM SR. The production cross section for this signal point is $21 \pm 3$ pb. Quality Cuts indicate a set of cuts applied to ensure good quality events in data. A full description of the cuts used is given in the text. The original input file has a filter applied to it that ensures that all the events have $E_T^{miss}<60$ GeV and one electron or muon with $p_\mathrm{T} > 20$ GeV at truth level. After the filter is applied (efficiency = 0.117) there are 50000 events remaining before applying the event weights.

The cut flow on the raw generated events for the signal point (scalar top mass, scalar tau mass) = (391,337) GeV for the lepton-hadron HM SR. The production cross section for this signal point is $0.41 \pm 0.06$ pb. Quality Cuts indicate a set of cuts applied to ensure good quality events in data. A full description of the cuts used is given in the text. The original input file has a filter applied to it that ensures that all the events have either $E_T^{miss}>150$ GeV or at least one electron or muon with $p_\mathrm{T} > 20$ GeV at truth level. After the filter is applied (efficiency = 0.925) there are 50000 events remaining before applying the event weights.

Expected 95% CL exclusion contour for the Gbb signal.

Observed 95% CL exclusion contour for the Gbb signal.

Expected 95% CL exclusion contour for the Gtt combination.

Observed 95% CL exclusion contour for the Gtt combination.

Acceptances for the Gbb model in SR-Gbb-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptance times efficiency for the Gbb model in SR-Gbb-A.

Acceptance times efficiency for the Gbb model in SR-Gbb-B.

Acceptance times efficiency for the Gbb model in SR-Gbb-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-B.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-B.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gbb model.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 0-lepton channel.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 1-lepton channel.

Combination of two 0-lepton and 1-lepton signal regions yielding the best expected sensitivity for each point of the parameter space in the Gtt model.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

Summary of results for cross-section of non-prompt $J/\psi$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of prompt $\psi(2S)$ decaying to a muon pair for 7 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of prompt $\psi(2S)$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 7 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Mean weight correction factor for $J/\psi$ under the "longitudinal" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse zero" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse positive" spin-alignment transverse positive hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "longitudinal" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse zero" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "longitudinal" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse zero" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "longitudinal" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse zero" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Selection efficiency x Acceptance for a spin-0 resonance.

Reconstructed m_tt spectrum for the boosted selections.

Reconstructed m_tt spectrum for the resolved selections.

Reconstructed m_tt spectrum for the all the selections.

Limits on the production cross-section x branching ratio to tt final states as a function of the mass of Z'TC2.

Limits on the production cross-section x branching ratio to tt final states as a function of the mass of bulk RS KK graviton.

Limits on the production cross-section x branching ratio to tt final states as a function of the mass of bulk RS KK gluon.

Limits on the production cross-section x branching ratio to tt final states as a function of the mass of a scalar.

Limits on the production cross-section x branching ratio to tt final states as a function of the width of a 1TeV bulk RS KK gluon.

Limits on the production cross-section x branching ratio to tt final states as a function of the width of a 2TeV bulk RS KK gluon.

Limits on the production cross-section x branching ratio to tt final states as a function of the width of a 3TeV bulk RS KK gluon.

Migration from the true mtt values to the reconstructed mtt values for the resolved selection.

Migration from the true mtt values to the reconstructed mtt values for the boosted selection.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Observed 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the pMSSM grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the pMSSM grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the pMSSM grid.

+1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

-1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the 2Step grid.

Observed 95% CL limit for the 2Step grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the 2Step grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the 2Step grid.

+1 sigma excursion of the expected 95% CL limit for the 2Step grid.

-1 sigma excursion of the expected 95% CL limit for the 2Step grid.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Degree of multijet closure for signal and vaidation regions with at no b-jet requirement. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 1 b-jet. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 2 b-jets. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Summary of all 15 signal regions (post-fit).

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the 2Step grid.

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the pMSSM grid.

95% CLs observed upper limit on model cross-section for 2-step signal points for the best-expected signal region.

Performance of the 8j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Normalised fiducial ttbar differential cross-section for the jet pull angle distribution constructed using all particles. No uncertainty due to a potential non-SM colour flow model is included. These data should be taken as the 'default' all-particles pull angle data and uncertainties.

