Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

Predicted and observed yields as a function of $m_{4\ell}$ in the VBS-Suppressed region. Overflow events are included in the last bin of the distribution.

Relative systematic uncertainties in the unfolded differential cross section for 4ljj production in the VBS-Enhanced region as a function of m_{jj}

Relative systematic uncertainties in the unfolded differential cross section for 4ljj production in the VBS-Enhanced region as a function of m_{4\ell}

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $m_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $m_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $m_{4\ell}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $m_{4\ell}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $ p_{T,4l}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $ p_{T,4l}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $\Delta\phi_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $\Delta\phi_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $|\Delta y_{jj}|$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $|\Delta y_{jj}|$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $cos(\theta^{*}_{12})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $cos(\theta^{*}_{12})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $cos(\theta^{*}_{34})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $cos(\theta^{*}_{34})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $p_{T,jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $p_{T,jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $p_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $p_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $S_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $S_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Statistical correlation between different bins of the unfolded cross-section for all the measured observables in the VBS-Enhanced region.

Statistical correlation between different bins of the unfolded cross-section for all the measured observables in the VBS-Suppressed region.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.4.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.6 and after requiring that the pseudorapidity gap > 2.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.4 and after requiring that the pseudorapidity gap > 2.

Definition of the fiducial phase space.

The seven input variables to the NN ordered by their discriminating power. The jet that is not $b$-tagged is referred to as $\textit{untagged}~$jet.

The seven input variables to the NN ordered by their discriminating power. The jet that is not $b$-tagged is referred to as $\textit{untagged}~$jet.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events(at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-quark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-antiquark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the absolute differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$.

Uncertainties for the normalised differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Differential cross section in bins of ABS(YRAP(P=3)-YRAP(P=4)) for Z/GAMMA* transverse momentum > 45 GeV.

Differential cross section in bins of ABS(YRAP(P=3)+YRAP(P=4))/2 for Z/GAMMA* transverse momentum > 25 GeV.

Differential cross section in bins of ABS(YRAP(P=3)+YRAP(P=4))/2 for Z/GAMMA* transverse momentum > 45 GeV.

Individual percentage contributions to the systematic error for the binning in PHI(P=3)-PHI(P=4) for Z/GAMMA* transverse momentum > 25 GeV.

Individual percentage contributions to the systematic error for the binning in PHI(P=3)-PHI(P=4) for Z/GAMMA* transverse momentum > 45 GeV.

Individual percentage contributions to the systematic error for the binning in ABS(YRAP(P=3)-YRAP(P=4)) for Z/GAMMA* transverse momentum > 25 GeV.

Individual percentage contributions to the systematic error for the binning in ABS(YRAP(P=3)-YRAP(P=4)) for Z/GAMMA* transverse momentum > 45 GeV.

Individual percentage contributions to the systematic error for the binning in ABS(YRAP(P=3)+YRAP(P=4))/2 for Z/GAMMA* transverse momentum > 25 GeV.

Individual percentage contributions to the systematic error for the binning in ABS(YRAP(P=3)+YRAP(P=4))/2 for Z/GAMMA* transverse momentum > 45 GeV.

Fiducial Upsilon(3S) production cross-section, where pT>4 GeV and |eta|<2.3 for both muons, as a function of Upsilon(3S) pT in the Upsilon(3S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Fiducial Upsilon(nS) production cross-section, where pT>4 GeV and |eta|<2.3 for both muons, as a function of Upsilon(nS) rapidity (|y|) in Upsilon(nS) PT ranging from 0 - 70 GeV. The first uncertainty is statistical, the second is systematic.

Inclusive Upsilon(1S) production cross-section as a function of Upsilon(1S) pT in the Upsilon(1S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(2S) production cross-section as a function of Upsilon(2S) pT in the Upsilon(2S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(3S) production cross-section as a function of Upsilon(3S) pT in the Upsilon(3S) rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Inclusive Upsilon(nS) production cross-section as a function of Upsilon(nS) rapidity (|y|) in Upsilon(nS) PT ranging from 0 - 70 GeV. The first uncertainty is statistical, the second is systematic and the third encapsulates any possible variation due to spin-alignment from the unpolarised central value.

Ratio of Upsilon(2S) to Upsilon(1S) inclusive cross-section as a function of Upsilon pT in the Upsilon rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Ratio of Upsilon(3S) to Upsilon(1S) inclusive cross-section as a function of Upsilon pT in the Upsilon rapidity (|y|) bins 0-1.2 and 1.2-2.25. The first uncertainty is statistical, the second is systematic.

Ratio of Upsilon(2S) and Upsilon(3S) to Upsilon(1S) inclusive cross-section as a function of Upsilon rapidity (|y|) in Upsilon pT 0 - 70 GeV. The first uncertainty is statistical, the second is systematic.

The differential cross section as a function of the transverse momentum of the top quark/antiquark, PT(TOP/TOPBAR).

Measured cross section as a function of the Z0 rapidity.

Integrated cross section.. The second DSYS error is from the muon identification and the third from the luminosity measurement.

Measurement of the cross section for inclusive Z0/GAMMA* production. The second DSYS error is from the muon identification and the third from the luminosity measurement.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $p_T$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$.

Integrated $Z+\ge 2$ $b$-jets cross-section.

Breakdown of systematic uncertainties (in %) for the integrated $Z+\ge 2$ $b$-jets cross-section.

The cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$.

Normalized differential distribution in CHI(dijet) for two-jet mass 500 to 600 GeV and the non perturbative correction factor.

Normalized differential distribution in CHI(dijet) for two-jet mass 600 to 700 GeV and the non perturbative correction factor.

Normalized differential distribution in CHI(dijet) for two-jet mass 700 to 800 GeV and the non perturbative correction factor.

Normalized differential distribution in CHI(dijet) for two-jet mass 800 to 900 GeV and the non perturbative correction factor.

Normalized differential distribution in CHI(dijet) for two-jet mass 900 to 1000 GeV and the non perturbative correction factor.

Normalized differential distribution in CHI(dijet) for two-jet mass 1000 to1100 GeV and the non perturbative correction factor.

Normalized differential distribution in CHI(dijet) for two-jet mass > 1100 GeV and the non perturbative correction factor.

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