Probability of finding at least one TAR jet, where the p_T-leading TAR jet passes the m_Wcand and D₂^β=1 requirements, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=500 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1000 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1700 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied that do not pass the requirements of the merged category.

Observed exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected+1σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected-1σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected+2σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected-2σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=0.5 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=0.5 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=1 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=1.7 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=1.7 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=2.1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=2.1 TeV, shown in dashed blue.

Data overlaid on SM background yields stacked in each SR and CR category after the fit to data ('Post-fit'). The yields in the SR are broken down into their contributions to the individual bins. The maximum-likelihood estimators are set to the conditional values of the CR-only fit, and propagated to SR and CRs.

Dominant sources of uncertainty for three dark Higgs scenarios after the fit to data. The uncertainties are quantified in terms of their contribution to the fitted signal uncertainty that is expressed relative to the theory prediction. Three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01 and m_χ=200 GeV are considered, which are indicated using the (m_Z', m_s) format in units of GeV in the table columns.

Cumulative efficiencies in the merged category for three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01, m_Z' = 1 TeV, and m_χ=200 GeV considering s→W(ℓν)W(qq) decays only.

Cumulative efficiencies in the resolved category for three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01, m_Z' = 1 TeV, and m_χ=200 GeV considering s→W(ℓν)W(qq) decays only.

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={300, 350, 400, 500, 750} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={1000, 1700} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={2100, 2500, 2900, 3300} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Observed 95% confidence-level upper limits on the cross section for Drell-Yan spin-1/2 HECO production as a function of mass for various values of electric charge in the range $20\le|z|\le100$.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 200 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 1000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 1500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 2000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 2500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 3000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=1g_\textrm{D}$ monopoles of mass 4000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 200 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 1000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 1500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 2000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 2500 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 3000 GeV.

Selection efficiency as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for $g=2g_\textrm{D}$ monopoles of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=20$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=40$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=60$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=80$ of mass 4000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 200 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 1000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 1500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 2000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 2500 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 3000 GeV.

Total selection efficiency (i.e., the fraction of MC HECOs surviving the trigger and offline selection criteria) as a function of transverse kinetic energy $E^\text{kin}_\text{T}=E_\text{kin}\sin\theta$ and pseudorapidity $|\eta|$ for HECOs of charge $|z|=100$ of mass 4000 GeV.

Upper limits at the 95% CL on the cross section for SSM $W^\prime$ production and decay to the muon+neutrino channel as a function of the $W^\prime$ pole mass.

Combined (electron and muon channels) upper limits at the 95% CL on the cross section for SSM $W^\prime$ production and decay to a single lepton generation as a function of the $W^\prime$ pole mass.

Observed upper limits at the 95% CL on the cross section for generic $W^\prime$ production and decay to the electron+neutrino channel as a function of the $W^\prime$ pole mass.

Observed upper limits at the 95% CL on the cross section for generic $W^\prime$ production and decay to the muon+neutrino channel as a function of the $W^\prime$ pole mass.

Combined (electron and muon channels) observed upper limits at the 95% CL on the cross section for generic $W^\prime$ production and decay to a single lepton generation as a function of the $W^\prime$ pole mass.

Observed upper limits at the 95% CL on the visible cross section in the electron+neutrino channel as a function of the transverse mass threshold.

Observed upper limits at the 95% CL on the visible cross section in the muon+neutrino channel as a function of the transverse mass threshold.

Product of acceptance and efficiency for the electron and muon selections as a function of the $W^\prime$ pole mass.

Expected upper limits at the 95% CL on the cross section for generic $W^\prime$ production and decay to the electron+neutrino channel as a function of the $W^\prime$ pole mass.

Expected upper limits at the 95% CL on the cross section for generic $W^\prime$ production and decay to the muon+neutrino channel as a function of the $W^\prime$ pole mass.

Combined (electron and muon channels) expected upper limits at the 95% CL on the cross section for generic $W^\prime$ production and decay to a single lepton generation as a function of the $W^\prime$ pole mass.

Dijet invariant mass distribution for the category with at least one b-tagged jet.