Normalised fiducial ttbar differential cross-section for the jet pull angle distribution constructed using charged particles. No uncertainty due to a potential non-SM colour flow model is included. These data should be taken as the 'default' charged-particles pull angle data and uncertainties.

Statistical+Systematic bin-bin correlation matrix.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of dijet pT^avg, shown here for +0.3 < eta^dijet < +0.8.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of dijet pT^avg, shown here for -0.3 < eta^dijet < +0.3.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of dijet pT^avg, shown here for -0.8 < eta^dijet < -0.3.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of dijet pT^avg, shown here for -1.2 < eta^dijet < -0.8.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of dijet pT^avg, shown here for -2.1 < eta^dijet < -1.2.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of dijet pT^avg, shown here for -2.8 < eta^dijet < -2.1.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for +2.1 < eta^dijet < +2.8.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for +1.2 < eta^dijet < +2.1.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for +0.8 < eta^dijet < +1.2.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for +0.3 < eta^dijet < +0.8.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for -0.3 < eta^dijet < +0.3.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for -0.8 < eta^dijet < -0.3.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for -1.2 < eta^dijet < -0.8.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for -2.1 < eta^dijet < -1.2.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of dijet pT^avg, shown here for -2.8 < eta^dijet < -2.1.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of x_proj, shown here for 10^-3 < x_targ < 10^-2.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of x_proj, shown here for 10^-2 < x_targ < 10^-1.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of x_proj, shown here for 10^-1 < x_targ < 1$.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of x_proj, shown here for 10^-3 < x_targ < 1$.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of x_targ, shown here for 10^-3 < x_proj < 10^-2.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of x_targ, shown here for 10^-2 < x_proj < 10^-1.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of x_targ, shown here for 10^-1 < x_proj < 1$.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, <SumET>. Reported as a function of x_targ, shown here for 10^-3 < x_proj < 1$.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of x_proj, shown here for 10^-3 < x_targ < 10^-2.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of x_proj, shown here for 10^-2 < x_targ < 10^-1.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of x_proj, shown here for 10^-1 < x_targ < 1$.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of x_proj, shown here for 10^-3 < x_targ < 1$.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of x_targ, shown here for 10^-3 < x_proj < 10^-2.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of x_targ, shown here for 10^-2 < x_proj < 10^-1.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of x_targ, shown here for 10^-1 < x_proj < 1$.

Mean value of the sum of the transverse energy in -4.9 < eta < -3.2 in pp collisions, divided by a reference value (see text), <SumET>/<SumET>^ref. Reported as a function of x_targ, shown here for 10^-3 < x_proj < 1$.

The average charged particle multiplicity for the more central jet and a charged particle threshold of 0.5 GeV as a function of the jet transverse momentum.

The average charged particle multiplicity for the more central jet and a charged particle threshold of 2 GeV as a function of the jet transverse momentum.

The average charged particle multiplicity for the more central jet and a charged particle threshold of 5 GeV as a function of the jet transverse momentum.

The average charged particle multiplicity differnce between the more forward and the more central jets and a charged particle threshold of 0.5 GeV as a function of the jet transverse momentum.

The average charged particle multiplicity differnce between the more forward and the more central jets and a charged particle threshold of 2 GeV as a function of the jet transverse momentum.

The average charged particle multiplicity differnce between the more forward and the more central jets and a charged particle threshold of 5 GeV as a function of the jet transverse momentum.

The average charged particle multiplicity for the sum of the more forward and the more central jets and a charged particle threshold of 0.5 GeV as a function of the jet transverse momentum.

The average charged particle multiplicity for the sum of the more forward and the more central jets and a charged particle threshold of 2 GeV as a function of the jet transverse momentum.

The average charged particle multiplicity for the sum of the more forward and the more central jets and a charged particle threshold of 5 GeV as a function of the jet transverse momentum.

Charged-particle multiplicities in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicity distribution in proton-proton collisions at a centre-of-mass energy of 13000 GeV for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <2.5.

Average transverse momentum in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <2.5.

Extrapolated charged-particle multiplicities in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <2.5.

Extrapolated charged-particle multiplicities in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <2.5.

Extrapolated charged-particle multiplicity distributions in proton-proton collisions at a centre-of-mass energy of 13000 GeV for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <2.5.

Extrapolated average transverse momentum in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <0.8.

Charged-particle multiplicities in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <0.8.

