Expected and observed 95% CL cross section exclusion contours for top squark pair production in the plane of top squark lifetime ($c\tau$) and top squark mass. These limits assume a branching fraction of 100\% through the RPV vertex $\tilde{t}$ $\to$ b l, where the branching fraction to any lepton flavor is equal to 1/3. As indicated in the plot, the region to the left of the contours is excluded by this search.

Electron reconstruction efficiency as function of its tranverse impact parameter, $d_0$.

Muon reconstruction efficiency as function of its tranverse impact parameter, $d_0$.

Electron selection efficiency as function of its tranverse momentum, $p_T$.

Muon selection efficiency as function of its tranverse momentum, $p_T$.

$v_{2,2}^{unsub}$ and $v_{2,2}$ as a function of $\Delta\eta$ calculated from the 2-D per-trigger yields in figure 4(a) and 4(b), respectively.

$v_{3,3}^{unsub}$ and $v_{3,3}$ as a function of $\Delta\eta$ calculated from the 2-D per-trigger yields in figure 4(a) and 4(b), respectively.

$v_{4,4}^{unsub}$ and $v_{4,4}$ as a function of $\Delta\eta$ calculated from the 2-D per-trigger yields in figure 4(a) and 4(b), respectively.

The per-trigger yield distributions $Y^{corr}(\Delta\phi)$ and $Y^{recoil}(\Delta\phi)$ for events with $N_{ch}^{rec} \geq$ 220 in the long-range region $|\Delta\eta| >$ 2.

The per-trigger yield distributions $Y^{corr}(\Delta\phi)$ and $Y^{recoil}(\Delta\phi)$ for events with $N_{ch}^{rec} \geq$ 220 in the long-range region $|\Delta\eta| >$ 2.

The per-trigger yield distributions $Y^{corr}(\Delta\phi)$ and $Y^{recoil}(\Delta\phi)$ for events with $N_{ch}^{rec} \geq$ 220 in the long-range region $|\Delta\eta| >$ 2.

The per-trigger yield distributions $Y^{corr}(\Delta\phi)$ and $Y^{recoil}(\Delta\phi)$ for events with $N_{ch}^{rec} \geq$ 220 in the long-range region $|\Delta\eta| >$ 2.

The per-trigger yield distributions $Y^{corr}(\Delta\phi)$ and $Y^{recoil}(\Delta\phi)$ for events with $N_{ch}^{rec} \geq$ 220 in the long-range region $|\Delta\eta| >$ 2.

The per-trigger yield distributions $Y^{corr}(\Delta\phi)$ and $Y^{recoil}(\Delta\phi)$ for events with $N_{ch}^{rec} \geq$ 220 in the long-range region $|\Delta\eta| >$ 2.

The per-trigger yield distributions $Y^{corr}(\Delta\phi)$ and $Y^{recoil}(\Delta\phi)$ for events with $N_{ch}^{rec} \geq$ 220 in the long-range region $|\Delta\eta| >$ 2.

Integrated per-trigger yield, $Y_{int}$, on the near-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the near-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the near-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the near-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the near-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the away-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the away-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the away-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the away-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

Integrated per-trigger yield, $Y_{int}$, on the away-side as a function of $p_{T}^{a}$ for 1 $< p_{T}^{b} <$ 3 GeV.

The integrated per-trigger yield, Y_{int}, on the near-side, the away-side and their difference and Y_{int} from the recoil as a function of event activity. Errors are statistical.

The integrated per-trigger yield, Y_{int}, on the near-side, the away-side and their difference and Y_{int} from the recoil as a function of event activity. Errors are statistical.

The Fourier coefficients $v_{n}$ as a function of $p_{T}^{a}$ extracted from the correlation functions, before and after the subtraction of the recoil component.

The Fourier coefficients $v_{n}$ as a function of $p_{T}^{a}$ extracted from the correlation functions, before and after the subtraction of the recoil component.

The Fourier coefficients $v_{n}$ as a function of $p_{T}^{a}$ extracted from the correlation functions, before and after the subtraction of the recoil component.

