Distributions in SR-low of the data and post-fit background prediction for H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3ℓ/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3ℓ/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3ℓ). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3ℓ). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Observed $CL_S$ limits on $\sigma \times BR$ for $m_{\Phi} = 200-400$ GeV.

Observed $CL_S$ limits on $\sigma \times BR$ for $m_{\Phi} = 600-1000$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 15$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 40$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

Comparison of the IDVx reconstruction and selection efficiency for a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV, using only standard tracking versus using standard and large radius tracking for all ID vertices in the signal MC sample.

Comparison of the IDVx reconstruction and selection efficiency for a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV, using only standard tracking versus using standard and large radius tracking for ID vertices passing the full IDVx selection criteria.

Comparison of the IDVx reconstruction and selection efficiency for a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV, using only standard tracking versus using standard and large radius tracking for all ID vertices in the signal MC sample.

Comparison of the IDVx reconstruction and selection efficiency for a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV, using only standard tracking versus using standard and large radius tracking for ID vertices passing the full IDVx selection criteria.

The IDVx selection efficiency as a function of long-lived particle decay $z$ position for MC signal samples with a 125 GeV Higgs boson decaying to LLPs with masses of 8, 25, and 55 GeV. The efficiency for the 55 GeV LLP sample is shown both with and without the material veto applied.

The IDVx selection efficiency as a function of long-lived particle decay $z$ position for MC signal samples with mediators of masses 200, 400, and 600 GeV decaying to LLPs with a mass of 50 GeV. The efficiency for the 200 GeV mediator sample is shown both with and without the material veto applied.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 8$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 15$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 25$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 40$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 8$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 400$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 400$ GeV, $m_s = 100$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 600$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 600$ GeV, $m_s = 150$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 150$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 400$ GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Expected 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

The observed upper limits on the model cross-section in units of pb for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production. Three points at $M({\tilde{\chi}}^{0}_{1})=200GeV$ were removed from the plot but kept in the table because they overlapped with the plot's legend and are far from the exclusion contour.

The observed 95\% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95\% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

The measured fiducial cross section vs $E_{\mathrm{T}}^\gamma$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

Distribution of $v_{3}$ from MBT events plotted as a function of the A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of $v_{3}$ from $p_{T}^{jet}>75$ GeV events plotted as a function of the A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of $v_{3}$ from $p_{T}^{jet}>100$ GeV events plotted as a function of the A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of $v_{2}$ from MBT events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of $v_{2}$ from $p_{T}^{jet}>75$ GeV events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of $v_{2}$ from $p_{T}^{jet}>100$ GeV events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of $v_{2}$ from MBT events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of $v_{2}$ from $p_{T}^{jet}>75$ GeV events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of $v_{2}$ from $p_{T}^{jet}>100$ GeV events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of $v_{2}$ from MBT events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (9-100 GeV).

Distribution of $v_{2}$ from $p_{T}^{jet}>75$ GeV events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (9-100 GeV).

Distribution of $v_{2}$ from $p_{T}^{jet}>100$ GeV events plotted as a function of the event centrality and A-particle $p_\mathrm{T}$ in (9-100 GeV).

Distribution of relative UE-UE pair fractions from MBT events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative HS-HS pair fractions from MBT events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative HS-UE pair fractions from MBT events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative UE-HS pair fractions from MBT events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative UE-UE pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative HS-HS pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative HS-UE pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative UE-HS pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative UE-UE pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative HS-HS pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative HS-UE pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative UE-HS pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of A-particle $p_\mathrm{T}$ for 0-5% centrality.

Distribution of relative UE-UE pair fractions from MBT events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of relative HS-UE pair fractions from MBT events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of relative UE-UE pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of relative HS-UE pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of relative UE-UE pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of relative HS-UE pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (0.5-2 GeV).

Distribution of relative UE-UE pair fractions from MBT events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of relative HS-UE pair fractions from MBT events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of relative UE-UE pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of relative HS-UE pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of relative UE-UE pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of relative HS-UE pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (2-9 GeV).

Distribution of relative UE-UE pair fractions from MBT events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (9-100 GeV).

Distribution of relative HS-UE pair fractions from MBT events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (9-100 GeV).