Charged-particle multiplicity distribution in proton-proton collisions at a centre-of-mass energy of 13000 GeV for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <0.8.

Average transverse momentum in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <0.8.

Extrapolated charged-particle multiplicities in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <0.8.

Extrapolated charged-particle multiplicities in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <0.8.

Extrapolated charged-particle multiplicity distributions in proton-proton collisions at a centre-of-mass energy of 13000 GeV for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <0.8.

Extrapolated average transverse momentum in proton-proton collisions at a centre-of-mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=1 having transverse momentum >500 MeV and absolute(pseudorapidity) <0.8.

Comparison of data with estimated backgrounds in the $\tilde{E}_\text{T}^\text{miss}$ distribution with the TZCR1 event selection except for the requirement on $\tilde{E}_\text{T}^\text{miss}$. The variables $\tilde{E}_\text{T}^\text{miss}$ and $\tilde{m}_\text{T}$ are constructed in the same way as $E_\text{T}^\text{miss}$ and $m_\text{T}$ but treating the leading photon transverse momentum as invisible. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Comparison of data with estimated backgrounds in the $\tilde{m}_\text{T}$ distribution with the TZCR1 event selection except for the requirement on $\tilde{m}_\text{T}$. The variables $\tilde{E}_\text{T}^\text{miss}$ and $\tilde{m}_\text{T}$ are constructed in the same way as $E_\text{T}^\text{miss}$ and $m_\text{T}$ but treating the leading photon transverse momentum as invisible. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Comparison of the observed data ($n_\text{obs}$) with the predicted background ($n_\text{exp}$) in the validation and signal regions. The background predictions are obtained using the background-only fit configuration. The bottom panel shows the significance of the difference between data and predicted background, where the significance is based on the total uncertainty ($\sigma_\text{tot}$).

Jet multiplicity distributions for events where exactly two signal leptons are selected. No correction factors are included in the background normalizations. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Jet multiplicity distributions for events where exactly one lepton plus one $\tau$ candidate are selected. No correction factors are included in the background normalizations. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

The $E_\text{T}^\text{miss}$ distribution in SR1. In the plot, the full event selection in the corresponding signal region is applied, except for the requirement on $E_\text{T}^\text{miss}$. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin contains the overflow. Benchmark signal models are overlaid for comparison. The benchmark models are specified by the gluino and stop masses, given in TeV in the table.

The $m_\text{T}$ distribution in SR1. In the plot, the full event selection in the corresponding signal region is applied, except for the requirement on $m_\text{T}$. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin contains the overflow. Benchmark signal models are overlaid for comparison. The benchmark models are specified by the gluino and stop masses, given in TeV in the table.

Expected (black dashed) 95% excluded regions in the plane of $m_{\tilde{g}}$ versus $m_{\tilde{t}_1}$ for gluino-mediated stop production.

Observed (red solid) 95% excluded regions in the plane of $m_{\tilde{g}}$ versus $m_{\tilde{t}_1}$ for gluino-mediated stop production.

Expected (black dashed) 95% excluded regions in the plane of $m_{\tilde{t}_1}$ versus $m_{\tilde{\chi}_1^0}$ for direct stop production.

Observed (red solid) 95% excluded regions in the plane of $m_{\tilde{t}_1}$ versus $m_{\tilde{\chi}_1^0}$ for direct stop production.

The expected upper limits on $T$ quark pair production times the squared branching ratio for $T \rightarrow tZ$ as a function of the $T$ quark mass.

The observed upper limits on $T$ quark pair production times the squared branching ratio for $T \rightarrow tZ$ as a function of the $T$ quark mass.

The expected limits on $T$ quarks as a function of the branching ratios $B\left(T \rightarrow bW\right)$ and $B\left(T \rightarrow tH\right)$ for a $T$ quark with a mass of 800 GeV. The $T$ is assumed to decay in three possible ways: $T \to tZ$, $T \to tH$, and $T \to bW$.

The observed limits on $T$ quarks as a function of the branching ratios $B\left(T \rightarrow bW\right)$ and $B\left(T \rightarrow tH\right)$ for a $T$ quark with a mass of 800 GeV. The $T$ is assumed to decay in three possible ways: $T \to tZ$, $T \to tH$, and $T \to bW$.

The $m_\text{T}$ distribution in the WVR2-tail validation region which has the same preselection and jet $p_\text{T}$ requirements as SR2.

