Final state radiation correction used in the $\phi_{\eta}^{*}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Final state radiation correction used in the $y^{Z}-p_{T}^{Z}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Final state radiation correction used in the $y^{Z}-\phi_{\eta}^{*}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Correlation matrix of statistical uncertainty for one-dimensional $y^Z$ measurement.

Correlation matrix of statistical uncertainty for one-dimensional $p_{T}^{Z}$ measurement.

Correlation matrix of statistical uncertainty for one-dimensional $\phi_{\eta}^{*}$ measurement.

Correlation matrix of statistical uncertainty for two-dimensional $y^Z-p_{T}^{Z}$ measurement.

Correlation matrix of statistical uncertainty for two-dimensional $y^Z-\phi_{\eta}^{*}$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $y^Z$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $p_{T}^{Z}$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $\phi_{\eta}^{*}$ measurement.

Correlation matrix of efficiency uncertainty for two-dimensional $y^Z-p_{T}^{Z}$ measurement.

Correlation matrix of efficiency uncertainty for two-dimensional $y^Z-\phi_{\eta}^{*}$ measurement.

Measured total $Z$-boson cross-section for different datasets. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $y^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $p_{T}^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $\phi_{\eta}^{*}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured double differential cross-sections in interval regions of $y^{Z}$ and $p_{T}^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured double differential cross-sections in interval regions of $y^{Z}$ and $\phi_{\eta}^{*}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Systematic uncertainties in the single differential cross-sections in interval regions of $y^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the single differential cross-sections in interval regions of $p_{T}^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the single differential cross-sections in interval regions of $\phi_{\eta}^{*}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the double differential cross-sections in interval regions of $y^{Z}$ and $p_{T}^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the double differential cross-sections in interval regions of $y^{Z}$ and $\phi_{\eta}^{*}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Single-differential production cross-sections for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Single-differential production cross-sections for prompt $J/\psi$ mesons as a function of $y$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Single-differential production cross-sections for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Fraction of nonprompt $J/\psi$ mesons (in \%) in ($p_\text{T},y$) intervals. The first uncertainty is statistical and the second is systematic.

Nuclear modification factor $R_{p\text{Pb}}$ for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Nuclear modification factor $R_{p\text{Pb}}$ for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=-0.2$ rather than zero, in ($p_\text{T},y$) intervals.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=-1$ rather than zero, in ($p_\text{T},y$) intervals.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=+1$ rather than zero, in ($p_\text{T},y$) intervals.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons with a Soeding-inspired analytic function --- statistical correlations only. Only one half of the (symmetric) matrix is stored.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons, differential in the dipion mass and in bins of $W$. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons, differential in the dipion mass and in bins of $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, in bins of the photon-proton energy $W$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross sections off protons as a function of energy. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross sections off protons as a function of energy --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic $\rho^0(770)$ photoproduction cross section off protons as a function of energy (various experiments)

Fit of elastic $\rho^0(770)$ photoproduction cross sections off protons as a function of energy (various experiments) --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction cross section off protons, double-differential in the dipion mass and the momentum transfer $\vert t\vert$. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction cross section off protons, double-differential in the dipion mass and the momentum transfer $\vert t\vert$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single-differential in the momentum transfer $\vert t\vert$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single differential in the momentum transfer $\vert t\vert$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction double-differenial cross section off protons, as a function of the dipion mass and the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$ The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction double-differenial cross section off protons, as a function of the dipion mass and the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single-differential in the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross section off protons, single differential in the momentum transfer $\vert t\vert$ and in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Regge fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ and photon-proton energy $W$. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Regge fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ and photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of $b$-slopes in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$.

Fit of $b$-slopes in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of Pomeron trajectories in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$.

Fit of Pomeron trajectories in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 50$< p_{T}^{4l} <$100 GeV

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 100$< p_{T}^{4l} <$600 GeV

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.0$< y_{4l} <$0.4

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.4$< y_{4l} <$0.8

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.8$< y_{4l} <$1.2

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 1.2$< y_{4l} <$2.5

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$<$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$>$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $\mu\mu\mu\mu$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $eeee$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $ee\mu\mu$ events

Systematic covariance matrix for the differential $m_{4l}$ distribution.

Statistical covariance matrix for the differential $m_{4l}$ distribution.

Background covariance matrix for the differential $m_{4l}$ distribution.