Distribution of relative UE-UE pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (9-100 GeV).

Distribution of relative HS-UE pair fractions from $p_{T}^{jet}>75$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (9-100 GeV).

Distribution of relative UE-UE pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (9-100 GeV).

Distribution of relative HS-UE pair fractions from $p_{T}^{jet}>100$ GeV events plotted as a function of centrality A-particle $p_\mathrm{T}$ in (9-100 GeV).

Normalised differential cross-section in the fiducial region as a function of lepton |eta|. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The corresponding correlation matrices are given in Tables 29 and 30.

Absolute differential cross-section in the fiducial region as a function of dilepton pT. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The last bin includes overflow beyond the upper bin boundary. The corresponding correlation matrices are given in Tables 31 and 32.

Normalised differential cross-section in the fiducial region as a function of dilepton pT. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The last bin includes overflow beyond the upper bin boundary. The corresponding correlation matrices are given in Tables 33 and 34.

Absolute differential cross-section in the fiducial region as a function of dilepton invariant mass. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The last bin includes overflow beyond the upper bin boundary. The corresponding correlation matrices are given in Tables 35 and 36.

Normalised differential cross-section in the fiducial region as a function of dilepton invariant mass. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The last bin includes overflow beyond the upper bin boundary. The corresponding correlation matrices are given in Tables 37 and 38.

Absolute differential cross-section in the fiducial region as a function of dilepton |rapidity|. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The corresponding correlation matrices are given in Tables 39 and 40.

Normalised differential cross-section in the fiducial region as a function of dilepton |rapidity|. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The corresponding correlation matrices are given in Tables 41 and 42.

Absolute differential cross-section in the fiducial region as a function of the azimuthal angle between the leptons. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The corresponding correlation matrices are given in Tables 43 and 44.

Normalised differential cross-section in the fiducial region as a function of the azimuthal angle between the leptons. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The corresponding correlation matrices are given in Tables 45 and 46.

Absolute differential cross-section in the fiducial region as a function of the sum of pT of the two leptons. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The last bin includes overflow beyond the upper bin boundary. The corresponding correlation matrices are given in Tables 47 and 48.

Normalised differential cross-section in the fiducial region as a function of the sum of pT of the two leptons. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The last bin includes overflow beyond the upper bin boundary. The corresponding correlation matrices are given in Tables 49 and 50.

Absolute differential cross-section in the fiducial region as a function of the sum of the energies of the two leptons. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The last bin includes overflow beyond the upper bin boundary. The corresponding correlation matrices are given in Tables 51 and 52.

Normalised differential cross-section in the fiducial region as a function of the sum of the energies of the two leptons. The first column gives the cross-section including contributions from leptonic tau decays, the second without. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb). The last bin includes overflow beyond the upper bin boundary. The corresponding correlation matrices are given in Tables 53 and 54.

Absolute differential cross-section in the fiducial region as a function of lepton |eta| and dilepton invariant mass. The first four columns give the cross-section including contributions from leptonic tau decays in the four mass bins, and the last four columns do not include the leptonic tau contributions. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb).

Normalised differential cross-section in the fiducial region as a function of lepton |eta| and dilepton invariant mass. The first four columns give the cross-section including contributions from leptonic tau decays in the four mass bins, and the last four columns do not include the leptonic tau contributions. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb).

Absolute differential cross-section in the fiducial region as a function of dilepton |rapidity| and dilepton invariant mass. The first four columns give the cross-section including contributions from leptonic tau decays in the four mass bins, and the last four columns do not include the leptonic tau contributions. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb).

Normalised differential cross-section in the fiducial region as a function of dilepton |rapidity| and dilepton invariant mass. The first four columns give the cross-section including contributions from leptonic tau decays in the four mass bins, and the last four columns do not include the leptonic tau contributions. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb).

Absolute differential cross-section in the fiducial region as a function of the azimuthal angle between the leptons and dilepton invariant mass. The first four columns give the cross-section including contributions from leptonic tau decays in the four mass bins, and the last four columns do not include the leptonic tau contributions. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb).