$v_{2}$, $v_{3}$, $v_{4}$ and $v_{5}$ as a function of $p_T^a$ for 1 $< p_{T}^{b} <$ 3 GeV for different $N_{ch}^{rec}$ intervals.

$v_{2}$, $v_{3}$, $v_{4}$ and $v_{5}$ as a function of $p_T^a$ for 1 $< p_{T}^{b} <$ 3 GeV for different $N_{ch}^{rec}$ intervals.

$v_{2}$, $v_{3}$, $v_{4}$ and $v_{5}$ as a function of $p_T^a$ for 1 $< p_{T}^{b} <$ 3 GeV for different $N_{ch}^{rec}$ intervals.

$v_{2}$, $v_{3}$, $v_{4}$ and $v_{5}$ as a function of $p_T^a$ for 1 $< p_{T}^{b} <$ 3 GeV for different $N_{ch}^{rec}$ intervals.

$v_{2}$, $v_{3}$, $v_{4}$ and $v_{5}$ as a function of $p_T^a$ for 1 $< p_{T}^{b} <$ 3 GeV for different $N_{ch}^{rec}$ intervals.

$v_{2}$, $v_{3}$, $v_{4}$ and $v_{5}$ as a function of $p_T^a$ for 1 $< p_{T}^{b} <$ 3 GeV for different $N_{ch}^{rec}$ intervals.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{2}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The values of factorization variable $r_{3}$ defined by Eq.(11) before and after the subtraction of the recoil component. Errors are total experimental uncertainties.

The centrality dependence of $v_{2}$ as a function of $N_{ch}^{rec}$. Values from before and after the recoil subtraction are included.

The centrality dependence of $v_{3}$ as a function of $N_{ch}^{rec}$. Values from before and after the recoil subtraction are included.

The centrality dependence of $v_{4}$ as a function of $N_{ch}^{rec}$. Values from before and after the recoil subtraction are included.

The centrality dependence of $v_{2}$ as a function of $E_{T}^{Pb}$. Values from before and after the recoil subtraction are included.

The centrality dependence of $v_{3}$ as a function of $E_{T}^{Pb}$. Values from before and after the recoil subtraction are included.

The centrality dependence of $v_{4}$ as a function of $E_{T}^{Pb}$. Values from before and after the recoil subtraction are included.

The $v_{2}$ as a function of $E_{T}^{Pb}$ obtained indirectly by mapping from the $N_{ch}^{rec}-dependence of $v_{2}$ using the correlation data shown in Fig. 2(b).

The $v_{3}$ as a function of $E_{T}^{Pb}$ obtained indirectly by mapping from the $N_{ch}^{rec}-dependence of $v_{3}$ using the correlation data shown in Fig. 2(b).

The first-order harmonic of 2PC before recoil subtraction, $v_{1,1}^{unsub}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC before recoil subtraction, $v_{1,1}^{unsub}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC before recoil subtraction, $v_{1,1}^{unsub}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC before recoil subtraction, $v_{1,1}^{unsub}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC before recoil subtraction, $v_{1,1}^{unsub}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC before recoil subtraction, $v_{1,1}^{unsub}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC after recoil subtraction, $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC after recoil subtraction, $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC after recoil subtraction, $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC after recoil subtraction, $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC after recoil subtraction, $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic of 2PC after recoil subtraction, $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic $v_1$ obtained using factorization from $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic $v_1$ obtained using factorization from $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

The first-order harmonic $v_1$ obtained using factorization from $v_{1,1}$, as a function of $p_T^a$ for different $p_T^b$ ranges for events with $N_{ch}^{rec} \geq$ 220.

$v_{2}$ for Pb+Pb collisions in 55-60% centrality interval obtained using an EP method.

$v_{2}$ for Pb+Pb collisions in 55-60% centrality interval obtained using an EP method, after the scaling.

$v_{3}$ for Pb+Pb collisions in 55-60% centrality interval obtained using an EP method.

