Measured min-$d_{xy}$ distribution in the 2-match category, after requiring the $d_{xy}$ muon to pass the isolation requirement $I_{\mathrm{rel}}^{\mathrm{PF}} <0.25$ (i. e., the B and D bins of the ABCD plane). Overlaid with a red histogram is the background predicted from the region of the ABCD plane failing the same requirement (the A and C bins), as well as three signal benchmark hypotheses (as defined in the legends), assuming $\alpha_D = \alpha_{\mathrm{EM}}$ (the fine-structure constant). The red hatched bands correspond to the background prediction uncertainty. The last bin includes the overflow.

Two-dimensional exclusion surfaces for $\Delta = 0.1 \, m_1$ as a function of the DM mass $m_1$ and the signal strength $y$, with $m_{A'} = 3 \, m_1$. Filled histograms denote observed limits on $\sigma(\mathrm{pp} \to A' \to \chi_2 \chi_1) \, \mathcal{B}(\chi_2 \to \chi_1 \mu^+ \mu^-)$. Solid (dashed) curves denote the observed (expected) exclusion limits at 95% CL, with 68% CL uncertainty bands around the expectation. Regions above the curves are excluded, depending on the $\alpha_D$ hypothesis: $\alpha_{\mathrm{D}} = \alpha_{\mathrm{EM}}$ (dark blue) or 0.1 (light magenta).

Two-dimensional exclusion surfaces for $\Delta = 0.4 \, m_1$ as a function of the DM mass $m_1$ and the signal strength $y$, with $m_{A'} = 3 \, m_1$. Filled histograms denote observed limits on $\sigma(\mathrm{pp} \to A' \to \chi_2 \chi_1) \, \mathcal{B}(\chi_2 \to \chi_1 \mu^+ \mu^-)$. Solid (dashed) curves denote the observed (expected) exclusion limits at 95% CL, with 68% CL uncertainty bands around the expectation. Regions above the curves are excluded, depending on the $\alpha_D$ hypothesis: $\alpha_{\mathrm{D}} = \alpha_{\mathrm{EM}}$ (dark blue) or 0.1 (light magenta).

Measured ratio of $\mathcal{B}_{4\mu}/\mathcal{B}_{2\mu}$

Measured branching fraction $\mathcal{B}_{4\mu}$

Measured branching fraction $\mathcal{B}_{4\mu}$

Comparison of the $m_{miss}$ shapes for the simulated signal events within the fiducial region and those outside it, after including the effect of PU protons as describe in the text, for a generated $m_{X}$ mass of 1000 GeV. The distributions are shown for single(+z)-single(−z) proton reconstruction categories.

Product of the acceptance times the combined reconstruction and identification efficiency, as a function of $m_{X}$ , for events generated inside the fiducial volume defined in Table 1. The curves shown panel display the different final states. The definition of the fiducial region and signal model used to estimate the acceptance is provided in the text.

Product of the acceptance times the combined reconstruction and identification efficiency, as a function of $m_{X}$ , for different proton reconstruction categories in the $Z \rightarrow \mu\mu $ analysis, and for events generated inside the fiducial volume defined in Table 1. The curves shown panel display the different final states. The definition of the fiducial region and signal model used to estimate the acceptance is provided in the text.

Distributions of the reconstructed proton $\xi$ in the negative arm from the proton mixing procedure with simulated MC events, are compared to data. The ee final states are shown.The ee events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the positive arm from the proton mixing procedure with simulated MC events, are compared to data. The ee final states are shown.The ee events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed di-proton rapidity from the proton mixing procedure with simulated MC events, are compared to data. The ee final states are shown.The ee events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the negative arm from the proton mixing procedure with simulated MC events, are compared to data. The $\mu\mu$ final states are shown.The $\mu\mu$ events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the positive arm from the proton mixing procedure with simulated MC events, are compared to data. The $\mu\mu$ final states are shown.The $\mu\mu$ events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed di-proton rapidity from the proton mixing procedure with simulated MC events, are compared to data. The $\mu\mu$ final states are shown.The $\mu\mu$ events are displayed without the Z boson $p_T$ requirement.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the negative arm from the proton mixing procedure with simulated MC events, are compared to data. The $\gamma$ final states are shown.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed proton $\xi$ in the positive arm from the proton mixing procedure with simulated MC events, are compared to data. The $\gamma$ final states are shown.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Distributions of the reconstructed di-proton rapidity from the proton mixing procedure with simulated MC events, are compared to data. The $\gamma$ final states are shown.For illustration, the simulated signal distributions are superimposed for various choices of $m_{X}$ , normalised to a generated fiducial cross section of 100 pb.

