Final state radiation correction used in the $\phi_{\eta}^{*}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Final state radiation correction used in the $y^{Z}-p_{T}^{Z}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Final state radiation correction used in the $y^{Z}-\phi_{\eta}^{*}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Correlation matrix of statistical uncertainty for one-dimensional $y^Z$ measurement.

Correlation matrix of statistical uncertainty for one-dimensional $p_{T}^{Z}$ measurement.

Correlation matrix of statistical uncertainty for one-dimensional $\phi_{\eta}^{*}$ measurement.

Correlation matrix of statistical uncertainty for two-dimensional $y^Z-p_{T}^{Z}$ measurement.

Correlation matrix of statistical uncertainty for two-dimensional $y^Z-\phi_{\eta}^{*}$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $y^Z$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $p_{T}^{Z}$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $\phi_{\eta}^{*}$ measurement.

Correlation matrix of efficiency uncertainty for two-dimensional $y^Z-p_{T}^{Z}$ measurement.

Correlation matrix of efficiency uncertainty for two-dimensional $y^Z-\phi_{\eta}^{*}$ measurement.

Measured total $Z$-boson cross-section for different datasets. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $y^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $p_{T}^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $\phi_{\eta}^{*}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured double differential cross-sections in interval regions of $y^{Z}$ and $p_{T}^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured double differential cross-sections in interval regions of $y^{Z}$ and $\phi_{\eta}^{*}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Systematic uncertainties in the single differential cross-sections in interval regions of $y^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the single differential cross-sections in interval regions of $p_{T}^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the single differential cross-sections in interval regions of $\phi_{\eta}^{*}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the double differential cross-sections in interval regions of $y^{Z}$ and $p_{T}^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the double differential cross-sections in interval regions of $y^{Z}$ and $\phi_{\eta}^{*}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons with a Soeding-inspired analytic function --- statistical correlations only. Only one half of the (symmetric) matrix is stored.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons, differential in the dipion mass and in bins of $W$. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons, differential in the dipion mass and in bins of $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, in bins of the photon-proton energy $W$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross sections off protons as a function of energy. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross sections off protons as a function of energy --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic $\rho^0(770)$ photoproduction cross section off protons as a function of energy (various experiments)

Fit of elastic $\rho^0(770)$ photoproduction cross sections off protons as a function of energy (various experiments) --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction cross section off protons, double-differential in the dipion mass and the momentum transfer $\vert t\vert$. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction cross section off protons, double-differential in the dipion mass and the momentum transfer $\vert t\vert$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single-differential in the momentum transfer $\vert t\vert$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single differential in the momentum transfer $\vert t\vert$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction double-differenial cross section off protons, as a function of the dipion mass and the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$ The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction double-differenial cross section off protons, as a function of the dipion mass and the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single-differential in the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross section off protons, single differential in the momentum transfer $\vert t\vert$ and in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Regge fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ and photon-proton energy $W$. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Regge fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ and photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of $b$-slopes in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$.

Fit of $b$-slopes in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of Pomeron trajectories in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$.

Fit of Pomeron trajectories in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Neutron (and antineutron) inclusive differential production cross section in $8.99 < \eta < 9.21$

Neutron (and antineutron) inclusive differential production cross section in $8.80 < \eta < 8.99$

Neutron (and antineutron) inclusive differential production cross section in $8.65 < \eta < 8.80$

Neutron (and antineutron) inclusive differential energy flow vs pseudorapidity

Neutron (and antineutron) inclusive differential production cross section vs pseudorapidity

Neutron (and antineutron) inclusive production cross section vs elasticity

The measured fiducial cross section vs $E_{\mathrm{T}}^\gamma$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

Measured $\gamma+c$ fiducial differential cross section as a function of $E_\text{T}^\gamma$ for $|\eta^\gamma|<1.37$.

Measured $\gamma+c$ fiducial differential cross section as a function of $E_\text{T}^\gamma$ for $1.56<|\eta^\gamma|<2.37$.

Measured ratio of the $\gamma+b$ fiducial differential cross section as a function of $E_\text{T}^\gamma$ for $|\eta^\gamma|<1.37$ to that for $1.56<|\eta^\gamma|<2.37$.