Systematic covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution.<br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Statistical covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Background covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Systematic covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Statistical covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Background covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Systematic covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Statistical covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Background covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Systematic covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Statistical covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Background covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

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The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Summary of results for cross-section of non-prompt $J/\psi$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of prompt $\psi(2S)$ decaying to a muon pair for 7 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of prompt $\psi(2S)$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 7 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Mean weight correction factor for $J/\psi$ under the "longitudinal" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse zero" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse positive" spin-alignment transverse positive hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "longitudinal" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse zero" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "longitudinal" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse zero" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "longitudinal" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse zero" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

The effective exponential slope, $b_n$, obtained from the fit of double differential photoproduction cross sections ${\rm d^2}\sigma_{\gamma p}/{\rm d}x_L{\rm d}p_{T,n}^2$ to a single exponential function in bins of $x_L$. The first uncertainty represents the fit error from the statistical and uncorrelated systematic uncertainty and the second one is due to the correlated systematic uncertainty.

Energy dependence of the exclusive photoproduction of a $\rho^0$ meson associated with a leading neutron, $\gamma p \to \rho^0 n \pi^+$. The first uncertainty is statistical and the second is systematic. The global normalisation uncertainty of $4.4\%$ is not included. $\Phi_{\gamma}$ is the integral of the photon flux, Eq. (3) of paper, in a given $W_{\gamma p}$ bin.

Differential photoproduction cross section ${\rm d}\sigma_{\gamma p}/{\rm d}\eta$ for the exclusive process $\gamma p \to \rho^0 n \pi^+$ as a function of the $\rho^0$ pseudorapidity in the kinematic range $0.35 < x_L < 0.95$, $\theta_n < 0.75$ mrad and $20 < W_{\gamma p} < 100$ GeV. The statistical, uncorrelated and correlated systematic uncertainties, $\delta_{stat}$, $\delta_{sys}^{unc}$ and $\delta_{sys}^{cor}$ respectively, are given, which does not include the global normalisation error of $4.4\%$.

Differential photoproduction cross section ${\rm d}\sigma_{\gamma p}/{\rm d}t^{\prime}$ for the exclusive process $\gamma p \to \rho^0 n \pi^+$ as a function of the $\rho^0$ four-momentum transfer squared, $t^{\prime}$, in the kinematic range $0.35 < x_L < 0.95$, $\theta_n < 0.75$ mrad and $20 < W_{\gamma p} < 100$ GeV. The statistical, uncorrelated and correlated systematic uncertainties, $\delta_{stat}$, $\delta_{sys}^{unc}$ and $\delta_{sys}^{cor}$ respectively, are given, which does not include the global normalisation error of $4.4\%$.

Exponential slopes, $b_1$ and $b_2$, and the ratio $\sigma_1/\sigma_2$, obtained from the components of fit, Eq. (14) of paper, to the differential cross section ${\rm d}\sigma_{\gamma p}/{\rm d}t^{\prime}$ in bins of $x_L$. The errors represent the statistical and systematic uncertainties added in quadrature.

Exponential slopes, $b_1$ and $b_2$, and the ratio $\sigma_1/\sigma_2$, obtained from the components of fit, Eq. (14) of paper, to the differential cross section ${\rm d}\sigma_{\gamma p}/{\rm d}t^{\prime}$ in bins of $p_{T,n}^2$. The errors represent the statistical and systematic uncertainties added in quadrature.

Energy dependence of elastic $\rho^0$ photoproduction on the pion, $\gamma \pi^+ \to \rho^0 \pi^+$, extracted in the one-pion-exchange approximation using OPE1 sample. The first uncertainty represents the full experimental error and the second is the model error coming from the pion flux uncertainty (see text). $\Gamma_\pi(x_L)$ represents the value of the pion flux, Eqs. (5-6) of paper, integrated over the $p_{T,n}<0.2$ GeV range, at a given $x_L$.

Cross section of elastic $\rho^0$ photoproduction on the pion, $\gamma \pi^+ \to \rho^0 \pi^+$, extracted in the one-pion-exchange approximation using three different samples: full sample, OPE1 and OPE2. The first uncertainty represents the full experimental error and the second is the model error coming from the pion flux uncertainty (see text). $\Gamma_\pi$ represents the value of the pion flux, Eqs. (5-6) of paper, integrated over the corresponding $(x_L,p_{T,n})$ range.