Validation of the background modelling method, using the $e\mu$ control sample. Selected $e\mu$ events are mixed with protons from $Z\rightarrow \mu \mu$ events with $p_{T}(Z)<10$ GeV to simulate the combinatorial background shape, while the data points are unaltered $e\mu$ events. The proton $\xi$ distribution for the positive CT-PPS arm is shown.

Validation of the background modelling method, using the $e\mu$ control sample. Selected $e\mu$ events are mixed with protons from $Z\rightarrow \mu \mu$ events with $p_{T}(Z)<10$ GeV to simulate the combinatorial background shape, while the data points are unaltered $e\mu$ events. The proton $\xi$ distribution for the negative CT-PPS arm is shown.

Validation of the background modelling method, using the $e\mu$ control sample. Selected $e\mu$ events are mixed with protons from $Z\rightarrow \mu \mu$ events with $p_{T}(Z)<10$ GeV to simulate the combinatorial background shape, while the data points are unaltered $e\mu$ events. The di-proton invariant mass is shown.

Validation of the background modelling method, using the $e\mu$ control sample. Selected $e\mu$ events are mixed with protons from $Z\rightarrow \mu \mu$ events with $p_{T}(Z)<10$ GeV to simulate the combinatorial background shape, while the data points are unaltered $e\mu$ events. The $m_{miss}$ is shown.

$m_{miss}$ distributions in the $pp\rightarrow ppZeeX$, with the protons reconstructed with the multi(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZeeX$, with the protons reconstructed with the multi(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZeeX$, with the protons reconstructed with the single(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZeeX$, with the protons reconstructed with the single(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZ\mu\mu X$, with the protons reconstructed with the multi(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZ\mu\mu X$, with the protons reconstructed with the multi(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZ\mu\mu X$, with the protons reconstructed with the single(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow ppZ\mu\mu X$, with the protons reconstructed with the single(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 1 pb.

$m_{miss}$ distributions in the $pp\rightarrow pp\gamma X$, with the protons reconstructed with the multi(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 10 pb.

$m_{miss}$ distributions in the $pp\rightarrow pp\gamma X$, with the protons reconstructed with the multi(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 10 pb.

$m_{miss}$ distributions in the $pp\rightarrow pp\gamma X$, with the protons reconstructed with the single(+z)-multi(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 10 pb.

$m_{miss}$ distributions in the $pp\rightarrow pp\gamma X$, with the protons reconstructed with the single(+z)-single(-z)method. The background distributions are shown after the fit. The expectations for a signal with $m_{X} = 1000$ GeV are superimposed, where the fiducial production cross section is normalised to 10 pb.

Upper limits on the $pp\rightarrow ppZ/\gamma X$ cross section at 95% CL, as a function of $m_X$. The 68 and 95% central intervals of the expected limits are represented by the green and yellow bands, respectively, while the observed limit is superimposed as a curve. The plot corresponds to the $Z\rightarrow ee$ analysis.

Upper limits on the $pp\rightarrow ppZ/\gamma X$ cross section at 95% CL, as a function of $m_X$. The 68 and 95% central intervals of the expected limits are represented by the green and yellow bands, respectively, while the observed limit is superimposed as a curve. The plot corresponds to the $Z\rightarrow \mu\mu$ analysis.

Upper limits on the $pp\rightarrow ppZ/\gamma X$ cross section at 95% CL, as a function of $m_X$. The 68 and 95% central intervals of the expected limits are represented by the green and yellow bands, respectively, while the observed limit is superimposed as a curve. The plot corresponds to the $Z$ analysis.

Upper limits on the $pp\rightarrow ppZ/\gamma X$ cross section at 95% CL, as a function of $m_X$. The 68 and 95% central intervals of the expected limits are represented by the green and yellow bands, respectively, while the observed limit is superimposed as a curve. The plot corresponds to the $\gamma$ analysis.

