Exclusive J/psi photoproduction cross section in gamma-p.

Dissociative J/psi photoproduction gamma-p.

Cross section ratio, dissociative J/psi photoproduction gamma-p over exclusive J/psi photoproduction gamma-p.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.17$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.19$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.21$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.23$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.25$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.27$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.29$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.31$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.33$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.42$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for the non-resonant production of top squark pairs in the RPV SUSY decay scenario. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to the top squark model cross section.

Observed differential four-jet mass spectrum for 0.22 < $\\a$ < 0.24. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Observed differential four-jet mass spectrum for 0.24 < $\\a$ < 0.26. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Observed differential four-jet mass spectrum for 0.26 < $\\a$ < 0.28. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Observed differential four-jet mass spectrum for all $\\a$ bins together. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Observed differential average dijet mass spectrum within three $\\a$ bins of the non-resonant search. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons with a Soeding-inspired analytic function --- statistical correlations only. Only one half of the (symmetric) matrix is stored.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons, differential in the dipion mass and in bins of $W$. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction off protons, differential in the dipion mass and in bins of $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, in bins of the photon-proton energy $W$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross sections off protons as a function of energy. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross sections off protons as a function of energy --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic $\rho^0(770)$ photoproduction cross section off protons as a function of energy (various experiments)

Fit of elastic $\rho^0(770)$ photoproduction cross sections off protons as a function of energy (various experiments) --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction cross section off protons, double-differential in the dipion mass and the momentum transfer $\vert t\vert$. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction cross section off protons, double-differential in the dipion mass and the momentum transfer $\vert t\vert$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single-differential in the momentum transfer $\vert t\vert$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single differential in the momentum transfer $\vert t\vert$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction double-differenial cross section off protons, as a function of the dipion mass and the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$ The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\pi^{+}\pi^{-}$ photoproduction double-differenial cross section off protons, as a function of the dipion mass and the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction off protons, single-differential in the momentum transfer $\vert t\vert$, in bins of the photon-proton energy $W$. The cross section is defined as the integral of the relativistic Breit Wigner resonance in the dipion mass over the range $2m_\pi<m_{\pi\pi}<1.53$ GeV. The tabulated cross sections are $\gamma p$ cross sections but can be converted to $ep$ cross sections using the effective photon flux $\Phi_{\gamma/e}$.

Elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction cross section off protons, single differential in the momentum transfer $\vert t\vert$ and in bins of the photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Regge fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ and photon-proton energy $W$. Parameters with subscript "el" and "pd" correspond to elastic and proton-dissociative cross sections, respectively.

Regge fit of elastic ($m_Y=m_p$) and proton-dissociative ($1<m_Y<10$ GeV) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ and photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of $b$-slopes in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$.

Fit of $b$-slopes in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Fit of Pomeron trajectories in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$.

Fit of Pomeron trajectories in elastic ($m_Y=m_p$) $\rho^0(770)$ photoproduction single-differential cross sections off protons as a function of momentum transfer $t$ in bins of photon-proton energy $W$ --- statistical correlations coefficients $\rho_{ij}$ only. Only one half of the (symmetric) matrix is stored. Bins are identified by their global bin number.

Dielectron excess spectra as in pp collisions at $\sqrt{s}$ = 13 TeV as a function of $m_{\rm ee}$ after subtraction of the hadronicdecay cocktail. Electrons are measured within $|\eta_{\rm e}| < 0.8$ and $p_{\rm T,e} > 0.075$ GeV/$c$.

Dielectron excess spectra as in pp collisions at $\sqrt{s}$ = 13 TeV in the invariant mass interval 0.15<$m_{\rm ee}$<0.6 as a function of $p_{\rm T,ee}$ after subtraction of the hadronicdecay cocktail. Electrons are measured within $|\eta_{\rm e}| < 0.8$ and $p_{\rm T,e} > 0.075$ GeV/$c$.

Inclusive $e^+e^-$ cross section in p-Pb collisions at $\sqrt{s}$ = 5.02 TeV as a function of $p_{\rm T,ee}$ for $0.5 < m_{\rm ee} < 1.1$ GeV/$c$. Electrons are measured within $|\eta_{\rm e}| < 0.8$ and $p_{\rm T,e} > 0.2$ GeV/$c$.

Inclusive $e^+e^-$ cross section in pp collisions at $\sqrt{s}$ = 5.02 TeV as a function of $p_{\rm T,ee}$ for $1.1 < m_{\rm ee} < 2.7$ GeV/$c$. Electrons are measured within $|\eta_{\rm e}| < 0.8$ and $p_{\rm T,e} > 0.2$ GeV/$c$.

Inclusive $e^+e^-$ cross section in p-Pb collisions at $\sqrt{s}$ = 5.02 TeV as a function of $p_{\rm T,ee}$ for $1.1 < m_{\rm ee} < 2.7$ GeV/$c$. Electrons are measured within $|\eta_{\rm e}| < 0.8$ and $p_{\rm T,e} > 0.2$ GeV/$c$.

Dielectron nuclear modification factor $R_{\rm pPb}$ at $\sqrt{s}$ = 5.02 TeV as a function of $m_{\rm ee}$. Electrons are measured within $|\eta_{\rm e}| < 0.8$ and $p_{\rm T,e} > 0.2$ GeV/$c$.

Dielectron nuclear modification factor $R_{\rm pPb}$ at $\sqrt{s}$ = 5.02 TeV as a function of $p_{\rm T,ee}$ for $0.5 < m_{\rm ee} < 1.1$ GeV/$c$. Electrons are measured within $|\eta_{\rm e}| < 0.8$ and $p_{\rm T,e} > 0.2$ GeV/$c$.

Dielectron nuclear modification factor $R_{\rm pPb}$ at $\sqrt{s}$ = 5.02 TeV as a function of $p_{\rm T,ee}$ for $1.1 < m_{\rm ee} < 2.7$ GeV/$c$. Electrons are measured within $|\eta_{\rm e}| < 0.8$ and $p_{\rm T,e} > 0.2$ GeV/$c$.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $467 < m^{\gamma-\rm jet1} < 510$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $510 < m^{\gamma-\rm jet1} < 590$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $590 < m^{\gamma-\rm jet1} < 670$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $670 < m^{\gamma-\rm jet1} < 760$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $760 < m^{\gamma-\rm jet1} < 850$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $850 < m^{\gamma-\rm jet1} < 950$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $0.95 < m^{\gamma-\rm jet1} < 1.05$ TeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $1.05 < m^{\gamma-\rm jet1} < 1.25$ TeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $1.25 < m^{\gamma-\rm jet1} < 2.45$ TeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $E_{\rm T}^{\gamma}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $p_{\rm T}^{\rm jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\beta^{\rm jet1}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\beta^{\gamma}$.

Ratio of measured cross sections for isolated-photon plus 2jet production as a function of $\beta$.

Measured cross sections for isolated-photon plus 3jet production as a function of $E_{\rm T}^{\gamma}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $p_{\rm T}^{\rm jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Parton-level normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are pb$^2$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are pb$^2$.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The total uncertainty covariance matrix for measured differential cross sections in $m_{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

The total uncertainty covariance matrix for measured differential cross sections in $p_\mathrm{T}^{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.