Dijet invariant mass distribution for the category with both jets b-tagged.

The 95% CL upper limits on the cross-section times acceptance times branching ratio into two jets as a function of the mass of q* signal.

The 95% CL upper limits on the cross-section times acceptance times branching ratio into two jets as a function of the mass of QBH signal.

The 95% CL upper limits on the cross-section times acceptance times branching ratio into two jets as a function of the mass of W' signal.

The 95% CL upper limits on the cross-section times acceptance times branching ratio into two jets as a function of the mass of W* signal.

The upper limits on the DM mediator Z' signal at 95% CL from the inclusive category. The 95% CL upper limits are set on the universal quark coupling $g_q$ as a function of the Z' mass.

The 95% CL upper limit on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the mass of the b* signal.

The 95% CL upper limit on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the signal mass in the DM mediator Z' with $g_q$ = 0.25 model.

The 95% CL upper limit on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the signal mass in the SSM Z' model.

The 95% CL upper limit on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the signal mass in the graviton with $k/\overline{M}_{PL}=0.2$ model.

The 95% CL upper limit on the cross-section times kinematic acceptance times branching ratio for resonances with a generic Gaussian shape, as a function of the Gaussian mean mass in the inclusive category. Different widths, from 0% up to 15% of the signal mass, are considered. Gaussian-shape signals with 0% widths correspond to signal widths smaller than the experimental resolution. For a Gaussian-shaped signal with a relative width of 15%, the limits are truncated at high mass when the broad signal starts to overlap the upper end of the mass spectrum.

The 95% CL upper limit on the cross-section times kinematic acceptance times b-tagging efficiency times branching ratio for resonances with a generic Gaussian shape, as a function of the Gaussian mean mass in the 1 b category. Different widths, from 0% up to 15% of the signal mass, are considered. Gaussian-shape signals with 0% widths correspond to signal widths smaller than the experimental resolution. For a Gaussian-shaped signal with a relative width of 15%, the limits are truncated at high mass when the broad signal starts to overlap the upper end of the mass spectrum.

The 95% CL upper limit on the cross-section times kinematic acceptance times b-tagging efficiency times branching ratio for resonances with a generic Gaussian shape, as a function of the Gaussian mean mass in the 2 b category. Different widths, from 0% up to 15% of the signal mass, are considered. Gaussian-shape signals with 0% widths correspond to signal widths smaller than the experimental resolution. For a Gaussian-shaped signal with a relative width of 15%, the limits are truncated at high mass when the broad signal starts to overlap the upper end of the mass spectrum.

The expected 95% CL upper limits on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the DM mediator Z' mass for the current and previous iterations of the analysis. The upper limit of the previous result was obtained with the Bayesian method and is also shown scaled to the 139 fb$^{-1}$ integrated luminosity of the current result to illustrate the effect of the analysis improvements.

Acceptance for the QBH, Q* and W' benchmark signal models in the inclusive category, as a function of the simulated mass.

Acceptance for the DM Z' benchmark signal model for various $g_q$ coupling parameters in the inclusive category, as a function of the simulated mass.

Acceptance for the W* benchmark signal model in the inclusive category, as a function of the simulated mass.

Acceptance times b-tagging efficiency for the b* benchmark signal model in the 1b category, as a function of the simulated mass.

Acceptance times b-tagging efficiency for the DM Z' with $g_q$=0.25, SSM Z' and graviton with $k/\overline{M}_{PL}=0.2$ benchmark signal models in the 2b category, as a function of the simulated mass.

The expected 95% CL upper limits on the cross-section times branching ratio as a function of the DM mediator Z' mass for the current and previous iterations of the analysis. The upper limit of the previous result was obtained with the Bayesian method and is also shown scaled to the 139 fb$^{-1}$ integrated luminosity of the current result to illustrate the effect of the analysis improvements. The current b-tagging requirement is tighter than the previous one for high-$p_T$ jets, resulting in a data sample with limited size for mass above 4 TeV. The background rejection, instead, has improved significantly across the entire mass spectrum inspected by the analysis.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> ee. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the transverse decay radius Rxy of the long-lived Z' for Z' -> emu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> emu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the transverse decay radius Rxy of the long-lived Z' for Z' -> mumu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> mumu. The error bars indicate the total uncertainties.