Electron $p_{T}$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_{T}^{miss}$ distribution in the electron channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Muon $p_T$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_T^{miss}$ distribution in the muon channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the E+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the MU+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Theoretical prediction for the production and decay cross-section of SSM WPRIME bosons (W --> LEPTON + NU) as a function of the WPRIME mass, for the range 200-6400 GeV and inclusive in phase-space (no cuts). The uncertainty shown covers PDF and ALPHAS uncertainties. These theoretical predictions are obtained with PYTHIA (LO) and corrected to NNLO in QCD using FEWZ program.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW as a function of the mass of the WPRIME boson, for the electron channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime, being equal to gW, the SM coupling.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW, as a function of the mass of the WPRIME boson, for the muon channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime , being equal to gW, the SM coupling.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the electron channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the muon channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the combined electron and muon channels for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{231}$ coupling in the RPV SUSY model with a STAU mediator, as a function of the mass of STAU, for the electron channel and for the production coupling, ${\lambda}^{'}_{3ij}$=0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying the ones shown by the ratio ${\lambda}^{'}_{3ij}$/0.5

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{132}$ coupling in the RPV SUSY model with a stau mediator, as a function of the mass of the stau, for the muon channel and for the production coupling, ${\lambda}^{'}_{3ij}$ = 0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying these ones by the ratio ${\lambda}^{'}_{3ij}$/0.5

Region in the oblique (W,Y) parameter phase space allowed by the current analysis at 95% CL. The combination of the electron and muon channel distributions from the 2017 and 2018 data sets at sqrt(s) = 13 TeV is used, having 101 fb-1 of luminosity.

Negative Log-Likelihood for the determination of the oblique W parameter, for the combination of the electron and muon channel and for 2017 and 2018 data sets (L=101 fb-1) at sqrt(s) = 13 TeV.

Total background estimate and observed data in all bins used in the limit calculation for the SSM WPRIME limits. The total event sample is split into the three years of data taking and the two lepton flavors.The distributions being shown are $M_T$ ones. The associated integrated luminosities for each year are of 35.9, 41.5, and 59.4 fb$̣^{-1}. The mass bins are numbered in ascending order.

Observed and expected 95% CL upper limits on the product of the production cross section ($\sigma$) and the branching fraction, obtained after combining all categories with 138 $\mathrm{fb}^{−1}$ of data at $\sqrt{s}$ = 13 TeV for $\mathrm{V'}$ to $VV$ + $VH$ signal in HVT model C.

Total signal efficiency including all event categories as a function of the resonance mass $M_X$ for all DY/ggF signal models under consideration. The estimates from MC simulation (markers) are interpolated with a functional form (lines).

Total signal efficiency including all event categories as a function of the resonance mass $M_X$ for all VBF signal models under consideration. The estimates from MC simulation (markers) are interpolated with a functional form (lines).

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=1600\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2000\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2200\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2400\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2600\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2800\;\mathrm{GeV}$.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.01 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.1 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.2 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.3 $ imes$ its mass.

Model independent observed 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a top quark and a Z boson as a function of the T mass and width.

Singlet model 95% CL excluded values of the product of the cross section and branching fraction for a T decaying to a top quark and a Z boson.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Distribution of the three leading leptons flavour in the SR-WZ with uncertainties evaluated after the inclusive cross section fit

Efficiency, acceptance, and proportion of events with leptonic tau decays in WZ production

WZ fiducial cross section in the four flavour exclusive and the flavour inclusive channels

WZ total cross section extrapolated from the four flavour exclusive and the flavour inclusive channels

Distribution of the total lepton charge in the SR-WZ with uncertainties evaluated after the inclusive cross section fit

W$^{+}$Z fiducial cross section in the four flavour exclusive and the flavour inclusive channels

W$^{-}$Z fiducial cross section in the four flavour exclusive and the flavour inclusive channels

WZ charge asymmetry ratio measured on each of the four flavour exclusive and the flavour inclusive channels

Distribution of the cosine of the W polarization angle times total lepton charge in the SR-WZ with uncertainties evaluated after the W polarization fit

Distribution of the cosine of the Z polarization angle in the SR-WZ with uncertainties evaluated after the Z polarization fit

Best fits to the W and Z polarization fractions

2D confidence regions at the 68, 95, and 99% CL in the $f_O^W$-$f_{L}^W-f_R^W$ plane

2D confidence regions at the 68, 95, and 99% CL in the $f_O^Z$-$f_{L}^Z-f_R^Z$ plane

Distribution of the invariant mass of the WZ system in the SR-WZ with uncertainties evaluated after the inclusive cross section fit

Best fit values and one dimensional confidence regions in several EFT coefficients obtained from the EFT fit considering both the SM interferences and purely BSM (order $\Lambda^{-2}$ and $\Lambda^{-4}$) terms

