Bin averaged hadron level differential cross section for diffractive dijet production as a function of X(C=POMERON). The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of Z(C=POMERON). The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of the average pseudorapidity of the dijet system. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of the absolute difference of the pseudorapidities of the two jets. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of W. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of the dijet invariant mass. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level differential cross section for diffractive dijet production as a function of mass of the diffractive system. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level double-differential cross section for diffractive dijet production as a function of X(GAMMA) for 3 ranges of ET of jet 1. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Bin averaged hadron level double-differential cross section for diffractive dijet production as a function of Z(POMERON) for 2 ranges of X(GAMMA). The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of X(C=GAMMA). The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of ET of jet 1. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of the average pseudorapidity of the dijet system. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of the absolute difference in the pseudorapidities of the 2 jets. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of the invariant mass of the dijet system. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Ratios of the diffractive to the inclusive single-differential hadron level dijet cross sections as a function of W. The first systematic error is the uncorrelated and the second the correlated uncertainty.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons with a Soeding-inspired analytic function --- statistical correlations only. Only one half of the (symmetric) matrix is stored.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons, differential in the dipion mass and in bins of $W$. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons, differential in the dipion mass and in bins of $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, in bins of the photon-proton energy $W$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross sections off protons as a function of energy. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross sections off protons as a function of energy --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic $\rho^0(770)$ photoproduction cross section off protons as a function of energy (various experiments)

Fit of elastic $\rho^0(770)$ photoproduction cross sections off protons as a function of energy (various experiments) --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction cross section off protons, double-differential in the dipion mass and the momentum transfer $\vert t\vert$. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction cross section off protons, double-differential in the dipion mass and the momentum transfer $\vert t\vert$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single-differential in the momentum transfer $\vert t\vert$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single differential in the momentum transfer $\vert t\vert$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction double-differenial cross section off protons, as a function of the dipion mass and the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$ The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction double-differenial cross section off protons, as a function of the dipion mass and the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single-differential in the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross section off protons, single differential in the momentum transfer $\vert t\vert$ and in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Regge fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ and photon-proton energy $W$. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Regge fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ and photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of $b$-slopes in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$.

Fit of $b$-slopes in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of Pomeron trajectories in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$.

Fit of Pomeron trajectories in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

The total uncertainty covariance matrix for measured differential cross sections in $m_{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

The total uncertainty covariance matrix for measured differential cross sections in $p_\mathrm{T}^{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

Measured differential four-jet cross section for R=0.4 jets, in bins of pT4, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of HT, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of m_4j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of min(m_2j)/m_4j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as m_2j>500 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of min(m_2j)/m_4j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as m_2j>1000 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of min(m_2j)/m_4j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as m_2j>1500 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of min(m_2j)/m_4j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as m_2j>2000 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDphi_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDphi_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDphi_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>700 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDphi_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>1000 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDphi_3j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDphi_3j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDphi_3j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>700 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDphi_3j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>1000 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDy_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDy_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDy_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>700 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDy_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>1000 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDy_3j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDy_3j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDy_3j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>700 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of minDy_3j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>1000 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of maxDy_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of maxDy_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>250 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of maxDy_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of maxDy_2j, along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts, as well as pT1>550 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>1. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>1, as well as pT1>250 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>1, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>1, as well as pT1>550 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>2. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>2, as well as pT1>250 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>2, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>2, as well as pT1>550 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>3. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>3, as well as pT1>250 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>3, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>3, as well as pT1>550 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>4. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>4, as well as pT1>250 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>4, as well as pT1>400 GeV. All other details are as for pT1.

Measured differential four-jet cross section for R=0.4 jets, in bins of sum(pT), along with the uncertainties in the measurement. The events are selected using the inclusive analysis cuts and maxDy_2j>4, as well as pT1>550 GeV. All other details are as for pT1.

Measured cross section for kaon production as a function of W.

Cross section dsigma/dpt as a function of the leading jet pt corrected to the lepton common fiducial region and for QED radiation effects.

Cross section dsigma/dpt as a function of the second-leading jet pt corrected to the lepton common fiducial region and for QED radiation effects.

Inclusive jet differential cross section dsigma/dy corrected to the lepton common fiducial region and for QED radiation effects.

Jet differential cross section dsigma/dy as a function of the leading jet y corrected to the lepton common fiducial region and for QED radiation effects.