Overall signal efficiency as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model. The error bars indicate the total uncertainties.

Overall signal efficiency as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model. The error bars indicate the total uncertainties.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model and a 700 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model and a 700 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model and a 1600 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model and a 1600 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

Fraction of detector volume covered by the material veto as a function of z and Rxy of the displaced dilepton vertex.

Fraction of detector volume covered by the disabled pixel modules veto veto as a function of z and Rxy of the displaced dilepton vertex.

Observed Rxy distribution of vertices composed of two non-leptonic tracks in a control sample in the data and the predicted distribution obtained from the event mixing. The error bars indicate the statistical uncertainties.

Rxy distributions of Kshort vertices from the large radius tracking in the data and background MC samples. Data has been normalised such that the total number of Kshort from the standard tracking in the data agrees with the total number of Kshort from the standard tracking in the MC. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the statistical uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the total uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the total uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the total uncertainties.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> mumu.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 100 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 250 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 500 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 750 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 1000 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Vertex selection efficiency for the $\tilde{t}$ $R$-hadron benchmark model as a function of the transverse decay distance $r_{DV}$.

Track multiplicity $n_{Tracks}$ for preselected DVs in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

The observed event yields in the control, validation and signal regions are shown for the MET Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the MET Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the Muon Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the Muon Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

Expected exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (1 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (1 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (2 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (2 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (+1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (+1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (-1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (-1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Exclusion limits on the production cross section as a function of m($\tilde{t}$) are shown for several values of $\tau(\tilde{t})$ along with the nominal signal production cross section and its theoretical uncertainty.

Exclusion limits on the production cross section as a function of m($\tilde{t}$) are shown for several values of $\tau(\tilde{t})$ along with the nominal signal production cross section and its theoretical uncertainty.

Parameterized event selection efficiencies for the $E_{T}^{miss}$ Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the $E_{T}^{miss}$ Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the Muon Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the Muon Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized muon-level reconstruction efficiencies as a function of the muon $p_{T}$ and $d_{0}$. The muon-level efficiencies are extracted using muons passing the muon acceptance criteria.

Parameterized muon-level reconstruction efficiencies as a function of the muon $p_{T}$ and $d_{0}$. The muon-level efficiencies are extracted using muons passing the muon acceptance criteria.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated independent of the muons originating from this truth vertex.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated independent of the muons originating from this truth vertex.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated only for truth vertices which have a muon originating from them which is matched to a reconstructed muon.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated only for truth vertices which have a muon originating from them which is matched to a reconstructed muon.

The $p_{T}$ distribution of all muons originating from LLP decays in the samples used to calculate and validate the efficiencies.

The $p_{T}$ distribution of all muons originating from LLP decays in the samples used to calculate and validate the efficiencies.

The invariant mass and multiplicity of selected decay products of all truth vertices used in the calculation and validation of the reconstructed efficiencies.

The invariant mass and multiplicity of selected decay products of all truth vertices used in the calculation and validation of the reconstructed efficiencies.