2D confidence regions at the 68, 95, and 99% CL in the $c_{www}$-$c_{w}$ plane

2D confidence regions at the 68, 95, and 99% CL in the $c_{w}$-$c_{b}$ plane

2D confidence regions at the 68, 95, and 99% CL in the $c_{www}$-$c_{w}$ plane

Best fit values and one dimensional confidence regions in several EFT coefficients obtained from the EFT fit considering only the SM-EFT interference (order $\Lambda^{-2}$) terms

Evolution of the best fit and expected and observed 95% CI for the $c_{w}$ parameter as a function of the cutoff scale

Evolution of the best fit and expected and observed 95% CI for the $c_{b}$ parameter as a function of the cutoff scale

Evolution of the best fit and expected and observed 95% CI for the $c_{www}$ parameter as a function of the cutoff scale

Evolution of the best fit and expected and observed 95% CI for the $\tilde{c}_{www}$ parameter as a function of the cutoff scale

Evolution of the best fit and expected and observed 95% CI for the $\tilde{c}_{w}$ parameter as a function of the cutoff scale

Differential cross section with respect to the transverse momentum of the Z boson

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the Z boson

Response matrix for the $p_{T}$ of the Z boson obtained with POWHEG

Differential cross section with respect to the transverse momentum of the leading jet

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the leading jet

Response matrix for the $p_{T}$ of the leading jet obtained with POWHEG

Differential cross section with respect to the jet multiplicity

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the jet multiplicity

Response matrix for the jet multiplicity obtained with POWHEG

Differential cross section with respect to the invariant mass of the WZ system

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the invariant mass of the WZ system

Response matrix for the invariant mass of the WZ system obtained with POWHEG

Differential cross section with respect to the transverse momentum of the lepton associated to the W boson

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the lepton associated to the W boson

Response matrix for the $p_{T}$ of the lepton associated to the W boson obtained with POWHEG

Differential cross section with respect to the transverse momentum of the lepton associated to the W boson, W$^{+}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the lepton associated to the W boson, W$^{+}$Z only

Differential cross section with respect to the transverse momentum of the lepton associated to the W boson, W$^{-}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the $p_{T}$ of the lepton associated to the W boson, W$^{-}$Z only

Differential cross section with respect to the cosine of the W polarization angle times total lepton charge

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the W polarization angle times total lepton charge

Response matrix for the cosine of the W polarization angle times total lepton charge obtained with POWHEG

Differential cross section with respect to the cosine of the W polarization angle times total lepton charge, W$^{+}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the W polarization angle times total lepton charge, W$^{+}$Z only

Differential cross section with respect to the cosine of the W polarization angle times total lepton charge, W$^{-}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the W polarization angle times total lepton charge, W$^{-}$Z only

Differential cross section with respect to the cosine of the Z polarization angle

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the Z polarization angle

Response matrix for the cosine of the Z polarization angle obtained with POWHEG

Differential cross section with respect to the cosine of the Z polarization angle, W$^{+}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the Z polarization angle, W$^{+}$Z only

Differential cross section with respect to the cosine of the Z polarization angle, W$^{-}$Z only

Correlation matrix for the unfolded results obtained using NNLO bias, area con-straint, and no additional regularization for the cosine of the Z polarization angle, W$^{-}$Z only

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Differential signal yields for various signal hypotheses.

Background and data yields in the control and signal region bins. The prediction before ("prefit") and after the background only fit ("b-only") are given separately.

Background and data yields in the control and signal region bins. The prediction before ("prefit") and after the background only fit ("b-only") are given separately.

Background and data yields in the control and signal region bins. The prediction before ("prefit") and after the background only fit ("b-only") are given separately.

Background and data yields in the control and signal region bins. The prediction before ("prefit") and after the background only fit ("b-only") are given separately.

Background and data yields in the control and signal region bins. The prediction before ("prefit") and after the background only fit ("b-only") are given separately.

Background and data yields in the control and signal region bins. The prediction before ("prefit") and after the background only fit ("b-only") are given separately.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit to the control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit to the control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit to the corresponding control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit to the corresponding control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit to the control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit to the control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit to the corresponding control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit to the corresponding control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit to the control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit to the control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit to the corresponding control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit to the corresponding control regions, and serve as input to the simplified likelihood reinterpretation scheme.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Unweighted signal acceptance times efficiency at every cut stage. The requirements called "HCAL mitigation" refer to the requirements imposed in the 2018 data set in order to mitigate the localized failure of the HCAL detector.

Median Expected exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with axial couplings.

Median Expected exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with axial couplings.

Observed exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with axial couplings.

Observed exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with axial couplings.

Expected plus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with axial couplings.