$v_{3}$ for Pb+Pb collisions in 55-60% centrality interval obtained using an EP method, after the scaling.

$v_{4}$ for Pb+Pb collisions in 55-60% centrality interval obtained using an EP method.

$v_{4}$ for Pb+Pb collisions in 55-60% centrality interval obtained using an EP method, after the scaling.

Correlation between $E_{T}^{FCal}$ and $N_{ch}^{rec}$ for MB events (without weighting) and MB+HMT events (with weighting), errors are statistical.

The $v_{dyn}$ and the three terms of $v_{dyn}$ vs $\sqrt{\langle N_{ch}\rangle \langle N_{\gamma}\rangle }$ for mixed events. $Corr_{\gamma\,-ch}^{real}$ is plotted.

The $v_{dyn}$ and the three terms of $v_{dyn}$ vs $\sqrt{\langle N_{ch}\rangle \langle N_{\gamma}\rangle }$ for mixed events. $Corr_{\gamma\,-ch}^{mixed}$ is plotted.

The $v_{dyn}$ and the three terms of $v_{dyn}$ vs $\sqrt{\langle N_{ch}\rangle \langle N_{\gamma}\rangle }$ for mixed events. $\omega_{\gamma}^{real}$ is plotted.

The $v_{dyn}$ and the three terms of $v_{dyn}$ vs $\sqrt{\langle N_{ch}\rangle \langle N_{\gamma}\rangle }$ for mixed events. $\omega_{\gamma}^{mixed}$ is plotted.

The $v_{dyn}$ and the three terms of $v_{dyn}$ vs $\sqrt{\langle N_{ch}\rangle \langle N_{\gamma}\rangle }$ for mixed events. $v_{dyn}^{real}$ is plotted.

The $v_{dyn}$ and the three terms of $v_{dyn}$ vs $\sqrt{\langle N_{ch}\rangle \langle N_{\gamma}\rangle }$ for mixed events. $v_{dyn}^{mixed}$ is plotted.

The values of the observable $v_{dyn}^{ch-\gamma}$ for the same side.

The values of the observable $v_{dyn}^{ch-\gamma}$ for the same side.

The values of the observable $v_{dyn}^{ch-\gamma}$ for the away-side.

The values of the observable $v_{dyn}^{ch-\gamma}$ for the away-side.

The correlation between positive and negative charged particles measured by the FTPC and photons measured by the PMD using $v_{dyn}$ for real events.

$r_{m,1}$ vs multiplicity for first order of m.

$r_{m,1}$ vs multiplicity for first order of m.

$r_{m,1}$ vs multiplicity for second order of m.

$r_{m,1}$ vs multiplicity for second order of m.

$r_{m,1}$ vs multiplicity for third order of m.

$r_{m,1}$ vs multiplicity for third order of m.

The moments $r_{m,1}$(m=1-3) for real and mixed events as a function of order m in a fixed multiplicity bin of 47$\langle \sqrt{\langle N_{ch}\rangle \langle N_{\gamma}\rangle }\langle 54$.

Differential production yield per binary collision for $W^{-}$ bosons as a function of $|\eta_\ell|$.

The lepton charge asymmetry $A_{\ell}$ from $W^\pm$ bosons as a function of absolute pseudorapidity.

The $\Lambda\Lambda$ interaction parameters from this experiment.

Selection acceptance times efficiency as a function of WPRIME mass at truth level for left- and right-handed WPRIME MC. The total efficiency curves correspond to the sum of the efficiencies of the one b-tag and two b-tag categories.

Cutflow (efficiency with respect to total number of events in %) for several WPRIME masses in the left-handed and in the right-handed model for hadronic top-quark decays.

Overview of the signal acceptance times efficiency (A x Eff) for the hadronic top-quark decay for both categories, the predicted cross section times branching ratio to TOP BOTTOM, as well as the observed 95% CL limit on the cross section times branching ratio for several WPRIME masses in the left-handed and in the right-handed model. The expected signal event yields in the two categories for 20.3 fb-1 of 8 TeV data are also shown.