- - - - - - - - Overview of HEPData Record - - - - - - - - <br/><br/> <b>Background Fit results:</b> <ul> <li><a href="89413?version=4&table=Background fit 1">CRs</a> <li><a href="89413?version=4&table=Background fit 2">VRs</a> <li><a href="89413?version=4&table=Background fit 5">inclusive DF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 6">inclusive DF-1J SRs</a> <li><a href="89413?version=4&table=Background fit 3">inclusive SF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 4">inclusive SF-1J SRs</a> </ul> <b>Kinematic distributions in VRs:</b> <ul> <li><a href="89413?version=4&table=VR kinematics 1">$m_{T2}$ in VR-top-low</a> <li><a href="89413?version=4&table=VR kinematics 2">$m_{T2}$ in VR-top-high</a> <li><a href="89413?version=4&table=VR kinematics 3">$E_T^{miss}$ in VR-WW-0J</a> <li><a href="89413?version=4&table=VR kinematics 4">$E_T^{miss}$ in VR-WW-1J</a> <li><a href="89413?version=4&table=VR kinematics 5">$E_T^{miss}$ sig in VR-VZ</a> <li><a href="89413?version=4&table=VR kinematics 6">$E_T^{miss}$ sig in VR-top-WW</a> </ul> <b>Kinematic distributions in SRs:</b> <ul> <li><a href="89413?version=4&table=SR kinematics 1">$m_{T2}$ in SR-SF-0J</a> <li><a href="89413?version=4&table=SR kinematics 2">$m_{T2}$ in SR-SF-1J</a> <li><a href="89413?version=4&table=SR kinematics 3">$m_{T2}$ in SR-DF-0J</a> <li><a href="89413?version=4&table=SR kinematics 4">$m_{T2}$ in SR-DF-1J</a> </ul> <b>Systematic uncertaities:</b> <ul> <li><a href="89413?version=4&table=Systematic uncertainties">dominant systematic uncertainties in the inclusive SRs</a> </ul> <b>Exclusion contours:</b> <ul> <li><a href="89413?version=4&table=Exclusion contour (exp) 1">expected exclusion contour direct chargino-pair production via W decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 1">observed exclusion contour direct chargino-pair production via W decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 2">expected exclusion contour direct chargino-pair production via slepton decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 2">observed exclusion contour direct chargino-pair production via slepton decay grid</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 3">expected exclusion contour direct slepton-pair production grid</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 3">observed exclusion contour direct slepton-pair production grid</a> </ul> <br/><br/><b>AUXILIARY MATERIAL</b><br/> <b>Background Fit in binned SRs:</b> <ul> <li><a href="89413?version=4&table=Background fit 7">binned DF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 8">binned DF-1J SRs</a> <li><a href="89413?version=4&table=Background fit 9">binned SF-0J SRs</a> <li><a href="89413?version=4&table=Background fit 10">binned SF-1J SRs</a> </ul> <b>Exclusion contours:</b> <ul> <li><a href="89413?version=4&table=Exclusion contour (exp) 4">expected exclusion contour left-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 4">observed exclusion contour left-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 5">expected exclusion contour right-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 5">observed exclusion contour right-handed slepton-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 6">expected exclusion contour selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 6">observed exclusion contour selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 7">expected exclusion contour left-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 7">observed exclusion contour left-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 8">expected exclusion contour right-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 8">observed exclusion contour right-handed selectron-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 9">expected exclusion contour smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 9">observed exclusion contour smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 10">expected exclusion contour left-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 10">observed exclusion contour left-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (exp) 11">expected exclusion contour right-handed smuon-pair production</a> <li><a href="89413?version=4&table=Exclusion contour (obs) 11">observed exclusion contour right-handed smuon-pair production</a> </ul> <b>Cross section upper limits:</b> <ul> <li><a href="89413?version=4&table=xsec upper limits 1">upper limits on signal cross section for direct chargino-pair production via W decay</a> <li><a href="89413?version=4&table=xsec upper limits 2">upper limits on signal cross section for direct chargino-pair production via slepton decay</a> <li><a href="89413?version=4&table=xsec upper limits 3">upper limits on signal cross section for direct slepton-pair production</a> </ul> <b>Acceptances and Efficiencies for direct chargino-pair production via W decay grid </b> <ul> <li> <b>Acceptance</b> <br/> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,inf) for C1C1WW grid">SR-DF-0J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[160,inf) for C1C1WW grid">SR-DF-0J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,120) for C1C1WW grid">SR-DF-0J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[120,160) for C1C1WW grid">SR-DF-0J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[100,105) for C1C1WW grid">SR-DF-0J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[105,110) for C1C1WW grid">SR-DF-0J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[110,120) for