Expected plus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with axial couplings.

Expected minus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with axial couplings.

Expected minus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with axial couplings.

Median Expected exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with vector couplings.

Median Expected exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with vector couplings.

Observed exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with vector couplings.

Observed exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with vector couplings.

Expected plus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with vector couplings.

Expected plus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with vector couplings.

Expected minus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with vector couplings.

Expected minus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the simplified model with vector couplings.

Upper limits on the coupling $g_{\chi}$ in the simplified model with a axial mediator.

Upper limits on the coupling $g_{\chi}$ in the simplified model with a axial mediator.

Upper limits on the coupling $g_{q}$ in the simplified model with a axial mediator.

Upper limits on the coupling $g_{q}$ in the simplified model with a axial mediator.

Upper limits on the coupling $g_{\chi}$ in the simplified model with a vector mediator.

Upper limits on the coupling $g_{\chi}$ in the simplified model with a vector mediator.

Upper limits on the coupling $g_{q}$ in the simplified model with a vector mediator.

Upper limits on the coupling $g_{q}$ in the simplified model with a vector mediator.

Exclusion limits on the signal strength in the simplified model with scalar couplings.

Exclusion limits on the signal strength in the simplified model with scalar couplings.

Exclusion limits on the signal strength in the simplified model with pseudoscalar couplings.

Exclusion limits on the signal strength in the simplified model with pseudoscalar couplings.

Exclusion limits on the fundamental Planck scale $M_{D}$ as a function of the number of extra dimensions $d$.

Exclusion limits on the fundamental Planck scale $M_{D}$ as a function of the number of extra dimensions $d$.

Median Expected exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the fermion portal model.

Median Expected exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the fermion portal model.

Observed exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the fermion portal model.

Observed exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the fermion portal model.

Expected plus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the fermion portal model.

Expected plus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the fermion portal model.

Expected minus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the fermion portal model.

Expected minus 1 s.d. exclusion contour in the $m_{med}$-$m_{\chi}$ plane in the fermion portal model.

Tagging efficiency for AK8 jets. The efficiency includes the effect of the machine-learning based DeepAK8 tagger, as well as the application of the mass window requirement on the jet. The efficiency is split depending on the matching generator-level object. For reinterpretation purposes, this efficiency can directly be applied to any AK8 jet that is matched to a given type of generator-level object, with no prior selection on the jet mass. Other acceptance requirements on jet $\p_{T}$ and $\eta$ should still be applied.

Tagging efficiency for AK8 jets. The efficiency includes the effect of the machine-learning based DeepAK8 tagger, as well as the application of the mass window requirement on the jet. The efficiency is split depending on the matching generator-level object. For reinterpretation purposes, this efficiency can directly be applied to any AK8 jet that is matched to a given type of generator-level object, with no prior selection on the jet mass. Other acceptance requirements on jet $\p_{T}$ and $\eta$ should still be applied.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 15 GeV mass and $ S \rightarrow d\bar{d}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 40 GeV mass and $ S \rightarrow d\bar{d}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 40 GeV mass and $ S \rightarrow d\bar{d}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 55 GeV mass and $ S \rightarrow d\bar{d}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 55 GeV mass and $ S \rightarrow d\bar{d}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 7 GeV mass and $ S \rightarrow \tau^{+} \tau^{-}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 7 GeV mass and $ S \rightarrow \tau^{+} \tau^{-}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 15 GeV mass and $ S \rightarrow \tau^{+} \tau^{-}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 15 GeV mass and $ S \rightarrow \tau^{+} \tau^{-}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 40 GeV mass and $ S \rightarrow \tau^{+} \tau^{-}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 40 GeV mass and $ S \rightarrow \tau^{+} \tau^{-}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 55 GeV mass and $ S \rightarrow \tau^{+} \tau^{-}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 55 GeV mass and $ S \rightarrow \tau^{+} \tau^{-}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 15 GeV mass and $ S \rightarrow b\bar{b}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 15 GeV mass and $ S \rightarrow b\bar{b}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 40 GeV mass and $ S \rightarrow b\bar{b}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 40 GeV mass and $ S \rightarrow b\bar{b}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 55 GeV mass and $ S \rightarrow b\bar{b}$ decay mode.

The 95% CL observed and expected limits on the branching fraction B(H $\rightarrow$ SS) for 55 GeV mass and $ S \rightarrow b\bar{b}$ decay mode.