Measured ratio of the $\gamma+c$ fiducial differential cross section as a function of $E_\text{T}^\gamma$ for $|\eta^\gamma|<1.37$ to that for $1.56<|\eta^\gamma|<2.37$.

Statistical correlation between the $\gamma+b$ and the $\gamma+c$ cross sections in a given $E_\text{T}^\gamma$ bin and $|\eta^\gamma|$ region. The two cross sections are correlated as the heavy flavour fractions are extracted simultaneously from a template fit, performed in each $E_\text{T}^\gamma$ bin and separately for the two $|\eta^\gamma|$ regions.

Signed shifts of the individual systematic uncertainties on the $\gamma+b$ cross section for $|\eta^\gamma|<1.37$. The numbers after the name of the uncertainty source refer to the individual component in that uncertainty. Each bin of the MC statistical uncertainty is independent of any other bin. The first four components of the photon energy scale uncertainty are specific to this $|\eta^\gamma|$ region and are independent of the components in the other region. The region is indicated as part of their name to indicate the independence between the $|\eta^\gamma|$ regions. The uncertainties on the prompt photon modelling, non-perturbative QCD models and particle-level migration effects are only varied once and not up and down by their nature, but are symmetrised for the final results. Only uncertainties which have at least a 1% variation in at least one bin of the $\gamma+b$ and $\gamma+c$ cross section measurements, including the ratios, are listed. The others are summed in quadrature and listed as a single entry.

Signed shifts of the individual systematic uncertainties on the $\gamma+b$ cross section for $1.56<|\eta^\gamma|<2.37$. The numbers after the name of the uncertainty source refer to the individual component in that uncertainty. Each bin of the MC statistical uncertainty is independent of any other bin. The first four components of the photon energy scale uncertainty are specific to this $|\eta^\gamma|$ region and are independent of the components in the other region. The region is indicated as part of their name to indicate the independence between the $|\eta^\gamma|$ regions. The uncertainties on the prompt photon modelling, non-perturbative QCD models and particle-level migration effects are only varied once and not up and down by their nature, but are symmetrised for the final results. Only uncertainties which have at least a 1% variation in at least one bin of the $\gamma+b$ and $\gamma+c$ cross section measurements, including the ratios, are listed. The others are summed in quadrature and listed as a single entry.

Signed shifts of the individual systematic uncertainties on the $\gamma+c$ cross section for $|\eta^\gamma|<1.37$. The numbers after the name of the uncertainty source refer to the individual component in that uncertainty. Each bin of the MC statistical uncertainty is independent of any other bin. The first four components of the photon energy scale uncertainty are specific to this $|\eta^\gamma|$ region and are independent of the components in the other region. The region is indicated as part of their name to indicate the independence between the $|\eta^\gamma|$ regions. The uncertainties on the prompt photon modelling, non-perturbative QCD models and particle-level migration effects are only varied once and not up and down by their nature, but are symmetrised for the final results. Only uncertainties which have at least a 1% variation in at least one bin of the $\gamma+b$ and $\gamma+c$ cross section measurements, including the ratios, are listed. The others are summed in quadrature and listed as a single entry.

Signed shifts of the individual systematic uncertainties on the $\gamma+c$ cross section for $1.56<|\eta^\gamma|<2.37$. The numbers after the name of the uncertainty source refer to the individual component in that uncertainty. Each bin of the MC statistical uncertainty is independent of any other bin. The first four components of the photon energy scale uncertainty are specific to this $|\eta^\gamma|$ region and are independent of the components in the other region. The region is indicated as part of their name to indicate the independence between the $|\eta^\gamma|$ regions. The uncertainties on the prompt photon modelling, non-perturbative QCD models and particle-level migration effects are only varied once and not up and down by their nature, but are symmetrised for the final results. Only uncertainties which have at least a 1% variation in at least one bin of the $\gamma+b$ and $\gamma+c$ cross section measurements, including the ratios, are listed. The others are summed in quadrature and listed as a single entry.

The measured differential cross-section normalized to the bin width in values of the angle between the leptons in the leading reconstructed lepton pair for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the rapidity difference between the reconstructed lepton pairs for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the leading reconstructed dilepton pT for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the angle between the dilepton pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the transverse mass of the reconstructed diboson pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.