$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $N_{ch}(p_T < 0.4 GeV)$ (EvSel_$N_{ch}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $N_{ch}(p_T < 0.4 GeV)$ (EvSel_$N_{ch}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $N_{ch}(p_T < 0.4 GeV)$ (EvSel_$N_{ch}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $N_{ch}(p_T < 0.4 GeV)$ (EvSel_$N_{ch}$) for PbPb collisions at $\sqrt{ s_{NN} }$=2.76 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{6\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{6\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{6\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{6\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{8\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{8\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{8\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{8\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{6\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{8\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{6\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{8\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{6\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{8\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{6\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{8\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{4\}/v_2\{2, | \Delta \eta > 2 \}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{6\}/v_2\{4\}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{8\}/v_2\{6\}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{4\}/v_2\{2, | \Delta \eta > 2 \}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{6\}/v_2\{4\}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{8\}/v_2\{6\}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{4\}/v_2\{2, | \Delta \eta > 2 \}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{6\}/v_2\{4\}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{8\}/v_2\{6\}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{4\}/v_2\{2, | \Delta \eta > 2 \}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{6\}/v_2\{4\}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{8\}/v_2\{6\}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_3\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_3\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_4\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_4\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_3\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_3\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_3\{2, | \Delta \eta > 2 \}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_3\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_3\{2, | \Delta \eta > 2 \}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_4\{2, | \Delta \eta > 2 \}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_4\{2, | \Delta \eta > 2 \}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$ v_2\{4\} $ harmonics for reference particles with 0.2 $ < p_{T} < $ 3.0 GeV as a function of $ < N_{ch}(|\eta|<1) > $ for p+Pb collisions at $ \sqrt{ s_{NN} } $= 5.02 TeV.

$ v_2\{4\} $ harmonics for reference particles with 0.2 $ < p_{T}< $ 3.0 GeV as a function of $ < N_{ch}(|\eta|<1) > $ for Pb+Pb collisions at $ \sqrt{ s_{NN} } $= 2.76 TeV.

D(pt) distributions for pp and Pb+Pb collisions, jet rapidity 1.2 < |y| < 2.1.

D(z) distributions for pp and Pb+Pb collisions, jet rapidity |y| < 2.1.

D(z) distributions for pp and Pb+Pb collisions, jet rapidity |y| < 0.3.

D(z) distributions for pp and Pb+Pb collisions, jet rapidity 0.3 < |y| < 0.8.

D(z) distributions for pp and Pb+Pb collisions, jet rapidity 1.2 < |y| < 2.1.

Ratio of D(pt) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 0-10 PCT for jets with |y| < 0.3, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 20-30 PCT for jets with |y| < 0.3, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 30-40 PCT for jets with |y| < 0.3, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 60-80 PCT for jets with |y| < 0.3, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 0-10 PCT for jets with 0.3 < |y| < 0.8, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 20-30 PCT for jets with 0.3 < |y| < 0.8, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 30-40 PCT for jets with 0.3 < |y| < 0.8, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 60-80 PCT for jets with 0.3 < |y| < 0.8, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 0-10 PCT for jets with 1.2 < |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 20-30 PCT for jets with 1.2 < |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 30-40 PCT for jets with 1.2 < |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 60-80 PCT for jets with 1.2 < |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 0-10 PCT for jets with |y| < 0.3, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 20-30 PCT for jets with |y| < 0.3, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 30-40 PCT for jets with |y| < 0.3, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 60-80 PCT for jets with |y| < 0.3, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 0-10 PCT for jets with 0.3 < |y| < 0.8, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 20-30 PCT for jets with 0.3 < |y| < 0.8, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 30-40 PCT for jets with 0.3 < |y| < 0.8, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 60-80 PCT for jets with 0.3 < |y| < 0.8, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 0-10 PCT for jets with 1.2 < |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 20-30 PCT for jets with 1.2 < |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 30-40 PCT for jets with 1.2 < |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 60-80 PCT for jets with 1.2 < |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 100 < pt < 126 GeV.

Ratio of D(pt) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 100 < pt < 126 GeV.

Ratio of D(pt) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 100 < pt < 126 GeV.

Ratio of D(pt) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 100 < pt < 126 GeV.

Ratio of D(pt) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 126 < pt < 158 GeV.

Ratio of D(pt) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 126 < pt < 158 GeV.

Ratio of D(pt) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 126 < pt < 158 GeV.

Ratio of D(pt) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 126 < pt < 158 GeV.

Ratio of D(pt) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 158 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 158 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 158 < pt < 398 GeV.

Ratio of D(pt) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 158 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 100 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 100 < pt < 126 GeV.

Ratio of D(z) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 100 < pt < 126 GeV.

Ratio of D(z) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 100 < pt < 126 GeV.

Ratio of D(z) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 100 < pt < 126 GeV.

Ratio of D(z) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 126 < pt < 158 GeV.

Ratio of D(z) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 126 < pt < 158 GeV.

Ratio of D(z) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 126 < pt < 158 GeV.

Ratio of D(z) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 126 < pt < 158 GeV.

Ratio of D(z) distributions collisions, centrality 0-10 PCT for jets with |y| < 2.1, 158 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 20-30 PCT for jets with |y| < 2.1, 158 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 30-40 PCT for jets with |y| < 2.1, 158 < pt < 398 GeV.