The cluster efficiency in bins of hadronic and EM energy in region A. Region A is defined as 391 cm $< r <$ 695.5 cm and 400 cm $< |z| <$ 671 cm. The cluster efficiency is estimated with LLPs decaying to $\tau^{+} \tau^{-}$. The sample contains equal fractions of events with LLP mass of 7, 15, 40, and 55 GeV and LLP lifetime of 0.1, 1, 10, and 100m. The first hadronic energy bins correspond to LLPs that decayed leptonically with 0 hadronic energy. The cluster efficiency includes all cluster-level selections described in the paper, except for the jet veto, time cut, and $\Delta\phi$ cut. The full simulation signal yield prediction for samples with various LLP mass between 7 - 55 GeV, lifetime between 0.1 - 100 m, and decay mode to $d\bar{d}$ and $\tau^{+} \tau^{-}$ can be reproduced using this parameterization to within 35% and 20% for region A and B, respectively.

The cluster efficiency in bins of hadronic and EM energy in region A. Region A is defined as 391 cm $< r <$ 695.5 cm and 400 cm $< |z| <$ 671 cm. The cluster efficiency is estimated with LLPs decaying to $\tau^{+} \tau^{-}$. The sample contains equal fractions of events with LLP mass of 7, 15, 40, and 55 GeV and LLP lifetime of 0.1, 1, 10, and 100m. The first hadronic energy bins correspond to LLPs that decayed leptonically with 0 hadronic energy. The cluster efficiency includes all cluster-level selections described in the paper, except for the jet veto, time cut, and $\Delta\phi$ cut. The full simulation signal yield prediction for samples with various LLP mass between 7 - 55 GeV, lifetime between 0.1 - 100 m, and decay mode to $d\bar{d}$ and $\tau^{+} \tau^{-}$ can be reproduced using this parameterization to within 35% and 20% for region A and B, respectively.

The cluster efficiency in bins of hadronic and EM energy in region B. Region B is defined as 671 cm $< |z| <$ 1100 cm, $r <$ 695.5 cm, and $|\eta| <$ 2. The cluster efficiency is estimated with LLPs decaying to $\tau^{+} \tau^{-}$. The sample contains equal fractions of events with LLP mass of 7, 15, 40, and 55 GeV and LLP lifetime of 0.1, 1, 10, and 100m. The first hadronic energy bins correspond to LLPs that decayed leptonically with 0 hadronic energy. The cluster efficiency includes all cluster-level selections described in the paper, except for the jet veto, time cut, and $\Delta\phi$ cut. The full simulation signal yield prediction for samples with various LLP mass between 7 - 55 GeV, lifetime between 0.1 - 100 m, and decay mode to $d\bar{d}$ and $\tau^{+} \tau^{-}$ can be reproduced using this parameterization to within 35% and 20% for region A and B, respectively.

The cluster efficiency in bins of hadronic and EM energy in region B. Region B is defined as 671 cm $< |z| <$ 1100 cm, $r <$ 695.5 cm, and $|\eta| <$ 2. The cluster efficiency is estimated with LLPs decaying to $\tau^{+} \tau^{-}$. The sample contains equal fractions of events with LLP mass of 7, 15, 40, and 55 GeV and LLP lifetime of 0.1, 1, 10, and 100m. The first hadronic energy bins correspond to LLPs that decayed leptonically with 0 hadronic energy. The cluster efficiency includes all cluster-level selections described in the paper, except for the jet veto, time cut, and $\Delta\phi$ cut. The full simulation signal yield prediction for samples with various LLP mass between 7 - 55 GeV, lifetime between 0.1 - 100 m, and decay mode to $d\bar{d}$ and $\tau^{+} \tau^{-}$ can be reproduced using this parameterization to within 35% and 20% for region A and B, respectively.

The efficiency of $N_{station} > 1$ requirement in bins of hadronic energy in region B. Region B is defined as 671 cm $< |z| <$ 1100 cm, $r <$ 695.5 cm, and $|\eta| <$ 2. The cluster efficiency is estimated with LLPs decaying to $\tau^{+} \tau^{-}$. The sample contains equal fractions of events with LLP mass of 7, 15, 40, and 55 GeV and LLP lifetime of 0.1, 1, 10, and 100m. The first hadronic energy bin corresponds to LLPs that decayed leptonically with 0 hadronic energy. The efficiency is calculated with respect to clusters that pass all cluster-level cuts described in the paper, except for the jet veto, time cut, and $\Delta\phi$ cut. The full simulation signal yield prediction for samples with various LLP mass between 7 - 55 GeV, lifetime between 0.1 - 100 m, and decay mode to $d\bar{d}$ and $\tau^{+} \tau^{-}$ can be reproduced using this parameterization to within 10%.