Normalised differential cross-section in the fiducial region as a function of the azimuthal angle between the leptons and dilepton invariant mass. The first four columns give the cross-section including contributions from leptonic tau decays in the four mass bins, and the last four columns do not include the leptonic tau contributions. Systematic uncertainties are given for ttbar modelling (ttmod), lepton calibration (lept), jet and b-tagging calibration (jet), backgrounds (bkg) and integrated luminosity and beam energy (leb).

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of lepton pT as measured in Table 1, including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of lepton pT as measured in Table 1, not including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of lepton pT as measured in Table 2, including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of lepton pT as measured in Table 2, not including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of lepton |eta| as measured in Table 3, including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of lepton |eta| as measured in Table 3, not including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of lepton |eta| as measured in Table 4, including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of lepton |eta| as measured in Table 4, not including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of dilepton pT as measured in Table 5, including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of dilepton pT as measured in Table 5, not including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of dilepton pT as measured in Table 6, including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of dilepton pT as measured in Table 6, not including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of dilepton invariant mass as measured in Table 7, including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of dilepton invariant mass as measured in Table 7, not including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of dilepton invariant mass as measured in Table 8, including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of dilepton invariant mass as measured in Table 8, not including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of dilepton |rapidity| as measured in Table 9, including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of dilepton |rapidity| as measured in Table 9, not including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of dilepton |rapidity| as measured in Table 10, including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of dilepton |rapidity| as measured in Table 10, not including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of the azimuthal angle between the leptons as measured in Table 11, including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of the azimuthal angle between the leptons as measured in Table 11, not including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of the azimuthal angle between the leptons as measured in Table 12, including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of the azimuthal angle between the leptons as measured in Table 12, not including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of the sum of pT of the two leptons as measured in Table 13, including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of the sum of pT of the two leptons as measured in Table 13, not including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of the sum of pT of the two leptons as measured in Table 14, including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of the sum of pT of the two leptons as measured in Table 14, not including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of the sum of the energies of the two leptons as measured in Table 15, including tau decay contributions.

Correlation matrix for the absolute differential cross-section in the fiducial region as a function of the sum of the energies of the two leptons as measured in Table 15, not including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of the sum of the energies of the two leptons as measured in Table 16, including tau decay contributions.

Correlation matrix for the normalised differential cross-section in the fiducial region as a function of the sum of the energies of the two leptons as measured in Table 16, not including tau decay contributions.

Correlation matrix for the combination of all eight one-dimensional absolute fiducial cross-section measurements, including tau decay contributions. The observables are arranged as follows: lepton pT (bins 1-11),lepton |eta| (bins 12-20),dilepton pT (bins 21-29),dilepton invariant mass (bins 30-41),dilepton |rapidity| (bins 42-50),the azimuthal angle between the leptons (bins 51-60),the sum of pT of the two leptons (bins 61-68),the sum of the energies of the two leptons (bins 69-78).

Correlation matrix for the combination of all eight one-dimensional absolute fiducial cross-section measurements, not including tau decay contributions. The observables are arranged as follows: lepton pT (bins 1-11),lepton |eta| (bins 12-20),dilepton pT (bins 21-29),dilepton invariant mass (bins 30-41),dilepton |rapidity| (bins 42-50),the azimuthal angle between the leptons (bins 51-60),the sum of pT of the two leptons (bins 61-68),the sum of the energies of the two leptons (bins 69-78).

Correlation matrix for the combination of all eight one-dimensional normalised fiducial cross-section measurements, including tau decay contributions. The observables are arranged as follows: lepton pT (bins 1-10),lepton |eta| (bins 11-18),dilepton pT (bins 19-26),dilepton invariant mass (bins 27-37),dilepton |rapidity| (bins 38-45),the azimuthal angle between the leptons (bins 46-54),the sum of pT of the two leptons (bins 55-61),the sum of the energies of the two leptons (bins 62-70).

Correlation matrix for the combination of all eight one-dimensional normalised fiducial cross-section measurements, not including tau decay contributions. The observables are arranged as follows: lepton pT (bins 1-10),lepton |eta| (bins 11-18),dilepton pT (bins 19-26),dilepton invariant mass (bins 27-37),dilepton |rapidity| (bins 38-45),the azimuthal angle between the leptons (bins 46-54),the sum of pT of the two leptons (bins 55-61),the sum of the energies of the two leptons (bins 62-70).