Ratio of D(z) distributions collisions, centrality 60-80 PCT for jets with |y| < 2.1, 158 < pt < 398 GeV.

The difference between the total yield of particles with 1 < pt^trk < 4 GeV measured in 0-80 PCT Pb+Pb collisions and the total yield measured in the same pt interval measured in pp collisions in jets with |y| < 2.1, 100 < pt < 398 GeV.

The difference between the total yield of particles with 4 < pt^trk < 25 GeV measured in 0-80 PCT Pb+Pb collisions and the total yield measured in the same pt interval measured in pp collisions in jets with |y| < 2.1, 100 < pt < 398 GeV.

The difference between the total yield of particles with 25 < pt^trk < 100 GeV measured in 0-80 PCT Pb+Pb collisions and the total yield measured in the same pt interval measured in pp collisions in jets with |y| < 2.1, 100 < pt < 398 GeV.

The difference between the total transverse momentum of particles with 1 < pt^trk < 4 GeV measured in 0-80 PCT Pb+Pb collisions and the total transverse momentum of particles in the same pt interval measured in pp collisions in jets with |y| < 2.1, 100 < pt < 398 GeV.

The difference between the total transverse momentum of particles with 4 < pt^trk < 25 GeV measured in 0-80 PCT Pb+Pb collisions and the total transverse momentum of particles in the same pt interval measured in pp collisions in jets with |y| < 2.1, 100 < pt < 398 GeV.

The difference between the total transverse momentum of particles with 25 < pt^trk < 100 GeV measured in 0-80 PCT Pb+Pb collisions and the total transverse momentum of particles in the same pt interval measured in pp collisions in jets with |y| < 2.1, 100 < pt < 398 GeV.

The ratio of R_D(z) distributions in three rapidity selections for 0-10 PCT Pb+Pb collisions.

The ratio of R_D(z) distributions in three rapidity selections for 10-20 PCT Pb+Pb collisions.

The ratio of R_D(z) distributions in three rapidity selections for 20-30 PCT Pb+Pb collisions.

The expected 95% CL exclusion contour (-1$\sigma$) for a simplified model of dark-matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$ = 0.25, $g_{\chi}$ = 1 and $g_{l}$ = 0 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour for a simplified model of dark-matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$ = 0.25, $g_{\chi}$ = 1 and $g_{l}$ = 0 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The observed 95% CL exclusion contour for a simplified model of dark-matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$ = 0.1, $g_{\chi}$ = 1 and $g_{l}$ = 0.1 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour (+1$\sigma$) for a simplified model of dark-matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$ = 0.1, $g_{\chi}$ = 1 and $g_{l}$ = 0.1 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour (-1$\sigma$) for a simplified model of dark-matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$ = 0.1, $g_{\chi}$ = 1 and $g_{l}$ = 0.1 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour for a simplified model of dark-matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$ = 0.1, $g_{\chi}$ = 1 and $g_{l}$ = 0.1 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The observed 95% CL exclusion contour for a simplified model of dark-matter production involving a vector operator with couplings $g_{q}$ = 0.25, $g_{\chi}$ =1 and $g_{l}$ = 0 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour ($+1\sigma$) for a simplified model of dark-matter production involving a vector operator with couplings $g_{q}$ = 0.25, $g_{\chi}$ =1 and $g_{l}$ = 0 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour ($-1\sigma$) for a simplified model of dark-matter production involving a vector operator with couplings $g_{q}$ = 0.25, $g_{\chi}$ =1 and $g_{l}$ = 0 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour for a simplified model of dark-matter production involving a vector operator with couplings $g_{q}$ = 0.25, $g_{\chi}$ =1 and $g_{l}$ = 0 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The observed 95% CL exclusion contour for a simplified model of dark-matter production involving for a vector operator with couplings $g_{q}$ = 0.1, $g_{\chi}$ = 1 and $g_{l}$ = 0.01 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour ($+1\sigma$) for a simplified model of dark-matter production involving for a vector operator with couplings $g_{q}$ = 0.1, $g_{\chi}$ = 1 and $g_{l}$ = 0.01 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour ($-1\sigma$) for a simplified model of dark-matter production involving for a vector operator with couplings $g_{q}$ = 0.1, $g_{\chi}$ = 1 and $g_{l}$ = 0.01 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The expected 95% CL exclusion contour for a simplified model of dark-matter production involving for a vector operator with couplings $g_{q}$ = 0.1, $g_{\chi}$ = 1 and $g_{l}$ = 0.01 as a function of the dark-matter mass $m_{\chi}$ and the mediator mass $m_{\mathrm{med}}$. The plane under the limit curve is excluded.

The 90% CL exclusion limit on the $\chi$-proton scattering cross section in a simplifed model of dark-matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$ = 0.25, $g_{\chi}$ = 1 and $g_{l}$ = 0 as a function of the dark-matter mass $m_{\chi}$.

The 90% CL exclusion limit on the $\chi$-nucleon scattering cross section in a simplifed model of dark-matter production involving a vector operator, Dirac DM and couplings $g_{q}$ = 0.25, $g_{\chi}$ = 1 and $g_{l}$ = 0 as a function of the dark-matter mass $m_{\chi}$.

The observed and expected 95% CL limits on M* for a dimension-7 operator EFT model with a contact interaction of type $\gamma\gamma\chi\chi$ as a function of dark-matter mass $m_{\chi}$.

The observed and expected limit at 95% CL on the production cross section of a $Z\gamma$ resonance as a function of its mass.