The efficiency of $N_{station} > 1$ requirement in bins of hadronic energy in region B. Region B is defined as 671 cm $< |z| <$ 1100 cm, $r <$ 695.5 cm, and $|\eta| <$ 2. The cluster efficiency is estimated with LLPs decaying to $\tau^{+} \tau^{-}$. The sample contains equal fractions of events with LLP mass of 7, 15, 40, and 55 GeV and LLP lifetime of 0.1, 1, 10, and 100m. The first hadronic energy bin corresponds to LLPs that decayed leptonically with 0 hadronic energy. The efficiency is calculated with respect to clusters that pass all cluster-level cuts described in the paper, except for the jet veto, time cut, and $\Delta\phi$ cut. The full simulation signal yield prediction for samples with various LLP mass between 7 - 55 GeV, lifetime between 0.1 - 100 m, and decay mode to $d\bar{d}$ and $\tau^{+} \tau^{-}$ can be reproduced using this parameterization to within 10%.

The geometric signal acceptance as a function of $c\tau$. The acceptance is shown for four different LLP mass hypotheses: 7, 15, 40, and 55 GeV. The acceptance is defined by requiring at least 1 LLP to decay in the region defined as 400 cm $< |z| <$ 1100 cm, $r < $ 695.5 cm, and $|\eta| <$ 2.4.

The product of signal acceptance and efficiency in the 2l categories for the signal produced via vector boson fusion.

$m_{X}^{T}$ distribution in data in the 0l 2b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}^{T}$ observed in the SR.

$m_{X}^{T}$ distribution in data in the 0l $\leq$1b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}^{T}$ observed in the SR.

$m_{X}$ distribution in data in the 2e 2b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2e $\leq$1b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2$\mu$ 2b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2$\mu$ $\leq$1b non-VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}^{T}$ distribution in data in the 0l 2b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}^{T}$ observed in the SR.

$m_{X}^{T}$ distribution in data in the 0l $\leq$1b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}^{T}$ observed in the SR.

$m_{X}$ distribution in data in the 2e 2b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2e $\leq$1b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2$\mu$ 2b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

$m_{X}$ distribution in data in the 2$\mu$ $\leq$1b VBF category. The data is shown as Events/10 GeV. The distribution is shown up 4000 GeV, which corresponds to the event with the highest $m_{X}$ observed in the SR.

Observed and expected 95% CL upper limit on $\sigma \mathcal{B}$(Z'-> ZH) with all categories combined for the non-VBF signal, including all statistical and systematic uncertainties. The inner green band and the outer yellow band indicate the regions containing 68 and 95%, respectively, of the distribution of expected limits under the background-only hypothesis. The CMS search for a heavy resonance using 2016 data and the same final state [JHEP 11 (2018) 172] is shown as a comparison.

Observed and expected 95% CL upper limit on $\sigma \mathcal{B}$(Z'-> ZH) with all categories combined for the VBF signal, including all statistical and systematic uncertainties. The inner green band and the outer yellow band indicate the regions containing 68 and 95%, respectively, of the distribution of expected limits under the background-only hypothesis.

Observed exclusion limit in the space of the HVT model parameters [$g_{V}c_{H}$, $g^{2}c_{F}/g_{V}$] for mass hypotheses of 2 TeV for the non-VBF signal.

Observed exclusion limit in the space of the HVT model parameters [$g_{V}c_{H}$, $g^{2}c_{F}/g_{V}$] for mass hypotheses of 3 TeV for the non-VBF signal.

Observed exclusion limit in the space of the HVT model parameters [$g_{V}c_{H}$, $g^{2}c_{F}/g_{V}$] for mass hypotheses of 4 TeV for the non-VBF signal.

Distributions in SR-low of the data and post-fit background prediction for H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3&#8467;/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3&#8467;/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3&#8467;). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3&#8467;). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

The observed upper limits on the model cross-section in units of pb for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production. Three points at $M({\tilde{\chi}}^{0}_{1})=200GeV$ were removed from the plot but kept in the table because they overlapped with the plot's legend and are far from the exclusion contour.

The observed 95\% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95\% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onLM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onMM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onMM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onMM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onMM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onHM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onHM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onHM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-onHM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offLM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offLM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offLM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offLM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offMM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offMM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offMM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offMM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offHM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offHM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offHM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution is shown in the validation region VR-offHM after all the selection requirements are applied other than the $m_{CT}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. The red line with arrow indicates the $m_{CT}$ cut used in SR selection. The first and the last bin include the underflow and overflow events (where present), respectively.

