Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 50$< p_{T}^{4l} <$100 GeV

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 100$< p_{T}^{4l} <$600 GeV

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.0$< y_{4l} <$0.4

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.4$< y_{4l} <$0.8

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.8$< y_{4l} <$1.2

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 1.2$< y_{4l} <$2.5

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$<$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$>$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $\mu\mu\mu\mu$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $eeee$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $ee\mu\mu$ events

Systematic covariance matrix for the differential $m_{4l}$ distribution.

Statistical covariance matrix for the differential $m_{4l}$ distribution.

Background covariance matrix for the differential $m_{4l}$ distribution.

Systematic covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution.<br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Statistical covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Background covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Systematic covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Statistical covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Background covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Systematic covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Statistical covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Background covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Systematic covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Statistical covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Background covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

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Double differential cross-section for $J/\psi$-from-$b$ mesons as a function of $p_\perp$ in bins of $y$. The first uncertainties are statistical, the second are the correlated systematic uncertainties shared between bins and the last are the uncorrelated systematic uncertainties.

The fraction of $J/\psi$-from-$b$ mesons (in %) in bins of the $J/\psi$ $p_\perp$ and $y$. The uncertainties are statistical only. The systematic uncertainties are negligible.

The fraction of $J/\psi$-from-$b$ mesons (in %) in bins of the $J/\psi$ $p_\perp$ and $y$. The uncertainties are statistical only. The systematic uncertainties are negligible.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Differential production cross-sections for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{0} + \bar{D}^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{0} + \bar{D}^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{*+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{*+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

Differential production cross-sections for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections in for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections in for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/7}$, for prompt $D^{0} + \bar{D}^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/7}$, for prompt $D^{0} + \bar{D}^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/7}$, for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/7}$, for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/7}$, for prompt $D_{s}^{+} + D_{s}^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/7}$, for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/7}$, for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/7}$, for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{*+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{*+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $2.0 < y < 4.5$.

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ [pb] for $p_T < 30$ GeV.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T )$ for $2.0 < y < 4.5$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y )$ for $p_T < 30$ GeV/$c$.

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $2.0 < y < 4.5$.

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ [pb] for $p_T < 30$ GeV.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T )$ for $2.0 < y < 4.5$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y )$ for $p_T < 30$ GeV/$c$.

The ratio of differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $\sqrt{s}=8$ and $\sqrt{s}=7$ TeV in $2.0 < y < 4.5$.

The ratio of differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ for $\sqrt{s}=8$ and $\sqrt{s}=7$ TeV and $p_T < 30$ GeV/$c$.

Mean PT and RMS for J/PSI production from b-hadron decay (assuming unpolarised).

DSIG/DY for prompt (unpolarised) J/PSI and from b-hadron decay integrated over PT.

Double differential cross section in PT and YRAP for prompt J/PSI production assuming no polarisation. The first systematic error is the uncorrelated systematic error and the second is the correlated systematic error.

Double differential cross section in PT and YRAP for J/PSI from b-hadron decays assuming no polarisation. The first systematic error is the uncorrelated systematic error and the second is the correlated systematic error.

Double differential cross section in PT and YRAP for prompt J/PSI production assuming fully transversely polarised J/PSIs The first systematic error is the uncorrelated systematic error and the second is the correlated systematic error.

Double differential cross section in PT and YRAP for prompt J/PSI production assuming fully longitudinally polarised J/PSIs The first systematic error is the uncorrelated systematic error and the second is the correlated systematic error.

Fraction of J/PSIs from b-hadron decay in bins of PT and YRAP assuming no polaraisation. The first systematic error is uncorrelated between bins and the second is the uncertainty due to the unknown polarisation of the prompt J/PSI.

Covariance matrix of total experimental uncertainties (statistical and systematic uncertainties added in quadrature) of absolute double differential fiducial cross section. The bin index is PT_i + 10*y_j.

No description provided.

No description provided.

No description provided.