The observed 95% CL upper limits on signal strength $\mu$, the ratio of the experimental limit to the predicted signal cross section, for a simplified model of dark matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$ = 0.25 and $g_{\chi}$ = 1 as a function of the DM and the mediator particle masses. The bound on $\mu$ only applies for choices of couplings that yield the same kinematic distributions as the benchmark model.

Acceptance, in %, for a simplified model of dark matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$= 0.25 and $g_{\chi}$ = 1 for various $m_{\chi}$ and $m_{\textrm{med}}$ values. It is constant as a function of $m_{\chi}$ for a fixed $m_{\textrm{med}}$ in the region $m_{\textrm{med}}>2m_{\chi}$.

Fiducial reconstruction efficiencies in the three inclusive signal regions for a simplified model of dark matter production involving an axial-vector operator, Dirac DM and couplings $g_{q}$= 0.25 and $g_{\chi}$ = 1 for various $m_{\chi}$ and $m_{\textrm{med}}$ values. It is constant as a function of $m_{\chi}$ for a fixed $m_{\textrm{med}}$ in the region $m_{\textrm{med}}>2m_{\chi}$.

Measured non-prompt J/psi differential cross-section multiplied by branching ratio. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity, the second is the luminosity.

Measured prompt J/psi differential cross-section multiplied by branching ratio. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity, the second is the luminosity.

Measured non-prompt J/psi differential cross-section multiplied by branching ratio. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity, the second is the luminosity.

Measured forward-backward production ratio.

Measured forward-backward production ratio.

The sumPT distribution in the Z+jets control region (electron channel). Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the Z+jets control region (muon channel). Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the ttbar control region (electron channel). Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the ttbar control region (muon channel). Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the electron channel. The selection is that of the signal regions except for the final requirement on sumPT. Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the muon channel. The selection is that of the signal regions except for the final requirement on sumPT. Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

Expected and observed exclusion contours in the MTH, MD plane for models of rotating black holes with two, four and six extra dimensions simulated with Charybdis2 1.0.4. Masses below the corresponding lines are excluded.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the hadronic pseudo-top-quark $|y(\hat{t}_{\mathrm{h}})|$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the leptonic pseudo-top-quark $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}})$ in the muon channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the leptonic pseudo-top-quark $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}})$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the leptonic pseudo-top-quark $|y(\hat{t}_{\mathrm{l}})|$ in the muon channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the leptonic pseudo-top-quark $|y(\hat{t}_{\mathrm{l}})|$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ in the muon channel.The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $|y(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})|$ in the muon channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $|y(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})|$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $m(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ in the muon channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $m(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the hadronic pseudo-top-quark $p_{\mathrm{T}}(\hat{t}_{\mathrm{h}})$ after the electron and muon channel combination. The results shown in this table correspond to the results presented in figure 11(a).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the hadronic pseudo-top-quark $|y(\hat{t}_{\mathrm{h}})|$ after the electron and muon channel combination. The results shown in this table correspond to the results presentedin figure 12(a).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of theleptonic pseudo-top-quark $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}})$ after the electron and muon channel combination.The results shown in this table correspond to the results presented in figure 11(b).

Measured $t\bar{t}$ differential cross-section and relative uncertaintyas a function of the leptonic pseudo-top-quark $|y(\hat{t}_{\mathrm{l}})|$ after the electron and muon channel combination.The results shown in this table correspond to the results presented in figure 12(b).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function ofthe pseudo-top-quark-pair $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ after the electron and muon channel combination.The results shown in this table correspond to the results presented in figure 13(a).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $|y(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})|$ after the electron and muon channel combination.The results shown in this table correspond to the results presented in figure 13(b).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $m(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$after the electron and muon channel combination. The results shown in this table correspond to the results presented in figure 13(c).

The measured differential cross sections $\rm{d}\sigma/\rm{d}|\eta|$ of $D^{*\pm}$ and $D^\pm$ production with $20<p_T<100\,$GeV. The first and second errors are the statistical and systematic uncertainties, respectively. The systematic uncertainty fractions corresponding to the tracking ($\delta_2$) uncertainties (Table 2 of the paper) are strongly correlated. The fully correlated uncertainties linked with the luminosity measurement ($3.5\%$) and branching fractions ($1.5\%$ and $2.1\%$ for $D^{*\pm}$ and $D^\pm$, respectively) are not shown.

Measured fiducial cross section in fb as a function of Yll.

Measured fiducial cross section in fb/GeV as a function of the leading jet pT, PT(JET1).

Measured normalised fiducial cross section as a function of Njet. Jet PT>25 GeV for |eta|<2.4 and PT>30 GeV for 2.4<|eta|<4.5.

Measured normalised fiducial cross section in 1/GeV as a function of pTH.

Measured normalised fiducial cross section as a function of Yll.

Measured normalised fiducial cross section in 1/GeV as a function of the leading jet pT, PT(JET1).

Jet veto efficiency as a function of PT(JET1) pT threshold.

Full correlation matrix for the measured differential cross section as a function of Njet, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured differential cross section as a function of pTH, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured differential cross section as a function of Yll, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured differential cross section as a function of the leading jet pT, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured normalised differential cross section as a function of Njet, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured normalised differential cross section as a function of pTH, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured normalised differential cross section as a function of Yll, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured normalised differential cross section as a function of the leading jet pT, taking into account statistical and systematic uncertainties.