Selection efficiencies in % for the signal in the top squark search, estimated from the simulation.

The final $S_{\text{T}}$ distribution for the leptoquark search with the $\text{e}\tau_{\text{h}}$ and $\mu\tau_{\text{h}}$ channels combined. The last bin contains the overflow events.

The final $S_{\text{T}}$ distribution for the top squark search with the $\text{e}\tau_{\text{h}}$ and $\mu\tau_{\text{h}}$ channels combined. The last bin contains the overflow events.

The expected and observed combined upper limits on the third-generation LQ pair production cross section $\sigma$ times the square of the branching fraction, $\mathcal{B}^2$, at 95% CL, as a function of the LQ mass. These limits also apply to top squarks decaying directly via the coupling $\lambda^{\prime}_{333}$.

The expected and observed combined upper limits on the top squark pair production cross section $\sigma$ times the square of the branching fraction, $\mathcal{B}^2$, at 95% CL, as a function of the top squark mass. These limits apply to top squarks with a chargino-mediated decay through the coupling $\lambda^{\prime}_{3jk}$.

The expected and observed 95% CL upper limits on the branching fraction for the leptoquark decay to a tau lepton and a bottom quark, as a function of the leptoquark mass. A search for top squark pair production [EPJC 73(2013)2677] has the same kinematic signature as the leptoquark decay to a tau neutrino and a top quark. This search is reinterpreted to provide the expected and observed 95% CL upper limits for low values of $\mathcal{B}$, assuming the leptoquark only decays to third-generation fermions.

Spectrum of ETmiss for the muon channel after the event selection. The spectrum is shown with the requirement MT > 252 GeV.

Spectrum of MT for the electron channel after the event selection.

Spectrum of MT for the muon channel after the event selection.

Observed and expected limits on SIGMA*B for WPRIME at 95% CL in the electron channel.

Observed and expected limits on SIGMA*B for W* at 95% CL in the electron channel.

Observed and expected limits on SIGMA*B for WPRIME at 95% CL in the muon channel.

Observed and expected limits on SIGMA*B for W* at 95% CL in the muon channel.

Observed and expected limits on SIGMA*B for WPRIME at 95% CL for the combination of the electron and muon channels.

Observed and expected limits on SIGMA*B for W* at 95% CL for the combination of the electron and muon channels.

Observed limits on M* as a function of the DM particle mass M(chi) at 90% CL for the combination of the electron and muon channel for various operators in the EFT.

Observed limits on the DM-nucleon scattering cross-section as a function of M(chi) at 90% CL for various operators in the EFT.

Observed limits on M* as a function of the DM particle mass M(chi) at 90% CL in the electron for various operators in the EFT.

Observed limits on M* as a function of the DM particle mass M(chi) at 90% CL in the muon for various operators in the EFT.

Observed limits on M* as a function of the DM particle mass M(chi) at 95% CL in the electron for various operators in the EFT.

Observed limits on M* as a function of the DM particle mass M(chi) at 95% CL in the muon for various operators in the EFT.

Observed limits on M* as a function of the DM particle mass M(chi) at 95% CL for the combination of the electron and muon channel for various operators in the EFT.

Reconstructed $\cos\theta^*$ distributions for data and the SM background estimate in the dimuon channel.

Reconstructed $A_{\rm FB}$ distributions for data and the SM background estimate as a function of dielectron mass.

Reconstructed $A_{\rm FB}$ distributions for data and the SM background estimate as a function of dimuon mass.

Summary of 95% C.L. lower exclusion limits on $\Lambda$ for the combined dilepton contact interaction search, using a uniform positive prior in 1/$\Lambda^2$.

Summary of 95% C.L. lower exclusion limits on $M_{\rm S}$ for the combined dilepton ADD large extra dimensions search, using a uniform positive prior in 1/$M_{\rm S}^8$.

Reconstructed $\cos\theta^*$ distributions for data and the SM background estimate in the electron channel.

Reconstructed $\cos\theta^*$ distributions for data and the SM background estimate in the muon channel.

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.