C1C1WW grid">SR-DF-0J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[120,140) for C1C1WW grid">SR-DF-0J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[140,160) for C1C1WW grid">SR-DF-0J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[160,180) for C1C1WW grid">SR-DF-0J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[180,220) for C1C1WW grid">SR-DF-0J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[220,260) for C1C1WW grid">SR-DF-0J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-DF-0J-[260,inf) for C1C1WW grid">SR-DF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,inf) for C1C1WW grid">SR-DF-1J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[160,inf) for C1C1WW grid">SR-DF-1J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,120) for C1C1WW grid">SR-DF-1J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[120,160) for C1C1WW grid">SR-DF-1J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[100,105) for C1C1WW grid">SR-DF-1J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[105,110) for C1C1WW grid">SR-DF-1J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[110,120) for C1C1WW grid">SR-DF-1J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[120,140) for C1C1WW grid">SR-DF-1J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[140,160) for C1C1WW grid">SR-DF-1J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[160,180) for C1C1WW grid">SR-DF-1J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[180,220) for C1C1WW grid">SR-DF-1J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[220,260) for C1C1WW grid">SR-DF-1J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-DF-1J-[260,inf) for C1C1WW grid">SR-DF-1J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,inf) for C1C1WW grid">SR-SF-0J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[160,inf) for C1C1WW grid">SR-SF-0J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,120) for C1C1WW grid">SR-SF-0J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[120,160) for C1C1WW grid">SR-SF-0J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[100,105) for C1C1WW grid">SR-SF-0J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[105,110) for C1C1WW grid">SR-SF-0J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[110,120) for C1C1WW grid">SR-SF-0J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[120,140) for C1C1WW grid">SR-SF-0J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[140,160) for C1C1WW grid">SR-SF-0J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[160,180) for C1C1WW grid">SR-SF-0J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[180,220) for C1C1WW grid">SR-SF-0J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[220,260) for C1C1WW grid">SR-SF-0J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-SF-0J-[260,inf) for C1C1WW grid">SR-SF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,inf) for C1C1WW grid">SR-SF-1J-[100,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[160,inf) for C1C1WW grid">SR-SF-1J-[160,inf) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,120) for C1C1WW grid">SR-SF-1J-[100,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[120,160) for C1C1WW grid">SR-SF-1J-[120,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[100,105) for C1C1WW grid">SR-SF-1J-[100,105) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[105,110) for C1C1WW grid">SR-SF-1J-[105,110) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[110,120) for C1C1WW grid">SR-SF-1J-[110,120) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[120,140) for C1C1WW grid">SR-SF-1J-[120,140) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[140,160) for C1C1WW grid">SR-SF-1J-[140,160) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[160,180) for C1C1WW grid">SR-SF-1J-[160,180) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[180,220) for C1C1WW grid">SR-SF-1J-[180,220) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[220,260) for C1C1WW grid">SR-SF-1J-[220,260) </a> <a href="89413?version=4&table=Acceptance SR-SF-1J-[260,inf) for C1C1WW grid">SR-SF-1J-[260,inf) </a><br/> <li> <b>Efficiency</b> <br/> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,inf) for C1C1WW grid">SR-DF-0J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[160,inf) for C1C1WW grid">SR-DF-0J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,120) for C1C1WW grid">SR-DF-0J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[120,160) for C1C1WW grid">SR-DF-0J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[100,105) for C1C1WW grid">SR-DF-0J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[105,110) for C1C1WW grid">SR-DF-0J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[110,120) for C1C1WW grid">SR-DF-0J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[120,140) for C1C1WW grid">SR-DF-0J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[140,160) for C1C1WW grid">SR-DF-0J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[160,180) for C1C1WW grid">SR-DF-0J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[180,220) for C1C1WW grid">SR-DF-0J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[220,260) for C1C1WW grid">SR-DF-0J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-DF-0J-[260,inf) for C1C1WW grid">SR-DF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,inf) for C1C1WW grid">SR-DF-1J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[160,inf) for C1C1WW