Fiducial cross section of H+0-jet events in femtobarn for different values of PT(JET1) pT threshold with the uncertainties for each bin given in absolute values and in percent. The asterisk for the 25 GeV column header indicates that the results are for a mixed jet pT threshold, which is raised from 25 GeV to 30 GeV for jets with 2.5 < |eta| < 4.5.

Correction factors from inclusive parton level to fiducial particle level for bins of Njet derived with POWHEG NNLOPS+Pythia8. Uncertainties due to the non-perturbative correction are dominant for the correction factors.

Correction factors from inclusive parton level to fiducial particle level for bins of the leading jet pT derived with POWHEG NNLOPS+Pythia8. Uncertainties due to the non-perturbative correction are dominant for the correction factors.

Correction factors from inclusive parton level to fiducial particle level for the jet-veto efficiency with different jet pT thresholds derived with POWHEG NNLOPS+Pythia8. The asterisk on the 25 GeV bin label indicates that the results are for a mixed pT threshold, which is raised from 25 GeV to 30 GeV for jets with 2.5 < |eta| < 4.5, corresponding to the selection used to define the signal regions for the analysis.

The measured differential cross-section normalized to the bin width in values of the angle between the leptons in the leading reconstructed lepton pair for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the rapidity difference between the reconstructed lepton pairs for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the leading reconstructed dilepton pT for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the angle between the dilepton pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the transverse mass of the reconstructed diboson pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Ratio of fiducial cross sections measured for $W^{\pm} Z$ production at $\sqrt{s}=13$ TeV and $\sqrt{s}=8$ TeV. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Measured fiducial cross section as a function of the exclusive jet multiplicity, where jets are particle level jets with anti-kt R=0.4. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Correlation matrix for the total uncertainties, including all sources of systematic and statistical uncertainties, for the differential cross section as a function of the exclusive jet multiplicity.

All correlated systematic relative uncertainties in percent on measured differential cross section as a function of the exclusive jet multiplicity.

Breakdown of systematic uncertainties in percent for the measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+mu- final state at 13TeV.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured total cross-section for ttbar events using e-mu events with b-tagged jets.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV, omitting the common normalisation uncertainty due to the luminosity calibration and beam energy.

Z-boson and ttbar production cross-section single ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both numerator and denominator. In the second column, the total cross section is used for the numerator while the fiducial (FID) cross section is used for the denominator. In the third column, the fiducial cross sections are used for both numerator and denominator. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections. The luminosity uncertainty almost entirely cancels in some of the ratio measurements.

Z-boson and ttbar production cross-section double ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both ttbar and Z processes. In the second column, the total cross section is used for ttbar while the fiducial (FID) cross section is used for Z. In the third column, the fiducial cross sections are used for both ttbar and Z. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections.

Measured charge asymmetry, $A_c$, values for the electron and muon channels combined after unfolding as a function of the $t\bar{t}$ transverse momentum, $p_{{\rm T}, t\bar{t}}$. The quoted uncertainties include statistical and systematic components after the marginalisation.

Correlation coefficients $\rho_{i,j}$ for the statistical and systematic uncertainties between the $i$-th and $j$-th bin of the differential $A_c$ measurement as a function of the $t\bar{t}$ invariant mass, $m_{t\bar{t}}$.

Correlation coefficients $\rho_{i,j}$ for the statistical and systematic uncertainties between the $i$-th and $j$-th bin of the differential $A_c$ measurement as a function of the $t\bar{t}$ velocity along the z-axis, $\beta_{z,t\bar{t}}$.

Correlation coefficients $\rho_{i,j}$ for the statistical and systematic uncertainties between the $i$-th and $j$-th bin of the differential $A_c$ measurement as a function of the transverse momentum, $p_{{\rm T}, t\bar{t}}$.

Median expected and observed 95% CL upper limits on the cross-section times branching ratio (sigma*B) for W'_SSM production for the exclusive muon and electron channels, and for both channels combined.

Parton-level normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level normalized $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The cross-sections in the last bins include events (if any) beyond of the bin edges. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Parton-level absolute $t\bar t$ differential cross-sections for the $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The uncertainties quoted in the second column represent the statistical and systematic uncertainties added in quadrature.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of 10$^{-6}$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are unit-less.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The elements of the covariance matrix are pb$^2$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are in units of pb$^2$ GeV$^{-2}$.

Full covariance matrix of the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The elements of the covariance matrix are pb$^2$.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the normalized $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 7 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system mass $m_{t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system transverse momentum $p_{T, t\bar t}$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Statistical bin-to-bin correlations in the absolute $t\bar t$ differential cross-sections for $t\bar t$ system absolute rapidity $|y_{t\bar t}|$ at $\sqrt{s}$ = 8 TeV. The off-diagonal correlations mainly due to bin migrations in unfolding and the normalization condition.

Results for the DeltaR distribution. Statistical and systematic uncertainties are quoted.

Results for the pT distribution. Statistical and systematic uncertainties are quoted.

Results for the y_B distribution. Statistical and systematic uncertainties are quoted.

$R_{pPb}$ as a function of $p_{T}$ integrated over rapidity range $-1.8<y*<1.3$ for the 0--90% centrality interval for the three geometric models: (a) Glauber, (b) Glauber-Gribov with $\omega_{\sigma}=0.11$ and (c) Glauber-Gribov with $\omega_{\sigma}=0.2$.