Jet differential cross section dsigma/dy as a function of the second-leading jet y corrected to the lepton common fiducial region and for QED radiation effects.

Differential cross section dsigma/dmjj as a function of the dijet invariant mass mjj corrected to the lepton common fiducial region and for QED radiation effects.

Differential cross section dsigma/d DeltaYjj as a function of the dijet rapidity separation DeltaYjj corrected to the lepton common fiducial region and for QED radiation effects.

Differential cross section dsigma/d DeltaPhijj as a function of the dijet azimuthal separation DeltaPhijj corrected to the lepton common fiducial region and for QED radiation effects.

Differential cross section dsigma/d DeltaRjj as a function of the dijet angular separation DeltaRjj corrected to the lepton common fiducial region and for QED radiation effects.

Cross section for Inclusive Jet Multiplicity for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Ratio of cross sections for N/N-1 inclusive jet multiplicities for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized inclusive jet differential cross section 1/sigma_DY dsigma/dpt for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized leading jet differential cross section 1/sigma_DY dsigma/dpt for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized second-leading jet differential cross section 1/sigma_DY dsigma/dpt for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized inclusive jet differential cross section 1/sigma_DY dsigma/dy for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized leading jet differential cross section 1/sigma_DY dsigma/dy for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized second leading jet differential cross section 1/sigma_DY dsigma/dy for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized differential cross section as a function of dijet invariant mass 1/sigma_DY dsigma/dmjj for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized differential cross section as a function of dijet rapidity separation 1/sigma_DY dsigma/dDeltaYjj for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized differential cross section as a function of dijet azimuthal separation 1/sigma_DY dsigma/dDeltaPhijj (1/rad.) for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Measured normalized differential cross section as a function of dijet angular separation 1/sigma_DY dsigma/dDeltaRjj for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Inclusive double differential b-jet cross section as a function of PT for the |rapidity| range 1.2-2.1 from the lifetime-based analysis.

Differential b-jet cross sections as a function of PT from summing the data in the previous tables.

Differential b-jet cross sections as a function of PT from the muon-based analysis.

Differential b-bbar dijet cross sections as a function of dijet mass from the lifetime-based analysis.

Differential b-bbar dijet cross sections as a function of azimuthal angle difference between the jets from the lifetime-based analysis.

Double differential b-bbar dijet cross sections as a function of the angular variable chi between the jets for two different jet mass ranges from the lifetime-based analysis.

Double differential b-bbar dijet cross sections as a function of the angular variable chi between the jets for two different jet mass ranges from the lifetime-based analysis.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of the dilepton pT for the 2l2nu channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of deltaPhi between the two leptons of the leading dileptons for the 4l channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. UPDATE (30 APR 2014): extra significant digit added for first bin.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of deltaPhi between the two leptons for the 2l2nu channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of the mass of the ZZ system for the 4l channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of the transverse mass of the ZZ system for the 2l2nu channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Unfolded normalised differential Z+2j cross section as a function of the rapidity separation between the leading jets in the search region.

Unfolded normalised differential cross section distribution as a function of the number of jets in the rapidity interval between the two leading jets in the high mass region.

Unfolded normalised differential cross section distribution as a function of the normalised transverse momentum balance in the high mass region.

Unfolded normalised differential cross section distribution as a function of the azimuthal angle between the two leading jets in the high mass region.

Unfolded jet veto efficiency as a function of the dijet invariant mass in the baseline region.

Unfolded jet veto efficiency as a function of the rapidity separation between the two leading jets in the baseline region.

Unfolded average number of jets in the rapidity interval between the two leading jets as a function of the dijet invariant mass in the baseline region.

Unfolded average number of jets in the rapidity interval between the two leading jets as a function of the rapidity separation between the two leading jets in the baseline region.

Unfolded transverse momentum balance veto efficiency as a function of the dijet invariant mass in the baseline region.

Unfolded transverse momentum balance veto efficiency as a function of the rapidity separation between the two leading jets in the baseline region.

Unfolded normalised differential Z+2j cross section as a function of dijet invariant mass in the high-pt region.

Unfolded normalised differential Z+2j cross section as a function of dijet invariant mass in the control region.

Unfolded normalised differential Z+2j cross section as a function of the rapidity separation between the leading jets in the high-pt region.

Unfolded normalised differential Z+2j cross section as a function of the rapidity separation between the leading jets in the control region.