grid">SR-DF-1J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,120) for C1C1WW grid">SR-DF-1J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[120,160) for C1C1WW grid">SR-DF-1J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[100,105) for C1C1WW grid">SR-DF-1J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[105,110) for C1C1WW grid">SR-DF-1J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[110,120) for C1C1WW grid">SR-DF-1J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[120,140) for C1C1WW grid">SR-DF-1J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[140,160) for C1C1WW grid">SR-DF-1J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[160,180) for C1C1WW grid">SR-DF-1J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[180,220) for C1C1WW grid">SR-DF-1J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[220,260) for C1C1WW grid">SR-DF-1J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-DF-1J-[260,inf) for C1C1WW grid">SR-DF-1J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,inf) for C1C1WW grid">SR-SF-0J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[160,inf) for C1C1WW grid">SR-SF-0J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,120) for C1C1WW grid">SR-SF-0J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[120,160) for C1C1WW grid">SR-SF-0J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[100,105) for C1C1WW grid">SR-SF-0J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[105,110) for C1C1WW grid">SR-SF-0J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[110,120) for C1C1WW grid">SR-SF-0J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[120,140) for C1C1WW grid">SR-SF-0J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[140,160) for C1C1WW grid">SR-SF-0J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[160,180) for C1C1WW grid">SR-SF-0J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[180,220) for C1C1WW grid">SR-SF-0J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[220,260) for C1C1WW grid">SR-SF-0J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-SF-0J-[260,inf) for C1C1WW grid">SR-SF-0J-[260,inf) </a><br/> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,inf) for C1C1WW grid">SR-SF-1J-[100,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[160,inf) for C1C1WW grid">SR-SF-1J-[160,inf) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,120) for C1C1WW grid">SR-SF-1J-[100,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[120,160) for C1C1WW grid">SR-SF-1J-[120,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[100,105) for C1C1WW grid">SR-SF-1J-[100,105) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[105,110) for C1C1WW grid">SR-SF-1J-[105,110) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[110,120) for C1C1WW grid">SR-SF-1J-[110,120) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[120,140) for C1C1WW grid">SR-SF-1J-[120,140) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[140,160) for C1C1WW grid">SR-SF-1J-[140,160) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[160,180) for C1C1WW grid">SR-SF-1J-[160,180) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[180,220) for C1C1WW grid">SR-SF-1J-[180,220) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[220,260) for C1C1WW grid">SR-SF-1J-[220,260) </a> <a href="89413?version=4&table=Efficiency SR-SF-1J-[260,inf) for C1C1WW grid">SR-SF-1J-[260,inf) </a><br/> </ul> <b>Cutflow:</b> <ul> <li><a href="89413?version=4&table=Cutflow 1">Cutflow for direct chargino-pair production via W decay $m(\tilde{\chi}^{\pm}_1,\tilde{\chi}^{0}_1)=(300,50) GeV$</a> <li><a href="89413?version=4&table=Cutflow 2">Cutflow for direct chargino-pair production via slepton decay $m(\tilde{\chi}^{\pm}_1,\tilde{l},\tilde{\chi}^{0}_1)=(600,300,1) GeV$</a> <li><a href="89413?version=4&table=Cutflow 3">Cutflow for direct slepton-pair production $m(\tilde{l},\tilde{\chi}^{0}_1)=(400,200) GeV$</a> </ul> <b>SimpleAnalysis framework implementation</b> of the search SRs is available under "Resources" (purple button on the left)

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Displaced HNL search observed 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNV case).

Prompt HNL search observed and expected 95% confidence level exclusion upper limits in $|U_{e}|^2$ as a function of HNL mass.

Prompt HNL search observed and expected 95% confidence level exclusion upper limits in $|U_{\mu}|^2$ as a function of HNL mass.

Displaced HNL search expected 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNC case).

Displaced HNL search expected 95% confidence level exclusion contour in $|U_{\mu}|^2$ as a function of HNL mass (LNV case).

The observed upper limits on the model cross-section in units of pb for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production. Three points at $M({\tilde{\chi}}^{0}_{1})=200GeV$ were removed from the plot but kept in the table because they overlapped with the plot's legend and are far from the exclusion contour.

The observed 95\% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95\% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

Distributions in SR-low of the data and post-fit background prediction for H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3&#8467;/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3&#8467;/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3&#8467;). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3&#8467;). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.