$R_{pPb}$ values as a function of $p_{T}$ in the 0--90% centrality interval averaged over $|y*|<0.5$.The $\langle T_{Pb} \rangle$ value for the ATLAS centrality correction is calculated with the Glauber model. The total systematic uncertainties, which include the uncertainty in $\langle T_{Pb} \rangle$, are indicated by lines of the same colour. Strict quantitative agreement is not expected as each measurement uses different rapidity intervals for the centrality determination and apply different event selection criteria to reject diffractive collisions.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the VBS fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the aQGC fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Expected and observed one-dimensional 95% Confidence Level intervals on the anomalous couplings parameters. Anomalous couplings are introduced as form factors using a cut-off scale $\Lambda_{\mathrm{co}}$.

Expected and observed one-dimensional intervals at 95% Confidence Level on the Effective Field Theory (EFT) parameters.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Measured cross-section as a function of angular separation between the muon and the closest jet for $500~\text{GeV} < p_T^{\text{leading jet}} < 600~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Measured cross-section as a function of angular separation between the muon and the closest jet for $p_T^{\text{leading jet}} > 650~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Expected 95% CL exclusion contour for the Gbb signal.

Observed 95% CL exclusion contour for the Gbb signal.

Expected 95% CL exclusion contour for the Gtt combination.

Observed 95% CL exclusion contour for the Gtt combination.

Acceptances for the Gbb model in SR-Gbb-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptance times efficiency for the Gbb model in SR-Gbb-A.

Acceptance times efficiency for the Gbb model in SR-Gbb-B.

Acceptance times efficiency for the Gbb model in SR-Gbb-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-B.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-B.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gbb model.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 0-lepton channel.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 1-lepton channel.

Combination of two 0-lepton and 1-lepton signal regions yielding the best expected sensitivity for each point of the parameter space in the Gtt model.

Observed and expected background and signal effective mass distributions for SR2jl. For signal, a squark direct decay model with $m(\tilde q)=800$ GeV and $m(\tilde\chi^0_1)=400$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR2jm. For signal, a gluino direct decay model with $m(\tilde g)=750$ GeV and $m(\tilde\chi^0_1)=660$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR2jt. For signal, a squark direct decay model with $m(\tilde q)=1200$ GeV and $m(\tilde\chi^0_1)=0$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR4jt. For signal, a gluino direct decay model with $m(\tilde g)=1400$ GeV and $m(\tilde\chi^0_1)=0$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR5j. For signal, a gluino one-step decay model with $m(\tilde g)=1265$ GeV, $m(\tilde\chi^\pm_1)=945$ GeV and $m(\tilde\chi^0_1)=625$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR6jm. For signal, a gluino one-step decay model with $m(\tilde g)=1265$ GeV, $m(\tilde\chi^\pm_1)=945$ GeV and $m(\tilde\chi^0_1)=625$ GeV is shown.

Observed and expected background and signal effective mass distributions for SR6jt. For signal, a gluino one-step decay model with $m(\tilde g)=1385$ GeV, $m(\tilde\chi^\pm_1)=705$ GeV and $m(\tilde\chi^0_1)=25$ GeV is shown.

Expected limit at 95% CL for squark direct decay model grid.

Expected limits at 95% CL +1 sigma excursion due to experimental and background-only theoretical uncertainties for squark direct decay model grid.

Expected limits at 95% CL -1 sigma excursion due to experimental and background-only theoretical uncertainties for squark direct decay model grid.

Observed limits at 95% CL for squark direct decay model grid.

Observed limits at 95% CL +1 sigma excursion due to the signal cross-section uncertainty for squark direct decay model grid.

Observed limits at 95% CL -1 sigma excursion due to the signal cross-section uncertainty for squark direct decay model grid.

Expected limit at 95% CL for gluino direct decay model grid.

Expected limits at 95% CL +1 sigma excursion due to experimental and background-only theoretical uncertainties for gluino direct decay model grid.

Expected limits at 95% CL -1 sigma excursion due to experimental and background-only theoretical uncertainties for gluino direct decay model grid.

Observed limits at 95% CL for gluino direct decay model grid.

Observed limits at 95% CL +1 sigma excursion due to the signal cross-section uncertainty for gluino direct decay model grid.

Observed limits at 95% CL -1 sigma excursion due to the signal cross-section uncertainty for gluino direct decay model grid.

Expected limit at 95% CL for gluino one-step decay model grid.

Expected limits at 95% CL +1 sigma excursion due to experimental and background-only theoretical uncertainties for gluino one-step decay model grid.

Expected limits at 95% CL -1 sigma excursion due to experimental and background-only theoretical uncertainties for gluino one-step decay model grid.

Observed limits at 95% CL for gluino one-step decay model grid.

Observed limits at 95% CL +1 sigma excursion due to the signal cross-section uncertainty for gluino one-step decay model grid.

Observed limits at 95% CL -1 sigma excursion due to the signal cross-section uncertainty for gluino one-step decay model grid.

Observed and expected background effective mass distributions in control region CRgamma for SR2jl.

Observed and expected background effective mass distributions in validation region VRZ for SR2jl.

Observed and expected background effective mass distributions in control region CRW for SR2jl.

Observed and expected background effective mass distributions in control region CRT for SR2jl.

Observed and expected background effective mass distributions in control region CRgamma for SR2jm.