The $am_\text{T2}$ distribution in the WVR2-tail validation region which has the same preselection and jet $p_\text{T}$ requirements as SR2.

Large-radius jet mass ($R=1.2$), decomposed into the number of small-radius jet constituents. The lower panel shows the ratio of the total data to the total prediction (summed over all jet multiplicities). Events are required to have one lepton, four jets with $p_\text{T}>80,50,40,40$ GeV, at least one $b$-tagged jet, $E_\text{T}^\text{miss}>200$ GeV, and $m_\text{T}>30$ GeV.

Distribution of $m_\text{T2}^\tau$ in data for a selection enriched in $t\bar{t}$ events with one hadronically decaying $\tau$. Events that have no hadronic $\tau$ candidate (that passes the Loose identification criteria, as well as other requirements) are not shown in the plot.

Upper limits on the model cross-section in units of pb for the gluino-mediated stop models.

Upper limits on the model cross-section in units of pb for the models with direct stop pair production.

Illustration of the best expected signal region per signal grid point for the gluino-mediated stop models. This mapping is used for the final combined exclusion limits.

Illustration of the best expected signal region per signal grid point for models with direct stop pair production. This mapping is used for the final combined exclusion limits.

Expected $CL_s$ values for the gluino-mediated stop models.

Observed $CL_s$ values for the gluino-mediated stop models.

Expected $CL_s$ values for the direct stop pair production models.

Observed $CL_s$ values for the direct stop pair production models.

Expected limit using SR1 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR1 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR1 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR1 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR1 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR1 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Expected limit using SR2 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR2 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR2 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR2 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR2 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR2 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Acceptance for SR1 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR1 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR2 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR2 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR3 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR3 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Efficiency for SR1 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR1 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR2 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR2 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR3 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR3 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

The total inelastic cross section.

The measured differential elastic cross section. In addition to the statistical and total systematic uncertainties, the following 22 systematic shifts are given, which are included in the profile fit with their signs: -- Constraints: Beam optics uncertainty obtained by varying the ALFA constraints in the optics fit -- QScan: Variation by +/- 0.1 % of the quadrupole strength -- Q2: Fit of the strength of Q2 using the best value for the strength of Q1 and Q3 -- Q5Q6: Variation of the strength of Q5 and Q6 by -0.2% as indicated by machine constraints -- MadX: Uncertainty related to the beam transport replacing matrix transport by MadX PTC tracking -- Qmisal: Uncertainty due to the mis-alignment of the quadrupoles in the beam line -- Q1Q3: Propagation of the optics fit uncertainty in the strenght of Q1 and Q3 on the differential elastic cross section -- Aopt: Alignment uncertainty from the optimization procedure -- Offv: Alignment uncertainty related to the vertical beam center offset -- Offh: Alignment uncertainty related to the horizontal beam center offset -- Ang: Alignment uncertainty related to the detector rotation in the x-y plane -- BGn: Uncertainty from the background normalization -- BGs: Uncertainty from the background shape -- MCres: Error from modelling of the detector response -- Slope: Residual dependence on the physics model estimated by varying the nuclear slope in the simulation by +/- 1 GeV^-2 -- Emit: Uncertainty from the emittance used to calculate beam divergence in the simulation -- Unf: Unfolding uncertainty from the data-driven closure test -- Trac: Uncertainty from the variation of the track reconstruction selection cuts -- Xing: Uncertainty from residual crossing angle in the horizontal plane -- Eff: Uncertainty from the reconstruction efficiency -- Lumi: Luminosity uncertainty (+/- 1.5%) -- Ebeam: Uncertainty from the nominal beam energy (+/- 0.65%) Small differences in the values given here compared to the published version are related to insignificant rounding issues.

The statistical covariance matrix for the differential elastic cross section.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Median expected and observed 95% CL upper limits on the cross-section times branching ratio (sigma*B) for W'_SSM production for the exclusive muon and electron channels, and for both channels combined.

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Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA250.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA250.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA350.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA350.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA450.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA450.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRB.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRB.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the best expected signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA250 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA350 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA450 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRB signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the best expected signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA250 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA350 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA450 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRB signal region.

Total experimental systematic uncertainty in percent on the signal efficiency times acceptance in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane. The best expected signal region selection is used per point.