The post-fit $m_{CT}$ distribution for SR-HM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-HM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-HM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-HM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-MM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-MM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-MM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-MM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-LM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-LM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-LM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{CT}$ distribution for SR-LM. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-HM after all the selection requirements are applied other than the $m_{bb}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection.The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-HM after all the selection requirements are applied other than the $m_{bb}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection.The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-HM after all the selection requirements are applied other than the $m_{bb}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection.The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-HM after all the selection requirements are applied other than the $m_{bb}$ cut. The stacked histograms show the expected SM backgrounds. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection.The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-MM after all the selection requirements are applied other than the $m_{bb}$ cut. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection. The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-MM after all the selection requirements are applied other than the $m_{bb}$ cut. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection. The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-MM after all the selection requirements are applied other than the $m_{bb}$ cut. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection. The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-MM after all the selection requirements are applied other than the $m_{bb}$ cut. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection. The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-LM after all the selection requirements are applied other than the $m_{bb}$ cut. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection. The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-LM after all the selection requirements are applied other than the $m_{bb}$ cut. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection. The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-LM after all the selection requirements are applied other than the $m_{bb}$ cut. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection. The overflow events, where present, are included in the last bin.

The post-fit $m_{bb}$ distribution is shown in the signal region SR-LM after all the selection requirements are applied other than the $m_{bb}$ cut. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distribution of the SUSY reference points are also shown as dashed lines. The red line with arrow indicates the $m_{bb}$ cut used in SR selection. The overflow events, where present, are included in the last bin.

The observed exclusion for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The observed exclusion for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The observed exclusion for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The observed exclusion for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The observed exclusion up limit for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. The red dotted lines indicate the $\pm 1 \sigma$ on the observed exclusion limit due to the theoretical uncertainties in the signal cross-section.

The observed exclusion up limit for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. The red dotted lines indicate the $\pm 1 \sigma$ on the observed exclusion limit due to the theoretical uncertainties in the signal cross-section.

The observed exclusion up limit for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. The red dotted lines indicate the $\pm 1 \sigma$ on the observed exclusion limit due to the theoretical uncertainties in the signal cross-section.

The observed exclusion up limit for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. The red dotted lines indicate the $\pm 1 \sigma$ on the observed exclusion limit due to the theoretical uncertainties in the signal cross-section.

The observed exclusion down limit for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. The red dotted lines indicate the $\pm 1 \sigma$ on the observed exclusion limit due to the theoretical uncertainties in the signal cross-section.

The observed exclusion down limit for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. The red dotted lines indicate the $\pm 1 \sigma$ on the observed exclusion limit due to the theoretical uncertainties in the signal cross-section.

The observed exclusion down limit for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. The red dotted lines indicate the $\pm 1 \sigma$ on the observed exclusion limit due to the theoretical uncertainties in the signal cross-section.

The observed exclusion down limit for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. The red dotted lines indicate the $\pm 1 \sigma$ on the observed exclusion limit due to the theoretical uncertainties in the signal cross-section.

The expected exclusion for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The expected exclusion for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The expected exclusion for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

The expected exclusion for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. Experimental and theoretical systematic uncertainties are applied to background and signal samples and illustrated by the yellow band and the red dotted contour lines, respectively. The red dotted lines indicate the $\pm$ 1 standard-deviation variation on the observed exclusion limit due to theoretical uncertainties in the signal cross-section.

Upper limits on the cross sections for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Upper limits on the cross sections for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Upper limits on the cross sections for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Upper limits on the cross sections for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM med. $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM med. $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM med. $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM med. $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM high $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM high $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM high $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-LM high $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM med. $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM med. $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM med. $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM med. $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM high $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM high $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM high $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-MM high $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-HM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. 1lb\bar{b}$ production

Signal acceptance in SR-HM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. 1lb\bar{b}$ production

Signal acceptance in SR-HM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. 1lb\bar{b}$ production

Signal acceptance in SR-HM for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production. 1lb\bar{b}$ production

Signal acceptance in SR-HM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-HM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-HM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.

Signal acceptance in SR-HM low $m_{CT}$ for simplified models with $\tilde\chi^\pm_1 \tilde\chi^0_2 \rightarrow Wh\tilde\chi^0_1\tilde\chi^0_1, W \rightarrow l\nu, h \rightarrow b\bar{b}$ production.