Observed and expected background effective mass distributions in validation region VRZ for SR2jm.

Observed and expected background effective mass distributions in control region CRW for SR2jm.

Observed and expected background effective mass distributions in control region CRT for SR2jm.

Observed and expected background effective mass distributions in control region CRgamma for SR2jt.

Observed and expected background effective mass distributions in validation region VRZ for SR2jt.

Observed and expected background effective mass distributions in control region CRW for SR2jt.

Observed and expected background effective mass distributions in control region CRT for SR2jt.

Observed and expected background effective mass distributions in control region CRgamma for SR4jt.

Observed and expected background effective mass distributions in validation region VRZ for SR4jt.

Observed and expected background effective mass distributions in control region CRW for SR4jt.

Observed and expected background effective mass distributions in control region CRT for SR4jt.

Observed and expected background effective mass distributions in control region CRgamma for SR5j.

Observed and expected background effective mass distributions in validation region VRZ for SR5j.

Observed and expected background effective mass distributions in control region CRW for SR5j.

Observed and expected background effective mass distributions in control region CRT for SR5j.

Observed and expected background effective mass distributions in control region CRgamma for SR6jm.

Observed and expected background effective mass distributions in validation region VRZ for SR6jm.

Observed and expected background effective mass distributions in control region CRW for SR6jm.

Observed and expected background effective mass distributions in control region CRT for SR6jm.

Observed and expected background effective mass distributions in control region CRgamma for SR6jt.

Observed and expected background effective mass distributions in validation region VRZ for SR6jt.

Observed and expected background effective mass distributions in control region CRW for SR6jt.

Observed and expected background effective mass distributions in control region CRT for SR6jt.

Observed and expected event yields in VRZ as a function of signal region.

Observed and expected event yields in VRW as a function of signal region.

Observed and expected event yields in VRWv as a function of signal region.

Observed and expected event yields in VRT as a function of signal region.

Observed and expected event yields in VRTv as a function of signal region.

Observed and expected event yields in VRQa as a function of signal region.

Observed and expected event yields in VRQb as a function of signal region.

Signal acceptance for SR2jl in squark direct decay model grid.

Signal acceptance times efficiency for SR2jl in squark direct decay model grid.

Signal acceptance for SR2jm in squark direct decay model grid.

Signal acceptance times efficiency for SR2jm in squark direct decay model grid.

Signal acceptance for SR2jt in squark direct decay model grid.

Signal acceptance times efficiency for SR2jt in squark direct decay model grid.

Signal acceptance for SR4jt in squark direct decay model grid.

Signal acceptance times efficiency for SR4jt in squark direct decay model grid.

Signal acceptance for SR5j in squark direct decay model grid.

Signal acceptance times efficiency for SR5j in squark direct decay model grid.

Signal acceptance for SR6jm in squark direct decay model grid.

Signal acceptance times efficiency for SR6jm in squark direct decay model grid.

Signal acceptance for SR6jt in squark direct decay model grid.

Signal acceptance times efficiency for SR6jt in squark direct decay model grid.

Signal acceptance for SR2jl in gluino direct decay model grid.

Signal acceptance times efficiency for SR2jl in gluino direct decay model grid.

Signal acceptance for SR2jm in gluino direct decay model grid.

Signal acceptance times efficiency for SR2jm in gluino direct decay model grid.

Signal acceptance for SR2jt in gluino direct decay model grid.

Signal acceptance times efficiency for SR2jt in gluino direct decay model grid.

Signal acceptance for SR4jt in gluino direct decay model grid.

Signal acceptance times efficiency for SR4jt in gluino direct decay model grid.

Signal acceptance for SR5j in gluino direct decay model grid.

Signal acceptance times efficiency for SR5j in gluino direct decay model grid.

Signal acceptance for SR6jm in gluino direct decay model grid.

Signal acceptance times efficiency for SR6jm in gluino direct decay model grid.

Signal acceptance for SR6jt in gluino direct decay model grid.

Signal acceptance times efficiency for SR6jt in gluino direct decay model grid.

Signal acceptance for SR2jl in gluino one-step decay model grid.

Signal acceptance times efficiency for SR2jl in gluino one-step decay model grid.

Signal acceptance for SR2jm in gluino one-step decay model grid.

Signal acceptance times efficiency for SR2jm in gluino one-step decay model grid.

Signal acceptance for SR2j5 in gluino one-step decay model grid.

Signal acceptance times efficiency for SR2jt in gluino one-step decay model grid.

Signal acceptance for SR4jt in gluino one-step decay model grid.

Signal acceptance times efficiency for SR4jt in gluino one-step decay model grid.

Signal acceptance for SR5j in gluino one-step decay model grid.

Signal acceptance times efficiency for SR5j in gluino one-step decay model grid.

Signal acceptance for SR6jm in gluino one-step decay model grid.

Signal acceptance times efficiency for SR6jm in gluino one-step decay model grid.

Signal acceptance for SR6jt in gluino one-step decay model grid.

Signal acceptance times efficiency for SR6jt in gluino one-step decay model grid.