Fiducial region definition

Dijet invariant mass distribution for the category with at least one b-tagged jet.

Dijet invariant mass distribution for the category with both jets b-tagged.

The 95% CL upper limits on the cross-section times acceptance times branching ratio into two jets as a function of the mass of q* signal.

The 95% CL upper limits on the cross-section times acceptance times branching ratio into two jets as a function of the mass of QBH signal.

The 95% CL upper limits on the cross-section times acceptance times branching ratio into two jets as a function of the mass of W' signal.

The 95% CL upper limits on the cross-section times acceptance times branching ratio into two jets as a function of the mass of W* signal.

The upper limits on the DM mediator Z' signal at 95% CL from the inclusive category. The 95% CL upper limits are set on the universal quark coupling $g_q$ as a function of the Z' mass.

The 95% CL upper limit on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the mass of the b* signal.

The 95% CL upper limit on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the signal mass in the DM mediator Z' with $g_q$ = 0.25 model.

The 95% CL upper limit on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the signal mass in the SSM Z' model.

The 95% CL upper limit on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the signal mass in the graviton with $k/\overline{M}_{PL}=0.2$ model.

The 95% CL upper limit on the cross-section times kinematic acceptance times branching ratio for resonances with a generic Gaussian shape, as a function of the Gaussian mean mass in the inclusive category. Different widths, from 0% up to 15% of the signal mass, are considered. Gaussian-shape signals with 0% widths correspond to signal widths smaller than the experimental resolution. For a Gaussian-shaped signal with a relative width of 15%, the limits are truncated at high mass when the broad signal starts to overlap the upper end of the mass spectrum.

The 95% CL upper limit on the cross-section times kinematic acceptance times b-tagging efficiency times branching ratio for resonances with a generic Gaussian shape, as a function of the Gaussian mean mass in the 1 b category. Different widths, from 0% up to 15% of the signal mass, are considered. Gaussian-shape signals with 0% widths correspond to signal widths smaller than the experimental resolution. For a Gaussian-shaped signal with a relative width of 15%, the limits are truncated at high mass when the broad signal starts to overlap the upper end of the mass spectrum.

The 95% CL upper limit on the cross-section times kinematic acceptance times b-tagging efficiency times branching ratio for resonances with a generic Gaussian shape, as a function of the Gaussian mean mass in the 2 b category. Different widths, from 0% up to 15% of the signal mass, are considered. Gaussian-shape signals with 0% widths correspond to signal widths smaller than the experimental resolution. For a Gaussian-shaped signal with a relative width of 15%, the limits are truncated at high mass when the broad signal starts to overlap the upper end of the mass spectrum.

The expected 95% CL upper limits on the cross-section times acceptance times b-tagging efficiency times branching ratio as a function of the DM mediator Z' mass for the current and previous iterations of the analysis. The upper limit of the previous result was obtained with the Bayesian method and is also shown scaled to the 139 fb$^{-1}$ integrated luminosity of the current result to illustrate the effect of the analysis improvements.

Acceptance for the QBH, Q* and W' benchmark signal models in the inclusive category, as a function of the simulated mass.

Acceptance for the DM Z' benchmark signal model for various $g_q$ coupling parameters in the inclusive category, as a function of the simulated mass.

Acceptance for the W* benchmark signal model in the inclusive category, as a function of the simulated mass.

Acceptance times b-tagging efficiency for the b* benchmark signal model in the 1b category, as a function of the simulated mass.

Acceptance times b-tagging efficiency for the DM Z' with $g_q$=0.25, SSM Z' and graviton with $k/\overline{M}_{PL}=0.2$ benchmark signal models in the 2b category, as a function of the simulated mass.

The expected 95% CL upper limits on the cross-section times branching ratio as a function of the DM mediator Z' mass for the current and previous iterations of the analysis. The upper limit of the previous result was obtained with the Bayesian method and is also shown scaled to the 139 fb$^{-1}$ integrated luminosity of the current result to illustrate the effect of the analysis improvements. The current b-tagging requirement is tighter than the previous one for high-$p_T$ jets, resulting in a data sample with limited size for mass above 4 TeV. The background rejection, instead, has improved significantly across the entire mass spectrum inspected by the analysis.