Unfolded jet veto efficiency as a function of the dijet invariant mass in the high-pt region.

Unfolded jet veto efficiency as a function of the rapidity separation between the two leading jets in the high-pt region.

Unfolded average number of jets in the rapidity interval between the two leading jets as a function of the dijet invariant mass in the high-pt region.

Unfolded average number of jets in the rapidity interval between the two leading jets as a function of the rapidity separation between the two leading jets in the high-pt region.

Unfolded transverse momentum balance veto efficiency as a function of the dijet invariant mass in the high-pt region.

Unfolded transverse momentum balance veto efficiency as a function of the rapidity separation between the two leading jets in the high-pt region.

Experimental cross-section values per bin in PB for COS(THETA*(2GAMMA)).

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Measured differential cross section with associated uncertainties as a function of COS(THETA*). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2GAMMA). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>30 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>50 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of HT. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of M(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of ABSDPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2GAMMA,2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of TAUJET. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of SUM(TAUJET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=0,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=1,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=2,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET>=3,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

The measured cross sections or cross section limits of the diphoton, VBF-enhanced, Nlepton $\geq$ 1, high $E_{T}^{miss}$, and ttH-enhanced fiducial regions are shown.

Measured differential cross section with associated uncertainties as a function of diphoton transverse momentum in bins of ABS(COS(THETA*)). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.Each systematic uncertainty sources is fully uncorrelated with the other sources.

Non-perturbative correction factors in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are evaluated by deriving these factors using different generators and tunes as described in the text. No factor are given for the Nlepton $\geq$ 1 and High-$E_{T}^{miss}$ fiducial regions as the gluon fusion contamination in both is negligible.

Isolation efficiencies in percent for gluon fusion $H\rightarrow\gamma\gamma$ for each fiducial region/variable bin measured in this analysis. The isolation efficiency is defined as the probability for both photons to fulfil the isolation criteria (as described in Section 9.1) for events that pass the diphoton kinematic criteria. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are assigned in the same way as for the non-perturbative correction factors: by varying the fragmentation and underlying event modelling. These factors can be multiplied by the kinematic acceptance factors (see Table 29) to extrapolate an inclusive gluon fusion Higgs prediction to the fiducial volume used in this analysis. No factors for the Nlepton $\geq$ 1 and High $E_{T}^{miss}$ fiducial regions are provided as the gluon fusion contamination is negligible.

Combined non-perturbative (Table 27) and particle-level isolation correction factors (Table 28) in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. The uncertainties on the combined values properly take into account the correlations between both multiplicative factors.

Diphoton kinematic acceptances in percent for gluon-gluon fusion for the diphoton fiducial region and all differential variable bins studied in this paper, defined as the probability to fulfill the diphoton kinematic criteria: $p_{T}$/$m_{\gamma\gamma}$ < 0.35 (0.25) for the leading (subleading) photon and $|\eta_{\gamma\gamma}|$ < 2.37. The factors are evaluated using the Powheg NNLOPSevent generator. Uncertainties are taken from PDF variations. QCD scale variations have a negligible impact on these factors. The range of each bin is given in Table 26.

observed statistical correlations between pTyy, Njets, mjj, |DeltaPhijj| and pTj1

ggH default MC + XH predictions

XH ( = VBF + VH + ttH + bbH ) MC predictions

Best-fit values and uncertainties of the production-mode cross sections times branching ratio.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Normalized differential cross-sections for the absolute rapidity (|y|) of the ttbar system. The cross-section in each bin is given as the integral of the normalized differential cross-section over the bin width, divided by the bin width. The calculation of the cross-sections in the last bins includes events falling outside of the bin edges, and the normalization is done within the quoted bin width. The full covariance matrice is provided in Table 8 below.

Bin-wise full covariance matrices for the normalized differential cross-sections of the hadronically decaying top-quark PT. The elements of the covariance matrices are in units of TeV$^{-2}$.

Bin-wise full covariance matrices for the normalized differential cross-sections of the mass of the ttbar system. The elements of the covariance matrices are in units of TeV$^{-2}$.

Bin-wise full covariance matrices for the normalized differential cross-sections of the PT of the ttbar system. The elements of the covariance matrices are in units of TeV$^{-2}$.

Bin-wise full covariance matrices for the normalized differential cross-sections of the absolute rapidity (|y|) of the ttbar system.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

Parton-level normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are pb$^2$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are pb$^2$.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.