Comparison of data with estimated backgrounds in the $\tilde{E}_\text{T}^\text{miss}$ distribution with the TZCR1 event selection except for the requirement on $\tilde{E}_\text{T}^\text{miss}$. The variables $\tilde{E}_\text{T}^\text{miss}$ and $\tilde{m}_\text{T}$ are constructed in the same way as $E_\text{T}^\text{miss}$ and $m_\text{T}$ but treating the leading photon transverse momentum as invisible. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Comparison of data with estimated backgrounds in the $\tilde{m}_\text{T}$ distribution with the TZCR1 event selection except for the requirement on $\tilde{m}_\text{T}$. The variables $\tilde{E}_\text{T}^\text{miss}$ and $\tilde{m}_\text{T}$ are constructed in the same way as $E_\text{T}^\text{miss}$ and $m_\text{T}$ but treating the leading photon transverse momentum as invisible. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Comparison of the observed data ($n_\text{obs}$) with the predicted background ($n_\text{exp}$) in the validation and signal regions. The background predictions are obtained using the background-only fit configuration. The bottom panel shows the significance of the difference between data and predicted background, where the significance is based on the total uncertainty ($\sigma_\text{tot}$).

Jet multiplicity distributions for events where exactly two signal leptons are selected. No correction factors are included in the background normalizations. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Jet multiplicity distributions for events where exactly one lepton plus one $\tau$ candidate are selected. No correction factors are included in the background normalizations. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

The $E_\text{T}^\text{miss}$ distribution in SR1. In the plot, the full event selection in the corresponding signal region is applied, except for the requirement on $E_\text{T}^\text{miss}$. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin contains the overflow. Benchmark signal models are overlaid for comparison. The benchmark models are specified by the gluino and stop masses, given in TeV in the table.

The $m_\text{T}$ distribution in SR1. In the plot, the full event selection in the corresponding signal region is applied, except for the requirement on $m_\text{T}$. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin contains the overflow. Benchmark signal models are overlaid for comparison. The benchmark models are specified by the gluino and stop masses, given in TeV in the table.

Expected (black dashed) 95% excluded regions in the plane of $m_{\tilde{g}}$ versus $m_{\tilde{t}_1}$ for gluino-mediated stop production.

Observed (red solid) 95% excluded regions in the plane of $m_{\tilde{g}}$ versus $m_{\tilde{t}_1}$ for gluino-mediated stop production.

Expected (black dashed) 95% excluded regions in the plane of $m_{\tilde{t}_1}$ versus $m_{\tilde{\chi}_1^0}$ for direct stop production.

Observed (red solid) 95% excluded regions in the plane of $m_{\tilde{t}_1}$ versus $m_{\tilde{\chi}_1^0}$ for direct stop production.

The expected upper limits on $T$ quark pair production times the squared branching ratio for $T \rightarrow tZ$ as a function of the $T$ quark mass.

The observed upper limits on $T$ quark pair production times the squared branching ratio for $T \rightarrow tZ$ as a function of the $T$ quark mass.

The expected limits on $T$ quarks as a function of the branching ratios $B\left(T \rightarrow bW\right)$ and $B\left(T \rightarrow tH\right)$ for a $T$ quark with a mass of 800 GeV. The $T$ is assumed to decay in three possible ways: $T \to tZ$, $T \to tH$, and $T \to bW$.

The observed limits on $T$ quarks as a function of the branching ratios $B\left(T \rightarrow bW\right)$ and $B\left(T \rightarrow tH\right)$ for a $T$ quark with a mass of 800 GeV. The $T$ is assumed to decay in three possible ways: $T \to tZ$, $T \to tH$, and $T \to bW$.

The $m_\text{T}$ distribution in the WVR2-tail validation region which has the same preselection and jet $p_\text{T}$ requirements as SR2.

The $am_\text{T2}$ distribution in the WVR2-tail validation region which has the same preselection and jet $p_\text{T}$ requirements as SR2.

Large-radius jet mass ($R=1.2$), decomposed into the number of small-radius jet constituents. The lower panel shows the ratio of the total data to the total prediction (summed over all jet multiplicities). Events are required to have one lepton, four jets with $p_\text{T}>80,50,40,40$ GeV, at least one $b$-tagged jet, $E_\text{T}^\text{miss}>200$ GeV, and $m_\text{T}>30$ GeV.

Distribution of $m_\text{T2}^\tau$ in data for a selection enriched in $t\bar{t}$ events with one hadronically decaying $\tau$. Events that have no hadronic $\tau$ candidate (that passes the Loose identification criteria, as well as other requirements) are not shown in the plot.

Upper limits on the model cross-section in units of pb for the gluino-mediated stop models.

Upper limits on the model cross-section in units of pb for the models with direct stop pair production.

Illustration of the best expected signal region per signal grid point for the gluino-mediated stop models. This mapping is used for the final combined exclusion limits.

Illustration of the best expected signal region per signal grid point for models with direct stop pair production. This mapping is used for the final combined exclusion limits.

Expected $CL_s$ values for the gluino-mediated stop models.

Observed $CL_s$ values for the gluino-mediated stop models.

Expected $CL_s$ values for the direct stop pair production models.

Observed $CL_s$ values for the direct stop pair production models.

Expected limit using SR1 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR1 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR1 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR1 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR1 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR1 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Expected limit using SR2 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR2 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR2 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR2 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR2 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR2 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Acceptance for SR1 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR1 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR2 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR2 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR3 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR3 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Efficiency for SR1 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR1 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR2 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR2 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR3 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR3 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA250.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA250.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA350.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA350.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA450.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA450.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRB.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRB.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the best expected signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA250 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA350 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA450 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRB signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the best expected signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA250 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA350 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA450 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRB signal region.

