The Bose-Einstein correlation (BEC) parameter R as a function of n_ch for HMT events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter R as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter λ as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T >100 MeV at √s=13 TeV in the multiplicity interval 71 ≤ n_ch < 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T >100 MeV at √s=13 TeV in the multiplicity interval 231 ≤ n_ch < 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13 TeV (black circles) and 7 TeV (open blue circles), and the ratio of C₂^7 TeV (Q) to C₂^13 TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative multiplicity region 3.09 < m_ch ≤ 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13  TeV (black circles) and 7  TeV (open blue circles), and the ratio of C₂^7 TeV (Q) to C₂^13 TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative k_T region 400 < k_T ≤500  MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The two-dimensional dependence on m_ch and k_T for p_T > 100 MeV for the correlation strength, λ, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The two-dimensional dependence on m_ch and k_T for p_T > 100 MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The parameter λ for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p_T >100 MeV and for tracks with p_T >500 MeV, respectively.

The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p_T >100 MeV and for tracks with p_T >500 MeV, respectively.

The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p_T >100 MeV and for tracks with p_T >500 MeV, respectively.

The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p_T >100 MeV and for tracks with p_T >500 MeV, respectively.

The two-dimensional dependence on m_ch and k_T for p_T > 500 MeV for the correlation strength, λ, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The two-dimensional dependence on m_ch and k_T for p_T > 500 MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The parameter λ for p_T > 500 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of ∛n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of ∛n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of ∛n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

Systematic uncertainties (in percent) in the correlation strength, λ, and source radius, R, for the exponential fit of the two-particle double-ratio correlation functions, R₂(Q), for p_T > 100 MeV at √s= 13 TeV for the MB and HMT events. The choice of MC generator gives rise to asymmetric uncertainties, denoted by uparrow and downarrow. This asymmetry propagates through to the cumulative uncertainty. The columns under ‘Uncertainty range’ show the range of systematic uncertainty from the fits in the various n_ch intervals.

The results of the fits to the dependencies of the correlation strength, λ, and source radius, R, on the average rescaled charged-particle multiplicity, m_ch, for |η| < 2.5 and both p_T > 100 MeV and p_T > 500 MeV at √s = 13 TeV for the minimum-bias (MB) and the high-multiplicity track (HMT) events. The parameters γ and δ resulting from a joint fit to the MB and HMT data are presented. The total uncertainties are shown.

The results of the fits to the dependencies of the correlation strength, λ, and source radius, R, on the pair average transverse momentum, k_T, for various functional forms and for minimum-bias (MB) and high-multiplicity track (HMT) events for p_T > 100 MeV and p_T > 500 MeV at √s = 13 TeV. The total uncertainties are shown.

The Bose-Einstein correlation (BEC) parameters λ and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) λ versus n_ch for MB events, (b) λ versus n_ch for HMT events, (c) λ versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters λ and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) λ versus n_ch for MB events, (b) λ versus n_ch for HMT events, (c) λ versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters λ and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) λ versus n_ch for MB events, (b) λ versus n_ch for HMT events, (c) λ versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters λ and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) λ versus n_ch for MB events, (b) λ versus n_ch for HMT events, (c) λ versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 100 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 500 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 100 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 500 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

Measured and predicted fiducial cross-sections in both the lllljj and ll$\nu\nu$jj channels for the inclusive ZZjj processes. Uncertainties due to different sources are presented.

Measured and predicted fiducial cross-sections in both the lllljj and ll$\nu\nu$jj channels for the inclusive ZZjj processes. Uncertainties due to different sources are presented.

Observed and expected multivariate discriminant distribution in the $\ell\ell\ell\ell jj$ QCD CR.

Observed and expected multivariate discriminant distribution in the $\ell\ell\ell\ell jj$ QCD CR.

Observed and expected multivariate discriminant distribution in the $\ell\ell\ell\ell jj$ SR.

Observed and expected multivariate discriminant distribution in the $\ell\ell\ell\ell jj$ SR.

Observed and expected multivariate discriminant distribution in the $\ell\ell\nu\nu jj$ SR.

Observed and expected multivariate discriminant distribution in the $\ell\ell\nu\nu jj$ SR.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 0.33 < ln(R/#DeltaR) < 0.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 0.67 < ln(R/#DeltaR) < 1.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.00 < ln(R/#DeltaR) < 1.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.33 < ln(R/#DeltaR) < 1.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.67 < ln(R/#DeltaR) < 2.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.00 < ln(R/#DeltaR) < 2.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.33 < ln(R/#DeltaR) < 2.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.67 < ln(R/#DeltaR) < 3.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.00 < ln(R/#DeltaR) < 3.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.33 < ln(R/#DeltaR) < 3.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.67 < ln(R/#DeltaR) < 4.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 4.00 < ln(R/#DeltaR) < 4.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 0.69 < ln(1/z) < 0.97.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 0.97 < ln(1/z) < 1.25.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.25 < ln(1/z) < 1.52.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.52 < ln(1/z) < 1.80.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.80 < ln(1/z) < 2.08.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.08 < ln(1/z) < 2.36.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.36 < ln(1/z) < 2.63.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.63 < ln(1/z) < 2.91.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.91 < ln(1/z) < 3.19.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.19 < ln(1/z) < 3.47.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.47 < ln(1/z) < 3.74.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.74 < ln(1/z) < 4.02.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.02 < ln(1/z) < 4.30.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.30 < ln(1/z) < 4.57.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.57 < ln(1/z) < 4.85.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.85 < ln(1/z) < 5.13.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.13 < ln(1/z) < 5.41.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.41 < ln(1/z) < 5.68.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.68 < ln(1/z) < 5.96.