Total experimental systematic uncertainty in percent on the signal efficiency times acceptance in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane. The best expected signal region selection is used per point.

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Normalized distribution of the variable $\Delta^{p_{\mathrm{T}}}_{13}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta^{p_{\mathrm{T}}}_{23}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta^{p_{\mathrm{T}}}_{14}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta^{p_{\mathrm{T}}}_{24}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta\phi_{12}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta\phi_{13}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta\phi_{23}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta\phi_{14}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta\phi_{24}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta y_{12}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta y_{34}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta y_{13}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta y_{23}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta y_{14}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\Delta y_{24}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\phi_{1+2} - \phi_{3+4}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\phi_{1+3} - \phi_{2+4}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Normalized distribution of the variable $\phi_{1+4} - \phi_{2+3}$, defined in Eq (16) of the paper, in data after unfolding to particle level.

Measured cross section in bins of $p_{\rm{T}}^{\rm{j}1}$.

Measured fractions in bins of $p_{\rm{T}}^{\rm{H}}$.

Measured fractions in bins of $|y^{\rm{H}}|$.

Measured fractions in bins of $N_{\rm{jets}}$.

Measured fractions in bins of $p_{\rm{T}}^{\rm{j1}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $p_{\rm{T}}^{\rm{H}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $|y^{\rm{H}}|$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $N_{\rm{jets}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $p_{\rm{T}}^{\rm{j1}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $p_{\rm{T}}^{\rm{H}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $|y^{\rm{H}}|$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $N_{\rm{jets}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $p_{\rm{T}}^{\rm{j1}}$.

The total $pp\to H$ cross section in the $H\to\gamma\gamma$ and $H\to ZZ^*\to 4\ell$ channels and their combination.

Measured fiducial cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured fiducial cross-section ratios (lepton universality) R_{W} = sigma(W+/- -> e+/- nu/nubar)/sigma (W+/- -> mu+/- nu/nubar) and R_{Z} = sigma (Z/gamma^* -> e+ e-)/sigma (Z/gamma* -> mu+ mu-), and the correlation coefficient.

Measured fiducial cross section times leptonic branching ratio for W+ production in the combined W+ -> l+ nu (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the combined W- -> l- nubar (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the combined W+ -> l+ nu (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W- production in the combined W- -> l- nubar (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured fiducial cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured fiducial cross-section ratio R_{W+/W-} = sigma (W+ -> l+ nu) / sigma (W- -> l- nubar) where (l = e, mu).

Correlation coefficients among (W- -> l- nubar), (W+ -> l+ nu), (Z/gamma^* -> l+ l-) where (l = e, mu) excluding the common normalisation uncertainty due to the luminosity calibration.

NLO cross sections and selection efficiencies (assuming $\beta$ = 1) for different signal points.

The fiducial, inclusive (SPS+DPS) and DPS-subtracted differential cross-section ratio $\mathrm{d}R_{Z+J/\psi}/\mathrm{d}y$ as a function of $y_{J/\psi}$ for non-prompt $J/\psi$.

The inclusive (SPS+DPS) cross-section ratio $\mathrm{d}R_{Z+J/\psi}^\mathrm{incl}/\mathrm{d}p_\mathrm{T}$ for prompt and non-prompt $J/\psi$. Estimated DPS contributions for each bin, based on the assumptions made in this study, are presented.

The inclusive (SPS+DPS) cross-section ratio $\mathrm{d}R_{Z+J/\psi}^\mathrm{incl}/\mathrm{d}p_\mathrm{T}$ for prompt and non-prompt $J/\psi$. Estimated DPS contributions for each bin, based on the assumptions made in this study, are presented.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

v2(pT) for centrality interval 30-40% and |eta| <1.

v2(pT) for centrality interval 40-50% and |eta| <1.

v2(pT) for centrality interval 50-60% and |eta| <1.

v2(pT) for centrality interval 60-70% and |eta| <1.

v2(pT) for centrality interval 70-80% and |eta| <1.

v2(pT) for centrality interval 0-10% and 1< |eta| <2.

v2(pT) for centrality interval 10-20% and 1< |eta| <2.

v2(pT) for centrality interval 20-30% and 1< |eta| <2.

v2(pT) for centrality interval 30-40% and 1< |eta| <2.

v2(pT) for centrality interval 40-50% and 1< |eta| <2.

v2(pT) for centrality interval 50-60% and 1< |eta| <2.

v2(pT) for centrality interval 60-70% and 1< |eta| <2.

v2(pT) for centrality interval 70-80% and 1< |eta| <2.

v2(pT) for centrality interval 0-10% and 2< |eta| <2.5.

v2(pT) for centrality interval 10-20% and 2< |eta| <2.5.

v2(pT) for centrality interval 20-30% and 2< |eta| <2.5.

v2(pT) for centrality interval 30-40% and 2< |eta| <2.5.

v2(pT) for centrality interval 40-50% and 2< |eta| <2.5.

v2(pT) for centrality interval 50-60% and 2< |eta| <2.5.

v2(pT) for centrality interval 60-70% and 2< |eta| <2.5.

v2(pT) for centrality interval 70-80% and 2< |eta| <2.5.

v2(eta) for centrality interval 0-10% and 0.5< pT <0.7 GeV.

v2(eta) for centrality interval 10-20% and 0.5< pT <0.7 GeV.