The summed covariance matrix of all systematic and statistical uncertainties associated with the measurement in bins of $\ln{(1/z)} \times \ln{(R/\Delta R)}$.

The summed covariance matrix of all statistical uncertainties associated with the measurement in bins of $\ln{(1/z)} \times \ln{(R/\Delta R)}$.

Vertex selection efficiency for the $\tilde{t}$ $R$-hadron benchmark model as a function of the transverse decay distance $r_{DV}$.

Track multiplicity $n_{Tracks}$ for preselected DVs in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

The observed event yields in the control, validation and signal regions are shown for the MET Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the MET Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the Muon Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the Muon Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

Expected exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (1 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (1 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (2 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (2 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (+1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (+1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (-1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (-1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Exclusion limits on the production cross section as a function of m($\tilde{t}$) are shown for several values of $\tau(\tilde{t})$ along with the nominal signal production cross section and its theoretical uncertainty.

Exclusion limits on the production cross section as a function of m($\tilde{t}$) are shown for several values of $\tau(\tilde{t})$ along with the nominal signal production cross section and its theoretical uncertainty.

Parameterized event selection efficiencies for the $E_{T}^{miss}$ Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the $E_{T}^{miss}$ Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the Muon Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the Muon Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized muon-level reconstruction efficiencies as a function of the muon $p_{T}$ and $d_{0}$. The muon-level efficiencies are extracted using muons passing the muon acceptance criteria.

Parameterized muon-level reconstruction efficiencies as a function of the muon $p_{T}$ and $d_{0}$. The muon-level efficiencies are extracted using muons passing the muon acceptance criteria.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated independent of the muons originating from this truth vertex.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated independent of the muons originating from this truth vertex.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated only for truth vertices which have a muon originating from them which is matched to a reconstructed muon.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated only for truth vertices which have a muon originating from them which is matched to a reconstructed muon.

The $p_{T}$ distribution of all muons originating from LLP decays in the samples used to calculate and validate the efficiencies.

The $p_{T}$ distribution of all muons originating from LLP decays in the samples used to calculate and validate the efficiencies.

The invariant mass and multiplicity of selected decay products of all truth vertices used in the calculation and validation of the reconstructed efficiencies.

The invariant mass and multiplicity of selected decay products of all truth vertices used in the calculation and validation of the reconstructed efficiencies.

Post-fit BDT distributions after the VBF event selection for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. The VBF signal is shown for $\mu = 0.73$ and $\tilde d = -0.01$. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

The observed $\Delta\mathrm{NLL}$ curve as a function of $\tilde d$ values. For comparison, expected $\Delta\mathrm{NLL}$ curves are also shown. The constraints on the nuisance parameters and normalization factors are first determined in a CR-only fit, and then a fit to pseudo-data corresponding to these nuisance parameters, normalization factors, and to $\tilde d=0, \mu = 1$ or $\tilde d =0, \mu = 0.73$ is performed to obtain these $\Delta\mathrm{NLL}$ curves. Moreover, a pre-fit expected $\Delta\mathrm{NLL}$ is shown, using pseudo-data corresponding to $\tilde d =0$ and $\mu = 1$ in the signal and control regions.

The expected $\Delta\mathrm{NLL}$ curves comparing the sensitivity of the fit with and without systematic uncertainties. For comparison, other curves are shown which remove the effect of jet-based systematic uncertainties, $\tau$-based systematic uncertainties, and MC statistical uncertainties.

The observed $\Delta\mathrm{NLL}$ curves for each analysis channel as a function of $\tilde d$, compared to the combined result. For the individual analysis channel $\Delta\mathrm{NLL}$ curves, only event yield information in the other SRs is used, ensuring that the Optimal Observable distributions in the other SRs do not influence the preferred value of $\tilde d$. The signal strength is constrained to be positive in these individual channel $\Delta\mathrm{NLL}$ curves. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit BDT distributions in the top-quark CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit BDT distributions in the top-quark CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF channel. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit BDT distributions in the $Z\to \ell\ell$ CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit Optimal Observable distributions in the top-quark CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit Optimal Observable distributions in the top-quark CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF channel. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit Optimal Observable distributions in the $Z\to \ell\ell$ CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit distribution of weighted event yields as a function of the Optimal Observable for all four SRs combined. The contributions of the different SRs are weighted by a factor of ln(1 + S/B), where S and B are the post-fit expected numbers of signal and background events in that region, respectively. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $E_{\mathrm{T}}^{\gamma}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $p_{\mathrm{T}}^{\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $|y^{\textrm{jet}}|$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $E_{\mathrm{T}}^{\gamma}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $p_{\mathrm{T}}^{\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $|y^{\textrm{jet}}|$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Distributions in SR-low of the data and post-fit background prediction for H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3&#8467;/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3&#8467;/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3&#8467;). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3&#8467;). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Expected 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Expected 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

The measured fiducial cross section vs $E_{\mathrm{T}}^\gamma$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.